Abstract:
Die Erfindung betrifft ein Leistungshalbleitermodul (10) aufweisend: • wenigstens ein Substrat (4); • wenigstens einen auf dem Substrat (4) angeordneten Leistungshalbleiter (2), der auf seiner dem Substrat abgewandten Seite eine Anschlussfläche (21) aufweist; • eine auf dem Substrat (4) neben dem Leistungshalbleiter (2) angeordnete, gegebenenfalls segmentierte Lastpotenzialfläche (23); • mehrere Bondverbindungen (25, 26) zur parallelen elektrisch leitenden Verbindung der Anschlussfläche (21) mit der Lastpotenzialfläche (23), wobei jede Bondverbindung (25, 26) wenigstens einen ersten Bondfuß (31) auf der Lastpotenzialfläche (23) und mehrere zweite Bondfüße (32) auf der Anschlussfläche (21) aufweist und wobei jede Bondverbindung (25, 26) auf der Anschlussfläche (21) wenigstens ein Ende aufweist, • wobei die mehreren Bondverbindungen (25, 26) in wenigstens zwei Gruppen (25 bzw. 26) aus mehreren Bondverbindungen gleicher Anzahl von Bondfüßen arrangiert sind und die zweiten Bondfüße (32) jeder Bondverbindung einer Gruppe ausschließlich in einem durch eine Teilfläche der Anschlussfläche definierten Segment oder Bereich (22a bzw. 22b) der Anschlussfläche (21) angeordnet sind und die Gruppen sich dahingehend unterscheiden, dass deren erste Bondfüße (31) in einem unterschiedlichen, bevorzugt aber innerhalb jeder Gruppe übereinstimmenden, Abstand (a 1 bzw. a 2 ) zum Leistungshalbleiter (2) auf der Lastpotenzialfläche (23) angeordnet sind.
Abstract:
A die package having lead structures connecting to a die that provide for electromagnetic interference reductions. Mixed impedance leads connected to said die have a first lead with a first metal core (302), a dielectric layer (300,304) surrounding the first metal core (302), and first outer metal layer (306) connected to ground; and a second lead with a second metal core (302), and a second dielectric layer (300,304) surrounding the second metal core (302), and a second outer metal layer (306) connected to ground. Each lead reducing susceptibility to EMI and crosstalk.
Abstract:
An electronic component includes a III-N transistor and a III-N rectifying device both encased in a single package. A gate electrode of the III-N transistor is electrically connected to a first lead of the single package or to a conductive structural portion of the single package, a drain electrode of the III-N transistor is electrically connected to a second lead of the single package and to a first electrode of the III-N rectifying device, and a second electrode of the III-N rectifying device is electrically connected to a third lead of the single package.
Abstract:
Logic and memory may be packaged together in a single integrated circuit package that, in some embodiments, has high input/output pin count and low stack height. In some embodiments, the logic may be stacked on top of the memory which may be stacked on a flex substrate. Such a substrate may accommodate a multilayer interconnection system which facilitates high pin count and low package height. In some embodiments, the package may be wired so that the memory may only be accessed through the logic.
Abstract:
Ein optoelektronischer Empfänger, insbesondere ein Fernsteuer-Empfangsmodul, besitzt ein lichtempfindliches Halbleiterbauelement (11), mehrere Anschlussbeinchen (19, 25) und ein Gehäuse (29). Das lichtempfindliche Halbleiterbauelement (11) und die Anschlussbeinchen (19, 25) sind dergestalt in dem Gehäuse (29) vergossen, dass die Anschlussbeinchen mit einem jeweiligen freien Ende aus dem Gehäuse herausragen. Die Lichteintrittsfläche (31) des lichtempfindlichen Halbleiterbauelements (11) besitzt eine im Wesentlichen rechteckige Form. Die Seitenkanten der Lichteintrittsfläche (31) nehmen bezüglich der Erstreckungsrichtung der freien Enden der Anschlussbeinchen (19, 25) einen Winkel von 45° ein.
Abstract:
The present invention relates to an impedance transformation circuit (I10; 11 a; 11 b; 12) with a first contact pad (51) and a second contact pad (52) being spaced-apart and formed on a substrate (20). The impedance transformation circuit comprises at least first circuit element (40) providing a contact area (41) formed on the substrate (20) which is arranged adjacent and between the first (51) and the second (52) contact pad. A first 'Wire element (31) extends over the substrate (20) connecting the first contact pad (51) and a first end portion (41 a) of the contact area of the first circuit element (40), whilst at least a second wire element (32) extends over the substrate (20) connecting the second contact pad (52) and a second end portion (41b) of the contact area of the first circuit element (40). The contact area of the first circuit element (40) is shaped such that it is provided a capacitive connection with a predetermined capacitance between the contact area and a fixed reference poteitial. The packing density of the whole circuit can advantageously be increased by having tibe first wire element (31) and the at least second wire element (32) the same shape and having them arranged substantially in parallel to each other and further, by having the first contact's pad (51) and the second contact pad (52) located at opposite sides of the contact area of the at least first circuit element (40). Multiple impedance transformation circuits according to the invention can advantageously combined to a multi-coupled wire impedance transformation circuit (12).
Abstract:
A push-pull transistor chip comprises a single a semiconductor die having first and second LDMOS transistors formed thereon and configured for push-pull operation, the first and second transistors sharing a common element current region. In a power transistor package, the push-pull transistor chip is attached to a mounting flange serving as a common element ground reference, wherein a conductor (e.g., one or more bond wires) electrically connects the shared common element current region to the mounting flange.
Abstract:
A semiconductor integrated circuit device identifying method, wherein a plurality of identifying elements having the same form are formed in the process of production of semiconductor integrated circuit devices, the identifying elements being used as identifying information intrinsic in the semiconductor integrated circuit devices on the basis of the magnitude relation between physical values corresponding to process variations in the plurality of identifying elements.
Abstract:
A semiconductor package having a structure in which the surface of a semiconductor chip (30) is protected with a resin film (12) having a conductor wiring layer (11) and a method for manufacturing the semiconductor package. The surface of the semiconductor chip (30) and the resin film (12) are directly jointed by fusing the resin film (12), and a part of the conductor wiring layer (11) is connected with the electrode portion of the semiconductor chip (30) and another part of the conductor wiring layer (11) is exposed outside as an external terminal. The semiconductor package is highly reliable and excellent although it has a wireless/fine pitch and an extremely small thickness.
Abstract:
A method of increasing the packaging density of input/output interconnections on a semiconductor chip (10) includes creating a plurality of terminal pads on a substrate of the chip (10), providing an array of a plurality of bonding pads (11) on the surface of such chip (10) and connecting the bonding pads (11) and the terminal pads by means of insulated bond wires (13). The bonding pads are not limited to the periphery of the chip. The connections for the bond wires (13) are preferably made using the ball bonding process. Preferably, the bond wires (13) are made of aluminum and are coated with an aluminum oxide insulation (14).