CHIP PACKAGE AND METHOD OF MANUFACTURING THE SAME
    284.
    发明申请
    CHIP PACKAGE AND METHOD OF MANUFACTURING THE SAME 有权
    芯片包装及其制造方法

    公开(公告)号:US20160039663A1

    公开(公告)日:2016-02-11

    申请号:US14819174

    申请日:2015-08-05

    Applicant: XINTEC INC.

    Inventor: Chien-Min LIN

    Abstract: A method includes forming a bump on a lower surface of an interposer. A first insulation layer is formed to cover the lower surface and bump. A trench is formed extending from the lower towards an upper surface of the interposer. A polymer supporting adhesive layer is formed to surround the bump and couples between the interposer and a semiconductor chip. The semiconductor chip has at least a sensing component and a conductive pad electrically connected to the sensing component, and the bump is connected to the conductive pad. A via is formed extending from the upper towards the lower surface. A second insulation layer is formed to cover the upper surface and the via. A redistribution layer is formed on the second insulation layer and in the via. A packaging layer is formed to cover the redistribution layer and has a second opening.

    Abstract translation: 一种方法包括在插入器的下表面上形成凸块。 形成第一绝缘层以覆盖下表面和凸起。 形成从插入件的下表面延伸到上表面的沟槽。 形成聚合物支持粘合剂层以围绕凸起并且在插入器和半导体芯片之间耦合。 半导体芯片具有至少一个感测部件和电连接到感测部件的导电焊盘,并且凸块连接到导电焊盘。 通孔形成为从上部向下表面延伸。 形成第二绝缘层以覆盖上表面和通孔。 在第二绝缘层和通孔中形成再分布层。 形成包装层以覆盖再分布层并具有第二开口。

    Semiconductor structure and manufacturing method thereof
    285.
    发明授权
    Semiconductor structure and manufacturing method thereof 有权
    半导体结构及其制造方法

    公开(公告)号:US09236429B2

    公开(公告)日:2016-01-12

    申请号:US14699261

    申请日:2015-04-29

    Applicant: XINTEC INC.

    CPC classification number: H01L29/0642 H01L21/76229 H01L27/1463 H01L27/14683

    Abstract: A semiconductor structure includes a substrate, a dam element, a first isolation layer, a second isolation layer, and a conductive layer. The substrate has a conductive pad, a trench, a sidewall, a first surface, and a second surface opposite to the first surface. The conductive pad is located on the second surface. The trench has a first opening at the first surface, and has a second opening at the second surface. The dam element is located on the second surface and covers the second opening. The dam element has a concave portion that is at the second opening. The first isolation layer is located on a portion of the sidewall. The second isolation layer is located on the first surface and the sidewall that is not covered by the first isolation layer, such that an interface is formed between the first and second isolation layers.

    Abstract translation: 半导体结构包括基板,阻挡元件,第一隔离层,第二隔离层和导电层。 衬底具有导电焊盘,沟槽,侧壁,第一表面和与第一表面相对的第二表面。 导电垫位于第二表面上。 沟槽在第一表面具有第一开口,并且在第二表面具有第二开口。 坝体元件位于第二表面并覆盖第二开口。 坝体元件具有在第二开口处的凹入部分。 第一隔离层位于侧壁的一部分上。 第二隔离层位于不被第一隔离层覆盖的第一表面和侧壁上,使得在第一和第二隔离层之间形成界面。

    Chip package having sensing element and method for forming the same
    289.
    发明授权
    Chip package having sensing element and method for forming the same 有权
    具有感测元件的芯片封装及其形成方法

    公开(公告)号:US09177905B2

    公开(公告)日:2015-11-03

    申请号:US14036954

    申请日:2013-09-25

    Applicant: XINTEC INC.

    Abstract: A chip package for a sensing element. The chip package includes a substrate having a first surface and a second surface, and a sensing layer having a sensing region disposed on the first surface of the substrate. A conducting pad structure is disposed on the substrate and electrically connected to the sensing region, and a spacer layer is disposed on the first surface of the substrate. A semiconductor substrate is place on the spacer layer. The semiconductor substrate, the spacer layer, and the substrate together surround a cavity on the sensing region. A through-hole extends from a surface of the semiconductor substrate toward the substrate, and connects to the cavity.

    Abstract translation: 用于传感元件的芯片封装。 芯片封装包括具有第一表面和第二表面的基板,以及具有设置在基板的第一表面上的感测区域的感测层。 导电焊盘结构设置在基板上并电连接到感测区域,并且间隔层设置在基板的第一表面上。 半导体衬底位于间隔层上。 半导体衬底,间隔层和衬底一起围绕感测区域上的空腔。 通孔从半导体衬底的表面朝向衬底延伸,并连接到空腔。

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