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公开(公告)号:US10026467B2
公开(公告)日:2018-07-17
申请号:US15337323
申请日:2016-10-28
申请人: Invensas Corporation
发明人: Zhuowen Sun , Yong Chen , Kyong-Mo Bang
IPC分类号: G11C5/06 , G11C11/408 , G11C8/18 , H01L25/065 , H01L25/18 , H01L23/64 , H01L23/31 , G11C11/409 , H01L23/02
CPC分类号: G11C11/4087 , G11C5/063 , G11C8/18 , G11C11/409 , H01L23/02 , H01L23/3128 , H01L23/64 , H01L25/0652 , H01L25/0657 , H01L25/18 , H01L2224/0401 , H01L2224/04042 , H01L2224/05548 , H01L2224/06135 , H01L2224/06136 , H01L2224/16227 , H01L2224/32145 , H01L2224/32225 , H01L2224/48227 , H01L2224/4824 , H01L2224/73204 , H01L2224/73215 , H01L2224/73265 , H01L2225/0651 , H01L2225/06572 , H01L2924/15311 , H01L2924/00012 , H01L2924/00
摘要: A microelectronic assembly can include an address bus comprising a plurality of signal conductors each passing sequentially through first, second, third, and fourth connection regions, and first and second microelectronic packages. The first microelectronic package can include first and second microelectronic elements, and the second microelectronic package can include third and fourth microelectronic elements. Each microelectronic element can be electrically coupled to the address bus via the respective connection region. An electrical characteristic between the first and second connection regions can be within a same tolerance of the electrical characteristic between the second and third connection regions.
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公开(公告)号:US09905507B2
公开(公告)日:2018-02-27
申请号:US15181872
申请日:2016-06-14
申请人: Invensas Corporation
发明人: Hong Shen , Zhuowen Sun , Charles G. Woychik , Arkalgud Sitaram
IPC分类号: H01L21/768 , H01L23/498 , H05K1/11 , H01L25/00 , H05K1/18 , H05K1/02 , H05K1/14 , H01L23/538 , H01L25/065 , H01L23/00 , H01L21/683 , H01L25/03 , H01L21/48 , H01L23/31 , H01L21/56
CPC分类号: H01L23/49833 , H01L21/4853 , H01L21/486 , H01L21/56 , H01L21/561 , H01L21/6835 , H01L21/76898 , H01L23/3121 , H01L23/3128 , H01L23/498 , H01L23/49827 , H01L23/49838 , H01L23/538 , H01L23/5381 , H01L23/5383 , H01L23/5385 , H01L23/5389 , H01L23/562 , H01L24/13 , H01L24/16 , H01L24/17 , H01L24/32 , H01L24/48 , H01L24/73 , H01L24/81 , H01L24/92 , H01L24/97 , H01L25/03 , H01L25/0652 , H01L25/0655 , H01L25/50 , H01L2221/68327 , H01L2224/0401 , H01L2224/04042 , H01L2224/131 , H01L2224/16225 , H01L2224/16227 , H01L2224/32145 , H01L2224/48227 , H01L2224/73204 , H01L2224/73253 , H01L2224/81203 , H01L2224/81801 , H01L2224/92125 , H01L2224/97 , H01L2225/0651 , H01L2225/06517 , H01L2225/06562 , H01L2225/06589 , H01L2924/00014 , H01L2924/14 , H01L2924/15174 , H01L2924/15192 , H01L2924/15311 , H01L2924/157 , H01L2924/1615 , H01L2924/16153 , H01L2924/16251 , H01L2924/181 , H05K1/0271 , H05K1/111 , H05K1/141 , H05K1/181 , H01L2924/00012 , H01L2224/81 , H01L2224/85 , H01L2924/014 , H01L2224/83 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
摘要: A combined interposer (120) includes multiple constituent interposers (120.i), each with its own substrate (120.iS) and with a circuit layer (e.g. redistribution layer) on top and/or bottom of the substrate. The top circuit layers can be part of a common circuit layer (120R.T) which can interconnect different interposers. Likewise, the bottom circuit layers can be part of a common circuit layer (120R.B). The constituent interposer substrates (120.iS) are initially part of a common wafer, and the common top circuit layer is fabricated before separation of the constituent interposer substrates from the wafer. Use of separated substrates reduces stress compared to use of a single large substrate. Other features are also provided.
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公开(公告)号:US20180040589A1
公开(公告)日:2018-02-08
申请号:US15227361
申请日:2016-08-03
申请人: Invensas Corporation
发明人: Shaowu Huang , Zhuowen Sun , Javier A. Delacruz , Belgacem Haba
IPC分类号: H01L25/065 , H01L23/538 , G11C5/06 , H01L25/10
CPC分类号: H01L25/0657 , G11C5/025 , G11C5/06 , G11C5/063 , H01L23/5386 , H01L25/105 , H01L2225/06506 , H01L2225/0651 , H01L2225/06551 , H01L2225/06562 , H01L2225/1035 , H01L2225/1064
摘要: A microelectronic assembly includes a circuit panel having a plurality of first contacts at a major surface thereof. One or more microelectronic packages comprise a plurality of microelectronic elements, the one or more packages having terminals electrically coupled with the first contacts, wherein each package includes at least one microelectronic element having a face, and element contacts at the face which are electrically coupled with the plurality of terminals. A repeater (redriver or retimer) assembly is configured to condition one or more signals received from a memory channel control element including one or more signals selected from: an address signal, a command signal, or a data signal, such that the plurality of the microelectronic elements are coupled to the at least one repeater assembly to receive the conditioned signals.
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公开(公告)号:US20170256492A1
公开(公告)日:2017-09-07
申请号:US15601406
申请日:2017-05-22
申请人: Invensas Corporation
发明人: Cyprian Emeka Uzoh , Zhuowen Sun
IPC分类号: H01L23/522 , H01L23/498 , H01L23/14 , H01L23/48 , H01L21/48 , H01L21/768
CPC分类号: H01L23/5226 , H01L21/486 , H01L21/76802 , H01L21/7682 , H01L23/147 , H01L23/481 , H01L23/49827 , H01L2924/0002 , H01L2924/00
摘要: An interconnection component includes a semiconductor material layer having a first surface and a second surface opposite the first surface and spaced apart in a first direction. At least two metalized vias extend through the semiconductor material layer. A first pair of the at least two metalized vias are spaced apart from each other in a second direction orthogonal to the first direction. A first insulating via in the semiconductor layer extends from the first surface toward the second surface. The insulating via is positioned such that a geometric center of the insulating via is between two planes that are orthogonal to the second direction and that pass through each of the first pair of the at least two metalized vias. A dielectric material at least partially fills the first insulating via or at least partially encloses a void in the insulating via.
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公开(公告)号:US20170212848A1
公开(公告)日:2017-07-27
申请号:US15481288
申请日:2017-04-06
申请人: Invensas Corporation
发明人: Zhuowen Sun , Yong Chen
CPC分类号: G06F13/1673 , G06F12/00 , G06F12/0623 , G06F13/1694 , G11C5/04 , G11C5/06 , G11C8/06 , G11C8/12 , H01L2224/4824 , H01L2924/15311
摘要: A method for reducing load in a memory module. In such a method, a plurality of memory chips are coupled to a circuit platform. Each memory chip of the plurality of memory chips each has a plurality of memory dies. At least one controller is coupled to the circuit platform and further coupled to the plurality of memory chips for communication with the plurality of memory dies thereof. The at least one controller is for receiving chip select signals to provide a plurality of rank select signals in excess of the chip select signals. The plurality of memory dies are coupled with wire bonds within the plurality of memory chips for a reduced load for coupling the circuit platform for communicating via a memory channel. The load is sufficiently reduced for having at least two instances of the memory module share the memory channel.
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公开(公告)号:US20170194281A1
公开(公告)日:2017-07-06
申请号:US14997774
申请日:2016-01-18
申请人: Invensas Corporation
IPC分类号: H01L23/00 , H01L23/498 , H01L25/065 , H01L23/31 , H01L25/16
CPC分类号: H01L24/49 , H01L23/3121 , H01L23/49838 , H01L23/552 , H01L24/17 , H01L24/48 , H01L24/97 , H01L25/0652 , H01L25/0655 , H01L25/0657 , H01L25/105 , H01L25/16 , H01L25/50 , H01L2224/04042 , H01L2224/11334 , H01L2224/16145 , H01L2224/16227 , H01L2224/17051 , H01L2224/32145 , H01L2224/32225 , H01L2224/48108 , H01L2224/48137 , H01L2224/48145 , H01L2224/48227 , H01L2224/49109 , H01L2224/73204 , H01L2224/73253 , H01L2224/73257 , H01L2224/73265 , H01L2225/06506 , H01L2225/0651 , H01L2225/06513 , H01L2225/06517 , H01L2225/06562 , H01L2225/1023 , H01L2924/00014 , H01L2924/14 , H01L2924/15192 , H01L2924/15311 , H01L2924/1532 , H01L2924/19041 , H01L2924/19042 , H01L2924/19043 , H01L2924/19105 , H01L2924/19107 , H01L2924/3025 , H05K1/0284 , H01L2224/45099 , H01L2924/00012 , H01L2924/00
摘要: In a vertically integrated microelectronic package, a first microelectronic device is coupled to an upper surface of a circuit platform in a wire bond-only surface area thereof. Wire bond wires are coupled to and extends away from an upper surface of the first microelectronic device. A second microelectronic device in a face-down orientation is coupled to upper ends of the wire bond wires in a surface mount-only area. The second microelectronic device is located above and at least partially overlaps the first microelectronic device. A protective layer is disposed over the circuit platform and the first microelectronic device. An upper surface of the protective layer has the surface mount-only area. The upper surface of the protective layer has the second microelectronic device disposed thereon in the face-down orientation in the surface mount-only area for coupling to the upper ends of the first wire bond wires.
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公开(公告)号:US09666521B2
公开(公告)日:2017-05-30
申请号:US13962349
申请日:2013-08-08
申请人: Invensas Corporation
发明人: Cyprian Emeka Uzoh , Zhuowen Sun
IPC分类号: H01L23/48 , H01L23/52 , H01L29/40 , H01L23/522 , H01L21/768 , H01L23/14 , H01L23/498 , H01L21/48
CPC分类号: H01L23/5226 , H01L21/486 , H01L21/76802 , H01L21/7682 , H01L23/147 , H01L23/481 , H01L23/49827 , H01L2924/0002 , H01L2924/00
摘要: An interconnection component includes a semiconductor material layer having a first surface and a second surface opposite the first surface and spaced apart in a first direction. At least two metalized vias extend through the semiconductor material layer. A first pair of the at least two metalized vias are spaced apart from each other in a second direction orthogonal to the first direction. A first insulating via in the semiconductor layer extends from the first surface toward the second surface. The insulating via is positioned such that a geometric center of the insulating via is between two planes that are orthogonal to the second direction and that pass through each of the first pair of the at least two metalized vias. A dielectric material at least partially fills the first insulating via or at least partially encloses a void in the insulating via.
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公开(公告)号:US09583417B2
公开(公告)日:2017-02-28
申请号:US14206756
申请日:2014-03-12
申请人: Invensas Corporation
发明人: Zhuowen Sun , Cyprian Emeka Uzoh , Yong Chen
IPC分类号: H01L23/48 , H01L23/532 , H01L23/498
CPC分类号: H01L23/49827 , H01L21/486 , H01L23/3675 , H01L23/481 , H01L23/53238 , H01L23/53295 , H01L23/5384 , H01L24/73 , H01L25/0657 , H01L2224/02372 , H01L2224/11 , H01L2224/16145 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/73204 , H01L2224/73253 , H01L2225/06513 , H01L2225/06541 , H01L2924/15311 , H01L2924/16152 , H01L2924/00
摘要: An apparatus relating generally to a substrate is disclosed. In such an apparatus, the substrate has a first surface and a second surface opposite the first surface. The first surface and the second surface define a thickness of the substrate. A via structure extends from the first surface of the substrate to the second surface of the substrate. The via structure has a first terminal at or proximate to the first surface and a second terminal at or proximate to the second surface provided by a conductive member of the via structure extending from the first terminal to the second terminal. A barrier layer of the via structure is disposed between at least a portion of the conductive member and the substrate. The barrier layer has a conductivity configured to offset a capacitance between the conductive member and the substrate when a signal is passed through the conductive member of the via structure.
摘要翻译: 公开了一般涉及基板的装置。 在这种装置中,衬底具有与第一表面相对的第一表面和第二表面。 第一表面和第二表面限定基底的厚度。 通孔结构从衬底的第一表面延伸到衬底的第二表面。 通孔结构具有位于第一表面处或靠近第一表面的第一端子和位于第二表面处或靠近第二表面处的第二端子,该第二端子由从第一端子延伸到第二端子的通孔结构的导电构件提供。 通孔结构的阻挡层设置在导电部件的至少一部分和基板之间。 阻挡层具有被配置为当信号通过通孔结构的导电构件时抵消导电构件和衬底之间的电容的导电性。
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公开(公告)号:US09484080B1
公开(公告)日:2016-11-01
申请号:US14935705
申请日:2015-11-09
申请人: Invensas Corporation
发明人: Zhuowen Sun , Yong Chen , Kyong-Mo Bang
IPC分类号: G11C5/06 , G11C11/408 , G11C8/18 , G11C11/409 , H01L25/065 , H01L25/18 , H01L23/02 , H01L23/64
CPC分类号: G11C11/4087 , G11C5/063 , G11C8/18 , G11C11/409 , H01L23/02 , H01L23/3128 , H01L23/64 , H01L25/0652 , H01L25/18 , H01L2224/0401 , H01L2224/04042 , H01L2224/05548 , H01L2224/06135 , H01L2224/06136 , H01L2224/16227 , H01L2224/32145 , H01L2224/32225 , H01L2224/48227 , H01L2224/4824 , H01L2224/73204 , H01L2224/73215 , H01L2224/73265 , H01L2924/15311 , H01L2924/00012 , H01L2924/00
摘要: A microelectronic assembly can include an address bus comprising a plurality of signal conductors each passing sequentially through first, second, third, and fourth connection regions, and first and second microelectronic packages. The first microelectronic package can include first and second microelectronic elements, and the second microelectronic package can include third and fourth microelectronic elements. Each microelectronic element can be electrically coupled to the address bus via the respective connection region. An electrical characteristic between the first and second connection regions can be within a same tolerance of the electrical characteristic between the second and third connection regions.
摘要翻译: 微电子组件可以包括地址总线,其包括多个信号导体,每个信号导体顺序地通过第一,第二,第三和第四连接区域,以及第一和第二微电子封装。 第一微电子封装可以包括第一和第二微电子元件,并且第二微电子封装可以包括第三和第四微电子元件。 每个微电子元件可以经由相应的连接区域电耦合到地址总线。 第一和第二连接区域之间的电特性可以在第二和第三连接区域之间的电特性的相同公差内。
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公开(公告)号:US20160293534A1
公开(公告)日:2016-10-06
申请号:US15181872
申请日:2016-06-14
申请人: Invensas Corporation
发明人: Hong SHEN , Zhuowen Sun , Charles G. Woychik , Arkalgud Sitaram
IPC分类号: H01L23/498 , H01L21/48 , H01L21/683 , H01L23/00 , H01L23/31 , H01L21/56 , H01L25/065 , H01L25/00
CPC分类号: H01L23/49833 , H01L21/4853 , H01L21/486 , H01L21/56 , H01L21/561 , H01L21/6835 , H01L21/76898 , H01L23/3121 , H01L23/3128 , H01L23/498 , H01L23/49827 , H01L23/49838 , H01L23/538 , H01L23/5381 , H01L23/5383 , H01L23/5385 , H01L23/5389 , H01L23/562 , H01L24/13 , H01L24/16 , H01L24/17 , H01L24/32 , H01L24/48 , H01L24/73 , H01L24/81 , H01L24/92 , H01L24/97 , H01L25/03 , H01L25/0652 , H01L25/0655 , H01L25/50 , H01L2221/68327 , H01L2224/0401 , H01L2224/04042 , H01L2224/131 , H01L2224/16225 , H01L2224/16227 , H01L2224/32145 , H01L2224/48227 , H01L2224/73204 , H01L2224/73253 , H01L2224/81203 , H01L2224/81801 , H01L2224/92125 , H01L2224/97 , H01L2225/0651 , H01L2225/06517 , H01L2225/06562 , H01L2225/06589 , H01L2924/00014 , H01L2924/14 , H01L2924/15174 , H01L2924/15192 , H01L2924/15311 , H01L2924/157 , H01L2924/1615 , H01L2924/16153 , H01L2924/16251 , H01L2924/181 , H05K1/0271 , H05K1/111 , H05K1/141 , H05K1/181 , H01L2924/00012 , H01L2224/81 , H01L2224/85 , H01L2924/014 , H01L2224/83 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
摘要: A combined interposer (120) includes multiple constituent interposers (120.i), each with its own substrate (120.iS) and with a circuit layer (e.g. redistribution layer) on top and/or bottom of the substrate. The top circuit layers can be part of a common circuit layer (120R.T) which can interconnect different interposers. Likewise, the bottom circuit layers can be part of a common circuit layer (120R.B). The constituent interposer substrates (120.iS) are initially part of a common wafer, and the common top circuit layer is fabricated before separation of the constituent interposer substrates from the wafer. Use of separated substrates reduces stress compared to use of a single large substrate. Other features are also provided.
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