Wiring substrate and manufacturing method thereof, and semiconductor apparatus
    1.
    发明授权
    Wiring substrate and manufacturing method thereof, and semiconductor apparatus 有权
    配线基板及其制造方法以及半导体装置

    公开(公告)号:US08115300B2

    公开(公告)日:2012-02-14

    申请号:US11763053

    申请日:2007-06-14

    IPC分类号: H01L23/12

    摘要: In a semiconductor apparatus, a semiconductor element is mounted on a wiring substrate. Wiring patterns and protrusions are formed on a surface of a substrate with the wiring patterns extending on tops of the protrusions. The surface of the substrate on which the wiring patterns are formed are covered with an insulating layer. Surfaces of connection parts of the wiring patterns formed on the tops of the protrusions are formed with the surfaces of the connection parts exposed to a surface of the insulating layer on a level with the surface of the insulating layer or in a position lower than the surface of the insulating layer. The connection parts are formed as pads for connection formed in alignment with connection electrodes of the semiconductor element. The semiconductor element is mounted by making electrical connection to the connection parts by flip chip bonding.

    摘要翻译: 在半导体装置中,将半导体元件安装在布线基板上。 布线图案和突起形成在基板的表面上,布线图案在突起的顶部延伸。 其上形成有布线图案的基板的表面被绝缘层覆盖。 形成在突起的顶部上的布线图形的连接部分的表面形成有连接部分的表面暴露于绝缘层的表面与绝缘层的表面或低于表面的位置 的绝缘层。 连接部分形成为与半导体元件的连接电极对准形成的用于连接的焊盘。 半导体元件通过倒装芯片接合与连接部分进行电连接来安装。

    WIRING SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND SEMICONDUCTOR APPARATUS
    2.
    发明申请
    WIRING SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND SEMICONDUCTOR APPARATUS 有权
    配线基板及其制造方法及半导体装置

    公开(公告)号:US20070290306A1

    公开(公告)日:2007-12-20

    申请号:US11763053

    申请日:2007-06-14

    IPC分类号: H01L21/00 H01L23/02

    摘要: In a semiconductor apparatus, a semiconductor element is mounted on a wiring substrate. Wiring patterns and protrusions are formed on a surface of a substrate with the wiring patterns extending on tops of the protrusions. The surface of the substrate on which the wiring patterns are formed are covered with an insulating layer. Surfaces of connection parts of the wiring patterns formed on the tops of the protrusions are formed with the surfaces of the connection parts exposed to a surface of the insulating layer on a level with the surface of the insulating layer or in a position lower than the surface of the insulating layer. The connection parts are formed as pads for connection formed in alignment with connection electrodes of the semiconductor element. The semiconductor element is mounted by making electrical connection to the connection parts by flip chip bonding.

    摘要翻译: 在半导体装置中,将半导体元件安装在布线基板上。 布线图案和突起形成在基板的表面上,布线图案在突起的顶部延伸。 其上形成有布线图案的基板的表面被绝缘层覆盖。 形成在突起的顶部上的布线图形的连接部分的表面形成有连接部分的表面暴露于绝缘层的表面与绝缘层的表面或低于表面的位置 的绝缘层。 连接部分形成为与半导体元件的连接电极对准形成的用于连接的焊盘。 半导体元件通过倒装芯片接合与连接部分进行电连接来安装。

    Process of packaging a semiconductor device with reinforced film substrate
    4.
    发明授权
    Process of packaging a semiconductor device with reinforced film substrate 失效
    用增强膜基材包装半导体器件的工艺

    公开(公告)号:US06444494B1

    公开(公告)日:2002-09-03

    申请号:US09412976

    申请日:1999-10-06

    IPC分类号: H01L2148

    摘要: Semiconductor devices are manufactured, using film substrates, as follows. Individual film substrates are separated from a film substrate tape having a plurality of film substrates continuously and integrally connected to each other, each the film substrate comprising a base film having first and second surfaces, a circuit pattern being formed on the first surface and a mounting section being formed on the second surface. The base film has an opening to which electrode terminals of a semiconductor element are exposed when the semiconductor element is mounted. The individual film substrates are adhered to respective reinforcement members of a reinforcement frame, which has a plurality of the reinforcement members continuously and integrally connected to each other. Each reinforcement member has an accommodation hole for accommodating the semiconductor element, so that the semiconductor element mount section is exposed in the accommodation hole. A semiconductor element is mounted on the film substrate by adhering an electrode terminal-forming surface of the semiconductor element to said mounting section so that electrode terminals of the semiconductor element are exposed in the accommodation hole. The electrode terminals exposed in the opening are electrically connected to the circuit patterns. The opening is sealed with resin and then the individual reinforcement members are separated from the reinforcement frame.

    摘要翻译: 使用膜基板制造半导体器件,如下。 各个薄膜基板与具有多个薄膜基片的薄膜基片分离,所述薄膜基片彼此连续且一体地连接,每个薄膜基片包括具有第一表面和第二表面的基底膜,在第一表面上形成电路图案, 形成在第二表面上。 当安装半导体元件时,基膜具有露出半导体元件的电极端子的开口。 各个胶片基材粘附到加强框架的相应的加强构件上,该加强框架具有连续且一体地连接的多个加强构件。 每个加强构件具有用于容纳半导体元件的容纳孔,使得半导体元件安装部暴露在容纳孔中。 半导体元件通过将半导体元件的电极端子形成表面粘附到所述安装部分而安装在膜基底上,使得半导体元件的电极端子露出在容纳孔中。 暴露在开口中的电极端子电连接到电路图案。 开口用树脂密封,然后各个加强构件与加强框架分离。

    Substrate for inspecting electronic device, method of manufacturing substrate, and method of inspecting electronic device
    10.
    发明授权
    Substrate for inspecting electronic device, method of manufacturing substrate, and method of inspecting electronic device 失效
    用于检查电子装置的基板,基板的制造方法以及检查电子装置的方法

    公开(公告)号:US06404214B1

    公开(公告)日:2002-06-11

    申请号:US09468060

    申请日:1999-12-20

    IPC分类号: G01R3102

    摘要: A substrate for inspecting an electronic device used for an electrical test of the electronic device having bump-shaped connection terminals, comprises: opening sections, the diameter of each opening being determined so that a connection terminal can be inserted into and drawn out from the opening, are formed penetrating the insulating substrate in a region on one side of an insulating substrate on which the electronic device is mounted, corresponding to an arrangement of the connection terminals; and wiring patterns, each of which is composed of a pad section being exposed onto a bottom face of the opening so that the pad can come into contact with the connection terminal so as to accomplish electrical continuity, a connecting pad section formed in a region outside of the region in which the pad section is formed, which comes into contact with a contact terminal of an inspection device so as to accomplish electrical continuity, and a wiring section for electrically connecting the pad section with the connecting pad section, are formed on the other side of the insulating substrate.

    摘要翻译: 一种用于检查用于具有凸起形连接端子的电子设备的电气测试的电子设备的基板,包括:开口部分,每个开口的直径被确定为使得连接端子能够从开口插入和拉出 对应于连接端子的布置,在安装有电子设备的绝缘基板的一侧的区域中穿过绝缘基板; 以及布线图案,每个布线图案由暴露于开口的底面的焊盘部分组成,使得焊盘能够与连接端子接触以实现电连续性;连接焊盘部分形成在外部区域 形成有与检查装置的接触端子接触以实现电连续性的形成有焊盘部的区域,以及用于将焊盘部与连接焊盘部电连接的布线部,形成在 绝缘基板的另一侧。