Package structure having micro-electromechanical element
    1.
    发明授权
    Package structure having micro-electromechanical element 有权
    具有微机电元件的封装结构

    公开(公告)号:US08564115B2

    公开(公告)日:2013-10-22

    申请号:US13492220

    申请日:2012-06-08

    IPC分类号: H01L23/04

    摘要: Proposed is a package structure having a micro-electromechanical (MEMS) element, including a chip having a plurality of electrical connecting pads and a MEMS element formed thereon; a lid disposed on the chip for covering the MEMS element; a stud bump disposed on each of the electrical connecting pads; an encapsulant formed on the chip with part of the stud bumps being exposed from the encapsulant; and a metal conductive layer formed on the encapsulant and connected to the stud bumps. The invention is characterized by completing the packaging process on the wafer directly to enable thinner and cheaper package structures to be fabricated within less time. This invention further provides a method for fabricating the package structure as described above.

    摘要翻译: 提出具有微机电(MEMS)元件的封装结构,其包括具有多个电连接焊盘和形成在其上的MEMS元件的芯片; 设置在所述芯片上用于覆盖所述MEMS元件的盖; 设置在每个电连接焊盘上的螺柱凸块; 形成在芯片上的密封剂,其中一部分柱状凸块从密封剂暴露出来; 以及金属导电层,形成在密封剂上并连接到凸块上。 本发明的特征在于直接完成晶片上的封装工艺,以便在更短的时间内制造更薄和更便宜的封装结构。 本发明还提供如上所述的用于制造封装结构的方法。

    METHOD FOR MANUFACTURING HEAT-DISSIPATING SEMICONDUCTOR PACKAGE STRUCTURE
    6.
    发明申请
    METHOD FOR MANUFACTURING HEAT-DISSIPATING SEMICONDUCTOR PACKAGE STRUCTURE 审中-公开
    制造散热半导体封装结构的方法

    公开(公告)号:US20110287588A1

    公开(公告)日:2011-11-24

    申请号:US13195639

    申请日:2011-08-01

    IPC分类号: H01L21/56

    摘要: A heat-dissipating semiconductor package structure and a method for manufacturing the same is disclosed. The method includes: disposing on and electrically connecting to a chip carrier at least a semiconductor chip and a package unit; disposing on the top surface of the package unit a heat-dissipating element having a flat portion and a supporting portion via the flat portion; receiving the package unit and semiconductor chip in a receiving space formed by the flat portion and supporting portion of the heat-dissipating element; and forming on the chip carrier encapsulant for encapsulating the package unit, semiconductor chip, and heat-dissipating element. The heat-dissipating element dissipates heat generated by the package unit, provides EMI shielding, prevents delamination between the package unit and the encapsulant, decreases thermal resistance, and prevents cracking.

    摘要翻译: 公开了一种散热半导体封装结构及其制造方法。 该方法包括:在至少半导体芯片和封装单元上布置并电连接到芯片载体; 在所述封装单元的顶表面上设置有经由所述平坦部分具有平坦部分和支撑部分的散热元件; 在由散热元件的平坦部分和支撑部分形成的接收空间中接收封装单元和半导体芯片; 以及在芯片载体密封剂上形成以封装封装单元,半导体芯片和散热元件。 散热元件消散封装单元产生的热量,提供EMI屏蔽,防止封装单元与密封剂之间的分层,降低热阻,防止开裂。

    FABRICATION METHOD OF SEMICONDUCTOR PACKAGE STRUCTURE
    7.
    发明申请
    FABRICATION METHOD OF SEMICONDUCTOR PACKAGE STRUCTURE 有权
    半导体封装结构的制造方法

    公开(公告)号:US20110159643A1

    公开(公告)日:2011-06-30

    申请号:US12770059

    申请日:2010-04-29

    IPC分类号: H01L21/60 H01L21/56

    摘要: A fabrication method of a semiconductor package structure includes: patterning a metal plate having first and second surfaces; forming a dielectric layer on the metal plate; forming a metal layer on the first surface and the dielectric layer; forming metal pads on the second surface, the metal layer having a die pad and traces each having a bond pad; mounting a semiconductor chip on the die pad, followed by connecting electrically the semiconductor chip to the bond pads through bonding wires; forming an encapsulant to cover the semiconductor chip and the metal layer; removing portions of the metal plate not covered by the metal pads so as to form metal pillars; and performing a singulation process. The fabrication method is characterized by disposing traces with bond pads close to the die pad to shorten the bonding wires and forming metal pillars protruding from the dielectric layer to avoid solder bridging.

    摘要翻译: 半导体封装结构的制造方法包括:图案化具有第一表面和第二表面的金属板; 在所述金属板上形成电介质层; 在所述第一表面和所述电介质层上形成金属层; 在所述第二表面上形成金属焊盘,所述金属层具有管芯焊盘并且各自具有接合焊盘; 将半导体芯片安装在芯片焊盘上,然后通过接合线将半导体芯片电连接到焊盘; 形成密封剂以覆盖半导体芯片和金属层; 去除未被金属垫覆盖的金属板的部分,以形成金属柱; 并执行单独处理。 该制造方法的特征在于,将具有接合焊盘的迹线设置在芯片焊盘附近以缩短接合线并形成从电介质层突出的金属柱,以避免焊料桥接。