Semiconductor package
    61.
    发明申请
    Semiconductor package 审中-公开
    半导体封装

    公开(公告)号:US20050168952A1

    公开(公告)日:2005-08-04

    申请号:US10974513

    申请日:2004-10-26

    IPC分类号: H01L23/04 H01L23/10 H05K7/20

    摘要: A semiconductor package includes a substrate; a chip mounted on a surface of the substrate; a lid having a flat portion and a support portion extending from the flat portion, wherein the support portion is attached to the substrate, with the chip being encompassed by the flat portion, the support portion and the substrate, and at least one cut-away portion is formed at an outer edge of a surface of the support portion attached to the substrate; an adhesive for attaching the lid to the substrate and filling the cut-away portion to allow an applied amount of the adhesive to be observed from the cut-away portion; and a plurality of solder balls mounted on another surface of the substrate. The applied amount of the adhesive can be adjusted optimally by provision of the cut-away portion to improve bonding strength between the lid and substrate and prevent flash of the adhesive.

    摘要翻译: 半导体封装包括基板; 安装在基板的表面上的芯片; 具有平坦部分和从所述平坦部分延伸的支撑部分的盖,其中所述支撑部分附接到所述基板,所述芯片被所述平坦部分,所述支撑部分和所述基板包围,并且至少一个切除 部分形成在附着于基板的支撑部分的表面的外边缘处; 粘合剂,用于将盖子附接到基板并填充切除部分,以允许从切除部分观察涂布量的粘合剂; 以及安装在所述基板的另一表面上的多个焊球。 可以通过设置切除部分来最佳地调节粘合剂的施加量,以提高盖和基板之间的粘合强度并防止粘合剂的闪光。

    Method and system of testing a semiconductor device
    67.
    发明授权
    Method and system of testing a semiconductor device 有权
    测试半导体器件的方法和系统

    公开(公告)号:US08400178B2

    公开(公告)日:2013-03-19

    申请号:US12431927

    申请日:2009-04-29

    IPC分类号: G01R31/02

    摘要: The present disclosure provides a semiconductor device, the device includes a substrate, a front-end structure formed in the substrate, a back-end structure formed on the front-end structure, a heater embedded in the back-end structure and operable to generate heat, and a sensor embedded in the back-end structure and operable to sense a temperature of the semiconductor device.

    摘要翻译: 本公开提供一种半导体器件,该器件包括衬底,形成在衬底中的前端结构,形成在前端结构上的后端结构,嵌入在后端结构中的加热器,可操作以产生 热和嵌入在后端结构中的传感器,并且可操作以感测半导体器件的温度。

    Heat dissipating structure and method for fabricating the same
    69.
    发明申请
    Heat dissipating structure and method for fabricating the same 审中-公开
    散热结构及其制造方法

    公开(公告)号:US20070296079A1

    公开(公告)日:2007-12-27

    申请号:US11818225

    申请日:2007-06-12

    IPC分类号: H01L23/34 H01L21/58

    摘要: A heat sink package structure and a method for fabricating the same are disclosed. The method includes mounting and electrically connecting a semiconductor chip to a chip carrier, forming an interface layer or a second heat dissipating element having the interface layer on the semiconductor chip and installing a first heat dissipating element having a heat dissipating portion and a supporting portion onto the chip carrier. The method further includes forming openings corresponding to the semiconductor chip in the heat dissipating portion, and forming an encapsulant for covering the semiconductor chip, the interface layer or the second heat dissipating element, and the first heat dissipating element. A height is reserved on top of the interface layer for the formation of the encapsulant for covering the interface layer. The method further includes cutting the encapsulant along edges of the interface layer, and removing the redundant encapsulant on the interface layer. Therefore, the drawbacks of the prior art of the burrs caused by a cutting tool for cutting the heat dissipating element and wearing of the cutting tool are overcome.

    摘要翻译: 公开了一种散热器封装结构及其制造方法。 该方法包括将半导体芯片安装并电连接到芯片载体,在半导体芯片上形成具有界面层的界面层或第二散热元件,并将具有散热部分和支撑部分的第一散热元件安装到 芯片载体。 该方法还包括形成对应于散热部分中的半导体芯片的开口,以及形成用于覆盖半导体芯片,界面层或第二散热元件的密封剂和第一散热元件。 在接口层顶部保留一个高度,用于形成覆盖界面层的密封剂。 该方法还包括沿着界面层的边缘切割密封剂,以及去除界面层上的冗余密封剂。 因此,克服了用于切割散热元件的切削工具和切削工具的磨损引起的毛刺现有技术的缺陷。