Method for determining a mathematical model of the electric behavior of a PN junction diode, and corresponding device
    453.
    发明授权
    Method for determining a mathematical model of the electric behavior of a PN junction diode, and corresponding device 有权
    用于确定PN结二极管的电气行为的数学模型的方法及其相应的装置

    公开(公告)号:US09268743B2

    公开(公告)日:2016-02-23

    申请号:US13949884

    申请日:2013-07-24

    CPC classification number: G06F17/10 G06F17/5036

    Abstract: The electric behavior of a reverse-biased PN junction diode is modeled by measuring the value of voltage V present across the diode and the value of the corresponding current I running through this diode, the voltage V varying within a range of values including the value of diode breakdown voltage. A representation of a function ln ⁡ ( I - I s ) according to voltage V is established from the measured values of current I and of voltage V, IS being the saturation current of the diode. A linear function representative of a substantially linear portion of the function, characterized by voltages V greater than breakdown voltage VBK in terms of absolute value, is determined. An avalanche multiplication factor MM is then calculated by MM = 1 + ⅇ ( - slbv · V + bv bv ) , with parameter slbv equal to the ordinate at the origin of the linear function, and parameter slbv/bv equal to the slope of the linear function.

    Abstract translation: 反向偏置PN结二极管的电气行为通过测量二极管上存在的电压V的值和通过该二极管的相应电流I的值来建模,电压V在包括的值的范围内变化 二极管击穿电压。 根据电压I和电压V的测量值建立函数ln⁡(I-I s)的表示,IS是二极管的饱和电流。 确定表示功能的基本线性部分的线性函数,其特征在于以绝对值计的大于击穿电压VBK的电压V。 然后通过MM = 1 +ⅇ( - slbv·V + bv bv)计算雪崩倍增因子MM,参数slbv等于线性函数原点的纵坐标,参数slbv / bv等于 线性函数。

    Method for manufacturing a vertical bipolar transistor compatible with CMOS manufacturing methods
    456.
    发明授权
    Method for manufacturing a vertical bipolar transistor compatible with CMOS manufacturing methods 有权
    制造与CMOS制造方法兼容的垂直双极晶体管的方法

    公开(公告)号:US09257526B2

    公开(公告)日:2016-02-09

    申请号:US14313836

    申请日:2014-06-24

    Inventor: Pierre Boulenc

    Abstract: The present disclosure relates to a method for manufacturing a bipolar transistor. The method forms a trench to isolate a first region from a second region in a semiconductor wafer, and to isolate these regions from the rest of the wafer. The method forms first P-doped well in the second region and produces a collector region of second and third wells by a P doping in the first region. The second well is in contact with the first well below the trench. The method also produces an N-doped base well on the collector region and, at the wafer surface, and forms a CMOS transistor gate on the first region and delimiting a third region and a fourth region. The method also forms a P+-doped collector contact region in the first well, forms a P+ doped emitter region in the third region, and forms an N+-doped base contact region in the fourth region.

    Abstract translation: 本公开涉及一种用于制造双极晶体管的方法。 该方法形成沟槽以将第一区域与半导体晶片中的第二区域隔离,并将这些区域与晶片的其余部分隔离。 该方法在第二区域中形成第一P掺杂阱,并且在第一区域中通过P掺杂产生第二阱和第三阱的集电极区。 第二个井与沟槽下面的第一个井接触。 该方法还在集电极区域和晶片表面上产生N掺杂的基极阱,并在第一区域上形成CMOS晶体管栅极并限定第三区域和第四区域。 该方法还在第一阱中形成P +掺杂的集电极接触区,在第三区中形成P +掺杂的发射极区,并在第四区中形成N +掺杂的基极接触区。

    METHOD FOR PROCESSING SIGNALS ORIGINATING FROM ONE OR MORE SENSORS, IN PARTICULAR PROXIMITY SENSORS, FOR THE RECOGNITION OF A MOVEMENT OF AN OBJECT AND CORRESPONDING DEVICE
    457.
    发明申请
    METHOD FOR PROCESSING SIGNALS ORIGINATING FROM ONE OR MORE SENSORS, IN PARTICULAR PROXIMITY SENSORS, FOR THE RECOGNITION OF A MOVEMENT OF AN OBJECT AND CORRESPONDING DEVICE 审中-公开
    用于处理来自一个或多个传感器,特定接近传感器的信号的识别方法,用于识别对象和对应设备的运动

    公开(公告)号:US20160033260A1

    公开(公告)日:2016-02-04

    申请号:US14661907

    申请日:2015-03-18

    Abstract: The method for processing signals originating for example from several proximity sensors for the recognition of a movement of an object, comprises first respective samplings of the said signals delivered by the sensors so as to obtain a first set of first date-stamped samples, the generation, from the first set of first date-stamped samples, of new sampling times comprising a start of movement time, an end of movement time, and times regularly spaced between the start of movement time and the end of movement time, a re-sampling of the signal delivered by each sensor between the start of movement time and the end of movement time at the said new sampling times using the first samples, in such a manner as to generate a second set of second date-stamped samples, and a processing of the said second set of date-stamped samples by a movement recognition algorithm.

    Abstract translation: 用于处理例如来自几个接近传感器的信号的方法,用于识别物体的移动,包括由传感器传送的所述信号的第一个相应采样,以便获得第一组初始加盖日期的采样, 从第一组初始日期标记的样本中,包括移动时间的开始,移动时间结束以及移动时间开始与移动时间结束之间规则间隔的时间的新采样时间,重新采样 在使用第一采样的所述新采样时间之间,在移动时间开始和移动时间结束之间由每个传感器传送的信号以产生第二组第二日期戳样本的方式,以及处理 的所述第二组日期戳样本通过运动识别算法。

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