Chip package and method of manufacturing the same
    32.
    发明授权
    Chip package and method of manufacturing the same 有权
    芯片封装及其制造方法

    公开(公告)号:US09406818B2

    公开(公告)日:2016-08-02

    申请号:US14971395

    申请日:2015-12-16

    Applicant: XINTEC INC.

    Abstract: A method of manufacturing chip package includes providing a semiconductor wafer having a plurality of semiconductor chips. An outer spacer and a plurality of inner spacers are formed on the semiconductor wafer. A protection lid is formed and disposed on the outer spacer and the inner spacers. A plurality of cavities is formed on each of the semiconductor chips from a lower surface thereof to expose the conductive pad disposed on the upper surface of the semiconductor chip. A plurality of conductive portions is formed and fills each of the cavities and electrically connected to each of the conductive pads. A plurality of solder balls is disposed on the lower surface and electrically connected to each of the conductive portions. The semiconductor chips are separated by cutting along a plurality of cutting lines between each of the semiconductor chips.

    Abstract translation: 制造芯片封装的方法包括提供具有多个半导体芯片的半导体晶片。 在半导体晶片上形成有外隔离物和多个内隔离物。 保护盖形成并设置在外隔离件和内间隔件上。 从其下表面在每个半导体芯片上形成多个空腔,以露出设置在半导体芯片的上表面上的导电焊盘。 形成多个导电部分,并填充每个空腔并电连接到每个导电焊盘。 多个焊球设置在下表面并电连接到每个导电部分。 半导体芯片通过沿着每个半导体芯片之间的多个切割线进行切割来分离。

    Chip package
    37.
    发明授权

    公开(公告)号:US11746003B2

    公开(公告)日:2023-09-05

    申请号:US17711067

    申请日:2022-04-01

    Applicant: XINTEC INC.

    CPC classification number: B81B7/007 B81B7/0074 B81C1/00301 B81B2207/07

    Abstract: A chip package includes a first die, a second die, a molding material, and a redistribution layer. The first die includes a first conductive pad. The second die is disposed on the first die and includes a second conductive pad. The molding material covers the first die and the second die. The molding material includes a top portion, a bottom portion, and an inclined portion adjoins the top portion and the bottom portion. The top portion is located on the second die, and the bottom portion is located on the first die. The redistribution layer is disposed along the top portion, the inclined portion, and the bottom portion. The redistribution layer is electrically connected to the first conductive pad and the second conductive pad.

    Chip package including substrate inclined sidewall and redistribution line

    公开(公告)号:US11521938B2

    公开(公告)日:2022-12-06

    申请号:US17140964

    申请日:2021-01-04

    Applicant: XINTEC INC.

    Abstract: A chip package includes a first substrate, a second substrate, a first conductive layer, and a metal layer. The first substrate has a bottom surface and an inclined sidewall adjoining the bottom surface, and an obtuse angle is between the bottom surface and the inclined sidewall. The second substrate is over the first substrate and has a portion that laterally extends beyond the inclined sidewall of the first substrate. The first conductive layer is between the first substrate and the second substrate. The metal layer is on said portion of the second substrate, on the bottom surface and the inclined sidewall of the first substrate, and electrically connected to an end of the first conductive layer.

    Chip package and fabrication method thereof

    公开(公告)号:US10049252B2

    公开(公告)日:2018-08-14

    申请号:US14967153

    申请日:2015-12-11

    Applicant: XINTEC INC.

    Abstract: A chip package includes a substrate, a capacitive sensing layer and a computing chip. The substrate has a first surface and a second surface opposite to the first surface, and the capacitive sensing layer is disposed above the second surface and having a third surface opposite to the second surface, which the capacitive sensing layer includes a plurality of capacitive sensing electrodes and a plurality of metal wires. The capacitive sensing electrodes are on the second surface, and the metal wires are on the capacitive sensing electrodes. The computing chip is disposed above the third surface and electrically connected to the capacitive sensing electrodes.

Patent Agency Ranking