APPARATUS AND METHOD FOR TESTING MULTIPLE INTEGRATED CIRCUIT DEVICES ON A FILM FRAME HANDLER
    3.
    发明申请
    APPARATUS AND METHOD FOR TESTING MULTIPLE INTEGRATED CIRCUIT DEVICES ON A FILM FRAME HANDLER 审中-公开
    用于在薄膜框架处理器上测试多个集成电路装置的装置和方法

    公开(公告)号:WO2011159524A2

    公开(公告)日:2011-12-22

    申请号:PCT/US2011/039500

    申请日:2011-06-07

    Inventor: BLANEY, Gerald

    CPC classification number: H01L21/6835 H01L2221/68331

    Abstract: Film frame assemblies and apparatus for testing and singulating integrated circuit packages, as well as associated methods for forming a film frame assembly, and testing and singulating integrated circuit packages are disclosed. A plurality of leads on a lead frame are cut to form singulated integrated circuit packages. Apparatus and methods are disclosed for mechanically aligning a set of electrical contacts attached to a contactor body with a plurality of leads on a singulated integrated circuit package.

    Abstract translation: 公开了用于测试和分组集成电路封装的胶片框架组件以及用于形成胶片框架组件的相关方法以及测试和分离集成电路封装的装置。 引线框架上的多个引线被切割以形成单个的集成电路封装。 公开了用于将连接到接触器主体的一组电触头与单个集成电路封装上的多个引线机械对准的装置和方法。

    A METHOD FOR PRODUCING A THIN SEMICONDUCTOR CHIP
    5.
    发明申请
    A METHOD FOR PRODUCING A THIN SEMICONDUCTOR CHIP 审中-公开
    一种生产半导体芯片的方法

    公开(公告)号:WO2007122438A1

    公开(公告)日:2007-11-01

    申请号:PCT/IB2006/000966

    申请日:2006-04-21

    Abstract: A method of fabricating a semiconductor chip, the method includes the step of providing an adhesive layer (6) on the outer area of the active surface (13) of a device wafer (1) . Next, a rigid body (3) is attached to the active surface (13) of the device wafer (1) by the adhesive layer (6) . After this, the device wafer (1) is thinned by treating the passive surface of the device wafer (1) that is opposite to the active surface (13) . Following this, a first backing tape (21, 23) is connected to the passive surface of the device wafer (1) . Then, the outer portion (32) of the rigid body (3) is separated from the central portion (33) of the rigid body (3) . In addition, the outer portion (12) of the device wafer (1) is separated from the central portion (14) of the device wafer (1) . After this, the central portion (33) of the rigid body (3) is removed from the first backing tape (21, 23) . Next, the outer portion (12) of the device wafer (1) and the outer portion (32) of the rigid body (3) is removed from the first backing tape (21, 23) . After this, the device wafer (1) is diced into semiconductor chips .

    Abstract translation: 一种制造半导体芯片的方法,该方法包括在器件晶片(1)的有源表面(13)的外部区域上提供粘合剂层(6)的步骤。 接下来,通过粘合剂层(6)将刚体(3)附接到装置晶片(1)的有源表面(13)。 之后,通过处理与有源表面(13)相对的器件晶片(1)的被动表面,使器件晶片(1)变薄。 之后,第一背衬带(21,23)连接到器件晶片(1)的被动表面。 然后,刚性体(3)的外部(32)与刚体(3)的中心部分(33)分离。 另外,器件晶片(1)的外部部分(12)与器件晶片(1)的中心部分(14)分离。 此后,刚性体(3)的中心部分(33)从第一背衬带(21,23)移除。 接下来,从第一背衬带(21,23)移除装置晶片(1)的外部部分(12)和刚体(3)的外部部分(32)。 之后,将器件晶片(1)切成半导体芯片。

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