公开(公告)号：US20140361420A1

公开(公告)日：2014-12-11

申请号：US13913770

申请日：2013-06-10

申请人： Hamza Yilmaz ,  Yan Xun Xue ,  Jun Lu ,  Peter Wilson ,  Yan Huo ,  Zhiqiang Niu ,  Ming-Chen Lu

发明人： Hamza Yilmaz ,  Yan Xun Xue ,  Jun Lu ,  Peter Wilson ,  Yan Huo ,  Zhiqiang Niu ,  Ming-Chen Lu

IPC分类号： H01L23/495

CPC分类号： H01L23/49568 ,  H01L21/4825 ,  H01L21/561 ,  H01L21/565 ,  H01L21/768 ,  H01L21/78 ,  H01L23/3107 ,  H01L23/3114 ,  H01L23/49503 ,  H01L23/4952 ,  H01L23/49524 ,  H01L23/49537 ,  H01L23/49541 ,  H01L23/49555 ,  H01L23/49562 ,  H01L23/49575 ,  H01L23/544 ,  H01L24/40 ,  H01L24/41 ,  H01L24/83 ,  H01L25/0655 ,  H01L25/50 ,  H01L2223/5446 ,  H01L2224/0401 ,  H01L2224/04026 ,  H01L2224/06181 ,  H01L2224/32245 ,  H01L2224/40095 ,  H01L2224/40137 ,  H01L2224/40139 ,  H01L2224/40245 ,  H01L2224/4103 ,  H01L2224/48091 ,  H01L2224/48465 ,  H01L2224/73104 ,  H01L2224/73221 ,  H01L2224/83801 ,  H01L2224/8385 ,  H01L2224/83851 ,  H01L2224/84801 ,  H01L2224/94 ,  H01L2924/00014 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2224/11 ,  H01L2224/03 ,  H01L2224/27 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2224/45099

摘要： A hybrid packaging multi-chip semiconductor device comprises a lead frame unit, a first semiconductor chip, a second semiconductor chip, a first interconnecting structure and a second interconnecting structure, wherein the first semiconductor chip is attached on a first die paddle and the second semiconductor chip is flipped and attached on a third pin and a second die paddle, the first interconnecting structure electrically connecting a first electrode at a front surface of the first semiconductor chip and a third electrode at a back surface of the second semiconductor chip and a second electrode at the front surface of the first semiconductor chip is electrically connected by second interconnecting structure.

摘要翻译： 一种混合封装多芯片半导体器件，包括引线框单元，第一半导体芯片，第二半导体芯片，第一互连结构和第二互连结构，其中第一半导体芯片附接在第一裸片上，第二半导体 芯片被翻转并附接在第三引脚和第二管芯焊盘上，第一互连结构电连接第一半导体芯片的前表面处的第一电极和第二半导体芯片的后表面处的第三电极和第二电极 在第一半导体芯片的前表面通过第二互连结构电连接。

公开(公告)号：US08703545B2

公开(公告)日：2014-04-22

申请号：US13408185

申请日：2012-02-29

申请人： Zhiqiang Niu ,  Ming-Chen Lu ,  Yan Xun Xue ,  Yan Huo ,  Hua Pan ,  Guo Feng Lian ,  Jun Lu

发明人： Zhiqiang Niu ,  Ming-Chen Lu ,  Yan Xun Xue ,  Yan Huo ,  Hua Pan ,  Guo Feng Lian ,  Jun Lu

IPC分类号： H01L21/56 ,  H01L23/495

CPC分类号： H01L23/3107 ,  H01L21/565 ,  H01L23/49562 ,  H01L23/49575 ,  H01L23/49582 ,  H01L24/73 ,  H01L2224/0603 ,  H01L2224/32245 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/49111 ,  H01L2224/73265 ,  H01L2924/13091 ,  H01L2924/15724 ,  H01L2924/181 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2924/00014

摘要： A semiconductor package is provided with an Aluminum alloy lead-frame without noble metal plated on the Aluminum base lead-frame. Aluminum alloy material with proper alloy composition and ratio for making an aluminum alloy lead-frame is provided. The aluminum alloy lead-frame is electroplated with a first metal electroplating layer, a second electroplating layer and a third electroplating layer in a sequence. The lead-frame electroplated with the first, second and third metal electroplating layers is then used in the fabrication process of a power semiconductor package including chip connecting, wire bonding, and plastic molding. After the molding process, the area of the lead-frame not covered by the molding compound is electroplated with a fourth metal electroplating layer that is not easy to be oxidized when exposing to air.

摘要翻译： 半导体封装设置有没有贵金属的铝合金引线框架，镀在铝基底引线框架上。 提供具有适当的合金组成和制造铝合金引线框架的比例的铝合金材料。 铝合金引线框架依次电镀有第一金属电镀层，第二电镀层和第三电镀层。 然后，利用第一，第二和第三金属电镀层电镀的引线框架用于包括芯片连接，引线接合和塑性模制的功率半导体封装的制造过程中。 在模制过程之后，未被模塑料覆盖的引线框架的区域用暴露于空气中不容易氧化的第四金属电镀层电镀。

公开(公告)号：US09054091B2

公开(公告)日：2015-06-09

申请号：US13913770

申请日：2013-06-10

申请人： Hamza Yilmaz ,  Yan Xun Xue ,  Jun Lu ,  Peter Wilson ,  Yan Huo ,  Zhiqiang Niu ,  Ming-Chen Lu

发明人： Hamza Yilmaz ,  Yan Xun Xue ,  Jun Lu ,  Peter Wilson ,  Yan Huo ,  Zhiqiang Niu ,  Ming-Chen Lu

IPC分类号： H01L23/495 ,  H01L23/48 ,  H01L23/52 ,  H01L23/02 ,  H01L23/34 ,  H01L23/00 ,  H01L23/31 ,  H01L21/56

CPC分类号： H01L23/49568 ,  H01L21/4825 ,  H01L21/561 ,  H01L21/565 ,  H01L21/768 ,  H01L21/78 ,  H01L23/3107 ,  H01L23/3114 ,  H01L23/49503 ,  H01L23/4952 ,  H01L23/49524 ,  H01L23/49537 ,  H01L23/49541 ,  H01L23/49555 ,  H01L23/49562 ,  H01L23/49575 ,  H01L23/544 ,  H01L24/40 ,  H01L24/41 ,  H01L24/83 ,  H01L25/0655 ,  H01L25/50 ,  H01L2223/5446 ,  H01L2224/0401 ,  H01L2224/04026 ,  H01L2224/06181 ,  H01L2224/32245 ,  H01L2224/40095 ,  H01L2224/40137 ,  H01L2224/40139 ,  H01L2224/40245 ,  H01L2224/4103 ,  H01L2224/48091 ,  H01L2224/48465 ,  H01L2224/73104 ,  H01L2224/73221 ,  H01L2224/83801 ,  H01L2224/8385 ,  H01L2224/83851 ,  H01L2224/84801 ,  H01L2224/94 ,  H01L2924/00014 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2224/11 ,  H01L2224/03 ,  H01L2224/27 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2224/45099

摘要： A hybrid packaging multi-chip semiconductor device comprises a lead frame unit, a first semiconductor chip, a second semiconductor chip, a first interconnecting structure and a second interconnecting structure, wherein the first semiconductor chip is attached on a first die paddle and the second semiconductor chip is flipped and attached on a third pin and a second die paddle, the first interconnecting structure electrically connecting a first electrode at a front surface of the first semiconductor chip and a third electrode at a back surface of the second semiconductor chip and a second electrode at the front surface of the first semiconductor chip is electrically connected by second interconnecting structure.

摘要翻译： 一种混合封装多芯片半导体器件，包括引线框单元，第一半导体芯片，第二半导体芯片，第一互连结构和第二互连结构，其中第一半导体芯片附接在第一裸片上，第二半导体 芯片被翻转并附接在第三引脚和第二管芯焊盘上，第一互连结构电连接第一半导体芯片的前表面处的第一电极和第二半导体芯片的后表面处的第三电极和第二电极 在第一半导体芯片的前表面通过第二互连结构电连接。

公开(公告)号：US20130221507A1

公开(公告)日：2013-08-29

申请号：US13408185

申请日：2012-02-29

申请人： Zhiqiang Niu ,  Ming-Chen Lu ,  Yan Xun Xue ,  Yan Huo ,  Hua Pan ,  Guo Feng Lian ,  Jun Lu

发明人： Zhiqiang Niu ,  Ming-Chen Lu ,  Yan Xun Xue ,  Yan Huo ,  Hua Pan ,  Guo Feng Lian ,  Jun Lu

IPC分类号： H01L23/495 ,  H01L21/56

CPC分类号： H01L23/3107 ,  H01L21/565 ,  H01L23/49562 ,  H01L23/49575 ,  H01L23/49582 ,  H01L24/73 ,  H01L2224/0603 ,  H01L2224/32245 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/49111 ,  H01L2224/73265 ,  H01L2924/13091 ,  H01L2924/15724 ,  H01L2924/181 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2924/00014

摘要： A semiconductor package is provided with an Aluminum alloy lead-frame without noble metal plated on the Aluminum base lead-frame. Aluminum alloy material with proper alloy composition and ratio for making an aluminum alloy lead-frame is provided. The aluminum alloy lead-frame is electroplated with a first metal electroplating layer, a second electroplating layer and a third electroplating layer in a sequence. The lead-frame electroplated with the first, second and third metal electroplating layers is then used in the fabrication process of a power semiconductor package including chip connecting, wire bonding, and plastic molding. After the molding process, the area of the lead-frame not covered by the molding compound is electroplated with a fourth metal electroplating layer that is not easy to be oxidized when exposing to air.

摘要翻译： 半导体封装设置有没有贵金属的铝合金引线框架，镀在铝基底引线框架上。 提供具有适当的合金组成和制造铝合金引线框架的比例的铝合金材料。 铝合金引线框架依次电镀有第一金属电镀层，第二电镀层和第三电镀层。 然后，利用第一，第二和第三金属电镀层电镀的引线框架用于包括芯片连接，引线接合和塑性模制的功率半导体封装的制造过程中。 在模制过程之后，未被模塑料覆盖的引线框架的区域用暴露于空气中不容易氧化的第四金属电镀层电镀。

公开(公告)号：US20120104580A1

公开(公告)日：2012-05-03

申请号：US12916086

申请日：2010-10-29

申请人： Tao Feng ,  Zhiqiang Niu ,  Yuping Gong ,  Ruisheng Wu ,  Ping Huang ,  Lei Shi ,  Yueh-Se Ho

发明人： Tao Feng ,  Zhiqiang Niu ,  Yuping Gong ,  Ruisheng Wu ,  Ping Huang ,  Lei Shi ,  Yueh-Se Ho

IPC分类号： H01L23/495 ,  H01L23/498

CPC分类号： H01L21/6836 ,  H01L21/56 ,  H01L21/561 ,  H01L21/563 ,  H01L21/565 ,  H01L21/6835 ,  H01L21/76897 ,  H01L21/78 ,  H01L23/3114 ,  H01L23/481 ,  H01L23/495 ,  H01L23/49524 ,  H01L23/49537 ,  H01L23/49562 ,  H01L23/49575 ,  H01L24/05 ,  H01L24/06 ,  H01L24/11 ,  H01L24/14 ,  H01L24/16 ,  H01L24/29 ,  H01L24/32 ,  H01L24/34 ,  H01L24/36 ,  H01L24/40 ,  H01L24/73 ,  H01L24/94 ,  H01L25/50 ,  H01L27/088 ,  H01L29/0657 ,  H01L29/7827 ,  H01L2221/68327 ,  H01L2221/6834 ,  H01L2221/68359 ,  H01L2221/68381 ,  H01L2224/0401 ,  H01L2224/04026 ,  H01L2224/04034 ,  H01L2224/05009 ,  H01L2224/05025 ,  H01L2224/051 ,  H01L2224/05139 ,  H01L2224/05155 ,  H01L2224/05166 ,  H01L2224/05571 ,  H01L2224/0603 ,  H01L2224/0616 ,  H01L2224/06181 ,  H01L2224/1184 ,  H01L2224/16245 ,  H01L2224/291 ,  H01L2224/32245 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/40247 ,  H01L2224/73253 ,  H01L2224/73255 ,  H01L2224/73263 ,  H01L2224/83801 ,  H01L2224/84801 ,  H01L2224/94 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01074 ,  H01L2924/01075 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/10155 ,  H01L2924/10253 ,  H01L2924/12042 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/14 ,  H01L2924/181 ,  H01L2924/2064 ,  H01L2924/3511 ,  H01L2224/03 ,  H01L2924/00 ,  H01L2224/05552 ,  H01L2924/00012 ,  H01L2224/37099

摘要： A substrate-less composite power semiconductor device may include a thin substrate and a top metal layer located on a top surface of the substrate. A total thickness of the substrate and the epitaxial layer may be less than 25 microns. Solder bumps are formed on top of the top metal layer and molding compound surrounds the solder bumps and leaves the solder bumps at least partly exposed.

摘要翻译： 无基底复合功率半导体器件可以包括薄衬底和位于衬底顶表面上的顶金属层。 衬底和外延层的总厚度可以小于25微米。 焊料凸块形成在顶部金属层的顶部，并且模塑料围绕焊料凸起并且使焊料凸块至少部分暴露。

公开(公告)号：US20140175628A1

公开(公告)日：2014-06-26

申请号：US13724006

申请日：2012-12-21

申请人： Hua Pan ,  Yueh-Se Ho ,  Jun Lu ,  Ming-Chen Lu ,  Zhiqiang Niu

发明人： Hua Pan ,  Yueh-Se Ho ,  Jun Lu ,  Ming-Chen Lu ,  Zhiqiang Niu

IPC分类号： H01L23/495 ,  H01L23/00

CPC分类号： H01L24/97 ,  H01L23/3107 ,  H01L23/3171 ,  H01L23/49524 ,  H01L23/49548 ,  H01L23/49562 ,  H01L24/03 ,  H01L24/05 ,  H01L24/29 ,  H01L24/32 ,  H01L24/37 ,  H01L24/40 ,  H01L24/45 ,  H01L24/48 ,  H01L24/73 ,  H01L24/83 ,  H01L24/84 ,  H01L24/85 ,  H01L24/92 ,  H01L24/94 ,  H01L2224/02166 ,  H01L2224/03464 ,  H01L2224/04042 ,  H01L2224/05082 ,  H01L2224/05124 ,  H01L2224/05155 ,  H01L2224/05647 ,  H01L2224/0603 ,  H01L2224/291 ,  H01L2224/32245 ,  H01L2224/37147 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/40479 ,  H01L2224/4048 ,  H01L2224/40499 ,  H01L2224/45015 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/48245 ,  H01L2224/48247 ,  H01L2224/48465 ,  H01L2224/48482 ,  H01L2224/48499 ,  H01L2224/48647 ,  H01L2224/48847 ,  H01L2224/73215 ,  H01L2224/73221 ,  H01L2224/73263 ,  H01L2224/73265 ,  H01L2224/83191 ,  H01L2224/83801 ,  H01L2224/83815 ,  H01L2224/8391 ,  H01L2224/84801 ,  H01L2224/84815 ,  H01L2224/8491 ,  H01L2224/92 ,  H01L2224/92142 ,  H01L2224/92147 ,  H01L2224/92157 ,  H01L2224/9221 ,  H01L2224/92242 ,  H01L2224/92246 ,  H01L2224/94 ,  H01L2224/97 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/386 ,  H01L2924/00 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2224/05644 ,  H01L2924/01079 ,  H01L2224/03 ,  H01L21/78 ,  H01L2224/83 ,  H01L2224/84 ,  H01L2224/85 ,  H01L2924/20752 ,  H01L2924/20753 ,  H01L2924/20755 ,  H01L2924/2075 ,  H01L2924/20754 ,  H01L2924/00015 ,  H01L2924/00012

摘要： A semiconductor device comprises a first top electrode and a second top electrode at a front surface of the die, at least a Ni plating layer and an Au plating layer overlaying the Ni plating layer are formed on each of the first top electrode and the second top electrode. A copper clip attaches on the Au plating layer of the second top electrode. A gold (Au) stud bump is formed on the Au plating layer of the first top electrode with a copper wire connected on the stud bump. The Au stud bump is thicker than a thickness of the Au plating layer and thinner than a thickness of the copper clip to avoid copper wire NSOP (non-stick on pad) problem due to Ni plating layer diffusion during the solder reflow process in the copper clip attachment.

摘要翻译： 半导体器件包括在管芯的前表面处的第一顶电极和第二顶电极，在第一顶电极和第二顶部的每一个上形成至少Ni镀层和覆盖Ni镀层的Au镀层 电极。 铜夹附着在第二顶电极的Au镀层上。 在第一顶电极的Au镀层上形成金（Au）柱凸块，铜柱连接在凸块上。 Au凸块比Au镀层的厚度厚，比铜夹的厚度薄，以避免在铜回焊过程中镀镍层扩散的铜线NSOP（不粘垫）问题 夹子附件。

公开(公告)号：US08987878B2

公开(公告)日：2015-03-24

申请号：US12916086

申请日：2010-10-29

申请人： Tao Feng ,  Zhiqiang Niu ,  Yuping Gong ,  Ruisheng Wu ,  Ping Huang ,  Lei Shi ,  Yueh-Se Ho

发明人： Tao Feng ,  Zhiqiang Niu ,  Yuping Gong ,  Ruisheng Wu ,  Ping Huang ,  Lei Shi ,  Yueh-Se Ho

IPC分类号： H01L23/495 ,  H01L21/683 ,  H01L21/56 ,  H01L23/31 ,  H01L23/48 ,  H01L23/00 ,  H01L29/06

CPC分类号： H01L21/6836 ,  H01L21/56 ,  H01L21/561 ,  H01L21/563 ,  H01L21/565 ,  H01L21/6835 ,  H01L21/76897 ,  H01L21/78 ,  H01L23/3114 ,  H01L23/481 ,  H01L23/495 ,  H01L23/49524 ,  H01L23/49537 ,  H01L23/49562 ,  H01L23/49575 ,  H01L24/05 ,  H01L24/06 ,  H01L24/11 ,  H01L24/14 ,  H01L24/16 ,  H01L24/29 ,  H01L24/32 ,  H01L24/34 ,  H01L24/36 ,  H01L24/40 ,  H01L24/73 ,  H01L24/94 ,  H01L25/50 ,  H01L27/088 ,  H01L29/0657 ,  H01L29/7827 ,  H01L2221/68327 ,  H01L2221/6834 ,  H01L2221/68359 ,  H01L2221/68381 ,  H01L2224/0401 ,  H01L2224/04026 ,  H01L2224/04034 ,  H01L2224/05009 ,  H01L2224/05025 ,  H01L2224/051 ,  H01L2224/05139 ,  H01L2224/05155 ,  H01L2224/05166 ,  H01L2224/05571 ,  H01L2224/0603 ,  H01L2224/0616 ,  H01L2224/06181 ,  H01L2224/1184 ,  H01L2224/16245 ,  H01L2224/291 ,  H01L2224/32245 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/40247 ,  H01L2224/73253 ,  H01L2224/73255 ,  H01L2224/73263 ,  H01L2224/83801 ,  H01L2224/84801 ,  H01L2224/94 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01074 ,  H01L2924/01075 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/10155 ,  H01L2924/10253 ,  H01L2924/12042 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/14 ,  H01L2924/181 ,  H01L2924/2064 ,  H01L2924/3511 ,  H01L2224/03 ,  H01L2924/00 ,  H01L2224/05552 ,  H01L2924/00012 ,  H01L2224/37099

摘要： A substrate-less composite power semiconductor device may include a thin substrate and a top metal layer located on a top surface of the substrate. A total thickness of the substrate and the epitaxial layer may be less than 25 microns. Solder bumps are formed on top of the top metal layer and molding compound surrounds the solder bumps and leaves the solder bumps at least partly exposed.

摘要翻译： 无基底复合功率半导体器件可以包括薄衬底和位于衬底顶表面上的顶金属层。 衬底和外延层的总厚度可以小于25微米。 焊料凸块形成在顶部金属层的顶部，并且模塑料围绕焊料凸起并且使焊料凸块至少部分暴露。