公开(公告)号：US20140175628A1

公开(公告)日：2014-06-26

申请号：US13724006

申请日：2012-12-21

申请人： Hua Pan ,  Yueh-Se Ho ,  Jun Lu ,  Ming-Chen Lu ,  Zhiqiang Niu

发明人： Hua Pan ,  Yueh-Se Ho ,  Jun Lu ,  Ming-Chen Lu ,  Zhiqiang Niu

IPC分类号： H01L23/495 ,  H01L23/00

CPC分类号： H01L24/97 ,  H01L23/3107 ,  H01L23/3171 ,  H01L23/49524 ,  H01L23/49548 ,  H01L23/49562 ,  H01L24/03 ,  H01L24/05 ,  H01L24/29 ,  H01L24/32 ,  H01L24/37 ,  H01L24/40 ,  H01L24/45 ,  H01L24/48 ,  H01L24/73 ,  H01L24/83 ,  H01L24/84 ,  H01L24/85 ,  H01L24/92 ,  H01L24/94 ,  H01L2224/02166 ,  H01L2224/03464 ,  H01L2224/04042 ,  H01L2224/05082 ,  H01L2224/05124 ,  H01L2224/05155 ,  H01L2224/05647 ,  H01L2224/0603 ,  H01L2224/291 ,  H01L2224/32245 ,  H01L2224/37147 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/40479 ,  H01L2224/4048 ,  H01L2224/40499 ,  H01L2224/45015 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/48245 ,  H01L2224/48247 ,  H01L2224/48465 ,  H01L2224/48482 ,  H01L2224/48499 ,  H01L2224/48647 ,  H01L2224/48847 ,  H01L2224/73215 ,  H01L2224/73221 ,  H01L2224/73263 ,  H01L2224/73265 ,  H01L2224/83191 ,  H01L2224/83801 ,  H01L2224/83815 ,  H01L2224/8391 ,  H01L2224/84801 ,  H01L2224/84815 ,  H01L2224/8491 ,  H01L2224/92 ,  H01L2224/92142 ,  H01L2224/92147 ,  H01L2224/92157 ,  H01L2224/9221 ,  H01L2224/92242 ,  H01L2224/92246 ,  H01L2224/94 ,  H01L2224/97 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/386 ,  H01L2924/00 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2224/05644 ,  H01L2924/01079 ,  H01L2224/03 ,  H01L21/78 ,  H01L2224/83 ,  H01L2224/84 ,  H01L2224/85 ,  H01L2924/20752 ,  H01L2924/20753 ,  H01L2924/20755 ,  H01L2924/2075 ,  H01L2924/20754 ,  H01L2924/00015 ,  H01L2924/00012

摘要： A semiconductor device comprises a first top electrode and a second top electrode at a front surface of the die, at least a Ni plating layer and an Au plating layer overlaying the Ni plating layer are formed on each of the first top electrode and the second top electrode. A copper clip attaches on the Au plating layer of the second top electrode. A gold (Au) stud bump is formed on the Au plating layer of the first top electrode with a copper wire connected on the stud bump. The Au stud bump is thicker than a thickness of the Au plating layer and thinner than a thickness of the copper clip to avoid copper wire NSOP (non-stick on pad) problem due to Ni plating layer diffusion during the solder reflow process in the copper clip attachment.

摘要翻译： 半导体器件包括在管芯的前表面处的第一顶电极和第二顶电极，在第一顶电极和第二顶部的每一个上形成至少Ni镀层和覆盖Ni镀层的Au镀层 电极。 铜夹附着在第二顶电极的Au镀层上。 在第一顶电极的Au镀层上形成金（Au）柱凸块，铜柱连接在凸块上。 Au凸块比Au镀层的厚度厚，比铜夹的厚度薄，以避免在铜回焊过程中镀镍层扩散的铜线NSOP（不粘垫）问题 夹子附件。

公开(公告)号：US20130130443A1

公开(公告)日：2013-05-23

申请号：US13302219

申请日：2011-11-22

申请人： Jun Lu ,  Alex Niu ,  Yueh-Se Ho ,  Ping Huang ,  Jacky Gong ,  Yan Xun Xue ,  Xiaotian Zhang ,  Ming-Chen Lu

发明人： Jun Lu ,  Alex Niu ,  Yueh-Se Ho ,  Ping Huang ,  Jacky Gong ,  Yan Xun Xue ,  Xiaotian Zhang ,  Ming-Chen Lu

IPC分类号： H01L21/78

CPC分类号： H01L21/561 ,  H01L21/566 ,  H01L21/568 ,  H01L23/3157 ,  H01L23/49524 ,  H01L23/49562 ,  H01L24/03 ,  H01L24/05 ,  H01L24/06 ,  H01L2224/03009 ,  H01L2224/0332 ,  H01L2224/0384 ,  H01L2224/03848 ,  H01L2224/03849 ,  H01L2224/04034 ,  H01L2224/05553 ,  H01L2224/05554 ,  H01L2224/05794 ,  H01L2224/058 ,  H01L2224/0603 ,  H01L2224/06051 ,  H01L2224/06135 ,  H01L2224/06164 ,  H01L2224/06181 ,  H01L2224/32245 ,  H01L2224/371 ,  H01L2224/40247 ,  H01L2224/73263 ,  H01L2224/84801 ,  H01L2224/94 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2224/03 ,  H01L2224/053 ,  H01L2924/014 ,  H01L2924/00

摘要： The invention generally relates to a packaging method of an ultra-thin chip, more specifically, the invention relates to a method for packaging the ultra-thin chip with solder ball thermo-compression in wafer level packaging process. The method starts with disposing solder balls on metal pads arranged on the front surface of semiconductor chips that are formed at the front surface of a semiconductor wafer. The solder balls are soften by heating the wafer, a compression plate is applied with a pressure on the top ends of the solder balls thus forming a co-planar top surface at the top ends of the solder balls. A molding compound is deposited on the front surface of the wafer with the top ends of the solder balls exposed. The wafer is then ground from its back surface to reduce its thickness to achieve ultra-thin chip.

摘要翻译： 本发明一般涉及超薄芯片的封装方法，更具体地说，本发明涉及一种用于在晶片级封装工艺中封装具有焊球热压缩的超薄芯片的方法。 该方法开始于将焊球设置在形成在半导体晶片的前表面的半导体芯片的前表面上的金属焊盘上。 通过加热晶片来软化焊球，压力板在焊球的顶端施加压力，从而在焊球的顶端形成共面顶表面。 模具化合物沉积在晶片的前表面上，其中焊球的顶端被暴露。 然后将晶片从其背面研磨以减小其厚度以实现超薄芯片。

公开(公告)号：US08642385B2

公开(公告)日：2014-02-04

申请号：US13205864

申请日：2011-08-09

申请人： Yan Xun Xue ,  Ping Huang ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu ,  Ming-Chen Lu

发明人： Yan Xun Xue ,  Ping Huang ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu ,  Ming-Chen Lu

IPC分类号： H01L23/498 ,  H01L21/78

CPC分类号： H01L21/76898 ,  H01L21/561 ,  H01L21/6836 ,  H01L23/3114 ,  H01L23/3135 ,  H01L23/481 ,  H01L24/03 ,  H01L24/05 ,  H01L24/11 ,  H01L24/13 ,  H01L2221/6834 ,  H01L2221/68359 ,  H01L2221/68377 ,  H01L2224/02166 ,  H01L2224/0401 ,  H01L2224/05548 ,  H01L2224/05554 ,  H01L2224/05571 ,  H01L2224/1184 ,  H01L2224/13009 ,  H01L2224/13022 ,  H01L2224/13024 ,  H01L2224/131 ,  H01L2224/94 ,  H01L2924/00014 ,  H01L2924/12042 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2224/03 ,  H01L2224/11 ,  H01L2924/00012 ,  H01L2924/014 ,  H01L2924/00 ,  H01L2224/05552

摘要： The present invention proposes a package for semiconductor device and the fabrication method for integrally encapsulating a whole semiconductor chip within a molding compound. In the semicondcutor device package, bonding pads distributed on the top of the chip are redistributed into an array of redistributed bonding pads located in an dielectric layer by utilizing the redistribution technique. The electrodes or signal terminals on the top of the semiconductor chip are connected to an electrode metal segment on the bottom of the chip by conductive materials filled in through holes formed in a silicon substrate of a semiconductor wafer. Furthermore, the top molding portion and the bottom molding portion seal the semiconductor chip completely, thus providing optimum mechanical and electrical protections.

摘要翻译： 本发明提出了一种用于半导体器件的封装以及用于将整个半导体芯片整体封装在模塑料中的制造方法。 在半封装器件封装中，通过利用再分配技术，分布在芯片顶部的焊盘重新分布到位于介质层中的再分布焊盘的阵列中。 半导体芯片的顶部上的电极或信号端子通过填充在半导体晶片的硅衬底中形成的通孔中的导电材料连接到芯片底部的电极金属段。 此外，顶部模制部分和底部模制部分完全密封半导体芯片，从而提供最佳的机械和电气保护。

公开(公告)号：US08563417B2

公开(公告)日：2013-10-22

申请号：US13302219

申请日：2011-11-22

申请人： Jun Lu ,  Alex Niu ,  Yueh-Se Ho ,  Ping Hoang ,  Jacky Gong ,  Yan Xun Xue ,  Xiaolian Zhang ,  Ming-Chen Lu

发明人： Jun Lu ,  Alex Niu ,  Yueh-Se Ho ,  Ping Hoang ,  Jacky Gong ,  Yan Xun Xue ,  Xiaolian Zhang ,  Ming-Chen Lu

IPC分类号： H01L21/78

CPC分类号： H01L21/561 ,  H01L21/566 ,  H01L21/568 ,  H01L23/3157 ,  H01L23/49524 ,  H01L23/49562 ,  H01L24/03 ,  H01L24/05 ,  H01L24/06 ,  H01L2224/03009 ,  H01L2224/0332 ,  H01L2224/0384 ,  H01L2224/03848 ,  H01L2224/03849 ,  H01L2224/04034 ,  H01L2224/05553 ,  H01L2224/05554 ,  H01L2224/05794 ,  H01L2224/058 ,  H01L2224/0603 ,  H01L2224/06051 ,  H01L2224/06135 ,  H01L2224/06164 ,  H01L2224/06181 ,  H01L2224/32245 ,  H01L2224/371 ,  H01L2224/40247 ,  H01L2224/73263 ,  H01L2224/84801 ,  H01L2224/94 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2224/03 ,  H01L2224/053 ,  H01L2924/014 ,  H01L2924/00

摘要： The invention generally relates to a packaging method of an ultra-thin chip, more specifically, the invention relates to a method for packaging the ultra-thin chip with solder ball thermo-compression in wafer level packaging process. The method starts with disposing solder balls on metal pads arranged on the front surface of semiconductor chips that are formed at the front surface of a semiconductor wafer. The solder balls are soften by heating the wafer, a compression plate is applied with a pressure on the top ends of the solder balls thus forming a co-planar top surface at the top ends of the solder balls. A molding compound is deposited on the front surface of the wafer with the top ends of the solder balls exposed. The wafer is then ground from its back surface to reduce its thickness to achieve ultra-thin chip.

摘要翻译： 本发明一般涉及超薄芯片的封装方法，更具体地说，本发明涉及一种用于在晶片级封装工艺中封装具有焊球热压缩的超薄芯片的方法。 该方法开始于将焊球设置在形成在半导体晶片的前表面的半导体芯片的前表面上的金属焊盘上。 通过加热晶片来软化焊球，压力板在焊球的顶端施加压力，从而在焊球的顶端形成共面顶表面。 模具化合物沉积在晶片的前表面上，其中焊球的顶端被暴露。 然后将晶片从其背面研磨以减小其厚度以实现超薄芯片。

公开(公告)号：US08952509B1

公开(公告)日：2015-02-10

申请号：US14031283

申请日：2013-09-19

申请人： Hamza Yilmaz ,  Yueh-Se Ho ,  Yan Xun Xue ,  Jun Lu ,  Xiaotian Zhang ,  Zhi Qiang Niu ,  Ming-Chen Lu ,  Liang Zhao ,  YuPing Gong ,  GuoFeng Lian

发明人： Hamza Yilmaz ,  Yueh-Se Ho ,  Yan Xun Xue ,  Jun Lu ,  Xiaotian Zhang ,  Zhi Qiang Niu ,  Ming-Chen Lu ,  Liang Zhao ,  YuPing Gong ,  GuoFeng Lian

IPC分类号： H01L25/07 ,  H01L23/495 ,  H01L25/00

CPC分类号： H01L23/49575 ,  H01L23/3107 ,  H01L23/49524 ,  H01L23/49551 ,  H01L23/49562 ,  H01L24/37 ,  H01L24/40 ,  H01L24/41 ,  H01L2224/37011 ,  H01L2224/371 ,  H01L2224/4007 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/83801 ,  H01L2224/84801 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2924/00014

摘要： The present invention discloses a stacked dual MOSFET package structure and a preparation method thereof. The stacked dual MOSFET package structure comprises a lead frame unit having a die paddle, a first lead and a second lead; a first chip flipped and attached on a top surface of a main paddle of the die paddle; a second chip attached on a bottom surface of the main paddle; and a metal clip mounted on the back of the flipped first chip and electrically connecting an electrode at the back of the first chip to the first lead. A top surface of a metal bump arranged on each electrode at the front of the second chip, a bottom surface of the die pin of the die paddle, a bottom surface of a lead pin of the second lead, and a bottom surface of the first lead are located on the same plane.

摘要翻译： 本发明公开了一种叠层双MOSFET封装结构及其制备方法。 堆叠双MOSFET封装结构包括具有管芯焊盘，第一引线和第二引线的引线框架单元; 第一芯片翻转并附接在模板的主桨的顶表面上; 附接在主桨的底表面上的第二芯片; 以及安装在翻转的第一芯片的背面上并将第一芯片背面的电极电连接到第一引线的金属夹。 布置在第二芯片的前面的每个电极上的金属凸块的顶表面，模板的模具销的底表面，第二引线的引脚的底表面和第一引脚的底表面 导线位于同一平面上。

公开(公告)号：US20130037935A1

公开(公告)日：2013-02-14

申请号：US13205864

申请日：2011-08-09

申请人： Yan Xun Xue ,  Ping Huang ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu ,  Ming-Chen Lu

发明人： Yan Xun Xue ,  Ping Huang ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu ,  Ming-Chen Lu

IPC分类号： H01L23/498 ,  H01L21/78

CPC分类号： H01L21/76898 ,  H01L21/561 ,  H01L21/6836 ,  H01L23/3114 ,  H01L23/3135 ,  H01L23/481 ,  H01L24/03 ,  H01L24/05 ,  H01L24/11 ,  H01L24/13 ,  H01L2221/6834 ,  H01L2221/68359 ,  H01L2221/68377 ,  H01L2224/02166 ,  H01L2224/0401 ,  H01L2224/05548 ,  H01L2224/05554 ,  H01L2224/05571 ,  H01L2224/1184 ,  H01L2224/13009 ,  H01L2224/13022 ,  H01L2224/13024 ,  H01L2224/131 ,  H01L2224/94 ,  H01L2924/00014 ,  H01L2924/12042 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2224/03 ,  H01L2224/11 ,  H01L2924/00012 ,  H01L2924/014 ,  H01L2924/00 ,  H01L2224/05552

摘要： The present invention relates to a package for semiconductor device and the fabrication method for integrally encapsulating a whole semiconductor chip within a molding compound. In the semicondcutor device package, bonding pads distributed on the top of the chip are redistributed into an array of redistributed bonding pads located in an dielectric layer by utilizing the redistribution technique. The electrodes or signal terminals on the top of the semiconductor chip are connected to an electrode metal segment on the bottom of the chip by conductive materials filled in through holes formed in a silicon substrate of a semiconductor wafer. Furthermore, the top molding portion and the bottom molding portion seal the semiconductor chip completely, thus providing optimum mechanical and electrical protections.

摘要翻译： 本发明涉及一种用于半导体器件的封装以及用于将整个半导体芯片整体封装在模塑料中的制造方法。 在半封装器件封装中，通过利用再分配技术，分布在芯片顶部的焊盘重新分布到位于介质层中的再分布焊盘的阵列中。 半导体芯片的顶部上的电极或信号端子通过填充在半导体晶片的硅衬底中形成的通孔中的导电材料连接到芯片底部的电极金属段。 此外，顶部模制部分和底部模制部分完全密封半导体芯片，从而提供最佳的机械和电气保护。

公开(公告)号：US20120104580A1

公开(公告)日：2012-05-03

申请号：US12916086

申请日：2010-10-29

申请人： Tao Feng ,  Zhiqiang Niu ,  Yuping Gong ,  Ruisheng Wu ,  Ping Huang ,  Lei Shi ,  Yueh-Se Ho

发明人： Tao Feng ,  Zhiqiang Niu ,  Yuping Gong ,  Ruisheng Wu ,  Ping Huang ,  Lei Shi ,  Yueh-Se Ho

IPC分类号： H01L23/495 ,  H01L23/498

CPC分类号： H01L21/6836 ,  H01L21/56 ,  H01L21/561 ,  H01L21/563 ,  H01L21/565 ,  H01L21/6835 ,  H01L21/76897 ,  H01L21/78 ,  H01L23/3114 ,  H01L23/481 ,  H01L23/495 ,  H01L23/49524 ,  H01L23/49537 ,  H01L23/49562 ,  H01L23/49575 ,  H01L24/05 ,  H01L24/06 ,  H01L24/11 ,  H01L24/14 ,  H01L24/16 ,  H01L24/29 ,  H01L24/32 ,  H01L24/34 ,  H01L24/36 ,  H01L24/40 ,  H01L24/73 ,  H01L24/94 ,  H01L25/50 ,  H01L27/088 ,  H01L29/0657 ,  H01L29/7827 ,  H01L2221/68327 ,  H01L2221/6834 ,  H01L2221/68359 ,  H01L2221/68381 ,  H01L2224/0401 ,  H01L2224/04026 ,  H01L2224/04034 ,  H01L2224/05009 ,  H01L2224/05025 ,  H01L2224/051 ,  H01L2224/05139 ,  H01L2224/05155 ,  H01L2224/05166 ,  H01L2224/05571 ,  H01L2224/0603 ,  H01L2224/0616 ,  H01L2224/06181 ,  H01L2224/1184 ,  H01L2224/16245 ,  H01L2224/291 ,  H01L2224/32245 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/40247 ,  H01L2224/73253 ,  H01L2224/73255 ,  H01L2224/73263 ,  H01L2224/83801 ,  H01L2224/84801 ,  H01L2224/94 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01074 ,  H01L2924/01075 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/10155 ,  H01L2924/10253 ,  H01L2924/12042 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/14 ,  H01L2924/181 ,  H01L2924/2064 ,  H01L2924/3511 ,  H01L2224/03 ,  H01L2924/00 ,  H01L2224/05552 ,  H01L2924/00012 ,  H01L2224/37099

摘要： A substrate-less composite power semiconductor device may include a thin substrate and a top metal layer located on a top surface of the substrate. A total thickness of the substrate and the epitaxial layer may be less than 25 microns. Solder bumps are formed on top of the top metal layer and molding compound surrounds the solder bumps and leaves the solder bumps at least partly exposed.

摘要翻译： 无基底复合功率半导体器件可以包括薄衬底和位于衬底顶表面上的顶金属层。 衬底和外延层的总厚度可以小于25微米。 焊料凸块形成在顶部金属层的顶部，并且模塑料围绕焊料凸起并且使焊料凸块至少部分暴露。

公开(公告)号：US08987878B2

公开(公告)日：2015-03-24

申请号：US12916086

申请日：2010-10-29

申请人： Tao Feng ,  Zhiqiang Niu ,  Yuping Gong ,  Ruisheng Wu ,  Ping Huang ,  Lei Shi ,  Yueh-Se Ho

发明人： Tao Feng ,  Zhiqiang Niu ,  Yuping Gong ,  Ruisheng Wu ,  Ping Huang ,  Lei Shi ,  Yueh-Se Ho

IPC分类号： H01L23/495 ,  H01L21/683 ,  H01L21/56 ,  H01L23/31 ,  H01L23/48 ,  H01L23/00 ,  H01L29/06

CPC分类号： H01L21/6836 ,  H01L21/56 ,  H01L21/561 ,  H01L21/563 ,  H01L21/565 ,  H01L21/6835 ,  H01L21/76897 ,  H01L21/78 ,  H01L23/3114 ,  H01L23/481 ,  H01L23/495 ,  H01L23/49524 ,  H01L23/49537 ,  H01L23/49562 ,  H01L23/49575 ,  H01L24/05 ,  H01L24/06 ,  H01L24/11 ,  H01L24/14 ,  H01L24/16 ,  H01L24/29 ,  H01L24/32 ,  H01L24/34 ,  H01L24/36 ,  H01L24/40 ,  H01L24/73 ,  H01L24/94 ,  H01L25/50 ,  H01L27/088 ,  H01L29/0657 ,  H01L29/7827 ,  H01L2221/68327 ,  H01L2221/6834 ,  H01L2221/68359 ,  H01L2221/68381 ,  H01L2224/0401 ,  H01L2224/04026 ,  H01L2224/04034 ,  H01L2224/05009 ,  H01L2224/05025 ,  H01L2224/051 ,  H01L2224/05139 ,  H01L2224/05155 ,  H01L2224/05166 ,  H01L2224/05571 ,  H01L2224/0603 ,  H01L2224/0616 ,  H01L2224/06181 ,  H01L2224/1184 ,  H01L2224/16245 ,  H01L2224/291 ,  H01L2224/32245 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/40247 ,  H01L2224/73253 ,  H01L2224/73255 ,  H01L2224/73263 ,  H01L2224/83801 ,  H01L2224/84801 ,  H01L2224/94 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01074 ,  H01L2924/01075 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/10155 ,  H01L2924/10253 ,  H01L2924/12042 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/14 ,  H01L2924/181 ,  H01L2924/2064 ,  H01L2924/3511 ,  H01L2224/03 ,  H01L2924/00 ,  H01L2224/05552 ,  H01L2924/00012 ,  H01L2224/37099

摘要： A substrate-less composite power semiconductor device may include a thin substrate and a top metal layer located on a top surface of the substrate. A total thickness of the substrate and the epitaxial layer may be less than 25 microns. Solder bumps are formed on top of the top metal layer and molding compound surrounds the solder bumps and leaves the solder bumps at least partly exposed.

摘要翻译： 无基底复合功率半导体器件可以包括薄衬底和位于衬底顶表面上的顶金属层。 衬底和外延层的总厚度可以小于25微米。 焊料凸块形成在顶部金属层的顶部，并且模塑料围绕焊料凸起并且使焊料凸块至少部分暴露。

公开(公告)号：US20160155688A9

公开(公告)日：2016-06-02

申请号：US14033140

申请日：2013-09-20

申请人： Yan Xun Xue ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu ,  Lei Shi ,  Liang Zhao ,  Ping Huang

发明人： Yan Xun Xue ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu ,  Lei Shi ,  Liang Zhao ,  Ping Huang

IPC分类号： H01L23/495

CPC分类号： H01L23/49537 ,  H01L23/49541 ,  H01L23/49548 ,  H01L23/49551 ,  H01L23/49562 ,  H01L23/49575 ,  H01L2224/16245 ,  H01L2924/13091 ,  H01L2924/00

摘要： A power semiconductor package has an ultra thin chip with front side molding to reduce substrate resistance; a lead frame unit with grooves located on both side leads provides precise positioning for connecting numerous bridge-shaped metal clips to the front side of the side leads. The bridge-shaped metal clips are provided with bridge structure and half or fully etched through holes for relieving superfluous solder during manufacturing process.

公开(公告)号：US09184117B2

公开(公告)日：2015-11-10

申请号：US13663694

申请日：2012-10-30

申请人： Yueh-Se Ho ,  Yan Xun Xue ,  Hamza Yilmaz ,  Jun Lu

发明人： Yueh-Se Ho ,  Yan Xun Xue ,  Hamza Yilmaz ,  Jun Lu

IPC分类号： H01L29/40 ,  H01L23/495 ,  H01L23/31 ,  H01L23/00 ,  H01L21/683

CPC分类号： H01L23/4952 ,  H01L21/6835 ,  H01L23/3107 ,  H01L23/3142 ,  H01L23/49562 ,  H01L24/11 ,  H01L24/13 ,  H01L24/14 ,  H01L24/16 ,  H01L24/29 ,  H01L24/32 ,  H01L24/37 ,  H01L24/40 ,  H01L24/41 ,  H01L24/81 ,  H01L24/83 ,  H01L24/84 ,  H01L2221/68327 ,  H01L2224/1134 ,  H01L2224/1308 ,  H01L2224/13082 ,  H01L2224/131 ,  H01L2224/13111 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/136 ,  H01L2224/13794 ,  H01L2224/13839 ,  H01L2224/1403 ,  H01L2224/16245 ,  H01L2224/2929 ,  H01L2224/293 ,  H01L2224/32245 ,  H01L2224/37011 ,  H01L2224/37013 ,  H01L2224/371 ,  H01L2224/4007 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/40248 ,  H01L2224/40499 ,  H01L2224/405 ,  H01L2224/73253 ,  H01L2224/73255 ,  H01L2224/81191 ,  H01L2224/81801 ,  H01L2224/8185 ,  H01L2224/83801 ,  H01L2224/83851 ,  H01L2224/84385 ,  H01L2224/84801 ,  H01L2224/8485 ,  H01L2224/92225 ,  H01L2224/92226 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2924/00014 ,  H01L2924/014 ,  H01L2924/01082 ,  H01L2924/07811 ,  H01L2924/00012

摘要： The invention relates to a power semiconductor device and a preparation method, particularly relates to preparation of stacked dual-chip packaging structure of MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor) using flip chip technology with two interconnecting plates. The first chip is flipped and attached on the base such that the first chip is overlapped with the third pin; the back metal layer of the first chip is connected to the bonding strip of the first pin through a first interconnecting plate; the second chip is flipped and attached on a main plate portion of the first interconnecting plate such that the second chip is overlapped with the fourth pin; and the back metal layer of the second chip is connected to the bonding strip of the second pin through the second interconnecting plate.

摘要翻译： 本发明涉及一种功率半导体器件及其制备方法，特别涉及使用具有两个互连板的倒装芯片技术来制备MOSFET（金属氧化物半导体场效应晶体管）的层叠双芯片封装结构。 第一芯片被翻转并附接在基座上，使得第一芯片与第三引脚重叠; 第一芯片的背金属层通过第一互连板连接到第一引脚的接合条; 第二芯片被翻转并附接在第一互连板的主板部分上，使得第二芯片与第四引脚重叠; 并且第二芯片的背金属层通过第二互连板连接到第二引脚的接合条。