Computer utilizing refrigeration for cooling
    9.
    发明授权
    Computer utilizing refrigeration for cooling 失效
    计算机利用制冷冷却

    公开(公告)号:US06493223B1

    公开(公告)日:2002-12-10

    申请号:US09606840

    申请日:2000-06-28

    IPC分类号: H05K720

    CPC分类号: G06F1/20 G06F2200/201

    摘要: The invention provides a computer with refrigeration. The computer has a housing, a processor, a refrigeration loop and a fan. The processor is located within the housing at a location distant from an air inlet into the housing. The refrigeration loop includes a compressor, a condenser, and expansion valve and an evaporator located in line one after the other. The evaporator is near the air inlet. The fan causes movement of air through the housing. The air passes over the evaporator to cool the air and the processor is primarily cooled by the air.

    摘要翻译: 本发明提供一种具有制冷的计算机。 计算机具有外壳,处理器,制冷回路和风扇。 处理器位于壳体内的远离进入壳体的空气入口的位置。 制冷回路包括压缩机,冷凝器,膨胀阀和蒸发器,一个接一个地排成一列。 蒸发器靠近进气口。 风扇引起空气流过外壳。 空气通过蒸发器以冷却空气,处理器主要由空气冷却。

    Thermally enhanced test socket
    10.
    发明授权
    Thermally enhanced test socket 失效
    热增强测试插座

    公开(公告)号:US06072322A

    公开(公告)日:2000-06-06

    申请号:US631

    申请日:1997-12-30

    IPC分类号: G01R1/04 G01R31/28 G01R31/02

    摘要: A test socket having a heat slug for removing heat from an electronic device positioned within the socket. In one embodiment the test socket includes a burn-in board electrically coupled to a test unit that generates a series of test signals to test the performance of the electronic device. Examples of electronic devices that can be tested by the test socket are integrated circuit packages such as tape carrier packages (TCP), ball grid arrays (BGA), pin grid arrays (PGA), land grid arrays (LGA), and other packages. The integrated circuit package is positioned within the socket which electrically connects the package to a printed circuit board, such as a burn-in board. The test socket includes an opening in which a heat slug is disposed. The heat slug has a contact surface that contacts the integrated circuit device under test. In another embodiment, the socket includes a lid having a heat slug attached to the lid, which heat slug has a contact surface that contacts an integrated circuit device under test.

    摘要翻译: 一种测试插座,其具有用于从位于插座内的电子设备移除热量的热塞。 在一个实施例中,测试插座包括电耦合到测试单元的老化板,其生成一系列测试信号以测试电子设备的性能。 可以通过测试插座测试的电子设备的例子是集成电路封装,例如带状载体封装(TCP),球栅阵列(BGA),引脚格栅阵列(PGA),光栅阵列(LGA)和其它封装。 集成电路封装位于插座内,该插座将封装电连接到印刷电路板,例如老化板。 测试插座包括其中设置有热塞的开口。 散热片具有与待测集成电路器件接触的接触表面。 在另一个实施例中,插座包括具有附接到盖子的散热片的盖子,该热塞具有接触被测试集成电路器件的接触表面。