PROBES FORMED FROM SEMICONDUCTOR REGION VIAS
    1.
    发明申请
    PROBES FORMED FROM SEMICONDUCTOR REGION VIAS 有权
    从半导体地区VIAS成立的研究

    公开(公告)号:US20120038379A1

    公开(公告)日:2012-02-16

    申请号:US12854697

    申请日:2010-08-11

    IPC分类号: G01R31/20

    摘要: Embodiments of the invention describe forming a set of probes using semiconductor regions each including a plurality of vias. A first set of probe segments may be formed from a first set of vias on a first semiconductor region. A second set of probe segments may be formed from a second set of vias on a second semiconductor region and bonded to the first set of probe segments. At least one spring comprising a dielectric material may be formed to couple the first set of probe segments, while a set of metal tips disposed on the second set of probe segments.

    摘要翻译: 本发明的实施例描述了使用包括多个通孔的半导体区形成一组探针。 第一组探针段可以由第一半导体区上的第一组通孔形成。 第二组探针段可以由第二半导体区上的第二组通孔形成并结合到第一组探针段上。 包括电介质材料的至少一个弹簧可以形成为耦合第一组探针段,而一组设置在第二组探针段上的金属尖端。

    Probes formed from semiconductor region vias
    2.
    发明授权
    Probes formed from semiconductor region vias 有权
    探针由半导体区形成

    公开(公告)号:US08513966B2

    公开(公告)日:2013-08-20

    申请号:US12854697

    申请日:2010-08-11

    IPC分类号: G01R31/20

    摘要: Embodiments of the invention describe forming a set of probes using semiconductor regions each including a plurality of vias. A first set of probe segments may be formed from a first set of vias on a first semiconductor region. A second set of probe segments may be formed from a second set of vias on a second semiconductor region and bonded to the first set of probe segments. At least one spring comprising a dielectric material may be formed to couple the first set of probe segments, while a set of metal tips disposed on the second set of probe segments.

    摘要翻译: 本发明的实施例描述了使用包括多个通孔的半导体区形成一组探针。 第一组探针段可以由第一半导体区上的第一组通孔形成。 第二组探针段可以由第二半导体区上的第二组通孔形成并结合到第一组探针段上。 包括电介质材料的至少一个弹簧可以形成为耦合第一组探针段,而一组设置在第二组探针段上的金属尖端。

    Inductive inertial sensor architecture and fabrication in packaging build-up layers
    6.
    发明授权
    Inductive inertial sensor architecture and fabrication in packaging build-up layers 有权
    感应惯性传感器结构和制造在包装堆积层

    公开(公告)号:US09429427B2

    公开(公告)日:2016-08-30

    申请号:US13720876

    申请日:2012-12-19

    CPC分类号: G01C19/56 G01C19/5776

    摘要: This invention relates to inductive inertial sensors employing a magnetic drive and/or sense architecture. In embodiments, translational gyroscopes utilize a conductive coil made to vibrate in a first dimension as a function of a time varying current driven through the coil in the presence of a magnetic field. Sense coils register an inductance that varies as a function of an angular velocity in a second dimension. In embodiments, the vibrating coil causes first and second mutual inductances in the sense coils to deviate from each other as a function of the angular velocity. In embodiments, self-inductances associated with a pair of meandering coils vary as a function of an angular velocity in a second dimension. In embodiments, package build-up layers are utilized to fabricate the inductive inertial sensors, enabling package-level integrated inertial sensing advantageous in small form factor computing platforms, such as mobile devices.

    摘要翻译: 本发明涉及采用磁驱动和/或感测架构的感应惯性传感器。 在实施例中,平移陀螺仪利用在第一维度中制成的导电线圈作为在存在磁场的情况下驱动通过线圈的时变电流的函数。 感应线圈记录在第二维度上作为角速度的函数变化的电感。 在实施例中,振动线圈使得感测线圈中的第一和第二互感器作为角速度的函数彼此偏离。 在实施例中,与一对曲折线圈相关联的自感量作为第二维度中的角速度的函数而变化。 在实施例中,使用封装积层来制造感应惯性传感器,使得能够在诸如移动设备的小尺寸计算平台中有利的封装级集成惯性感测。