Abstract:
A microelectronic connection component (62) has flexible leads (36) formed by polymeric strips (46, 50) with metallic conductors thereon. The metallic conductors (46, 50) may be very thin, desirably less than 5 microns thick, and provide good fatigue resistance. Each strip (46 or 50) may have two conductors thereon, one serving as a principal or signal conductor for connection to a contact on a chip (62) or other microelectronic element and the other serving as potential reference or ground conductor. The potential reference conductor on the lead provides enhanced resistance to crosstalk.
Abstract:
A thermal connector for conducting heat from microelectronic components such as semiconductor chips to a heat sink. The connector includes a large number of flexible thermal conductors (94, 96). The connector may be fabricated by a process which includes fabrication of the conductors as flat strips, bonding of the conductors to a pair of opposed planar sheets and vertically moving the sheets away from one another to expand the conductors vertically to their final three-dimensional configuration.
Abstract:
A method of connecting a semiconductor chip assembly (12) having at least first and second contacts (18) to a connection component (20) including at least first and second connection leads (30) by means of a tool (60) consisting of the steps of juxtaposing moving and connecting the leads to the corresponding contacts. The connection component (20) is juxtaposed with the semiconductor chip assembly (12) so that the first and second connection leads (30) are aligned with the first and second contacts (18) in such a manner that the first connection lead is offset from the first contact in the first direction and the second connection lead is offset from the second contact in the same first direction. The first connection lead is moved by means of the tool (60) substantially downwardly and towards the first contact in a second direction which is opposite to the first direction, so that an open space (A1) is formed between the first connection lead and the second contact and lead to facilitate movement of the second connection lead by the tool (60) substantially downwardly and towards the second contact in the second direction.
Abstract:
An interposer for interconnection between microelectronic circuit panels (260) has contacts (250) at its surfaces. Each contact has a central axis normal to the surface and a peripheral portion adapted to expand radially outwardly from the central axis responsive to a force applied by a pad (262) on the engaged circuit panel. Thus, when the circuit panels (260) are compressed with the interposers, the contacts expand radially and wipe across the pads (262). The wiping action facilitates bonding of the contacts to the pads, as by conductive bonding material (246) carried on the contacts themselves.
Abstract:
A connector for microelectronic elements includes a sheet-like body (30) having a plurality of holes (36), desirably arranged in a regular grid pattern. Each hole is provided with a resilient laminar contact (38) having a plurality of projections (42) extending inwardly over the hole in the body. Microelectronic elements (68) having bump leads (70) such as solder balls thereon may be engaged with the connector by advancing the bump leads into the holes of the connector to engage the bump leads with the contacts. The assembly can be tested, and if found acceptable, the bump leads can be permanently bonded to the contacts.
Abstract:
A method for creating an interface between a chip (10) and chip carrier (26) includes spacing the chip (10) a given distance above the chip carrier (26), and then introducing a liquid (50) in the gap (34) between the chip (10) and carrier (26). Preferably, the liquid (50) is an elastomer which is hardened into a resilient layer after its introduction into the gap (34). In another preferred embodiment, the terminals (331-34) on a chip carrier (326) are planarized or otherwise vertically positioned by deforming the terminals (331-34) into set vertical locations with a plate (380), and then hardening a liquid (350) between the chip carrier (326) and chip (310).
Abstract:
Provision of an expansion region (e.g., a flow path with increasing cross-section downstream of the EHD air mover) can provide operational benefits in EHD air mover-based thermal management systems. In contrast, such a design would generally be disfavored for conventional mechanical air mover-based systems. In some cases, an expansion chamber or volume may be provided between the EHD air mover and heat transfer surfaces. In some cases, expansion of the flow cross-section may be provided (at least in part) within the heat transfer surface volume itself. In some cases, leading surfaces of heat transfer surface (e.g., heat sink fins) may be shaped, disposed or otherwise presented to EHD motivated flow to reduce "laminarity" of the impinging air flow so as to reduce thermal transfer boundary layer effects and/or to divert flow outward in the flow channel so as to more evenly distribute ozone molecules over catalytic sites.
Abstract:
An apparatus for tandem cleaning of an emitter electrode (e.g., 106, 206, 306, 308) and collector electrode (e.g., 108, 208, 320) in electrohydrodynamic fluid accelerator (e.g., 201, 301) and precipitator (e.g., 303) devices via movement of a cleaning mechanism (e.g., 200, 300) including respective cleaning surfaces (e.g., 102, 104, 202, 204, 302, 304, 322, 332) positioned to frictionally engage the emitter electrode and collector electrode. The cleaning mechanism causes the respective cleaning surfaces to travel along a longitudinal extent of the emitter electrode and, in tandem, over a major dimension of the collector electrode to remove detrimental material from respective electrode surfaces. Alternatively, the electrodes can be transited in tandem in frictional engagement with a fixed cleaning mechanism in the same or opposite directions. A conditioning material is optionally deposited on an electrode to at least partially mitigate ozone, erosion, corrosion, oxidation, or dendrite formation on the electrodes. The conditioning material can include an ozone reducer.
Abstract:
A microelectronic package (10) may have a plurality of terminals (36) disposed at a face (32) thereof which are configured for connection to at least one external component, e.g., a circuit panel (70). First and second microelectronic elements (12), (14) can be affixed with packaging structure (30) therein. A first electrical connection (51A, 40A, 74A) can extend from a respective terminal (36A) of the package (10) to a corresponding contact (20A) on the first microelectronic element (12), and a second electrical connection (53A, 40B, 52A) can extend from the respective terminal (36A) to a corresponding contact (26A) on the second microelectronic element (14), the first and second connections being configured such that a respective signal carried by the first and second connections is subject to propagation delay of the same duration between the respective terminal (36A) and each of the corresponding contacts (20A, 26A) coupled thereto.
Abstract:
A microelectronic assembly 10 can include a substrate 20 having first and second surfaces 21, 22, at least two logic chips 30 overlying the first surface, and a memory chip 40 having a front surface 45 with contacts 44 thereon, the front surface of the memory chip confronting a rear surface 36 of each logic chip. Signal contacts 34 of each logic chip 30 can be directly electrically connected to signal contacts 34 of the other logic chips 30 through conductive structure 62 of the substrate 20 for transfer of signals between the logic chips. The logic chips 30 can be adapted to simultaneously execute a set of instructions of a given thread of a process. The contacts 44 of the memory chip 40 can be directly electrically connected to the signal contacts 34 of at least one of the logic chips 30 through the conductive structure 62.