TECHNOLOGIES FOR SEALING LIQUID METAL INTERCONNECT ARRAY PACKAGES

    公开(公告)号:US20240074046A1

    公开(公告)日:2024-02-29

    申请号:US17899336

    申请日:2022-08-30

    申请人: Intel Corporation

    IPC分类号: H05K1/11 H05K1/18 H05K3/46

    摘要: Technologies for integrated circuit components with liquid metal interconnects are disclosed. In the illustrative embodiment, a bed of nails socket can mate with an integrated circuit component with liquid metal interconnects. The nails pierce a foam cap layer that seals the liquid metal interconnects, electrically coupling the nails to the liquid metal interconnects. A fabric layer adjacent to the foam cap layer helps secure the foam cap layer, preventing small pieces of the foam cap layer that may be dislodged during repeated insertion into a bed of nails socket from becoming separated from the foam cap layer. The fabric layer can provide additional benefits, such as removing more of the liquid metal from the nails when the integrated circuit component is removed from the bed of nails socket.

    Space transformer with perforated metallic plate for electrical die test

    公开(公告)号:US09941652B2

    公开(公告)日:2018-04-10

    申请号:US14973543

    申请日:2015-12-17

    申请人: INTEL CORPORATION

    IPC分类号: G01R31/28 H01R43/20 G01R1/073

    CPC分类号: H01R43/20 G01R1/07378

    摘要: Space transformer including a substrate and a perforated plate disposed on the substrate. The substrate includes conductive traces and an array of conductive probe pins extend outwardly from anchor points on the substrate. The pins are electrically coupled to at least one of the conductive traces on the substrate as an interface between an E-testing apparatus and a DUT. The perforated plate may be affixed to a surface of the substrate and includes an array of perforations through which the conductive pins may pass. The perforated plate may provide one or more of lateral pin support and protection to the underlying substrate and/or traces. The perforated plate may include a metal sheet. A polymeric material may be disposed on at least a sidewall of the perforations to electrically isolate the metal sheet from the conductive probe pins.