PRESSURE SENSOR AND METHOD OF PACKAGING SAME
    7.
    发明申请
    PRESSURE SENSOR AND METHOD OF PACKAGING SAME 有权
    压力传感器及其包装方法

    公开(公告)号:US20140206124A1

    公开(公告)日:2014-07-24

    申请号:US14219011

    申请日:2014-03-19

    IPC分类号: H01L41/25

    摘要: A method of packaging a pressure sensor die includes providing a lead frame having a die pad and lead fingers that surround the die pad. A tape is attached to a first side of the lead frame. A pressure sensor die is attached to the die pad on a second side of the lead frame and bond pads of the die are connected to the lead fingers. An encapsulant is dispensed onto the second side of the lead frame and covers the lead fingers and the electrical connections thereto. A gel is dispensed onto a top surface of the die and covers the die bond pads and the electrical connections thereto. A lid is attached to the lead frame and covers the die and the gel, and sides of the lid penetrate the encapsulant.

    摘要翻译: 包装压力传感器管芯的方法包括提供引线框架,其具有围绕管芯焊盘的管芯焊盘和引线指。 带子附接到引线框架的第一侧。 压力传感器芯片在引线框架的第二侧附接到芯片焊盘,并且芯片的焊盘被连接到引线指。 将密封剂分配到引线框架的第二侧上并且覆盖引线指及其电连接。 将凝胶分配到模具的顶表面上并覆盖芯片接合焊盘及其电连接。 盖子连接到引线框架并覆盖模具和凝胶,并且盖的侧面穿透密封剂。

    Non-homogeneous molding of packaged semiconductor devices
    10.
    发明授权
    Non-homogeneous molding of packaged semiconductor devices 有权
    封装半导体器件的非均匀成型

    公开(公告)号:US09202770B1

    公开(公告)日:2015-12-01

    申请号:US14474291

    申请日:2014-09-01

    IPC分类号: H01L23/367 H01L21/56 B29B9/12

    摘要: A packaged semiconductor device has an integrated circuit (IC) die and first and second volumes of molding compound. The first volume of molding compound is disposed on a first portion of a first side of the IC die and comprises a first molding compound. The second volume of molding compound is disposed on a second side of the IC die, different from the first side, and comprises a second molding compound, different from the first molding compound. By including different molding compounds, the properties of the packaged semiconductor device can be varied across the device.

    摘要翻译: 封装的半导体器件具有集成电路(IC)模具和第一和第二体积的模塑料。 第一体积的模塑料被设置在IC模头的第一侧的第一部分上并且包括第一模塑料。 第二体积的成型化合物设置在IC模具的与第一侧不同的第二侧上,并且包括与第一模塑料不同的第二模塑料。 通过包括不同的成型化合物,封装的半导体器件的性能可以在整个器件上变化。