Rework methods for lead BGA/CGA
    2.
    发明授权
    Rework methods for lead BGA/CGA 有权
    铅BGA / CGA的返工方法

    公开(公告)号:US06719188B2

    公开(公告)日:2004-04-13

    申请号:US09912192

    申请日:2001-07-24

    IPC分类号: B23K1018

    摘要: A method and apparatus are provided for reworking electronic component assemblies where the components are joined by solder interconnections. A cutting device employing a heated wire, blade or other cutting element is forced against and through the solder interconnections to sever the interconnections. A preferred cutting device employs moving the cutting element transverse to the solder interconnections to also provide a sawing action to the solder interconnections. Another cutting device employs a water jet to provide a high pressure stream of water that cuts and severs the solder interconnections.

    摘要翻译: 提供了一种方法和装置,用于重新加工电子部件组件,其中部件通过焊料互连连接。 使用加热的线,刀片或其他切割元件的切割装置被迫抵抗并穿过焊料互连以切断互连。 优选的切割装置采用将切割元件横向于焊接互连件移动以向焊接互连提供锯切动作。 另一切割装置采用水射流来提供高压水流,其切割和切断焊料互连。

    Baseplate for chip burn-in and/of testing, and method thereof
    6.
    发明授权
    Baseplate for chip burn-in and/of testing, and method thereof 失效
    用于芯片烧录和/或测试的基板及其方法

    公开(公告)号:US06335210B1

    公开(公告)日:2002-01-01

    申请号:US09466607

    申请日:1999-12-17

    IPC分类号: H01L2166

    摘要: The present invention relates generally to a new structure and method for chip burn-in and/or testing. More particularly, the invention encompasses a baseplate that is secured to a delicate chip and a method for such an invention is also disclosed. The inventive baseplate provides an added strength to a complex chip while it is being tested and/or burned-in, and then during normal use the baseplate of this invention is an integrated component of the chip.

    摘要翻译: 本发明一般涉及用于芯片老化和/或测试的新结构和方法。 更具体地,本发明包括固定到精细芯片上的底板,并且还公开了用于这种发明的方法。 本发明的基板在被测试和/或燃烧时提供了对复合芯片的附加强度,然后在正常使用期间,本发明的底板是芯片的集成部件。