METHOD FOR FABRICATING A COMPOSITE STRUCTURE TO BE SEPARATED BY EXFOLIATION
    23.
    发明申请
    METHOD FOR FABRICATING A COMPOSITE STRUCTURE TO BE SEPARATED BY EXFOLIATION 有权
    用于制备通过分离分离的复合结构的方法

    公开(公告)号:US20140339681A1

    公开(公告)日:2014-11-20

    申请号:US14345558

    申请日:2012-07-18

    摘要: The invention relates to a method for fabricating a composite structure comprising a layer to be separated by irradiation, the method comprising the formation of a stack containing: a support substrate formed from a material that is at least partially transparent at a determined wavelength; a layer to be separated; and a separation layer interposed between the support substrate and the layer to be separated, the separation layer being adapted to be separated by exfoliation under the action of radiation having a wavelength corresponding to the determined wavelength. Furthermore, the method comprises, during the step for forming the composite step, a treatment step modifying the optical properties in reflection at the interface between the support substrate and the separation layer or on the upper face of the support substrate.

    摘要翻译: 本发明涉及一种用于制造复合结构的方法,所述复合结构包括通过照射分离的层,所述方法包括形成堆叠,所述堆叠包含:由以确定的波长至少部分透明的材料形成的支撑衬底; 一层要分开的; 以及插入在支撑基板和待分离层之间的分离层,分离层适于在具有对应于所确定的波长的波长的辐射的作用下通过剥离而分离。 此外,该方法包括在形成复合步骤的步骤期间,修改在支撑衬底和分离层之间或支撑​​衬底的上表面上的界面处的反射光学性质的处理步骤。

    Method and apparatus for microwave treatment of dielectric films
    24.
    发明申请
    Method and apparatus for microwave treatment of dielectric films 有权
    电介质膜微波处理方法和装置

    公开(公告)号:US20140322921A1

    公开(公告)日:2014-10-30

    申请号:US14120013

    申请日:2014-04-15

    IPC分类号: H01L21/02 H01L21/268

    摘要: A method for processing a dielectric film on a substrate comprises: depositing a porous dielectric film on a substrate; removing the porogen; stuffing the film with a protective polymeric material; performing at least one intermediate processing step on the stuffed dielectric film; placing the film in a microwave applicator cavity and heating to a first temperature to partially burn out the polymeric material; introducing a controlled amount of a polar solvent into the porosity created by the partial burn out; applying microwave energy to heat the film to a second selected temperature below the boiling point of the solvent to clean away remaining polymeric material; and applying microwave energy to heat the film to a third temperature above the boiling point of the solvent to completely burnout the residues of polymeric material. The interaction of the polar solvent with the microwaves enhances the efficiency of the cleaning process.

    摘要翻译: 一种用于处理衬底上的电介质膜的方法,包括:在衬底上沉积多孔电​​介质膜; 去除致孔剂; 用保护性聚合物材料填充该膜; 在填充的电介质膜上执行至少一个中间处理步骤; 将膜放置在微波施加器腔中并加热至第一温度以部分地烧掉聚合物材料; 将受控量的极性溶剂引入由部分烧尽产生的孔隙中; 施加微波能量以将薄膜加热到低于溶剂沸点的第二选定温度以清除剩余的聚合物材料; 并施加微波能量以将膜加热到高于溶剂沸点的第三温度以完全燃烧聚合材料的残余物。 极性溶剂与微波的相互作用提高了清洗过程的效率。

    Method for manufacturing semiconductor device
    27.
    发明授权
    Method for manufacturing semiconductor device 有权
    制造半导体器件的方法

    公开(公告)号:US07767538B2

    公开(公告)日:2010-08-03

    申请号:US11507007

    申请日:2006-08-21

    IPC分类号: H01L21/26 H01L27/14 H01L27/30

    摘要: It is made possible to form a silicon nitride film, an aluminum oxide film and a transition metal high-k insulation film of high quality. A manufacturing method includes: forming an insulation film having at least one kind of bonds selected out of silicon-nitrogen bonds, aluminum-oxygen bonds, transition metal-oxygen-silicon bonds, transition metal-oxygen-aluminum bonds, and transition metal-oxygen bonds on either a film having a semiconductor as a main component or a semiconductor substrate, and irradiating the insulation film with pulse infrared light having a wavelength corresponding to a maximum intensity in a wavelength region depending upon the insulation film and having a wavelength absorbed by the insulation film.

    摘要翻译: 可以形成高质量的氮化硅膜,氧化铝膜和过渡金属高k绝缘膜。 一种制造方法包括:形成具有选自硅 - 氮键,铝 - 氧键,过渡金属 - 氧 - 硅键,过渡金属 - 氧 - 铝键和过渡金属 - 氧中的至少一种键的绝缘膜 在具有半导体作为主要成分的膜或半导体衬底上的膜上键合,并且用绝缘膜照射具有与波长区域中的最大强度相对应的波长的脉冲红外光,该波长区域取决于绝缘膜并且具有由 绝缘膜。

    Flash Heating in Atomic Layer Deposition
    29.
    发明申请
    Flash Heating in Atomic Layer Deposition 审中-公开
    原子层沉积中的闪光加热

    公开(公告)号:US20070281082A1

    公开(公告)日:2007-12-06

    申请号:US11421992

    申请日:2006-06-02

    摘要: System and methods for flash heating of materials deposited using atomic layer deposition techniques are disclosed. By flash heating the surface of the deposited material after each or every few deposition cycles, contaminants such as un-reacted precursors and byproducts can be released from the deposited material. A higher quality material is deposited by reducing the incorporation of impurities. A flash heating source is capable of quickly raising the temperature of the surface of a deposited material without substantially raising the temperature of the bulk of the substrate on which the material is being deposited. Because the temperature of the bulk of the substrate is not significantly raised, the bulk acts like a heat sink to aid in cooling the surface after flash heating. In this manner, processing times are not significantly increased in order to allow the surface temperature to reach a suitably low temperature for deposition.

    摘要翻译: 公开了使用原子层沉积技术沉积的材料的闪蒸加热的系统和方法。 通过在每个或几个沉积循环之后快速加热沉积材料的表面,可以从沉积材料中释放诸如未反应前体和副产物的污染物。 通过减少杂质的掺入沉积更高质量的材料。 闪光加热源能够快速提高沉积材料的表面的温度,而不会基本上提高材料沉积的基底的体积的温度。 因为基板的体积的温度没有显着上升,所以散热器的作用就像散热器,以帮助在闪光加热之后冷却表面。 以这种方式,为了使表面温度达到适当低的沉积温度,处理时间不会显着增加。