公开(公告)号：US20140001617A1

公开(公告)日：2014-01-02

申请号：US13539304

申请日：2012-06-30

Applicant: Lei Shi ,  Aihua Lu ,  Yan Xun Xue

Inventor： Lei Shi ,  Aihua Lu ,  Yan Xun Xue

IPC: H01L21/50 ,  H01L23/495

CPC classification number: H01L24/11 ,  H01L21/50 ,  H01L23/495 ,  H01L23/4952 ,  H01L23/49562 ,  H01L24/14 ,  H01L24/17 ,  H01L24/32 ,  H01L2224/0603 ,  H01L2224/32245 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/49111 ,  H01L2224/73265 ,  H01L2224/8314 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/00014 ,  H01L2924/00 ,  H01L2924/00012

Abstract: A die attach method for a semiconductor chip with a back metal layer located at the back surface of the semiconductor chip comprises the steps of forming a bonding ball array including a plurality of bonding balls with a same height on a die attach area at a top surface of a die paddle; depositing a die attach material in the bonding ball array area with a thickness of the die attach material equal or slightly larger than the height of the bonding ball; attaching the semiconductor chip to the die attach area at the top surface of the die paddle by the die attach material, wherein the bonding ball array controls the bond line thickness of the die attach material between the back metal layer and the top surface of the die paddle and prevents the semiconductor chip from rotating on the die attach material when it is melted.

Abstract translation: 具有位于半导体芯片的背面的背面金属层的半导体芯片的芯片贴附方法包括以下步骤：在上表面的芯片附着区域上形成包括具有相同高度的多个接合球的接合球阵列 的模具 在焊接球阵列区域中沉积管芯附着材料，其中管芯附着材料的厚度等于或略大于焊接球的高度; 将所述半导体芯片通过所述芯片附着材料附接到所述芯片的顶表面处的所述芯片附着区域，其中，所述接合球阵列控制所述芯片附着材料在所述背面金属层与所述模具的顶表面之间的结合线厚度 并且防止半导体芯片在熔融时在芯片附着材料上旋转。

公开(公告)号：US08575006B2

公开(公告)日：2013-11-05

申请号：US12592596

申请日：2009-11-30

Applicant: Yan Xun Xue ,  Jun Lu

Inventor： Yan Xun Xue ,  Jun Lu

IPC: H01L31/00

CPC classification number: H01L23/49551 ,  H01L21/4842 ,  H01L21/561 ,  H01L23/4952 ,  H01L23/49562 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/97 ,  H01L2224/32245 ,  H01L2224/451 ,  H01L2224/48247 ,  H01L2224/49111 ,  H01L2224/73265 ,  H01L2224/97 ,  H01L2924/00014 ,  H01L2924/01033 ,  H01L2924/01082 ,  H01L2924/181 ,  H01L2224/85 ,  H01L2224/83 ,  H01L2924/00 ,  H01L2924/00015 ,  H01L2224/05599 ,  H01L2924/00012

Abstract: This invention discloses a process for packaging semiconductor device with external leads. The process includes comprises Step 1: providing a lead frame comprising a plurality of lead frame units connected by a plurality of metal beams, each lead frame unit comprising a die pad and a plurality of leads located on opposite sides of the die pad; adhering a semiconductor chip onto each of the die pad, and providing a plurality of metal connections for electrically connecting each chip to its corresponding leads; Step 2 providing a plastic molding material to enclose the plurality of the lead frame units, the metal beams, the chips, and at least portions of the metal connections; Step 3 removing a portion of the plastic molding material above the metal beams to expose the metal beams and portions of the leads in connection with the metal beams; and Step 4 separating each lead frame unit, forming a plurality of individual semiconductor plastic package components with external leads.

Abstract translation: 本发明公开了一种用外部引线封装半导体器件的方法。 该方法包括步骤1：提供引线框架，该引线框架包括由多个金属梁连接的多个引线框架单元，每个引线框架单元包括管芯焊盘和位于管芯焊盘的相对侧上的多个引线; 将半导体芯片粘附到每个芯片焊盘上，并且提供多个金属连接件，用于将每个芯片电连接到其相应的引线; 步骤2提供塑料模制材料以封闭多个引线框架单元，金属梁，芯片以及金属连接件的至少部分; 步骤3，移除金属梁上方的塑料成型材料的一部分，以暴露金属梁和引线的与金属梁相关的部分; 以及步骤4分离每个引线框架单元，用外部引线形成多个单独的半导体塑料封装部件。

公开(公告)号：US08569169B2

公开(公告)日：2013-10-29

申请号：US13273219

申请日：2011-10-13

Applicant: Yueh-Se Ho ,  Yan Xun Xue ,  Ping Huang

Inventor： Yueh-Se Ho ,  Yan Xun Xue ,  Ping Huang

IPC: H01L21/44

CPC classification number: H01L23/481 ,  H01L24/03 ,  H01L24/05 ,  H01L24/06 ,  H01L29/781 ,  H01L2224/04105 ,  H01L2224/05016 ,  H01L2224/05026 ,  H01L2224/05073 ,  H01L2224/051 ,  H01L2224/05562 ,  H01L2224/06102 ,  H01L2224/06181 ,  H01L2924/00014 ,  H01L2924/01033 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2224/05552

Abstract: A bottom source power metal-oxide-semiconductor field-effect transistor (MOSFET) device includes a gate electrode and a source electrode formed on an initial insulation layer on a first surface of a semiconductor chip and a drain electrode formed on a second surface of the semiconductor chip. The source electrode includes a source metal, a source electrode bump formed on the source metal and a source electrode metal layer on top of the source electrode bump. A first insulation layer covers the gate electrode. A through via aligned to the gate electrode is formed from the second surface of the chip to expose a portion of the gate electrode from the second surface.

Abstract translation: 底部源极功率金属氧化物半导体场效应晶体管（MOSFET）器件包括形成在半导体芯片的第一表面上的初始绝缘层上的栅电极和源电极，以及形成在半导体芯片的第二表面上的漏电极 半导体芯片 源电极包括源极金属，形成在源极金属上的源极电极凸点和源极电极凸起顶部上的源电极金属层。 第一绝缘层覆盖栅电极。 从芯片的第二表面形成与栅电极对准的贯通孔，以将栅电极的一部分从第二表面露出。

公开(公告)号：US08564110B2

公开(公告)日：2013-10-22

申请号：US13480391

申请日：2012-05-24

Applicant: Yan Xun Xue ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu ,  Lei Shi ,  Liang Zhao ,  Ping Huang

Inventor： Yan Xun Xue ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu ,  Lei Shi ,  Liang Zhao ,  Ping Huang

IPC: H01L23/495

CPC classification number: H01L24/73 ,  H01L23/3107 ,  H01L23/49513 ,  H01L23/49524 ,  H01L23/49548 ,  H01L23/49562 ,  H01L24/06 ,  H01L24/13 ,  H01L24/16 ,  H01L24/29 ,  H01L24/32 ,  H01L24/83 ,  H01L24/84 ,  H01L24/92 ,  H01L24/97 ,  H01L2224/0401 ,  H01L2224/05624 ,  H01L2224/06181 ,  H01L2224/11334 ,  H01L2224/1146 ,  H01L2224/1184 ,  H01L2224/131 ,  H01L2224/1329 ,  H01L2224/133 ,  H01L2224/16245 ,  H01L2224/2784 ,  H01L2224/291 ,  H01L2224/3015 ,  H01L2224/32245 ,  H01L2224/371 ,  H01L2224/40247 ,  H01L2224/73104 ,  H01L2224/73204 ,  H01L2224/73253 ,  H01L2224/83101 ,  H01L2224/83385 ,  H01L2224/83801 ,  H01L2224/84385 ,  H01L2224/84801 ,  H01L2224/8485 ,  H01L2224/92125 ,  H01L2224/97 ,  H01L2924/01005 ,  H01L2924/01013 ,  H01L2924/01023 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01057 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/16151 ,  H01L2924/167 ,  H01L2924/181 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2224/92 ,  H01L2224/83 ,  H01L2224/84 ,  H01L2224/85 ,  H01L2924/00012 ,  H01L2224/48247 ,  H01L2924/01014 ,  H01L2924/00014 ,  H01L2224/73103 ,  H01L2924/00

Abstract: A power semiconductor package has an ultra thin chip with front side molding to reduce substrate resistance; a lead frame unit with grooves located on both side leads provides precise positioning for connecting numerous bridge-shaped metal clips to the front side of the side leads. The bridge-shaped metal clips are provided with bridge structure and half or fully etched through holes for relieving superfluous solder during manufacturing process.

Abstract translation: 功率半导体封装具有超薄芯片，具有正面成型以降低基板电阻; 具有位于两侧引线上的凹槽的引线框单元提供精确的定位，用于将多个桥形金属夹连接到侧引线的前侧。 桥形金属夹具有桥结构和半或完全蚀刻的通孔，用于在制造过程中缓解多余的焊料。

公开(公告)号：US08563417B2

公开(公告)日：2013-10-22

申请号：US13302219

申请日：2011-11-22

Applicant: Jun Lu ,  Alex Niu ,  Yueh-Se Ho ,  Ping Hoang ,  Jacky Gong ,  Yan Xun Xue ,  Xiaolian Zhang ,  Ming-Chen Lu

Inventor： Jun Lu ,  Alex Niu ,  Yueh-Se Ho ,  Ping Hoang ,  Jacky Gong ,  Yan Xun Xue ,  Xiaolian Zhang ,  Ming-Chen Lu

IPC: H01L21/78

CPC classification number: H01L21/561 ,  H01L21/566 ,  H01L21/568 ,  H01L23/3157 ,  H01L23/49524 ,  H01L23/49562 ,  H01L24/03 ,  H01L24/05 ,  H01L24/06 ,  H01L2224/03009 ,  H01L2224/0332 ,  H01L2224/0384 ,  H01L2224/03848 ,  H01L2224/03849 ,  H01L2224/04034 ,  H01L2224/05553 ,  H01L2224/05554 ,  H01L2224/05794 ,  H01L2224/058 ,  H01L2224/0603 ,  H01L2224/06051 ,  H01L2224/06135 ,  H01L2224/06164 ,  H01L2224/06181 ,  H01L2224/32245 ,  H01L2224/371 ,  H01L2224/40247 ,  H01L2224/73263 ,  H01L2224/84801 ,  H01L2224/94 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2224/03 ,  H01L2224/053 ,  H01L2924/014 ,  H01L2924/00

Abstract: The invention generally relates to a packaging method of an ultra-thin chip, more specifically, the invention relates to a method for packaging the ultra-thin chip with solder ball thermo-compression in wafer level packaging process. The method starts with disposing solder balls on metal pads arranged on the front surface of semiconductor chips that are formed at the front surface of a semiconductor wafer. The solder balls are soften by heating the wafer, a compression plate is applied with a pressure on the top ends of the solder balls thus forming a co-planar top surface at the top ends of the solder balls. A molding compound is deposited on the front surface of the wafer with the top ends of the solder balls exposed. The wafer is then ground from its back surface to reduce its thickness to achieve ultra-thin chip.

Abstract translation: 本发明一般涉及超薄芯片的封装方法，更具体地说，本发明涉及一种用于在晶片级封装工艺中封装具有焊球热压缩的超薄芯片的方法。 该方法开始于将焊球设置在形成在半导体晶片的前表面的半导体芯片的前表面上的金属焊盘上。 通过加热晶片来软化焊球，压力板在焊球的顶端施加压力，从而在焊球的顶端形成共面顶表面。 模具化合物沉积在晶片的前表面上，其中焊球的顶端被暴露。 然后将晶片从其背面研磨以减小其厚度以实现超薄芯片。

公开(公告)号：US08476752B2

公开(公告)日：2013-07-02

申请号：US13494219

申请日：2012-06-12

Applicant: Yueh-Se Ho ,  Yan Xun Xue ,  Jun Lu

Inventor： Yueh-Se Ho ,  Yan Xun Xue ,  Jun Lu

IPC: H01L21/00 ,  H01L23/02

CPC classification number: H01L24/49 ,  H01L23/49524 ,  H01L23/49541 ,  H01L23/49562 ,  H01L23/49575 ,  H01L24/37 ,  H01L24/40 ,  H01L24/41 ,  H01L24/48 ,  H01L2224/371 ,  H01L2224/40095 ,  H01L2224/40137 ,  H01L2224/40245 ,  H01L2224/40247 ,  H01L2224/4103 ,  H01L2224/48091 ,  H01L2224/48137 ,  H01L2224/48247 ,  H01L2224/48257 ,  H01L2224/49111 ,  H01L2224/49112 ,  H01L2224/49113 ,  H01L2224/49171 ,  H01L2224/73221 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01033 ,  H01L2924/01067 ,  H01L2924/01082 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2224/45099 ,  H01L2924/00 ,  H01L2224/84

Abstract: A package structure for DC-DC converter disclosed herein can reduce the number of encapsulated elements as a low-side MOSFET chip can be stacked above the high-side MOSFET chip of a first die pad, through die pads of different thicknesses or interposers with joint parts of different thicknesses; moreover, it further reduces the size of the entire semiconductor package as a number of bond wires are contained in the space between the controller and the low-side MOSFET chip. Moreover, electrical connection between the top source electrode pin and the bottom source electrode pin of the low-side MOSFET chip is realized with a metal joint plate, such that when the DC-DC converter is sealed with plastic, the metal joint plate can be exposed outside to improve the thermal performance and effectively reduce the thickness of the semiconductor package.

Abstract translation: 本文公开的用于DC-DC转换器的封装结构可以减少封装元件的数量，因为低侧MOSFET芯片可以堆叠在第一裸片焊盘的高侧MOSFET芯片上方，通过具有不同厚度的芯片焊盘或具有接头的插入件 不同厚度的零件; 而且，由于控制器和低侧MOSFET芯片之间的空间中包含多个接合线，因此进一步减小了整个半导体封装的尺寸。 此外，利用金属接合板实现了顶部源极电极引脚和低端MOSFET芯片的底部源极电极引脚之间的电连接，使得当DC-DC转换器用塑料密封时，金属接合板可以 暴露在外面以改善热性能并有效地减小半导体封装的厚度。

公开(公告)号：US08436429B2

公开(公告)日：2013-05-07

申请号：US13118445

申请日：2011-05-29

Applicant: Yan Xun Xue ,  Yueh-Se Ho ,  Lei Shi ,  Jun Lu ,  Liang Zhao

Inventor： Yan Xun Xue ,  Yueh-Se Ho ,  Lei Shi ,  Jun Lu ,  Liang Zhao

IPC: H01L27/088

CPC classification number: H01L23/49562 ,  H01L23/49524 ,  H01L23/49575 ,  H01L24/48 ,  H01L2224/48247 ,  H01L2924/00014 ,  H01L2924/01322 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

Abstract: A stacked power semiconductor device includes vertical metal oxide semiconductor field-effect transistors and dual lead frames packaged with flip-chip technology. In the method of manufacturing the stacked power semiconductor device, a first semiconductor chip is flip chip mounted on the first lead frame. A mounting clips is connected to the electrode at back side of the first semiconductor chip. A second semiconductor chip is mounted on the second lead frame, which is then flipped and stacked on the mounting clip.

Abstract translation: 叠层功率半导体器件包括垂直金属氧化物半导体场效应晶体管和采用倒装芯片技术封装的双引线框架。 在制造堆叠式功率半导体器件的方法中，第一半导体芯片是安装在第一引线框上的倒装芯片。 安装夹在第一半导体芯片的背面连接到电极。 第二半导体芯片安装在第二引线框架上，然后翻转并堆叠在安装夹上。

公开(公告)号：US08431993B2

公开(公告)日：2013-04-30

申请号：US13289918

申请日：2011-11-04

Applicant: Yan Xun Xue ,  Jun Lu ,  Lei Shi ,  Liang Zhao

Inventor： Yan Xun Xue ,  Jun Lu ,  Lei Shi ,  Liang Zhao

IPC: H01L29/94 ,  H01L29/76 ,  H01L31/062 ,  H01L31/119 ,  H01L31/113

CPC classification number: H01L24/73 ,  H01L21/4842 ,  H01L23/3107 ,  H01L23/49541 ,  H01L23/49551 ,  H01L24/29 ,  H01L24/37 ,  H01L24/40 ,  H01L24/48 ,  H01L24/83 ,  H01L24/84 ,  H01L24/85 ,  H01L24/92 ,  H01L24/97 ,  H01L2224/0603 ,  H01L2224/29339 ,  H01L2224/371 ,  H01L2224/37599 ,  H01L2224/48247 ,  H01L2224/73221 ,  H01L2224/83101 ,  H01L2224/83801 ,  H01L2224/8385 ,  H01L2224/85 ,  H01L2224/92 ,  H01L2224/97 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01057 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/13091 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2224/83 ,  H01L2224/84 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

Abstract: A method is disclosed for attaching an interconnection plate to semiconductor die within leadframe package. A base leadframe is provided with die pad for attaching semiconductor die. An interconnection plate is provided for attachment to the base leadframe and semiconductor die. Add a base registration feature onto base leadframe and a plate registration feature onto interconnection plate with the registration features designed to match each other such that, upon approach of the interconnection plate to base leadframe, the two registration features would engage and guide each other causing concomitant self-aligned attachment of the interconnection plate to base leadframe. Next, the interconnection plate is brought into close approach to base leadframe to engage and lock plate registration feature to base registration feature hence completing attachment of the interconnection plate to semiconductor die and forming a leadframe package.

Abstract translation: 公开了一种将引线框封装内的互连板连接到半导体管芯的方法。 基座引线框架设置有用于附接半导体管芯的管芯焊盘。 提供互连板，用于附接到基底引线框架和半导体管芯。 将基准注册功能添加到基准引线框架和板对准特征到互连板上，其中配准特征被设计成彼此匹配，使得在互连板到基底引线框架的接近时，两个配准特征将相互接合并引导彼此引起伴随 互连板与基座引线框架的自对准连接。 接下来，使互连板靠近基底引线框架以将板对准特征接合并锁定到基准对准特征，从而完成互连板连接到半导体管芯并形成引线框封装。

公开(公告)号：US20130037962A1

公开(公告)日：2013-02-14

申请号：US13429263

申请日：2012-03-23

Applicant: Yan Xun Xue

Inventor： Yan Xun Xue

IPC: H01L23/48 ,  H01L21/78

CPC classification number: H01L24/96 ,  H01L21/561 ,  H01L23/3114 ,  H01L24/19 ,  H01L24/20 ,  H01L2224/04105 ,  H01L2224/94 ,  H01L2924/12042 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/00 ,  H01L2224/03

Abstract: A method to provide a wafer level package with increasing contact pad area comprising the steps of forming a first packaging layer on wafer top surface, grinding the wafer back surface and etch through holes, depositing a metal to fill the through holes and covering wafer backside, cutting through the wafer from wafer backside forming a plurality of grooves separating each chip then depositing a second packaging layer filling the grooves and covering the wafer back metal, reducing the first packaging layer thickness to expose the second packaging layer filling the grooves and forming a plurality of contact pads overlaying the first packaging layer thereafter cutting through the second packaging layer in the grooves to form individual package.

Abstract translation: 一种用于提供具有增加的接触焊盘区域的晶片级封装的方法，包括以下步骤：在晶片顶表面上形成第一封装层，研磨晶片背面并蚀刻通孔，沉积金属以填充通孔并覆盖晶片背面， 从晶片背面切割晶片，形成分开每个芯片的多个沟槽，然后沉积填充沟槽并覆盖晶片背面金属的第二封装层，减小第一封装层厚度以露出填充凹槽的第二封装层并形成多个 接触垫重叠在第一包装层上，然后切割槽中的第二包装层以形成单个包装。

公开(公告)号：US08247288B2

公开(公告)日：2012-08-21

申请号：US12947717

申请日：2010-11-16

Applicant: Yan Xun Xue ,  Anup Bhalla ,  Hamza Yilmaz ,  Jun Lu

Inventor： Yan Xun Xue ,  Anup Bhalla ,  Hamza Yilmaz ,  Jun Lu

IPC: H01L21/8242

CPC classification number: H01L23/5223 ,  H01L23/49562 ,  H01L24/03 ,  H01L24/05 ,  H01L24/06 ,  H01L24/48 ,  H01L24/49 ,  H01L27/0629 ,  H01L27/0688 ,  H01L28/88 ,  H01L2224/04042 ,  H01L2224/05001 ,  H01L2224/0554 ,  H01L2224/05552 ,  H01L2224/05554 ,  H01L2224/0603 ,  H01L2224/48247 ,  H01L2224/48257 ,  H01L2224/48465 ,  H01L2224/49111 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01014 ,  H01L2924/01027 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01082 ,  H01L2924/10253 ,  H01L2924/1305 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/19041 ,  H01L2924/19107 ,  H01L2924/30107 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2224/85399 ,  H01L2224/05599

Abstract: A bypass capacitor is directly integrated on top of a MOSFET chip. The capacitor comprises multi layers of conductive material and dielectric material staking on top of each other with connection vias through dielectric layer for connecting different conductive layers. The method of integrating the bypass capacitor comprises repeating steps of depositing a dielectric layer, forming connection vias through the dielectric layer, depositing a conductive layer and patterning the conductive layer.

Abstract translation: 旁路电容直接集成在MOSFET芯片的顶部。 电容器包括多层导电材料和电介质材料，它们通过介电层连接不同导电层的连接通孔彼此顶部。 集成旁路电容器的方法包括沉积介电层的重复步骤，形成通过电介质层的连接通孔，沉积导电层和图案化导电层。