Package on package structure
    56.
    发明授权
    Package on package structure 有权
    封装结构封装

    公开(公告)号:US08253228B2

    公开(公告)日:2012-08-28

    申请号:US13045103

    申请日:2011-03-10

    Abstract: A package on package structure includes a lower package and an upper package. The lower package includes a first semiconductor chip disposed in a chip region of an upper surface of a first substrate. The upper package includes a second semiconductor chip disposed on an upper surface of a second substrate, and a decoupling capacitor disposed in an outer region of a lower surface of the second substrate. The lower surface of the second substrate opposes the upper surface of the second substrate and faces the upper surface of the first substrate. The plane area of the second substrate is larger than the plane area of the first substrate. The outer region of the lower surface of the second substrate extends beyond a periphery of the first substrate.

    Abstract translation: 包装结构上的包装包括下包装和上包装。 下封装包括设置在第一基板的上表面的芯片区域中的第一半导体芯片。 上部封装包括设置在第二基板的上表面上的第二半导体芯片和设置在第二基板的下表面的外部区域中的去耦电容器。 第二基板的下表面与第二基板的上表面相对并且面向第一基板的上表面。 第二基板的平面面积大于第一基板的平面面积。 第二基板的下表面的外部区域延伸超出第一基板的周边。

    CIRCUIT BOARD INCLUDING EMBEDDED DECOUPLING CAPACITOR AND SEMICONDUCTOR PACKAGE THEREOF
    58.
    发明申请
    CIRCUIT BOARD INCLUDING EMBEDDED DECOUPLING CAPACITOR AND SEMICONDUCTOR PACKAGE THEREOF 审中-公开
    电路板包括嵌入式解压电容器及其半导体封装

    公开(公告)号:US20120080222A1

    公开(公告)日:2012-04-05

    申请号:US13247526

    申请日:2011-09-28

    Abstract: A circuit board including an embedded decoupling capacitor and a semiconductor package thereof are provided. The circuit board may include a core layer including an embedded decoupling capacitor, a first build-up layer at one side of the core layer, and a second build-up layer at the other side of the core layer, wherein the embedded decoupling capacitor includes a first electrode and a second electrode, the first build-up layer includes a first via contacting the first electrode, and the second build-up layer includes a second via contacting the first electrode.

    Abstract translation: 提供了包括嵌入式去耦电容器及其半导体封装的电路板。 电路板可以包括芯层,其包括嵌入的去耦电容器,在芯层的一侧的第一累积层和在芯层的另一侧的第二堆叠层,其中嵌入的去耦电容器包括 第一电极和第二电极,所述第一堆积层包括与所述第一电极接触的第一通孔,并且所述第二堆积层包括与所述第一电极接触的第二通路。

    Semiconductor package having test pads on top and bottom substrate surfaces and method of testing same
    59.
    发明授权
    Semiconductor package having test pads on top and bottom substrate surfaces and method of testing same 有权
    具有在顶部和底部衬底表面上的测试焊盘的半导体封装及其测试方法

    公开(公告)号:US08120024B2

    公开(公告)日:2012-02-21

    申请号:US11758176

    申请日:2007-06-05

    Abstract: A semiconductor package and testing method is disclosed. The package includes a substrate having top and bottom surfaces, a semiconductor chip mounted in a centrally located semiconductor chip mounting area of the substrate, and a plurality of test pads disposed on top and bottom surfaces of the substrate and comprising a first group of test pads configured on the top and bottom surfaces of the substrate and having a first height above the respective top and bottom surface of the substrate, and a second group of test pads disposed on the lower surface of the substrate and having a second height greater than the first, wherein each one of the second group of test pads includes a solder ball attached thereto.

    Abstract translation: 公开了半导体封装和测试方法。 封装包括具有顶表面和底表面的衬底,安装在衬底的位于中心的半导体芯片安装区域中的半导体芯片以及设置在衬底的顶表面和底表面上的多个测试焊盘,并且包括第一组测试焊盘 配置在衬底的顶表面和底表面上并且具有在衬底的相应顶部和底部表面上方的第一高度,以及设置在衬底的下表面上并具有大于第一衬底的第二高度的第二组测试焊盘 其中第二组测试垫中的每一个包括附接到其上的焊球。

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