RECESSED TRANSISTORS CONTAINING FERROELECTRIC MATERIAL
    3.
    发明申请
    RECESSED TRANSISTORS CONTAINING FERROELECTRIC MATERIAL 审中-公开
    含有电磁材料的残余晶体管

    公开(公告)号:WO2016057097A8

    公开(公告)日:2017-04-13

    申请号:PCT/US2015039480

    申请日:2015-07-08

    Abstract: Some embodiments include transistor constructions having a first insulative structure lining a recess within a base. A first conductive structure lines an interior of the first insulative structure, and a ferroelectric structure lines an interior of the first conductive structure. A second conductive structure is within a lower region of the ferroelectric structure, and the second conductive structure has an uppermost surface beneath an uppermost surface of the first conductive structure. A second insulative structure is over the second conductive structure and within the ferroelectric structure. A pair of source/drain regions are adjacent an upper region of the first insulative structure and are on opposing sides of the first insulative structure from one another.

    Abstract translation: 一些实施例包括具有衬在基底内的凹部的第一绝缘结构的晶体管结构。 第一导电结构将第一绝缘结构的内部排列,并且铁电结构将第一导电结构的内部排列。 第二导电结构在铁电结构的下部区域内,第二导电结构在第一导电结构的最上表面下方具有最上表面。 第二绝缘结构在第二导电结构之上并且在铁电体结构内。 一对源极/漏极区域与第一绝缘结构的上部区域相邻并且在第一绝缘结构的相对侧上彼此相邻。

    SELECTIVE BLOCKING DIELECTRIC FORMATION IN A THREE-DIMENSIONAL MEMORY STRUCTURE
    8.
    发明申请
    SELECTIVE BLOCKING DIELECTRIC FORMATION IN A THREE-DIMENSIONAL MEMORY STRUCTURE 审中-公开
    三维存储器结构中的选择性阻塞电介质形成

    公开(公告)号:WO2016099628A1

    公开(公告)日:2016-06-23

    申请号:PCT/US2015/053841

    申请日:2015-10-02

    Abstract: A plurality of blocking dielectric portions can be formed between a memory stack structure and an alternating stack of first material layers and second material layers by selective deposition of a dielectric material layer. The plurality of blocking dielectric portions can be formed after removal of the second material layers selective to the first material layers by depositing a dielectric material on surfaces of the memory stack structure while avoiding deposition on surfaces of the first material layers. A deposition inhibitor material layer or a deposition promoter material layer can be optionally employed. Alternatively, the plurality of blocking dielectric portions can be formed on surfaces of the second material layers while avoiding deposition on surfaces of the first material layers after formation of the memory opening and prior to formation of the memory stack structure. The plurality of blocking dielectric portions are vertically spaced annular structures.

    Abstract translation: 通过选择性沉积介电材料层,可以在存储器堆叠结构和第一材料层和第二材料层的交替堆叠之间形成多个阻挡电介质部分。 通过在存储堆叠结构的表面上沉积电介质材料,同时避免沉积在第一材料层的表面上,可以在去除对第一材料层选择性的第二材料层之后形成多个阻挡电介质部分。 可以任选地使用沉积抑制剂材料层或沉积促进剂材料层。 或者,可以在形成存储器开口之后并且在形成存储器堆叠结构之前,在第二材料层的表面上形成多个阻挡电介质部分,同时避免在第一材料层的表面上沉积。 多个阻挡电介质部分是垂直间隔开的环形结构。

Patent Agency Ranking