Abstract:
Resilient contact structures (430) are mounted directly to bond pads (410) on semiconductor dies (402a, 402b), prior to the dies (402a, 402b) being singulated (separated) from a semiconductor wafer. This enables the semiconductor dies (402a, 402b) to be exercised (e.g., tested and/or burned-in) by connecting to the semiconductor dies (702, 704) with a circuit board (710) or the like having a plurality of terminals (712) disposed on a surface thereof. Subsequently, the semiconductor dies (402a, 402b) may be singulated from the semiconductor wafer, whereupon the same resilient contact structures (430) can be used to effect interconnections between the semiconductor dies and other electronic components (such as wiring substrates, semiconductor packages, etc.). Using the all-metallic composite interconnection elements (430) of the present invention as the resilient contact structures, burn-in (792) can be performed at temperatures of at least 150 °C, and can be completed in less than 60 minutes.
Abstract:
The probe card assembly (500) includes a probe card (502), and a space transformer (506) having resilient contact structures (524) mounted to and extending from terminals (522) on its surface. An interposer (504) is disposed between the space transformer and the probe card. The space transformer and interposer are stacked on the probe card and the resilient contact structures can be arranged to optimise probing of entire wafer.
Abstract:
The probe card assembly (500) includes a probe card (502), and a space transformer (506) having resilient contact structures (524) mounted to and extending from terminals (522) on its surface. An interposer (504) is disposed between the space transformer and the probe card. The space transformer and interposer are stacked on the probe card and the resilient contact structures can be arranged to optimise probing of entire wafer.
Abstract:
The probe card assembly (500) includes a probe card (502), and a space transformer (506) having resilient contact structures (524) mounted to and extending from terminals (522) on its surface. An interposer (504) is disposed between the space transformer and the probe card. The space transformer and interposer are stacked on the probe card and the resilient contact structures can be arranged to optimise probing of entire wafer.
Abstract:
The present invention relates to integrated circuit devices for use in such civilian equipments as an electronic equipment, electrical equipment, communication equipment and measuring and controlling equipment, and its object is to provide an integrated circuit device which has an excellent heat radiating characteristic. Then, in order to achieve this object, it includes, on a metal board 1, a power supply 4 and a plurality of pin terminals 5 and includes, on a multi-layer circuit wiring board 7, mounted component parts comprising a cache controller 10, a cache memory section 11, a data buffer LSI section 14, a CPU chip 8 and a connector 12; and, by mounting a reverse surface of the multi-layer circuit wiring board 7 having the mounted component parts provided thereon on the metal board 1 having the power supply 4 provided thereon through the pin terminal group 5, it is possible to provide an integrated circuit device in which the degree of integration is enhanced and the heat radiating characteristic of heat generating component parts is excellent.
Abstract:
A semiconductor device includes: a plate like device substrate (12) having upper and lower surfaces and a semiconductor chip (14) rigidly mounted on one of them. Circuit patterns (16) are formed on the one surface, each circuit pattern having one end electrically connected to the semiconductor chip (14) and the other end formed as a land portion (20) for electrical connection to an outside circuit. A plate like terminal substrate (26) has upper and lower surfaces and a plurality of through holes (30) and a plurality of mounting terminals (32) inserted into and fixed to the through holes (30). The mounting terminal (32) projects from the upper and lower surfaces of the terminal substrate, respectively. The terminal substrate (26) is attached to the device substrate (12), so that upper contacts (34) on the terminal substrate are electrically connected to the land portions (20) on the device substrate (12).
Abstract:
A multilayer ceramic wiring substrate includes a polyimide resin layer, first lands, and pins for external connection. The polyimide resin layer is formed on a ceramic substrate and has via holes arranged at positions where the polyimide resin layer is connected to through holes filled with a conductive material. The first lands are formed on the upper surface of the polyimide resin layer to cover the via holes. The pins are respectively brazed to the first lands by a brazing material.
Abstract:
A printed circuit board (10) comprises a baseboard (15), having conductor patterns (15c,15d,15e) therein and ground layers (15a,15b) on both surfaces thereof, and terminal pins (16) mounted on the baseboard (15). The terminal pins (16) have a root portion which does not project from the baseboard (15) and a contact portion which projects from the baseboard (15). A circuit assembly comprises a mother printed circuit board (10), such as the above-mentioned printed circuit board, on which circuit modules (11) are mounted. The circuit module (11) has terminal jacks (14), which are enclosed within a shielded package (13) and into which the terminal pins (16) of the mother printed circuit board (10) are connected by insertion.
Abstract:
There is provided a stacked mounting structure in which, it is possible to realize a narrowing of pitch and to secure a height which enables to mount components to be mounted, and a method of manufacturing stacked mounting structure. The stacked mounting structure includes a plurality of members provided with a mounting area which is necessary for installing and operating components to be mounted on at least one principal surface, and an area for connections for signal transfer for operating the components to be mounted, and an electroconductive member which is disposed on the area for connections between the mutually facing members, and a cross section of the electroconductive member is same as or smaller than the area for connections, and an end portion of the electroconductive member is extended from a principal surface of one member up to a principal surface of the other member, and a height of the electroconductive member regulates a distance of the mounting area.