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公开(公告)号：US06730984B1
公开(公告)日：2004-05-04
申请号：US09712391
申请日：2000-11-14
IPC分类号： H01L2900
CPC分类号： C23C8/02 , C23C8/04 , C23C8/10 , C23C8/24 , C25D11/00 , C25D11/02 , C25D11/026 , H01C7/006 , H01C17/26 , H01L21/263 , H01L27/0802 , H01L29/8605 , Y10S257/904 , Y10S257/914
摘要： A method and structure for increasing an electrical resistance of a resistor that is within a semiconductor structure, by oxidizing or nitridizing a fraction of a surface layer of the resistor with oxygen/nitrogen (i.e., oxygen or nitrogen) particles, respectively. The semiconductor structure may include a semiconductor wafer, a semiconductor chip, and an integrated circuit. The method and structure comprises five embodiments. The first embodiment comprises heating an interior of a heating chamber that includes the oxygen/nitrogen particles as gaseous oxygen/nitrogen-comprising molecules (e.g., molecular oxygen/nitrogen). The second embodiment comprises heating the fraction of the surface layer by a beam of radiation (e.g., laser radiation), or a beam of particles, such that the semiconductor structure is within a chamber that includes the oxygen/particles as gaseous oxygen/nitrogen-comprising molecules (e.g., molecular oxygen/nitrogen). The third embodiment comprises: using a plasma chamber to generate plasma oxygen/nitrogen ions; and applying a DC voltage to the plasma oxygen/nitrogen ions to accelerate the plasma oxygen/nitrogen ions into the resistor such that the oxygen/nitrogen particles include the plasma oxygen/nitrogen ions. The fourth embodiment comprises using an anodization circuit to electrolytically generate oxygen/nitrogen ions in an electrolytic solution in which the resistor is immersed, wherein the oxygen/nitrogen particles include the electrolytically-generated oxygen/nitrogen ions. The fifth embodiment comprises immersing the semiconductor structure in a chemical solution which includes the oxygen/nitrogen particles, wherein the oxygen/nitrogen particles may include oxygen/nitrogen-comprising liquid molecules, oxygen/nitrogen ions, or an oxygen/nitrogen-comprising gas dissolved in the chemical solution under pressurization.
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公开(公告)号：US08513769B2
公开(公告)日：2013-08-20
申请号：US12765275
申请日：2010-04-22
申请人： Charles T. Black , Matthew E. Colburn , Timothy J. Dalton , Daniel C. Edelstein , Wai-Kin Li , Anthony K. Stamper , Haining S. Yang
发明人： Charles T. Black , Matthew E. Colburn , Timothy J. Dalton , Daniel C. Edelstein , Wai-Kin Li , Anthony K. Stamper , Haining S. Yang
IPC分类号： H01L23/5256 , H01L23/5329 , H01L21/7682
CPC分类号： H01L23/5256 , H01L21/0337 , H01L21/31144 , H01L21/32139 , H01L21/76816 , H01L23/5226 , H01L23/5228 , H01L27/101 , H01L2924/0002 , H01L2924/12044 , H01L2924/00
摘要： Electrical fuses and resistors having a sublithographic lateral or vertical dimension are provided. A conductive structure comprising a conductor or a semiconductor is formed on a semiconductor substrate. At least one insulator layer is formed on the conductive structure. A recessed area is formed in the at least one insulator layer. Self-assembling block copolymers are applied into the recessed area and annealed to form a fist set of polymer blocks and a second set of polymer blocks. The first set of polymer blocks are etched selective to the second set and the at least one insulator layer. Features having sublithographic dimensions are formed in the at least one insulator layer and/or the conductive structure. Various semiconductor structures having sublithographic dimensions are formed including electrical fuses and resistors.
摘要翻译： 提供具有亚光刻横向或垂直尺寸的电熔丝和电阻器。 包括导体或半导体的导电结构形成在半导体衬底上。 在导电结构上形成至少一个绝缘体层。 在所述至少一个绝缘体层中形成凹陷区域。 将自组装嵌段共聚物施加到凹陷区域中并退火以形成第一组聚合物嵌段和第二组聚合物嵌段。 第一组聚合物嵌段被选择性蚀刻到第二组和至少一个绝缘体层。 具有亚光刻尺寸的特征形成在至少一个绝缘体层和/或导电结构中。 形成具有亚光刻尺寸的各种半导体结构，其包括电熔丝和电阻器。
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公开(公告)号：US20120044611A1
公开(公告)日：2012-02-23
申请号：US12858953
申请日：2010-08-18
IPC分类号： H01G7/00
摘要： Embodiments of a method include forming a metal-insulator-metal (MIM) capacitor including a first electrode and a second electrode and an insulator layer between the first and second electrodes, the MIM capacitor also including a reactive layer; and altering the reactive layer to change a capacitive value of the MIM capacitor.
摘要翻译： 一种方法的实施例包括在第一和第二电极之间形成包括第一电极和第二电极以及绝缘体层的金属 - 绝缘体 - 金属（MIM）电容器，MIM电容器还包括反应层; 并改变反应层以改变MIM电容器的电容值。
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公开(公告)号：US08120143B2
公开(公告)日：2012-02-21
申请号：US12034728
申请日：2008-02-21
申请人： Daniel C. Edelstein , Anil K. Chinthakindi , Timothy J. Dalton , Ebenezer E. Eshun , Jeffrey P. Gambino , Sarah L. Lane , Anthony K. Stamper
发明人： Daniel C. Edelstein , Anil K. Chinthakindi , Timothy J. Dalton , Ebenezer E. Eshun , Jeffrey P. Gambino , Sarah L. Lane , Anthony K. Stamper
IPC分类号： H01L29/00
CPC分类号： H01L23/5223 , H01L21/76814 , H01L21/76816 , H01L21/76831 , H01L28/87 , H01L2924/0002 , H01L2924/3011 , H01L2924/00
摘要： The invention is directed to an integrated circuit comb capacitor with capacitor electrodes that have an increased capacitance between neighboring capacitor electrodes as compared with other interconnects and via contacts formed in the same metal wiring level and at the same pitches. The invention achieves a capacitor that minimizes capacitance tolerance and preserves symmetry in parasitic electrode-substrate capacitive coupling, without adversely affecting other interconnects and via contacts formed in the same wiring level, through the use of, at most, one additional noncritical, photomask.
摘要翻译： 本发明涉及具有电容器电极的集成电路梳状电容器，其与在相同金属布线级别和相同间距处形成的其它互连和通孔触点相比，在相邻的电容器电极之间具有增加的电容。 本发明实现了一种电容器，其使电容容限最小化并且在寄生电极 - 基板电容耦合中保持对称性，而不会通过使用至多一个附加的非临界光掩模来不利地影响在相同布线级别形成的其它互连和通孔触点。
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45.发明授权Device and methodology for reducing effective dielectric constant in semiconductor devices 有权用于降低半导体器件中有效介电常数的器件和方法公开(公告)号：US07892940B2
公开(公告)日：2011-02-22
申请号：US11851123
申请日：2007-09-06
申请人： Daniel C. Edelstein , Matthew E. Colburn , Edward C. Cooney, III , Timothy J. Dalton , John A. Fitzsimmons , Jeffrey P. Gambino , Elbert E. Huang , Michael W. Lane , Vincent J. McGahay , Lee M. Nicholson , Satyanarayana V. Nitta , Sampath Purushothaman , Sujatha Sankaran , Thomas M. Shaw , Andrew H. Simon , Anthony K. Stamper
发明人： Daniel C. Edelstein , Matthew E. Colburn , Edward C. Cooney, III , Timothy J. Dalton , John A. Fitzsimmons , Jeffrey P. Gambino , Elbert E. Huang , Michael W. Lane , Vincent J. McGahay , Lee M. Nicholson , Satyanarayana V. Nitta , Sampath Purushothaman , Sujatha Sankaran , Thomas M. Shaw , Andrew H. Simon , Anthony K. Stamper
IPC分类号： H01L21/00
CPC分类号： B82Y30/00 , H01L21/0332 , H01L21/31111 , H01L21/31144 , H01L21/7682 , H01L21/76829 , H01L23/5222 , H01L23/53295 , H01L2924/0002 , Y10S438/947 , H01L2924/00
摘要： Method of manufacturing a structure which includes the steps of providing a structure having an insulator layer with at least one interconnect, forming a sub lithographic template mask over the insulator layer, and selectively etching the insulator layer through the sub lithographic template mask to form sub lithographic features spanning to a sidewall of the at least one interconnect.
摘要翻译： 一种制造结构的方法，包括以下步骤：提供具有至少一个互连的绝缘体层的结构，在绝缘体层上形成次级光刻模板掩模，以及通过次级光刻模板掩模选择性地蚀刻绝缘体层以形成次光刻 特征跨越至少一个互连的侧壁。
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公开(公告)号：US20090011526A1
公开(公告)日：2009-01-08
申请号：US12202511
申请日：2008-09-02
CPC分类号： C23C8/02 , C23C8/04 , C23C8/10 , C23C8/24 , C25D11/00 , C25D11/02 , C25D11/026 , H01C7/006 , H01C17/26 , H01L21/263 , H01L27/0802 , H01L29/8605 , Y10S257/904 , Y10S257/914
摘要： A method for increasing an electrical resistance of a resistor. A semiconductor structure that includes the resistor is placed in a chamber that includes a gas including nitrogen-containing molecules at an nitrogen concentration. A fraction F of an exterior surface of a surface layer of the resistor is exposed to the nitrogen-comprising molecules. A portion of the surface layer is heated at a heating temperature. A combination of the nitrogen concentration and the heating temperature is sufficient to nitridize the portion of the surface layer by reacting the portion with the nitrogen-containing molecules. Heating the portion of the surface layer includes directing a beam of radiation or particles into the portion of the surface layer heat the portion of the surface layer. The portion of the surface layer is nitridized by being reacted with the nitrogen-containing molecules such that an electrical resistance of the resistor is increased.
摘要翻译： 一种用于增加电阻器的电阻的方法。 包括电阻器的半导体结构被放置在包括含氮浓度的含氮分子的气体的室中。 电阻器的表面层的外表面的分数F暴露于含氮分子。 表面层的一部分在加热温度下被加热。 氮浓度和加热温度的组合足以通过使该部分与含氮分子反应来氮化表面层的部分。 加热表面层的部分包括将辐射束或颗粒引导到表面层的部分中加热表面层的该部分。 通过与含氮分子反应使表面层的部分氮化，使得电阻器的电阻增加。
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公开(公告)号：US07271699B2
公开(公告)日：2007-09-18
申请号：US10691881
申请日：2003-10-23
IPC分类号： H01C10/00
CPC分类号： H01L28/20 , H01C7/006 , H01C17/242 , Y10T29/49082 , Y10T29/49099 , Y10T29/49105
摘要： A resistor and a structure for changing an electrical resistance of a resistor. Initially, the resistor is provided, wherein the resistor has a length L and an electrical resistance R1. A portion of the resistor is exposed to a laser radiation, wherein the portion includes a fraction F of the length L of the resistor. After the resistor has been exposed to the laser radiation, the resistor has an electrical resistance R2, wherein R2 is unequal to R1.
摘要翻译： 用于改变电阻器的电阻的电阻器和结构。 最初，提供电阻器，其中电阻器具有长度L和电阻R 1。 电阻器的一部分暴露于激光辐射，其中该部分包括电阻器长度L的分数F. 在电阻器暴露于激光辐射之后，电阻器具有电阻R 2，其中R 2不等于R 1。
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48.发明授权Backside integration of RF filters for RF front end modules and design structure 有权用于RF前端模块的RF滤波器的背面集成和设计结构公开(公告)号：US09058455B2
公开(公告)日：2015-06-16
申请号：US13354705
申请日：2012-01-20
申请人： James W. Adkisson , Panglijen Candra , Thomas J. Dunbar , Jeffrey P. Gambino , Mark D. Jaffe , Anthony K. Stamper , Randy L. Wolf
发明人： James W. Adkisson , Panglijen Candra , Thomas J. Dunbar , Jeffrey P. Gambino , Mark D. Jaffe , Anthony K. Stamper , Randy L. Wolf
IPC分类号： G06F17/50 , H01L21/768 , H01L23/48 , H03H9/64 , H01L23/00 , H01L27/06 , H01L49/02 , H01L23/66 , H01L25/16
CPC分类号： H01L41/293 , G06F17/5063 , G06F17/5068 , H01L21/76898 , H01L23/481 , H01L23/66 , H01L24/03 , H01L24/05 , H01L24/24 , H01L25/16 , H01L27/0694 , H01L28/40 , H01L41/0815 , H01L41/25 , H01L2224/03009 , H01L2224/0401 , H01L2224/04105 , H01L2224/0557 , H01L2224/05572 , H01L2224/06181 , H01L2224/12105 , H01L2224/14181 , H01L2224/16145 , H01L2224/24145 , H01L2225/06548 , H03H9/64
摘要： A design structure for an integrated radio frequency (RF) filter on a backside of a semiconductor substrate includes: a device on a first side of a substrate; a radio frequency (RF) filter on a backside of the substrate; and at least one substrate conductor extending from the front side of the substrate to the backside of the substrate and electrically coupling the RF filter to the device.
摘要翻译： 在半导体衬底的背面上的集成射频（RF）滤波器的设计结构包括：在衬底的第一侧上的器件; 在衬底的背面上的射频（RF）滤波器; 以及至少一个衬底导体，其从所述衬底的前侧延伸到所述衬底的所述背面并将所述RF滤波器电耦合到所述器件。
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49.发明授权公开(公告)号：US08973250B2
公开(公告)日：2015-03-10
申请号：US13164323
申请日：2011-06-20
CPC分类号： B81B3/001 , B81B3/0021 , B81B3/0059 , B81B3/0072 , B81B7/0006 , B81B7/008 , B81B2201/016 , B81B2203/0163 , B81C1/00015 , B81C1/0015 , B81C1/00476 , G06F17/5045 , H01L41/094 , H01L41/1134 , H01L41/1138 , Y10T29/49002 , Y10T29/49005 , Y10T29/4908 , Y10T29/49121
摘要： Micro-Electro-Mechanical System (MEMS) structures, methods of manufacture and design structures are provided. The method of forming a MEMS structure includes forming a wiring layer on a substrate comprising actuator electrodes and a contact electrode. The method further includes forming a MEMS beam above the wiring layer. The method further includes forming at least one spring attached to at least one end of the MEMS beam. The method further includes forming an array of mini-bumps between the wiring layer and the MEMS beam.
摘要翻译： 提供微机电系统（MEMS）结构，制造方法和设计结构。 形成MEMS结构的方法包括在包括致动器电极和接触电极的基板上形成布线层。 该方法还包括在布线层上方形成MEMS光束。 该方法还包括形成至少一个连接到MEMS梁的至少一端的弹簧。 该方法还包括在布线层和MEMS光束之间形成微小凸块的阵列。
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50.发明授权Planar cavity MEMS and related structures, methods of manufacture and design structures 有权平面腔MEMS及相关结构，制造方法和设计结构公开(公告)号：US08865497B2
公开(公告)日：2014-10-21
申请号：US12973422
申请日：2010-12-20
申请人： George A. Dunbar, III , Zhong-Xiang He , Jeffrey C. Maling , William J. Murphy , Anthony K. Stamper
发明人： George A. Dunbar, III , Zhong-Xiang He , Jeffrey C. Maling , William J. Murphy , Anthony K. Stamper
CPC分类号： B81B3/0072 , B81B3/0021 , B81B2201/01 , B81B2201/014 , B81B2203/0118 , B81B2203/0315 , B81B2203/04 , B81C1/0015 , B81C1/00365 , B81C1/00476 , B81C1/00619 , B81C1/00626 , B81C1/00666 , B81C2201/0109 , B81C2201/013 , B81C2201/0167 , B81C2201/017 , B81C2203/0136 , B81C2203/0172 , G06F17/5068 , G06F17/5072 , H01H1/0036 , H01H57/00 , H01H59/0009 , H01H2057/006 , H01L41/1136 , H01L2924/0002 , Y10S438/937 , Y10T29/42 , Y10T29/435 , Y10T29/49002 , Y10T29/49105 , Y10T29/49121 , Y10T29/49126 , Y10T29/4913 , Y10T29/49155 , Y10T29/5313 , H01L2924/00
摘要： A method of forming at least one Micro-Electro-Mechanical System (MEMS) includes forming a lower wiring layer on a substrate. The method further includes forming a plurality of discrete wires from the lower wiring layer. The method further includes forming an electrode beam over the plurality of discrete wires. The at least one of the forming of the electrode beam and the plurality of discrete wires are formed with a layout which minimizes hillocks and triple points in subsequent silicon deposition.
摘要翻译： 形成至少一个微机电系统（MEMS）的方法包括在基板上形成下布线层。 该方法还包括从下布线层形成多条分立布线。 该方法还包括在多个离散导线上形成电极束。 形成电极束和多个离散导线中的至少一个形成有最小化后续硅沉积中的小丘和三点的布局。
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