摘要:
In a semiconductor apparatus, a semiconductor element is mounted on a wiring substrate. Wiring patterns and protrusions are formed on a surface of a substrate with the wiring patterns extending on tops of the protrusions. The surface of the substrate on which the wiring patterns are formed are covered with an insulating layer. Surfaces of connection parts of the wiring patterns formed on the tops of the protrusions are formed with the surfaces of the connection parts exposed to a surface of the insulating layer on a level with the surface of the insulating layer or in a position lower than the surface of the insulating layer. The connection parts are formed as pads for connection formed in alignment with connection electrodes of the semiconductor element. The semiconductor element is mounted by making electrical connection to the connection parts by flip chip bonding.
摘要:
In a semiconductor apparatus, a semiconductor element is mounted on a wiring substrate. Wiring patterns and protrusions are formed on a surface of a substrate with the wiring patterns extending on tops of the protrusions. The surface of the substrate on which the wiring patterns are formed are covered with an insulating layer. Surfaces of connection parts of the wiring patterns formed on the tops of the protrusions are formed with the surfaces of the connection parts exposed to a surface of the insulating layer on a level with the surface of the insulating layer or in a position lower than the surface of the insulating layer. The connection parts are formed as pads for connection formed in alignment with connection electrodes of the semiconductor element. The semiconductor element is mounted by making electrical connection to the connection parts by flip chip bonding.
摘要:
A wiring board and electrode of a semiconductor element are connected with each other by the method of wire bonding, and problems arising from the thermal stress generated in the process of mounting are overcome. There is provided a wiring board comprising: a first face joined to an electrode forming face of a semiconductor element 10; and a second face on the opposite side of the first face, a wiring pattern 16 being formed on the second face, a land 24 joined to an external connecting terminal 22 being formed at one end of the wiring pattern, a wire bonding section 16a connected with a bonding wire 40 being formed at the other end of the wiring pattern, wherein the land 24 is supported by a buffer layer 34 for reducing the thermal stress generated when the semiconductor element, to which the wiring board is attached, is mounted via the external connecting terminals, and the wire bonding section 16a is supported by a bonding support layer 36 having an elastic modulus capable of allowing wire bonding.
摘要:
Semiconductor devices are manufactured, using film substrates, as follows. Individual film substrates are separated from a film substrate tape having a plurality of film substrates continuously and integrally connected to each other, each the film substrate comprising a base film having first and second surfaces, a circuit pattern being formed on the first surface and a mounting section being formed on the second surface. The base film has an opening to which electrode terminals of a semiconductor element are exposed when the semiconductor element is mounted. The individual film substrates are adhered to respective reinforcement members of a reinforcement frame, which has a plurality of the reinforcement members continuously and integrally connected to each other. Each reinforcement member has an accommodation hole for accommodating the semiconductor element, so that the semiconductor element mount section is exposed in the accommodation hole. A semiconductor element is mounted on the film substrate by adhering an electrode terminal-forming surface of the semiconductor element to said mounting section so that electrode terminals of the semiconductor element are exposed in the accommodation hole. The electrode terminals exposed in the opening are electrically connected to the circuit patterns. The opening is sealed with resin and then the individual reinforcement members are separated from the reinforcement frame.
摘要:
In the case in which an electrical connection between upper and lower layers is to be carried out through a via opening portion 16 provided on an insulating layer 14 of a wiring substrate constituting a multilayer wiring substrate, the electrical connection between the upper and lower layers is performed through a conductive material 30 while exposing a part of wall surfaces of the via opening portion 16 of the insulating layer without covering all of the wall surfaces of the via opening portion 16 with the conductive material 30.
摘要:
A semiconductor component having electrode terminals 14 formed in rectangular planar shapes arranged in parallel on an electrode forming surface of a semiconductor chip and formed with rerouting patterns 16 electrically connected with the electrode terminals 14 through vias on the surface of an electrical insulating layer covering the electrode forming surface, characterized in that the planar arrangement of the via pads 20 formed on the surface of the electrical insulating layer is made an arrangement alternately offset to one side and the other side of the longitudinal direction of the electrode terminals 14 and in that rerouting patterns 16 are provided connected to the via pads 20. The present invention enables easy formation of rerouting patterns even when the electrode terminals are arranged at fine intervals.
摘要:
A wiring substrate includes a wiring pattern in an uppermost layer that includes pads. A solder resist layer covers the wiring pattern. A recess exposes part of the wiring pattern from the solder resist layer to form pads. The solder resist layer includes a portion formed in a region corresponding to the recess, a portion formed outward from the recess, and a portion formed inward from the recess. The upper surface of the solder resist layer at the portion corresponding to the recess is higher than the upper surface of the pads but lower than the upper surfaces of the other portions of the solder resist layer.
摘要:
A wiring board includes: an uppermost wiring layer formed on a prescribed number of underlying wiring layers, a portion of the uppermost wiring layer being exposed and used as a pad for connection with a component to be mounted; and an insulation resin layer covering the uppermost wiring layer, wherein the thickness of the portion of the uppermost wiring layer is larger than that of other portions thereof.
摘要:
A unit interconnection substrate for mounting leadless type electronic parts on a mount substrate by superposing them on each other in two or more stages, comprising an insulating surface on the top surface of which an interconnection circuit with conductor pads and connection terminals is formed, depressions for holding electronic parts formed in a bottom surface of the insulating substrate, connection terminals provided on the bottom surface of the insulating substrate on the periphery of the depression, and connection terminals electrically connected to the connection terminals of the top surface of the insulating substrate via conductor via holes provided in the insulating substrate. Electronic parts are electrically connected to the conductor pads on the top surface of the insulating substrate, thereby to make it possible to mount the electronic parts on the insulating substrate. Together with this, holding of the electronic parts mounted on the mount substrate in the depressions of the bottom surface of the insulating substrate is made possible.
摘要:
A substrate for inspecting an electronic device used for an electrical test of the electronic device having bump-shaped connection terminals, comprises: opening sections, the diameter of each opening being determined so that a connection terminal can be inserted into and drawn out from the opening, are formed penetrating the insulating substrate in a region on one side of an insulating substrate on which the electronic device is mounted, corresponding to an arrangement of the connection terminals; and wiring patterns, each of which is composed of a pad section being exposed onto a bottom face of the opening so that the pad can come into contact with the connection terminal so as to accomplish electrical continuity, a connecting pad section formed in a region outside of the region in which the pad section is formed, which comes into contact with a contact terminal of an inspection device so as to accomplish electrical continuity, and a wiring section for electrically connecting the pad section with the connecting pad section, are formed on the other side of the insulating substrate.