公开(公告)号：US09761555B2

公开(公告)日：2017-09-12

申请号：US14604525

申请日：2015-01-23

Applicant: XINTEC INC.

Inventor： Jiun-Yen Lai ,  Yu-Wen Hu ,  Bai-Yao Lou ,  Chia-Sheng Lin ,  Yen-Shih Ho ,  Hsin Kuan

IPC: H01L31/00 ,  H01L23/00 ,  H01L23/522 ,  H01L49/02

CPC classification number: H01L24/81 ,  H01L23/5227 ,  H01L24/03 ,  H01L24/05 ,  H01L24/13 ,  H01L24/48 ,  H01L28/10 ,  H01L2224/03462 ,  H01L2224/0347 ,  H01L2224/03902 ,  H01L2224/0391 ,  H01L2224/0401 ,  H01L2224/04042 ,  H01L2224/05005 ,  H01L2224/05007 ,  H01L2224/05022 ,  H01L2224/05026 ,  H01L2224/05027 ,  H01L2224/05147 ,  H01L2224/05155 ,  H01L2224/05164 ,  H01L2224/05562 ,  H01L2224/05564 ,  H01L2224/05571 ,  H01L2224/05583 ,  H01L2224/05644 ,  H01L2224/13021 ,  H01L2224/1308 ,  H01L2224/131 ,  H01L2224/13147 ,  H01L2224/13155 ,  H01L2224/13164 ,  H01L2224/13562 ,  H01L2224/13644 ,  H01L2224/48 ,  H01L2924/00014 ,  H01L2224/45099 ,  H01L2924/00012 ,  H01L2924/014

Abstract: A manufacturing method of a passive component structure includes the following steps. A protection layer is formed on a substrate, and bond pads of the substrate are respectively exposed through protection layer openings. A conductive layer is formed on the bond pads and the protection layer. A patterned photoresist layer is formed on the conductive layer, and the conductive layer adjacent to the protection layer openings is exposed through photoresist layer openings. Copper bumps are respectively electroplated on the conductive layer. The photoresist layer and the conductive layer not covered by the copper bumps are removed. A passivation layer is formed on the copper bumps and the protection layer, and at least one of the copper bumps is exposed through a passivation layer opening. A diffusion barrier layer and an oxidation barrier layer are chemically plated in sequence on the copper bump.

公开(公告)号：US09293394B2

公开(公告)日：2016-03-22

申请号：US14260205

申请日：2014-04-23

Applicant: XINTEC INC.

Inventor： Bai-Yao Lou ,  Tsang-Yu Liu ,  Chia-Sheng Lin ,  Tzu-Hsiang Hung

IPC: H01L23/00 ,  H01L23/48 ,  H01L23/498 ,  H01L23/04 ,  H01L23/31 ,  H01L21/768

CPC classification number: H01L23/481 ,  H01L21/76898 ,  H01L23/04 ,  H01L23/3128 ,  H01L23/49816 ,  H01L23/49827 ,  H01L24/03 ,  H01L24/05 ,  H01L24/13 ,  H01L24/32 ,  H01L24/73 ,  H01L2224/02371 ,  H01L2224/02372 ,  H01L2224/0392 ,  H01L2224/0401 ,  H01L2224/04026 ,  H01L2224/05025 ,  H01L2224/05548 ,  H01L2224/05572 ,  H01L2224/056 ,  H01L2224/05687 ,  H01L2224/0569 ,  H01L2224/06181 ,  H01L2224/13022 ,  H01L2224/13024 ,  H01L2224/32225 ,  H01L2224/73153 ,  H01L2924/00013 ,  H01L2924/00014 ,  H01L2924/12041 ,  H01L2924/14 ,  H01L2924/1461 ,  H01L2924/00012 ,  H01L2224/13099 ,  H01L2224/13599 ,  H01L2224/05599 ,  H01L2224/05099 ,  H01L2224/29099 ,  H01L2224/29599 ,  H01L2924/00 ,  H01L2224/05552

Abstract: An embodiment of the invention provides a chip package which includes a substrate having a first surface and a second surface; a conducting pad structure located on the first surface; a dielectric layer located on the first surface of the substrate and the conducting pad structure, wherein the dielectric layer has an opening exposing a portion of the conducting pad structure; and a cap layer located on the dielectric layer and filled into the opening.

Abstract translation: 本发明的实施例提供一种芯片封装，其包括具有第一表面和第二表面的基板; 位于所述第一表面上的导电垫结构; 位于所述基板的所述第一表面上的电介质层和所述导电焊盘结构，其中所述电介质层具有暴露所述导电焊盘结构的一部分的开口; 以及位于电介质层上并填充到开口中的盖层。

公开(公告)号：US08778798B1

公开(公告)日：2014-07-15

申请号：US14207247

申请日：2014-03-12

Applicant: Xintec Inc.

Inventor： Shu-Ming Chang ,  Bai-Yao Lou ,  Ying-Nan Wen ,  Chien-Hung Liu

IPC: H01L21/44

CPC classification number: H01L21/50 ,  H01L23/481 ,  H01L24/03 ,  H01L24/05 ,  H01L24/11 ,  H01L24/13 ,  H01L24/32 ,  H01L24/81 ,  H01L24/92 ,  H01L24/93 ,  H01L24/94 ,  H01L33/62 ,  H01L2224/02311 ,  H01L2224/02313 ,  H01L2224/02331 ,  H01L2224/02371 ,  H01L2224/0239 ,  H01L2224/024 ,  H01L2224/0346 ,  H01L2224/0347 ,  H01L2224/03825 ,  H01L2224/039 ,  H01L2224/0391 ,  H01L2224/0401 ,  H01L2224/05548 ,  H01L2224/05569 ,  H01L2224/056 ,  H01L2224/1146 ,  H01L2224/1147 ,  H01L2224/11825 ,  H01L2224/119 ,  H01L2224/1191 ,  H01L2224/13021 ,  H01L2224/13024 ,  H01L2224/131 ,  H01L2224/136 ,  H01L2224/16225 ,  H01L2224/32052 ,  H01L2224/32225 ,  H01L2224/32245 ,  H01L2224/81191 ,  H01L2224/81192 ,  H01L2224/92142 ,  H01L2224/92143 ,  H01L2224/93 ,  H01L2224/94 ,  H01L2924/0001 ,  H01L2924/00014 ,  H01L2924/0002 ,  H01L2924/01006 ,  H01L2924/01024 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01074 ,  H01L2924/01079 ,  H01L2924/014 ,  H01L2924/12041 ,  H01L2924/14 ,  H01L2924/1461 ,  H01L2224/0231 ,  H01L2224/11 ,  H01L2224/1182 ,  H01L2224/03 ,  H01L2224/0382 ,  H01L2224/81 ,  H01L2224/83 ,  H01L2224/13099 ,  H01L2924/00 ,  H01L2224/05552

Abstract: An electronic device package is disclosed. The package includes at least one semiconductor chip having a first surface and a second surface opposite thereto, in which at least one redistribution layer is disposed on the first surface of the semiconductor chip and is electrically connected to at least one conductive pad structure. At least one abut portion is disposed on the redistribution layer and electrically contacting thereto. A passivation layer covers the first surface of the semiconductor chip and surrounds the abut portion. A substrate is attached onto the second surface of the semiconductor chip. A fabrication method of the electronic device package is also disclosed.

公开(公告)号：US09449897B2

公开(公告)日：2016-09-20

申请号：US14198542

申请日：2014-03-05

Applicant: XINTEC INC.

Inventor： Bai-Yao Lou ,  Shih-Kuang Chen ,  Sheng-Yuan Lee

IPC: H01L21/78 ,  H01L23/48 ,  H01L23/31 ,  H01L21/56

CPC classification number: H01L23/48 ,  H01L21/561 ,  H01L21/78 ,  H01L23/3114 ,  H01L2924/0002 ,  H01L2924/00

Abstract: An embodiment of the invention provides a chip package which includes: a semiconductor substrate; a device region formed in the semiconductor substrate; at least a conducting pad disposed over a surface of the semiconductor substrate; a protection plate disposed over the surface of the semiconductor substrate; and a spacer layer disposed between the surface of the semiconductor substrate and the protection plate, wherein the protection plate and the spacer layer surround a cavity over the device region, the spacer layer has an outer side surface away from the cavity, and the outer side surface of the spacer layer is not a cutting surface.

Abstract translation: 本发明的实施例提供一种芯片封装，其包括：半导体衬底; 形成在所述半导体衬底中的器件区域; 至少一个设置在所述半导体衬底的表面上的导电焊盘; 设置在所述半导体衬底的表面上的保护板; 以及设置在所述半导体衬底的表面和所述保护板之间的间隔层，其中所述保护板和所述间隔层围绕所述器件区域的空腔，所述间隔层具有远离所述腔的外侧表面，并且所述外侧 间隔层的表面不是切割面。

公开(公告)号：US09023676B2

公开(公告)日：2015-05-05

申请号：US14166749

申请日：2014-01-28

Applicant: Xintec Inc.

Inventor： Chih-Hao Chen ,  Bai-Yao Lou ,  Shih-Kuang Chen

IPC: H01L21/00 ,  H01L27/146 ,  H01L21/20

CPC classification number: H01L27/14687 ,  H01L21/2007 ,  H01L27/14618 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A wafer packaging method includes the following steps. A light transmissive carrier is provided. A hydrolytic temporary bonding layer is formed on the light transmissive carrier. A first surface of a light transmissive protection sheet is bonded to the hydrolytic temporary bonding layer, such that the hydrolytic temporary bonding layer is located between the light transmissive protection sheet and the light transmissive carrier. A second surface of the light transmissive protection sheet facing away from the first surface is bonded to a third surface of a wafer. The light transmissive carrier, the hydrolytic temporary bonding layer, the light transmissive protection sheet, and the wafer are immersed in a high temperature liquid, such that adhesion force of the hydrolytic temporary bonding layer is eliminated. The light transmissive protection sheet and the wafer are obtained from the high temperature liquid.

Abstract translation: 晶片封装方法包括以下步骤。 提供透光载体。 在透光性载体上形成水解性临时粘接层。 透光性保护片的第一表面与水解性临时粘合层接合，使得水解临时粘结层位于透光保护片和透光性载体之间。 透光保护片的背离第一表面的第二表面被结合到晶片的第三表面。 透光载体，水解临时粘合层，透光保护片和晶片浸入高温液体中，从而消除了水解临时粘合层的粘附力。 透光保护片和晶片是从高温液体中获得的。