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公开(公告)号:US20240412090A1
公开(公告)日:2024-12-12
申请号:US18330680
申请日:2023-06-07
Applicant: International Business Machines Corporation
Inventor: Neereja Sundaresan , Shawn Anthony Hall , Jason S. Orcutt , Jae-Woong Nah , Yves Martin , Wen-Sen Lu , John Michael Cotte
IPC: G06N10/40
Abstract: Systems and techniques that facilitate coupling a superconducting cable to a interconnect chip and a quantum processor. In various embodiments, a system can comprise a quantum processor, one or more interconnect chips, and one or more cable connections. The quantum processor can comprise a plurality of qubits. Additionally, the one or more interconnect chips can be bonded to the quantum processor, and the one or more cable connections can be coupled to the one or more interconnect chips. With embodiments, the one or more interconnect chips can comprise one or more signal routings from the one or more cable connections to the quantum processor. Further, in embodiments, a first signal can pass from the one or more cable connections to at least one of the plurality of qubits.
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公开(公告)号:US11749605B2
公开(公告)日:2023-09-05
申请号:US17116488
申请日:2020-12-09
Applicant: International Business Machines Corporation
Inventor: Jae-Woong Nah , Eric Peter Lewandowski , Adinath Shantinath Narasgond
IPC: H01L23/532 , H01L23/00 , H01L21/768 , G06N10/00 , H01L29/43 , H01L21/28
CPC classification number: H01L23/53285 , H01L21/76891 , H01L24/03 , H01L24/07 , H01L24/10 , H01L24/11 , H01L24/12 , H01L24/13 , H01L24/15 , H01L24/16 , G06N10/00 , H01L21/28026 , H01L29/437
Abstract: Devices and methods that can facilitate hybrid under-bump metallization components are provided. According to an embodiment, a device can comprise an under-bump metallization component that can comprise a superconducting interconnect component and a solder wetting component. The device can further comprise a solder bump that can be coupled to the superconducting interconnect component and the solder wetting component. In some embodiments, the superconducting interconnect component can comprise a hermetically sealed superconducting interconnect component.
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公开(公告)号:US20210351043A1
公开(公告)日:2021-11-11
申请号:US16869744
申请日:2020-05-08
Applicant: International Business Machines Corporation
Inventor: Jae-Woong Nah , Evan Colgan , Robert P. Kuder, II , James L. Speidell , Bucknell C. Webb
IPC: H01L21/48 , H01L23/473 , H01L21/67
Abstract: A method and apparatus for bonding a processor wafer with a microchannel wafer/glass manifold to form a bonded wafer structure are provided. A glass fixture is also provided for protecting C4 solder bumps on chips disposed on the processor wafer. When the glass fixture is positioned on the processor wafer, posts extending from the glass fixture contact corresponding regions on the processor wafer devoid of C4 solder bumps, so that the glass fixture protects the C4 solder bumps during wafer bonding. The method involves positioning the processor wafer/glass fixture and the microchannel wafer/glass manifold in a metal fixture having one or more alignment structures adapted to engage corresponding alignment elements formed in the processor wafer, glass fixture and/or glass manifold. The metal fixture secures the wafer components in place and, after melting solder pellets disposed between the processor wafer/glass fixture and microchannel wafer/glass manifold, a bonded wafer structure is formed.
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公开(公告)号:US20200316702A1
公开(公告)日:2020-10-08
申请号:US16378547
申请日:2019-04-08
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Jae-Woong Nah , Stephen L. Buchwalter , Peter A. Gruber , Da-Yuan Shih , Paul Alfred Lauro
Abstract: In an Injection Molded Soldering system, a single, one-layer decal has one or more through hole patterns where each through hole pattern has a plurality of through holes through the decal. A drum with a drum circumference turns while the decal is forced to be adjacent to the drum circumference. The decal passes by a tangent point on the drum circumference where one or more solder-filled through hole patterns align with recessed openings on a substrate at the tangent point of the drum circumference. Applied heat causes the solder structures to melt and flow into the recessed openings.
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公开(公告)号:US20200274113A1
公开(公告)日:2020-08-27
申请号:US16283654
申请日:2019-02-22
Inventor: Bing Dang , Qianwen Chen , Yu Luo , John Knickerbocker , Jae-Woong Nah , Kai Liu , Po-wen Cheng , Tung-hsiu Shih , Mengnian Niu , Kai-wei Nieh
IPC: H01M2/06 , H01M10/052 , H01M10/0585 , H01M2/30
Abstract: Vertical via connections to a battery are hermetically sealed to prevent environmental factors (e.g. moisture, oxygen, and nitrogen) from entering the internals of the battery through porous conductive material filling the vias resulting in reduced battery performance and battery failure.
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公开(公告)号:US10679931B2
公开(公告)日:2020-06-09
申请号:US16371038
申请日:2019-03-31
Applicant: International Business Machines Corporation
Inventor: Jae-Woong Nah , Charles L. Reynolds , Katsuyuki Sakuma
IPC: H01L23/498 , H01L21/033 , H01L23/00 , H01L23/15 , H05K3/34 , H05K3/40
Abstract: Ball grid assembly (BGA) bumping solder is formed on the back side of a laminate panel within a patterned temporary resist. Processes such as singulation and flip chip module assembly are conducted following BGA bumping with the temporary resist in place. The resist is removed from the back side of the singulated laminate panel prior to card assembly. Stand-off elements having relatively high melting points can be incorporated on the BGA side of the laminate panel to ensure a minimum assembly solder collapse height. Alignment assemblies are formed on the socket-facing side of an LGA module using elements having relatively high melting points and injected solder.
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公开(公告)号:US20190162902A1
公开(公告)日:2019-05-30
申请号:US15827306
申请日:2017-11-30
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Tymon Barwicz , Yves Martin , Jae-Woong Nah
CPC classification number: G02B6/13 , G02B6/423 , G02B6/4232 , G02B6/4238 , G02B6/4249
Abstract: A method for assembling a semiconductor device includes: receiving a first chip including a plurality of first bonding pads, a first standoff and a second standoff, wherein a first solder is deposited on each of the first bonding pads; depositing a second solder on each of the first and second standoffs; arranging a second chip over the first chip, wherein the second chip includes a plurality of second bonding pads, and at least one of the second bonding pads has a corresponding first bonding pad; heating the second chip over a melting point of the second solder to melt the second solder, and placing the second chip on the first chip to touch and solidify the second solder on each of the first and second standoffs; performing a reflow process to melt the first solder on each of the first bonding pads so that at least one of the first solders touches a corresponding second bonding pad; and waiting a predetermined period of time to allow the second chip to move until a side edge of the second chip touches a waveguide of the first chip.
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公开(公告)号:US20190091786A1
公开(公告)日:2019-03-28
申请号:US15719451
申请日:2017-09-28
Applicant: International Business Machines Corporation
Inventor: Jae-Woong Nah , John U. Knickerbocker , Eric P. Lewandowski
Abstract: An improved molten solder injection head having a vacuum filter and differential gauge system is provided. In one aspect, an injection head is provided. The injection head includes: a reservoir; an injection port on a bottom of the injection head connected to the reservoir; a vacuum port adjacent to the injection port on the bottom of the injection head connected to a vacuum source; and a filter disposed between the bottom of the injection head and the vacuum source. A method for molten solder injection using the present injection head is provided.
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公开(公告)号:US10014274B2
公开(公告)日:2018-07-03
申请号:US15224960
申请日:2016-08-01
Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
Inventor: Tymon Barwicz , Yves Martin , Jae-Woong Nah
IPC: H01L23/495 , H01L23/00 , H01L25/16 , H01L25/00
CPC classification number: H01L24/81 , H01L23/49503 , H01L24/03 , H01L24/05 , H01L24/06 , H01L24/09 , H01L24/11 , H01L24/13 , H01L24/16 , H01L24/30 , H01L25/167 , H01L25/50 , H01L2224/02245 , H01L2224/0225 , H01L2224/0345 , H01L2224/0346 , H01L2224/0401 , H01L2224/05552 , H01L2224/05554 , H01L2224/05555 , H01L2224/05644 , H01L2224/05647 , H01L2224/05655 , H01L2224/05666 , H01L2224/0603 , H01L2224/06515 , H01L2224/09515 , H01L2224/10145 , H01L2224/11013 , H01L2224/11462 , H01L2224/13101 , H01L2224/13109 , H01L2224/13111 , H01L2224/13113 , H01L2224/16058 , H01L2224/16105 , H01L2224/16145 , H01L2224/811 , H01L2224/81139 , H01L2224/81143 , H01L2224/81191 , H01L2224/81192 , H01L2224/81203 , H01L2224/81801 , H01L2224/81815 , H01L2924/3512 , H01L2924/3841 , H01L2924/00014 , H01L2924/014 , H01L2924/01083 , H01L2924/01082 , H01L2924/0105 , H01L2924/00012 , H01L2924/01029 , H01L2924/01047
Abstract: A multi-chip system includes a top chip stack element comprising a top chip having two major surfaces and top solder pads arrayed along a plane of one of the major surfaces; a bottom chip stack element comprising a bottom substrate having two major surfaces and bottom solder pads arrayed along a plane of one of the major surfaces; one or more solder reservoir pads connected to one or more of the top solder pads or of the bottom solder pads; and solder material; and wherein at least one of the top solder pads is connected to one of the bottom solder pads by one of the solder material.
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公开(公告)号:US20180174949A1
公开(公告)日:2018-06-21
申请号:US15896480
申请日:2018-02-14
Applicant: International Business Machines Corporation
Inventor: Peter A. Gruber , Jae-Woong Nah
IPC: H01L23/48 , B23K26/382 , B23K1/00 , B23K3/06 , B23K26/384 , H01L23/00 , B23K26/40 , H01L23/498 , H01L23/14 , H01L21/48 , B23K103/16 , B23K101/42
CPC classification number: H01L23/48 , B23K1/0016 , B23K3/0607 , B23K3/0623 , B23K26/384 , B23K26/389 , B23K26/40 , B23K2101/42 , B23K2103/16 , H01L21/4853 , H01L23/14 , H01L23/147 , H01L23/49816 , H01L24/03 , H01L24/05 , H01L24/11 , H01L24/13 , H01L24/14 , H01L2224/0345 , H01L2224/03464 , H01L2224/0347 , H01L2224/0401 , H01L2224/056 , H01L2224/11003 , H01L2224/11005 , H01L2224/111 , H01L2224/1112 , H01L2224/11436 , H01L2224/11472 , H01L2224/11849 , H01L2224/13017 , H01L2224/13144 , H01L2224/13147 , H01L2224/13155 , H01L2224/13551 , H01L2224/13561 , H01L2224/136 , H01L2224/81101 , H01L2224/81191 , H01L2924/01322 , H01L2924/12042 , H01L2924/00012 , H01L2924/00014 , H01L2924/014 , H01L2924/00
Abstract: A system of producing metal cored solder structures on a substrate includes: a decal, a carrier, and receiving elements. The decal includes one or more apertures each of which is tapered from a top surface to a bottom surface thereof. The carrier is positioned beneath the bottom of the decal and includes cavities in a top surface. The cavities are located in alignment with the apertures of the decal. The decal is positioned on the carrier having the decal bottom surface in contact with the carrier top surface to form feature cavities defined by the decal apertures and the carrier cavities. The feature cavities are shaped to receive one or more metal elements and are configured for receiving molten solder cooled in the cavities. The decal is separable from the carrier to partially expose metal core solder contacts. The receiving elements receive the metal core solder contacts thereon.
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