摘要:
Provided are semiconductor devices and methods of manufacturing the same. the device may include a semiconductor substrate, a first conductive pattern provided in the semiconductor substrate to have a first width at a surface level of the semiconductor substrate, a barrier pattern covering the first conductive pattern and having a second width substantially greater than the first width, a second conductive pattern partially covering the barrier pattern and having a third width substantially smaller than the second width, and an insulating pattern disposed on a sidewall of the second conductive pattern. The second width may be substantially equal to or less than to a sum of the third width and a width of the insulating pattern.
摘要:
Provided are semiconductor devices and methods of manufacturing the same. the device may include a semiconductor substrate, a first conductive pattern provided in the semiconductor substrate to have a first width at a surface level of the semiconductor substrate, a barrier pattern covering the first conductive pattern and having a second width substantially greater than the first width, a second conductive pattern partially covering the barrier pattern and having a third width substantially smaller than the second width, and an insulating pattern disposed on a sidewall of the second conductive pattern. The second width may be substantially equal to or less than to a sum of the third width and a width of the insulating pattern.
摘要:
Semiconductor devices having stacked structures and methods for fabricating the same are provided. A semiconductor device includes at least one single block including a first semiconductor chip and a second semiconductor chip stacked thereon. Each of the first and second semiconductor chips includes a semiconductor substrate including a through-electrode, a circuit layer on a front surface of the semiconductor substrate, and a front pad that is provided in the circuit layer and is electrically connected to the through-electrode. The surfaces of the semiconductor substrates face each other. The circuit layers directly contact each other such that the semiconductor chips are bonded to each other.
摘要:
Semiconductor devices having stacked structures and methods for fabricating the same are provided. A semiconductor device includes at least one single block including a first semiconductor chip and a second semiconductor chip stacked thereon. Each of the first and second semiconductor chips includes a semiconductor substrate including a through-electrode, a circuit layer on a front surface of the semiconductor substrate, and a front pad that is provided in the circuit layer and is electrically connected to the through-electrode. The surfaces of the semiconductor substrates face each other. The circuit layers directly contact each other such that the semiconductor chips are bonded to each other.
摘要:
A method of forming a connection terminal may include preparing a substrate, forming a first conductor of a tube shape having an opened upper portion on the substrate, forming a second conductor on the first conductor, and annealing the second conductor so that a portion of the second conductor extends in an internal space of the first conductor through the opened upper portion.
摘要:
A system and method for timing synchronization with a modified DVB-S2X waveform for a forward beam hopping satellite is described. The method includes: transmitting a channel including a plurality of beams per a Beam Hopping Time Plan (BHTP), wherein each beam includes a discontinuous signal including a superframe including timing markers and a Beam Hopping Forward Synchronization Pattern (BHFSP); receiving a synchronization information, without a loopback beam, for one of the plurality of beams; determining an adjustment period and an adjusted symbol rate for generation of terrestrial switching instants, based on the synchronization information, for a transmission of the plurality of beams such that at least a portion of a respective BHFSP of one of the beams aligns with one of satellite switching instants; and adjusting a timing and symbol rate of the transmission according to the adjustment period and the adjusted symbol rate, respectively.
摘要:
A chamber cleaning method includes processing a wafer for a Cu-to-Cu bonding process using plasma in a chamber; and removing copper from the chamber. Removing copper includes forming copper oxide on an inner wall of the chamber by oxidizing copper in the chamber by a plasma treatment that uses a first gas, performing a first monitoring operation that monitors a copper contamination state in the chamber using an optical diagnostic method, removing the copper oxide by a plasma treatment that uses a second gas; and performing a second monitoring operation that monitors a copper contamination state in the chamber using the optical diagnostic method.
摘要:
A plasma display apparatus is disclosed. The plasma display apparatus includes a plasma display panel that includes a scan electrode, a sustain electrode, and a data electrode; and a scan driver that supplies the scan electrode with a first driving voltage serving as a reference voltage, a second driving voltage supplied from a single voltage source, and a third driving voltage that has the same magnitude as that of the second driving voltage and has the opposite polarity of that of the second driving voltage.