Method of making a support circuit for a semiconductor chip assembly
    71.
    发明授权
    Method of making a support circuit for a semiconductor chip assembly 失效
    制造用于半导体芯片组件的支撑电路的方法

    公开(公告)号:US06402970B1

    公开(公告)日:2002-06-11

    申请号:US09643213

    申请日:2000-08-22

    Abstract: A method of manufacturing a support circuit includes providing a conductive layer with top and bottom surfaces, providing a top etch mask on the top surface that includes an opening that exposes a portion of the top surface, providing a bottom etch mask on the bottom surface that includes an opening that exposes a portion of the bottom surface, applying an etch to the exposed portion of the top surface through the opening in the top etch mask, thereby etching partially but not completely through the conductive layer and forming a recessed portion in the conductive layer below the top surface, forming an insulative base on the recessed portion without forming the insulative base on the top surface, and applying an etch to the exposed portion of the bottom surface through the opening in the bottom etch mask, thereby forming a through-hole in the recessed portion that extends to and is covered by the insulative base.

    Abstract translation: 制造支撑电路的方法包括:提供具有顶表面和底表面的导电层,在顶表面上提供顶部蚀刻掩模,该掩模包括暴露顶表面的一部分的开口,在底表面上提供底蚀刻掩模, 包括露出底表面的一部分的开口,通过顶部蚀刻掩模中的开口对顶表面的暴露部分施加蚀刻,从而通过导电层部分蚀刻但不完全蚀刻,并在导电层中形成凹陷部分 在顶表面下方形成绝缘基底,而不在顶表面上形成绝缘基底,并且通过底蚀刻掩模中的开口对底表面的暴露部分施加蚀刻,从而形成通孔, 在凹部中延伸并被绝缘基底覆盖的孔。

    Method of making a support circuit with a tapered through-hole for a semiconductor chip assembly
    72.
    发明授权
    Method of making a support circuit with a tapered through-hole for a semiconductor chip assembly 失效
    制造具有用于半导体芯片组件的锥形通孔的支撑电路的方法

    公开(公告)号:US06350386B1

    公开(公告)日:2002-02-26

    申请号:US09665931

    申请日:2000-09-20

    Abstract: A method of manufacturing a support circuit includes providing a conductive layer with top and bottom surfaces, providing a top etch mask on the top surface that includes an opening that exposes a portion of the top surface, providing a bottom etch mask on the bottom surface that includes an opening that exposes a portion of the bottom surface, applying an etch to the exposed portion of the top surface through the opening in the top etch mask thereby etching partially but not completely through the conductive layer and forming a recessed portion in the conductive layer below the top surface, forming an insulative base on the recessed portion without forming the insulative base on the top surface, applying an etch to the exposed portion of the bottom surface through the opening in the bottom etch mask thereby forming a routing line in the recessed portion, applying an etch to the insulative base to form an opening in the insulative base that exposes a portion of the routing line, and applying an etch to the exposed portion of the routing line through the opening in the insulative base thereby forming an opening in the routing line with tapered sidewalls. The method may also include providing an adhesive beneath the support circuit, and applying an etch that enlarges the opening in the insulative base to expose a portion of a top surface of the routing line adjacent to the opening in the routing line and that forms an opening in the adhesive beneath the opening in the routing line.

    Abstract translation: 制造支撑电路的方法包括:提供具有顶表面和底表面的导电层,在顶表面上提供顶部蚀刻掩模,该掩模包括暴露顶表面的一部分的开口,在底表面上提供底蚀刻掩模, 包括露出底表面的一部分的开口,通过顶部蚀刻掩模中的开口对顶表面的暴露部分施加蚀刻,从而部分蚀刻但不完全地通过导电层蚀刻,并在导电层中形成凹陷部分 在顶表面下方,在凹部上形成绝缘基底,而不在顶表面上形成绝缘基底,通过底蚀刻掩模中的开口对底表面的暴露部分施加蚀刻,从而在凹陷部分中形成布线线 对所述绝缘基底施加蚀刻,以在所述绝缘基体中形成露出所述布线线的一部分的开口,并且 通过绝缘基体中的开口对路线的暴露部分进行蚀刻,从而在具有锥形侧壁的布线线中形成开口。 该方法还可以包括在支撑电路下方提供粘合剂,以及施加一种蚀刻,其扩大绝缘基体中的开口,以暴露与布线线中的开口相邻的布线线的顶表面的一部分,并形成开口 在路线中的开口下面的粘合剂中。

    Selective electroless plating process for metal conductors
    73.
    发明授权
    Selective electroless plating process for metal conductors 失效
    金属导体的选择性化学镀工艺

    公开(公告)号:US5167992A

    公开(公告)日:1992-12-01

    申请号:US667778

    申请日:1991-03-11

    Abstract: A method for electrolessly plating an overcoat metal on a metal conductor disposed on a dielectric surface of a substrate. The method includes removing carbonized film from the dielectric surface by applying a plasma discharge, acid treating the metal conductor by dipping the substrate in a first acid solution in order to clean the surface of the metal conductor, activating the metal conductor to allow electroless plating thereon by dipping the substrate in a metal activator solution, deactivating the dielectric surface to prevent electroless plating thereon without deactivating the metal conductor by dipping the substrate in a second acid solution, and plating an overcoat metal on the metal conductor by dipping the substrate in an electroless plating solution so that the overcoat metal plates on and coats the metal conductor without plating on the dielectric surface.

    Abstract translation: 在设置在基板的电介质表面上的金属导体上无电镀电镀金属的方法。 该方法包括通过施加等离子体放电来从电介质表面去除碳化膜,通过将基底浸渍在第一酸溶液中来酸化处理金属导体,以清洁金属导体的表面,激活金属导体以允许金属导体在其上进行无电镀 通过将基底浸渍在金属活化剂溶液中,使电介质表面失活以防止其上化学镀,而不使金属导体通过将基底浸渍在第二酸溶液中而使金属导体失活,并且通过将基底浸渍在无电镀中而在金属导体上镀覆外涂层金属 电镀溶液,使得外涂金属板在金属导体上涂覆并涂覆在电介质表面上。

    Detecting completion of electroless via fill
    74.
    发明授权
    Detecting completion of electroless via fill 失效
    检测无电解通孔的完成

    公开(公告)号:US5116463A

    公开(公告)日:1992-05-26

    申请号:US717767

    申请日:1991-06-19

    Abstract: A method for detecting the completion of electrolessly depositing metal into a via. The method includes providing a non-autocatalytic detection mask with an opening over a via containing an autocatalytic material, electrolessly depositing a conductive metal into the via which fails to plate to the mask, and continuing the deposition until metal in the via contacts the mask, at which time the electrochemical potential of the mask changes and the metal plates to and covers the entire mask. The completion of the electroless via fill can be detected by changes in both the appearance and electrochemical potential of the mask.

    Abstract translation: 一种用于检测无电沉积金属到通孔中的完成方法。 该方法包括提供非自动催化检测掩模,该通孔包含含有自催化材料的通孔,将导电金属无电沉积到通孔中,该通孔不能平铺于掩模上,并且继续沉积,直到通孔中的金属接触掩模, 此时,掩模的电化学电位改变,金属板覆盖整个掩模。 可以通过掩模的外观和电化学电位的变化来检测无电通孔填充物的完成。

    Copper etching solution and method
    75.
    发明授权
    Copper etching solution and method 失效
    铜蚀刻溶液及方法

    公开(公告)号:US4952275A

    公开(公告)日:1990-08-28

    申请号:US452458

    申请日:1989-12-15

    CPC classification number: C23F1/10

    Abstract: A process and solution for selectively etching copper. The etching is effected by a nonaqueous solution of dimethyl sulfoxide and a halocarbon compound.

    Abstract translation: 一种选择性蚀刻铜的工艺和解决方案。 蚀刻由二甲基亚砜和卤代烃化合物的非水溶液进行。

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