Stack structure of semiconductor packages and method for fabricating the stack structure
    51.
    发明授权
    Stack structure of semiconductor packages and method for fabricating the stack structure 有权
    半导体封装的堆叠结构和制造堆叠结构的方法

    公开(公告)号:US07855443B2

    公开(公告)日:2010-12-21

    申请号:US11732853

    申请日:2007-04-04

    IPC分类号: H01L23/02

    摘要: A stack structure of semiconductor packages and a method for fabricating the stack structure are provided. A plurality of electrical connection pads and dummy pads are formed on a surface of a substrate of an upper semiconductor package and at positions corresponding to those around an encapsulant of a lower semiconductor package. Solder balls are implanted to the electrical connection pads and the dummy pads. The upper semiconductor package is mounted on the lower semiconductor package. The upper semiconductor package is electrically connected to the lower semiconductor package by the solder balls implanted to the electrical connection pads, and the encapsulant of the lower semiconductor package is surrounded and confined by the solder balls implanted to the dummy pads. Thereby, the upper semiconductor package is properly and securely positioned on the lower semiconductor package, without the occurrence of misalignment between the upper and lower semiconductor packages.

    摘要翻译: 提供半导体封装的堆叠结构以及制造叠层结构的方法。 在上半导体封装的衬底的表面上和与下半导体封装的密封剂周围的位置对应的位置处形成多个电连接焊盘和虚拟焊盘。 将焊球植入电连接焊盘和虚拟焊盘。 上半导体封装安装在下半导体封装上。 上半导体封装通过注入电连接焊盘的焊球电连接到下半导体封装,并且下半导体封装的密封剂被植入到虚拟焊盘中的焊球围绕并限制。 因此,上半导体封装被适当且牢固地定位在下半导体封装上,而不会发生上下半导体封装之间的未对准。

    Method of underfilling a flip-chip semiconductor device
    54.
    发明授权
    Method of underfilling a flip-chip semiconductor device 失效
    倒装芯片半导体器件底部填充方法

    公开(公告)号:US06498054B1

    公开(公告)日:2002-12-24

    申请号:US09585964

    申请日:2000-06-02

    IPC分类号: H01L2144

    摘要: A flip-chip underfill method is proposed for the purpose of underfilling a gap formed beneath a semiconductor chip mounted in a flip-chip manner over an underlying surface. The flip-chip underfill method comprises the following procedural steps of: preparing a dispensing needle having an outlet; then, moving the dispensing needle in such a manner as to position the outlet thereof at a corner point between the upper surface and the sidewall of the semiconductor chip; and finally injecting resin at the targeted corner point, which allows the injected resin from the outlet of the dispensing needle to flow down along the sidewall of the semiconductor chip to the edge of the lower surface of the semiconductor chip and subsequently fill into the gap through capillary action. This flip-chip underfill method is more advantageous to use than the prior art since it allows the dispensing needle to be unobstructed by any gold wires or passive components mounted beside the chip and also allows the injected resin to be substantially confined to the targeted area beneath the chip without being wasted.

    摘要翻译: 提出了一种倒装底层填充方法,其目的在于在底层表面上以倒装芯片的方式填充形成在半导体芯片下面的间隙。 倒装底层填充方法包括以下步骤:准备具有出口的分配针; 然后,以将出口定位在半导体芯片的上表面和侧壁之间的角点处的方式移动分配针; 并且最终在目标角点注入树脂,这允许来自分配针的出口的注入的树脂沿着半导体芯片的侧壁向下流到半导体芯片的下表面的边缘,随后填充到间隙中 毛细作用。 这种倒装底层填充方法比现有技术更有利于使用,因为其允许分配针由安装在芯片旁边的任何金线或无源元件不受阻碍,并且还允许注入的树脂基本上限制在下面的目标区域 芯片不被浪费。

    Method and system of testing a semiconductor device
    58.
    发明授权
    Method and system of testing a semiconductor device 有权
    测试半导体器件的方法和系统

    公开(公告)号:US08400178B2

    公开(公告)日:2013-03-19

    申请号:US12431927

    申请日:2009-04-29

    IPC分类号: G01R31/02

    摘要: The present disclosure provides a semiconductor device, the device includes a substrate, a front-end structure formed in the substrate, a back-end structure formed on the front-end structure, a heater embedded in the back-end structure and operable to generate heat, and a sensor embedded in the back-end structure and operable to sense a temperature of the semiconductor device.

    摘要翻译: 本公开提供一种半导体器件,该器件包括衬底,形成在衬底中的前端结构,形成在前端结构上的后端结构,嵌入在后端结构中的加热器,可操作以产生 热和嵌入在后端结构中的传感器,并且可操作以感测半导体器件的温度。

    METHOD FOR FABRICATING STACK STRUCTURE OF SEMICONDUCTOR PACKAGES
    60.
    发明申请
    METHOD FOR FABRICATING STACK STRUCTURE OF SEMICONDUCTOR PACKAGES 有权
    用于制作半导体封装的堆叠结构的方法

    公开(公告)号:US20110070697A1

    公开(公告)日:2011-03-24

    申请号:US12955256

    申请日:2010-11-29

    IPC分类号: H01L21/48

    摘要: A stack structure of semiconductor packages and a method for fabricating the stack structure are provided. A plurality of electrical connection pads and dummy pads are formed on a surface of a substrate of an upper semiconductor package and at positions corresponding to those around an encapsulant of a lower semiconductor package. Solder balls are implanted to the electrical connection pads and the dummy pads. The upper semiconductor package is mounted on the lower semiconductor package. The upper semiconductor package is electrically connected to the lower semiconductor package by the solder balls implanted to the electrical connection pads, and the encapsulant of the lower semiconductor package is surrounded and confined by the solder balls implanted to the dummy pads. Thereby, the upper semiconductor package is properly and securely positioned on the lower semiconductor package, without the occurrence of misalignment between the upper and lower semiconductor packages.

    摘要翻译: 提供半导体封装的堆叠结构以及制造叠层结构的方法。 在上半导体封装的衬底的表面上和与下半导体封装的密封剂周围的位置相对应的位置处形成多个电连接焊盘和虚拟焊盘。 将焊球植入电连接焊盘和虚拟焊盘。 上半导体封装安装在下半导体封装上。 上半导体封装通过注入电连接焊盘的焊球电连接到下半导体封装,并且下半导体封装的密封剂被植入到虚拟焊盘中的焊球围绕并限制。 因此,上半导体封装被适当且牢固地定位在下半导体封装上,而不会发生上下半导体封装之间的未对准。