摘要:
Semiconductor devices packages and methods are disclosed. In one embodiment, a package for a semiconductor device includes a substrate and a contact pad disposed on a first surface of the substrate. The contact pad has a first side and a second side opposite the first side. A conductive trace is coupled to the first side of the contact pad, and an extension of the conductive trace is coupled to the second side of the contact pad. A plurality of bond pads is disposed on a second surface of the substrate.
摘要:
Disclosed herein is a system and method for mounting packages by forming one or more wire loop interconnects, optionally, with a wirebonder, and mounting the interconnects to a mounting pad on a first substrate. A first and second stud ball may each have at least one flat surface be disposed on a single mounting pad, and a wire having a bend region and forming a loop may be disposed between the stud balls. The stud balls may be formed from a deformed mouthing node formed on a wire. The loop may be mounted on a mounting pad on a first substrate and a second substrate may be mounted on the loop via a conductive material such as solder.
摘要:
Disclosed herein is a system and method for mounting packages by forming one or more wire loop interconnects, optionally, with a wirebonder, and mounting the interconnects to a mounting pad on a first substrate. A first and second stud ball may each have at least one flat surface be disposed on a single mounting pad, and a wire having a bend region and forming a loop may be disposed between the stud balls. The stud balls may be formed from a deformed mouthing node formed on a wire. The loop may be mounted on a mounting pad on a first substrate and a second substrate may be mounted on the loop via a conductive material such as solder.
摘要:
Package on package (PoP) devices and methods of packaging semiconductor dies are disclosed. A PoP device includes a first packaged die and a second packaged die coupled to the first packaged die. Metal stud bumps are disposed between the first packaged die and the second packaged die. The metal stud bumps include a bump region and a tail region coupled to the bump region. The metal stud bumps are embedded in solder joints.
摘要:
An adjusting frequency device of built-in oscillator for USB interface and a method thereof are described. It is Auto detect the error of bit-rate between the USB host and the USB device, and produce tiny counting time for clocking the clock error between the USB host and the USB device by a delay lock loop. The clock error after quantification, digitization and operation outputting a quantitative code, then the oscillator adjusts the oscillation frequency according to the quantitative code. Whereby adjusting the oscillation frequency of the USB device and the frequency of the USB host to less than 1% clock error for ensuring the accuracy of data transmission.
摘要:
The described embodiments of forming bonding structures for package on package involves removing a portion of connectors and molding compound of the lower package. The described bonding mechanisms enable easier placement and alignment of connectors of an upper package to with connector of a lower package. As a result, the process window of the bonding process is wider. In addition, the bonding structures have smoother join profile and planar joint plane. As a result, the bonding structures are less likely to crack and also are less likely to crack. Both the yield and the form factor of the package on package structure are improved.
摘要:
The provided delay lock loop delaying an input signal includes a quadrature generator, a voltage controller and a delay cell. The input signal is inputted into the quadrature generator and the delay cell. A phase-changing signal from the quadrature generator and a delay signal respectively from the delay cell are inputted into the voltage controller at the same time so that a control voltage inputted into the delay cell to control a delay time of the delay signal is generated. Also, the provided phase angle generator generates an output signal in an arbitrary phase.
摘要:
One or more metallized chip terminals of an electronic device, such as an integrated circuit chip or a laser chip, in one embodiment are temporarily bonded to one or more metallized substrate pads of a wiring substrate, as for the purpose of electrically testing the electronic device. The composition of the metallized chip terminals is suitably different from that of the metallized substrate pads. The pads and terminals are aligned and electrically connected together with a solder located between them under pressure and a temperature above the melting point of the solder. The solder is cooled, and electrical tests of the electronic device are performed by means of electrical access from testing circuitry to the chip terminals through the substrate pads. Then the solder is heated again above its melting point while being immersed in a liquid flux, whereby the liquid solder wets the metallized chip terminals but not the metallized substrate pads, and the device is gently mechanically pulled away from the wiring substrate and is cooled thereafter. This substrate can thereafter be reused for testing other electronic devices that have similarly suitably metallized terminals. In another embodiment, testing can be performed or not as may be desired; and, as for the purpose of chip operation as an integrated circuit or laser, the chip can be allowed to remain permanently bonded to the substrate in the form of a heat-sinking or heat-spreading submount, or it can be allowed to remain only temporarily bonded to the submount and subsequently pulled away from the submount for the purpose of reuse of the submount for another chip.
摘要:
A device such as a laser is bonded to a submount such as diamond by a process in which the submount is successively coated with an adhesion layer such as titanium, a barrier layer such as nickel, and a gold-tin solder-metallization composite layer formed by sequential deposition on the barrier layer a number (preferably greater than seven) of multiple alternating layers of gold and tin, the last layer being gold having a thickness that is equal to approximately one-half or less than the thickness of the (next-to-last) tin layer that it contacts immediately beneath it. The bonding is performed under applied heat that is sufficient to melt the solder-metallization composite layer. Prior to the bonding, (in addition to the submount) the device advantageously is coated with gold and optionally with a similar gold-tin solder-metallization composite layer, at least at locations where it comes in contact with the gold-tin solder-metallization composite layer.
摘要:
The provided delay lock loop delaying an input signal includes a quadrature generator, a voltage controller and a delay cell. The input signal is inputted into the quadrature generator and the delay cell. A phase-changing signal from the quadrature generator and a delay signal respectively from the delay cell are inputted into the voltage controller at the same time so that a control voltage inputted into the delay cell to control a delay time of the delay signal is generated. Also, the provided phase angle generator generates an output signal in an arbitrary phase.