Semiconductor substrate manufacturing method, semiconductor pressure sensor and manufacturing method thereof
    3.
    发明授权
    Semiconductor substrate manufacturing method, semiconductor pressure sensor and manufacturing method thereof 失效
    半导体衬底制造方法,半导体压力传感器及其制造方法

    公开(公告)号:US06388279B1

    公开(公告)日:2002-05-14

    申请号:US09095131

    申请日:1998-06-10

    IPC分类号: H01L2720

    摘要: In the method for manufacturing a semiconductor substrate, a concavity and a connecting hole for connecting the concavity to the outside are formed on a lower face side of a first substrate, and the first substrate is laminated with a second substrate in an atmosphere at atmospheric pressure. A diaphragm is formed by thinning the first substrate from its upper face by polishing. A sealing hole reaching to the connecting hole is formed from the upper face of the first substrate. An oxide film is formed in the sealing hole in a vacuum, whereby the connecting hole is sealed while the pressure of the pressure reference chamber is reduced to a vacuum. In this way, since the pressure reference chamber is pressure-reduced in a final stage, the diaphragm can be prevented from deforming due to pressure difference during polishing.

    摘要翻译: 在半导体衬底的制造方法中,在第一衬底的下表面上形成用于将凹部连接到外部的凹部和连接孔,并且将第一衬底与大气压的气氛中的第二衬底层叠 。 通过抛光使第一基板从其上表面变薄而形成隔膜。 从第一基板的上表面形成到达连接孔的密封孔。 在真空中在密封孔中形成氧化膜,由此在压力基准室的压力降低到真空的同时密封连接孔。 以这种方式,由于压力基准室在最终阶段被减压,所以可以防止由于研磨过程中的压力差导致的隔膜变形。

    Semiconductor physical quantity sensor
    6.
    发明授权
    Semiconductor physical quantity sensor 有权
    半导体物理量传感器

    公开(公告)号:US06250165B1

    公开(公告)日:2001-06-26

    申请号:US09239781

    申请日:1999-01-29

    IPC分类号: G01L900

    摘要: A semiconductor physical quantity sensor has a P-type semiconductor substrate and an N-type semiconductor layer formed on a main surface of the P-type semiconductor substrate. A displaceable portion is formed by electrochemically etching the P-type semiconductor substrate from a side of the main surface. At that time, a buried insulation film formed to penetrate the N-type semiconductor layer and to extend into the P-type semiconductor substrate is used as a stopper for the etching. Accordingly, an etched region can be restricted by the buried insulation film, so that the displaceable portion can be precisely formed.

    摘要翻译: 半导体物理量传感器具有P型半导体衬底和形成在P型半导体衬底的主表面上的N型半导体层。 通过从主表面的一侧电化学蚀刻P型半导体衬底形成位移部分。 此时,形成为穿透N型半导体层并延伸到P型半导体衬底中的掩埋绝缘膜用作蚀刻的阻挡层。 因此,可以通过埋入绝缘膜来限制蚀刻区域,从而能够精确地形成位移部。

    Method of manufacturing semiconductor device capable of sensing dynamic quantity
    7.
    发明授权
    Method of manufacturing semiconductor device capable of sensing dynamic quantity 有权
    能够感测动态量的半导体器件的制造方法

    公开(公告)号:US06753201B2

    公开(公告)日:2004-06-22

    申请号:US10154784

    申请日:2002-05-28

    IPC分类号: H01L2100

    摘要: A method of manufacturing a semiconductor device is provided. The device is manufactured with use of an SOI (Silicon On Insulator) substrate having a first silicon layer, an oxide layer, and a second silicon layer laminated in this order. After forming a trench reaching the oxide layer from the second silicon layer, dry etching is performed, thus allowing the oxide layer located at the trench bottom to be charged at first. This charging forces etching ions to impinge upon part of the second silicon layer located laterally to the trench bottom. Such part is removed, forming a movable section. For example, ions to neutralize the electric charges are administered into the trench, so that the electric charges are removed from charged movable electrodes and their charged surrounding regions. Removing the electric charges prevents the movable section to stick to its surrounding portions.

    摘要翻译: 提供一种制造半导体器件的方法。 使用具有按顺序层叠的第一硅层,氧化物层和第二硅层的SOI(绝缘体上硅)基板来制造器件。 在形成从第二硅层到达氧化物层的沟槽之后,进行干蚀刻,从而允许首先将位于沟槽底部的氧化物层充电。 该充电迫使蚀刻离子撞击位于沟槽底部横向的第二硅层的一部分。 去除这样的部件,形成可动部分。 例如,中和电荷的离子被施加到沟槽中,使得电荷从带电的可移动电极及其带电的周围区域中去除。 拆卸电荷可防止可动部分粘附到其周围部分。

    Semiconductor physical quantity sensor with stopper portion
    10.
    发明授权
    Semiconductor physical quantity sensor with stopper portion 有权
    具有止动部分的半导体物理量传感器

    公开(公告)号:US6065341A

    公开(公告)日:2000-05-23

    申请号:US209414

    申请日:1998-12-11

    IPC分类号: G01P15/08 G01P15/125

    摘要: A mass portion of a movable portion is supported by an anchor portion protruding from a substrate through a beam portion. A stopper portion fixed to the substrate through another anchor portion is disposed on a side opposite to the mass portion with respect to the beam portion to define a gap with the beam portion. The stopper portion is electrically connected to the beam portion through the anchor portions. Accordingly, the movable portion is restricted from being displaced in a direction generally parallel to a surface of the substrate, and a movable electrode of the movable portion is prevented from being attached to the fixed electrode.

    摘要翻译: 可移动部分的质量部分由通过梁部分从基底突出的锚固部分支撑。 通过另一个锚定部分固定到基板的止动部分相对于梁部分设置在与质量部分相对的一侧上以限定与梁部分的间隙。 止动部分通过锚定部电连接到梁部分。 因此,可动部被限制在大致平行于基板的表面的方向上移动,并且防止可动部的可动电极附着到固定电极。