公开(公告)号：US20240312853A1

公开(公告)日：2024-09-19

申请号：US18121331

申请日：2023-03-14

申请人： Intel Corporation

发明人： Sashi S. KANDANUR ,  Srinivas V. PIETAMBARAM ,  Darko GRUJICIC ,  Brandon C. MARIN ,  Suddhasattwa NAD ,  Benjamin DUONG ,  Gang DUAN ,  Mohammad Mamunur RAHMAN ,  Numair AHMED

IPC分类号： H01L23/15 ,  H01L23/498

CPC分类号： H01L23/15 ,  H01L23/49816 ,  H01L23/49822 ,  H01L23/49827 ,  H01L23/49838

摘要： Embodiments herein relate to systems, apparatuses, techniques and/or processes for creating a substrate out of a plurality of layers of glass, where the substrate includes one or more vias that extend through each of the plurality of layers of glass. In embodiments, a high aspect ratio via may be constructed through the substrate by electrically coupling the individual vias. Other embodiments may be described and/or claimed.

公开(公告)号：US20240312819A1

公开(公告)日：2024-09-19

申请号：US18185427

申请日：2023-03-17

申请人： Intel Corporation

发明人： Hong Seung YEON ,  Mariano PHIELIPP ,  Yi LI ,  Minglu LIU ,  Robin McREE ,  Yosuke KANAOKA ,  Gang DUAN

IPC分类号： H01L21/68 ,  H01L21/67

CPC分类号： H01L21/68 ,  H01L21/67259

摘要： A method for real-time offset adjustment of a semiconductor die placement comprising: obtaining or receiving operational parameters of a die mounting tool in real-time, wherein the die mounting tool is configured for placing the semiconductor die on a panel; predicting an offset adjustment of the semiconductor die placement based on the operational parameters; and determining semiconductor die placement coordinates based on an original die placement and the offset adjustment.

公开(公告)号：US20240217216A1

公开(公告)日：2024-07-04

申请号：US18091028

申请日：2022-12-29

申请人： INTEL CORPORATION

发明人： Kristof DARMAWIKARTA ,  Tarek A. IBRAHIM ,  Srinivas V. PIETAMBARAM ,  Dilan SENEVIRATNE ,  Jieying KONG ,  Thomas HEATON ,  Whitney BRYKS ,  Vinith BEJUGAM ,  Junxin WANG ,  Gang DUAN

IPC分类号： B32B17/10 ,  B32B7/12 ,  B32B17/02 ,  B65D85/48

CPC分类号： B32B17/10642 ,  B32B7/12 ,  B32B17/02 ,  B65D85/48 ,  B32B2260/04 ,  B32B2307/202 ,  B32B2457/00

摘要： Embodiments disclosed herein include package substrates with glass stiffeners. In an embodiment, the package substrate comprises a first layer, where the first layer comprises glass. In an embodiment, the package substrate comprises a second layer over the first layer, where the second layer is a buildup film. In an embodiment, the package substrate further comprises an electrically conductive interconnect structure through the first layer and the second layer.

公开(公告)号：US20240213156A1

公开(公告)日：2024-06-27

申请号：US18089491

申请日：2022-12-27

申请人： Intel Corporation

发明人： Kristof DARMAWIKARTA ,  Srinivas V. PIETAMBARAM ,  Gang DUAN ,  Tarek A. IBRAHIM ,  Aaron GARELICK ,  Srikant NEKKANTY ,  Ravindranath V. MAHAJAN ,  Rahul N. MANEPALLI

IPC分类号： H01L23/532 ,  H01L23/00 ,  H01L23/15 ,  H01L23/498 ,  H01L23/522 ,  H01L23/535 ,  H01L23/64 ,  H01L25/065

CPC分类号： H01L23/53209 ,  H01L23/15 ,  H01L23/49816 ,  H01L23/5226 ,  H01L23/535 ,  H01L23/642 ,  H01L24/05 ,  H01L24/29 ,  H01L25/0655 ,  H01L2224/04026 ,  H01L2224/05567 ,  H01L2224/29007 ,  H01L2224/29021 ,  H01L2224/29101 ,  H01L2924/1436 ,  H01L2924/15321

摘要： Embodiments disclosed herein include package substrates. In an embodiment, the package substrate comprises a core and buildup layers over the core. In an embodiment, a pad is provided on the buildup layers. In an embodiment, a liquid metal well is over the pad.

公开(公告)号：US20240177918A1

公开(公告)日：2024-05-30

申请号：US18071237

申请日：2022-11-29

申请人： Intel Corporation

发明人： Suddhasattwa NAD ,  Brandon C. MARIN ,  Jeremy D. ECTON ,  Srinivas V. PIETAMBARAM ,  Gang DUAN ,  Mohammad Mamunur RAHMAN

IPC分类号： H01F27/28 ,  H01F27/30 ,  H01F41/04 ,  H01L23/08 ,  H01L23/31

CPC分类号： H01F27/2804 ,  H01F27/306 ,  H01F41/041 ,  H01L23/08 ,  H01L23/3128 ,  H01F2027/2809 ,  H01F2027/2819

摘要： Embodiments disclosed herein include a package core. In an embodiment, the package core comprises a core substrate, a first opening through the core substrate, a second opening through the core substrate and adjacent to the first opening, and a first structure around the core substrate between the first opening and the second opening. In an embodiment, the first structure is electrically conductive. The package core may further comprise a second structure around the core substrate outside of the first opening and the second opening, where the second structure is electrically conductive.

公开(公告)号：US20240063069A1

公开(公告)日：2024-02-22

申请号：US17892930

申请日：2022-08-22

申请人： Intel Corporation

发明人： Brandon C. MARIN ,  Rahul N. MANEPALLI ,  Ravindranath V. MAHAJAN ,  Srinivas V. PIETAMBARAM ,  Jeremy D. ECTON ,  Gang DUAN ,  Suddhasattwa NAD

IPC分类号： H01L23/13 ,  H01L23/498 ,  H01L23/15

CPC分类号： H01L23/13 ,  H01L23/49816 ,  H01L23/49822 ,  H01L23/49833 ,  H01L23/49838 ,  H01L23/15 ,  H01L24/16

摘要： Embodiments disclosed herein include package substrates with glass cores. In an embodiment, a core comprises a substrate with a first surface and a second surface opposite from the first surface. In an embodiment, the substrate comprises glass, In an embodiment, through glass vias (TGVs) pass through the substrate, and notches are formed into the first surface and the second surface of the substrate.

公开(公告)号：US20240006283A1

公开(公告)日：2024-01-04

申请号：US17853487

申请日：2022-06-29

申请人： Intel Corporation

发明人： Suddhasattawa NAD ,  Rahul N. MANEPALLI ,  Gang DUAN ,  Srinivas V. PIETAMBARAM ,  Yi YANG ,  Marcel WALL ,  Darko GRUJICIC ,  Haobo CHEN ,  Aaron GARELICK

IPC分类号： H01L23/498 ,  H01L21/48

CPC分类号： H01L23/49822 ,  H01L23/49866 ,  H01L21/4857 ,  H01L2224/16225 ,  H01L24/16

摘要： Embodiments disclosed herein include package substrates and methods of forming such substrates. In an embodiment, a package substrate comprises a core, a first layer over the core, where the first layer comprises a metal, and a second layer over the first layer, where the second layer comprises an electrical insulator. In an embodiment, the package substrate further comprises a third layer over the second layer, where the third layer comprises a dielectric material, and where an edge of the core extends past edges of the first layer, the second layer, and the third layer.

公开(公告)号：US20220310518A1

公开(公告)日：2022-09-29

申请号：US17213147

申请日：2021-03-25

申请人： Intel Corporation

发明人： Haobo CHEN ,  Xiaoying GUO ,  Hongxia FENG ,  Kristof DARMAWIKARTA ,  Bai NIE ,  Tarek A. IBRAHIM ,  Gang DUAN ,  Jeremy D. ECTON ,  Sheng C. LI ,  Leonel ARANA

IPC分类号： H01L23/538 ,  H01L23/498 ,  H01L23/00 ,  H01L21/48

摘要： Embodiments disclosed herein include a multi-die packages with an embedded bridge and a thinned surface. In an example, a multi-die interconnect structure includes a package substrate having a cavity. A bridge die is in the cavity of the package substrate, the bridge die including silicon. A dielectric material is over the package substrate, over the bridge die, and in the cavity. A plurality of conductive bond pads is on the dielectric material. The multi-die interconnect structure further includes a plurality of conductive pillars, individual ones of the plurality of conductive pillars on a corresponding one of the plurality of conductive bond pads. A solder resist material is on the dielectric material, on exposed portions of the plurality of conductive bond pads, and laterally surrounding the plurality of conductive pillars. The plurality of conductive pillars has a top surface above a top surface of the solder resist material.

公开(公告)号：US20220155539A1

公开(公告)日：2022-05-19

申请号：US16953146

申请日：2020-11-19

申请人： Intel Corporation

发明人： Srinivas V. PIETAMBARAM ,  Brandon C. MARIN ,  Sameer PAITAL ,  Sai VADLAMANI ,  Rahul N. MANEPALLI ,  Xiaoqian LI ,  Suresh V. POTHUKUCHI ,  Sujit SHARAN ,  Arnab SARKAR ,  Omkar KARHADE ,  Nitin DESHPANDE ,  Divya PRATAP ,  Jeremy ECTON ,  Debendra MALLIK ,  Ravindranath V. MAHAJAN ,  Zhichao ZHANG ,  Kemal AYGÜN ,  Bai NIE ,  Kristof DARMAWIKARTA ,  James E. JAUSSI ,  Jason M. GAMBA ,  Bryan K. CASPER ,  Gang DUAN ,  Rajesh INTI ,  Mozhgan MANSURI ,  Susheel JADHAV ,  Kenneth BROWN ,  Ankar AGRAWAL ,  Priyanka DOBRIYAL

IPC分类号： G02B6/42

摘要： Embodiments disclosed herein include optical packages. In an embodiment, an optical package comprises a package substrate, and a photonics die coupled to the package substrate. In an embodiment, a compute die is coupled to the package substrate, where the photonics die is communicatively coupled to the compute die by a bridge in the package substrate. In an embodiment, the optical package further comprises an optical waveguide embedded in the package substrate. In an embodiment, a first end of the optical waveguide is below the photonics die, and a second end of the optical waveguide is substantially coplanar with an edge of the package substrate.

公开(公告)号：US20200343175A1

公开(公告)日：2020-10-29

申请号：US16392171

申请日：2019-04-23

申请人： Intel Corporation

发明人： Zhiguo QIAN ,  Gang DUAN ,  Kemal AYGÜN ,  Jieying KONG

IPC分类号： H01L23/498 ,  H01L21/48 ,  H01L23/66

摘要： Embodiments include package substrates and methods of forming the package substrates. A package substrate includes a first conductive layer in a first dielectric, a second dielectric over the first dielectric, and a second conductive layer in the second dielectric, where the second conductive layer includes first and second traces. The package substrate also includes a third conductive layer over the second dielectric, and a high dielectric constant (Dk) and low DK regions in the first and second dielectrics, where the high Dk region surrounds the first traces, and where the low Dk region surrounds the second traces. The high Dk region may be between the first and third conductive layers. The low Dk region may be between the first and third conductive layers. The package substrate may include a dielectric region in the first and second dielectrics, where the dielectric region separates the high Dk and low Dk regions.