Migration and plasma enhanced chemical vapor deposition
    43.
    发明授权
    Migration and plasma enhanced chemical vapor deposition 有权
    迁移和等离子体增强化学气相沉积

    公开(公告)号:US09045824B2

    公开(公告)日:2015-06-02

    申请号:US13748458

    申请日:2013-01-23

    Abstract: A method of producing a thin film using plasma enhanced chemical vapor deposition, including the steps of supplying a cation species to a substrate region when there is at most a relatively low flux of a plasma based anion species in the substrate region, and supplying the plasma based anion species to the substrate region when there is at most a relatively low flux of the cation species in the substrate region. This enables delivery of gaseous reactants to be separated in time in PECVD and/or RPECVD based film growth systems, which provides a significant reduction in the formation of dust particles for these plasma based film growth techniques.

    Abstract translation: 一种使用等离子体增强化学气相沉积法生产薄膜的方法,包括以下步骤:当基底区域中基于等离子体的阴离子种类最多具有相对较低的通量时,将阳离子种类提供给基底区域,并且提供等离子体 当衬底区域中阳离子种类最多具有相对较低的通量时,基底阴离子物质与基底区域相关。 这使得能够在PECVD和/或基于RPECVD的膜生长系统中及时分离出气态反应物的分离,这为这些基于等离子体的膜生长技术的灰尘颗粒的形成提供了显着的降低。

    METHOD OF DEPOSITING THIN FILM
    44.
    发明申请
    METHOD OF DEPOSITING THIN FILM 有权
    沉积薄膜的方法

    公开(公告)号:US20150125629A1

    公开(公告)日:2015-05-07

    申请号:US14526811

    申请日:2014-10-29

    Abstract: A method of depositing a thin film includes: repeating a first gas supply cycle a first plurality of times, the first gas supply cycle including supplying a source gas to a reaction space; supplying first plasma while supplying a reactant gas to the reaction space; repeating a second gas supply cycle a second plurality of times, the second gas supply cycle including supplying the source gas to the reaction space; and supplying second plasma while supplying the reactant gas to the reaction space, wherein the supplying of the first plasma includes supplying remote plasma, and the supplying of the second plasma includes supplying direct plasma.

    Abstract translation: 沉积薄膜的方法包括:首先重复第一气体供应循环,第一气体供应循环包括将源气体供应到反应空间; 供应第一等离子体,同时向反应空间供应反应气体; 重复第二次气体供给循环第二次,第二气体供应循环包括将源气体供应到反应空间; 以及在将所述反应气体供应到所述反应空间的同时供给第二等离子体,其中所述第一等离子体的供给包括供给远程等离子体,所述第二等离子体的供给包括供给直接等离子体

    SUBSTRATE PROCESSING APPARATUS
    47.
    发明申请
    SUBSTRATE PROCESSING APPARATUS 有权
    基板加工设备

    公开(公告)号:US20150007772A1

    公开(公告)日:2015-01-08

    申请号:US14312137

    申请日:2014-06-23

    Abstract: A substrate processing apparatus includes: a processing vessel configured to be vacuumed; a holding unit configured to hold a plurality of substrates and to be inserted into or separated from the processing vessel; a gas supply unit configured to supply gas into the processing vessel; a plasma generation box partitioned and formed by a plasma partition wall; an inductively coupled electrode located at an outer sidewall of the plasma generation box along its length direction; a high frequency power supply connected to the inductively coupled electrode through a feed line; and a ground electrode located outside the plasma generation box and between the processing vessel and the inductively coupled electrode and arranged in the vicinity of the outer sidewall of the plasma generation box or at least partially in contact with the outer sidewall.

    Abstract translation: 基板处理装置包括:被配置为被抽真空的处理容器; 保持单元,其构造成保持多个基板并插入到处理容器中或与处理容器分离; 气体供给单元,其构造成将气体供给到所述处理容器内; 由等离子体隔壁分隔和形成的等离子体产生箱; 电感耦合电极,位于等离子体发生箱的沿其长度方向的外侧壁; 高频电源,通过馈电线连接到电感耦合电极; 位于等离子体生成箱的外部,处理容器与电感耦合电极之间的配置在等离子体生成箱的外侧壁附近,或至少部分地与外侧壁接触的接地电极。

    FLOWABLE SILICON-CARBON-OXYGEN LAYERS FOR SEMICONDUCTOR PROCESSING
    49.
    发明申请
    FLOWABLE SILICON-CARBON-OXYGEN LAYERS FOR SEMICONDUCTOR PROCESSING 有权
    用于半导体加工的可流动的硅 - 氧 - 氧层

    公开(公告)号:US20140302688A1

    公开(公告)日:2014-10-09

    申请号:US13934863

    申请日:2013-07-03

    Abstract: Methods are described for forming a dielectric layer on a patterned substrate. The methods may include combining a silicon-and-carbon-containing precursor and a radical oxygen precursor in a plasma free substrate processing region within a chemical vapor deposition chamber. The silicon-and-carbon-containing precursor and the radical oxygen precursor react in to deposit a flowable silicon-carbon-oxygen layer on the patterned substrate. The resulting film possesses a low wet etch rate ratio relative to thermal silicon oxide and other standard dielectrics.

    Abstract translation: 描述了在图案化衬底上形成电介质层的方法。 所述方法可以包括在化学气相沉积室内的无等离子体衬底处理区域中组合含硅和碳的前体和自由基氧前体。 含硅和碳的前体和自由基氧前体反应以在图案化的衬底上沉积可流动的硅 - 碳 - 氧层。 所得膜相对于热氧化硅和其它标准电介质具有低的湿蚀刻速率比。

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