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公开(公告)号:US20180122686A1
公开(公告)日:2018-05-03
申请号:US15863924
申请日:2018-01-06
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Zeev Wurman
IPC: H01L21/768 , H03K19/177 , G06F17/50 , H01L23/525
CPC classification number: H01L21/768 , G06F17/5031 , G06F17/505 , G06F17/5068 , G06F17/5081 , G11C5/025 , G11C5/063 , G11C8/08 , G11C17/16 , G11C17/18 , G11C29/12 , G11C29/32 , G11C29/44 , G11C29/70 , G11C2029/0407 , H01L23/5252 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/73204 , H01L2224/73265 , H01L2924/00 , H01L2924/00014 , H01L2924/1305 , H01L2924/15311 , H01L2924/181 , H03K19/17736 , H03K19/17748 , H03K19/1778 , H01L2924/00012
Abstract: A 3D device, the device including: a first stratum including an array of memory bit cells, the array of memory bit cells is controlled via a plurality of bit-lines and a plurality of word-lines; and a second stratum overlaying the first stratum, the second stratum including memory control circuits, where the control circuits provide control of the plurality of bit-lines and the plurality of word-lines.
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公开(公告)号:US09954080B2
公开(公告)日:2018-04-24
申请号:US15622124
申请日:2017-06-14
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Deepak C. Sekar , Brian Cronquist
IPC: H01L29/76 , H01L29/94 , H01L31/062 , H01L31/113 , H01L31/119 , H01L29/00 , H01L29/66 , H01L23/544 , H01L27/02 , H01L27/088 , H01L21/74 , H01L27/11551 , H01L29/78 , H01L23/34 , H01L27/11573 , H01L23/50 , H01L27/11526 , H01L23/48 , H01L27/118 , H01L29/10 , H01L27/108 , H01L29/732 , H01L27/11578 , H01L29/808 , H01L27/06 , H01L27/24
CPC classification number: H01L29/66704 , H01L21/743 , H01L21/76898 , H01L21/823475 , H01L23/34 , H01L23/481 , H01L23/50 , H01L23/544 , H01L27/0207 , H01L27/0623 , H01L27/0688 , H01L27/088 , H01L27/0886 , H01L27/092 , H01L27/10802 , H01L27/10894 , H01L27/10897 , H01L27/11526 , H01L27/11551 , H01L27/11573 , H01L27/11578 , H01L27/11807 , H01L27/1203 , H01L27/228 , H01L27/2436 , H01L27/249 , H01L29/1066 , H01L29/66272 , H01L29/66825 , H01L29/66901 , H01L29/732 , H01L29/7841 , H01L29/786 , H01L29/808 , H01L45/04 , H01L45/06 , H01L45/146 , H01L45/16 , H01L2223/54426 , H01L2223/54453 , H01L2224/16225 , H01L2224/73253 , H01L2924/00 , H01L2924/0002 , H01L2924/12032 , H01L2924/1305 , H01L2924/13062 , H01L2924/13091 , H01L2924/1461 , H01L2924/16152
Abstract: A 3D integrated circuit device, including: a first transistor; a second transistor; and a third transistor, where the third transistor is overlaying the second transistor and the second transistor is overlaying the first transistor, where the first transistor controls the supply of a ground or a power signal to the third transistor, and where the first transistor, the second transistor and the third transistor are aligned to each other with less than 100 nm misalignment.
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公开(公告)号:US09953972B2
公开(公告)日:2018-04-24
申请号:US15470866
申请日:2017-03-27
Applicant: Monolithic 3D Inc.
Inventor: Deepak Sekar , Zvi Or-Bach , Brian Cronquist
IPC: H01L27/06 , H01L21/762 , H01L27/108 , H01L21/8234 , H01L23/367 , H01L23/48 , H01L23/522 , H01L25/065 , H01L27/088 , H01L27/092
CPC classification number: H01L27/0688 , H01L21/76254 , H01L21/823475 , H01L23/3677 , H01L23/481 , H01L23/5225 , H01L23/585 , H01L25/0657 , H01L27/088 , H01L27/0886 , H01L27/092 , H01L27/0922 , H01L27/10802 , H01L27/10897 , H01L28/00 , H01L2225/06527 , H01L2225/06541 , H01L2225/06589 , H01L2924/0002 , H01L2924/00
Abstract: An Integrated Circuit device, including: first transistors and second transistors, where the first transistors and the second transistors each include a single crystal channel, where at least one of the second transistors overlays at least one of the first transistors with less than 1 micron distance apart, and where at least one of the second transistors is a dopant segregated schottky barrier transistor.
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公开(公告)号:US09953870B2
公开(公告)日:2018-04-24
申请号:US15488514
申请日:2017-04-16
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Deepak C. Sekar , Brian Cronquist , Zeev Wurman
IPC: H01L21/77 , H01L29/66 , H01L27/10 , H01L23/40 , H01L23/00 , H01L23/31 , H01L27/02 , B82Y10/00 , H01L21/84 , H01L23/528 , H01L21/683 , H01L21/762 , H01L27/06 , H01L29/78 , H01L27/092 , H01L27/105 , H01L27/108 , H01L29/786 , H01L29/788 , H01L29/792 , H01L27/11 , H01L27/11524 , H01L27/11526 , H01L27/11529 , H01L27/11551 , H01L27/1157 , H01L27/11573 , H01L27/11578 , H01L27/118 , H01L27/12 , H01L29/10 , G11C16/04 , H01L23/36 , H01L23/367 , H01L27/088
CPC classification number: H01L21/77 , B82Y10/00 , G11C16/0408 , G11C16/0483 , H01L21/6835 , H01L21/76254 , H01L21/84 , H01L23/3114 , H01L23/36 , H01L23/3677 , H01L23/4012 , H01L23/5286 , H01L24/01 , H01L24/13 , H01L24/16 , H01L24/32 , H01L24/48 , H01L27/0207 , H01L27/0688 , H01L27/0694 , H01L27/088 , H01L27/092 , H01L27/10 , H01L27/1052 , H01L27/10802 , H01L27/10894 , H01L27/10897 , H01L27/1104 , H01L27/1108 , H01L27/1116 , H01L27/11524 , H01L27/11526 , H01L27/11529 , H01L27/11551 , H01L27/1157 , H01L27/11573 , H01L27/11578 , H01L27/11807 , H01L27/1203 , H01L27/2436 , H01L27/249 , H01L28/00 , H01L29/1033 , H01L29/66257 , H01L29/6659 , H01L29/66795 , H01L29/66825 , H01L29/66833 , H01L29/7841 , H01L29/785 , H01L29/78696 , H01L29/7881 , H01L29/792 , H01L45/04 , H01L45/1226 , H01L45/146 , H01L2221/6835 , H01L2221/68381 , H01L2224/131 , H01L2224/16145 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/48227 , H01L2224/73204 , H01L2224/73265 , H01L2224/81001 , H01L2924/00014 , H01L2924/10253 , H01L2924/12032 , H01L2924/12042 , H01L2924/1305 , H01L2924/13062 , H01L2924/13091 , H01L2924/1461 , H01L2924/15311 , H01L2924/3011 , H01L2924/3025 , H01L2924/00012 , H01L2924/00015 , H01L2924/014 , H01L2924/3512 , H01L2924/00 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
Abstract: A 3D integrated circuit device, including: a first transistor; a second transistor; and a third transistor, where the third transistor is overlaying the second transistor and the third transistor is controlled by a third control line, where the second transistor is overlaying the first transistor and the second transistor is controlled by a second control line, where the first transistor is part of a control circuit controlling the second control line and the third control line, and where the second transistor and the third transistor are self-aligned.
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公开(公告)号:US20170294415A1
公开(公告)日:2017-10-12
申请号:US15632325
申请日:2017-06-24
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach
IPC: H01L25/065 , H01L23/544
CPC classification number: H01L25/0657 , H01L23/544 , H01L25/0652 , H01L25/50 , H01L2223/5442 , H01L2223/54426 , H01L2225/06541 , H01L2225/06568 , H01L2225/06593
Abstract: A 3D semiconductor device and structure, including: a first die including first transistors and first interconnect, overlaid by a second die including second transistors and second interconnect, where the first die has a first die area and the second die has a second die area, where the first die area is at least 10% larger than the second die area, and where the second die has a thickness of less than four microns.
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公开(公告)号:US20170287844A1
公开(公告)日:2017-10-05
申请号:US15622124
申请日:2017-06-14
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Deepak C. Sekar , Brian Cronquist
IPC: H01L23/544 , H01L27/088 , H01L23/34 , H01L27/11551 , H01L29/66 , H01L29/78 , H01L27/02 , H01L21/74
CPC classification number: H01L29/66704 , H01L21/743 , H01L21/76898 , H01L21/823475 , H01L23/34 , H01L23/481 , H01L23/50 , H01L23/544 , H01L27/0207 , H01L27/0623 , H01L27/0688 , H01L27/088 , H01L27/0886 , H01L27/092 , H01L27/10802 , H01L27/10894 , H01L27/10897 , H01L27/11526 , H01L27/11551 , H01L27/11573 , H01L27/11578 , H01L27/11807 , H01L27/1203 , H01L27/228 , H01L27/2436 , H01L27/249 , H01L29/1066 , H01L29/66272 , H01L29/66825 , H01L29/66901 , H01L29/732 , H01L29/7841 , H01L29/786 , H01L29/808 , H01L45/04 , H01L45/06 , H01L45/146 , H01L45/16 , H01L2223/54426 , H01L2223/54453 , H01L2224/16225 , H01L2224/73253 , H01L2924/00 , H01L2924/0002 , H01L2924/12032 , H01L2924/1305 , H01L2924/13062 , H01L2924/13091 , H01L2924/1461 , H01L2924/16152
Abstract: A 3D integrated circuit device, including: a first transistor; a second transistor; and a third transistor, where the third transistor is overlaying the second transistor and the second transistor is overlaying the first transistor, where the first transistor controls the supply of a ground or a power signal to the third transistor, and where the first transistor, the second transistor and the third transistor are aligned to each other with less than 100 nm misalignment.
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公开(公告)号:US20170186770A1
公开(公告)日:2017-06-29
申请号:US15460230
申请日:2017-03-16
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Brian Cronquist , Deepak C. Sekar , Zeev Wurman , Israel Beinglass
IPC: H01L27/11582 , H01L29/16 , H01L27/11575 , H01L29/04 , H01L27/11573 , H01L27/24
CPC classification number: H01L27/11582 , B82Y10/00 , H01L21/6835 , H01L21/76254 , H01L21/8221 , H01L21/823828 , H01L21/84 , H01L23/3677 , H01L23/5252 , H01L23/544 , H01L24/00 , H01L24/45 , H01L24/48 , H01L25/0655 , H01L25/0657 , H01L25/50 , H01L27/0207 , H01L27/0688 , H01L27/088 , H01L27/092 , H01L27/10 , H01L27/105 , H01L27/10802 , H01L27/10873 , H01L27/10876 , H01L27/10894 , H01L27/10897 , H01L27/11 , H01L27/1108 , H01L27/112 , H01L27/11206 , H01L27/11526 , H01L27/11529 , H01L27/11551 , H01L27/11573 , H01L27/11575 , H01L27/11578 , H01L27/11807 , H01L27/11898 , H01L27/1203 , H01L27/1214 , H01L27/1266 , H01L27/2436 , H01L27/249 , H01L28/00 , H01L29/04 , H01L29/0673 , H01L29/66272 , H01L29/66439 , H01L29/66825 , H01L29/66833 , H01L29/66901 , H01L29/775 , H01L29/7841 , H01L29/785 , H01L29/7881 , H01L29/792 , H01L45/04 , H01L45/1226 , H01L45/146 , H01L2221/68368 , H01L2223/54426 , H01L2223/54453 , H01L2224/131 , H01L2224/16225 , H01L2224/16235 , H01L2224/32145 , H01L2224/32225 , H01L2224/45124 , H01L2224/45147 , H01L2224/48091 , H01L2224/48227 , H01L2224/73204 , H01L2224/73253 , H01L2224/73265 , H01L2224/83894 , H01L2225/06513 , H01L2225/06541 , H01L2225/06558 , H01L2924/00011 , H01L2924/00014 , H01L2924/01322 , H01L2924/10253 , H01L2924/10329 , H01L2924/12032 , H01L2924/12033 , H01L2924/12036 , H01L2924/12042 , H01L2924/1301 , H01L2924/1305 , H01L2924/13062 , H01L2924/13091 , H01L2924/1431 , H01L2924/1434 , H01L2924/1461 , H01L2924/15311 , H01L2924/1579 , H01L2924/16152 , H01L2924/19041 , H01L2924/30105 , H01L2924/3011 , H01L2924/3025 , H01L2924/014 , H01L2924/00015 , H01L2924/00 , H01L2224/80001 , H01L2224/05599
Abstract: A semiconductor memory, including: a first memory cell including a first transistor; a second memory cell including a second transistor; and a memory peripherals transistor, the memory peripherals transistor is overlaying the second transistor or is underneath the first transistor, where the second memory cell overlays the first memory cell at a distance of less than 200 nm, and where the memory peripherals transistor is part of a peripherals circuit controlling the memory.
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公开(公告)号:US20170092541A1
公开(公告)日:2017-03-30
申请号:US15201430
申请日:2016-07-02
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Deepak C. Sekar , Brian Cronquist
IPC: H01L21/822 , H01L23/367 , H01L27/22 , H01L27/24 , H01L21/762 , H01L27/108
CPC classification number: H01L21/8221 , H01L21/76254 , H01L23/367 , H01L27/0688 , H01L27/085 , H01L27/0886 , H01L27/092 , H01L27/10802 , H01L27/10844 , H01L27/1108 , H01L27/11524 , H01L27/11551 , H01L27/226 , H01L27/2436 , H01L27/2481 , H01L27/249 , H01L29/42392 , H01L45/04 , H01L45/1226 , H01L45/146 , H01L45/16 , H01L2224/16225 , H01L2224/32225 , H01L2224/73204 , H01L2924/15311 , H01L2924/00
Abstract: A 3D semiconductor device including: a first structure including first single crystal transistors; a second structure including second single crystal transistors, the second structure overlaying the first single crystal transistors, where at least one of the second single crystal transistors is at least partially self-aligned to at least one of the first single crystal transistors; and at least one thermal conducting path from at least one of the first single crystal transistors and second single crystal transistors to an external surface of the device.
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公开(公告)号:US09412645B1
公开(公告)日:2016-08-09
申请号:US14200061
申请日:2014-03-07
Applicant: Monolithic 3D Inc.
Inventor: Zvi Or-Bach , Zeev Wurman
IPC: H03K19/094 , H01L21/768 , H01L23/525
CPC classification number: H01L27/1128 , G06F17/505 , G06F17/5068 , H01L21/768 , H01L23/5252 , H01L27/11206 , H01L2224/16225 , H01L2224/32145 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/73204 , H01L2224/73265 , H01L2924/1305 , H03K19/17736 , H03K19/17748 , H03K19/1778 , H01L2924/00014 , H01L2924/00
Abstract: A method for fabricating semiconductor devices, including: providing a CMOS fabric and metal layers, the metal layers including a first metal layer, a second metal layer, a third metal layer, and a fourth metal layer, the metal layers providing interconnection for the CMOS fabric, and constructing mask defined connections between the third metal layer and the fourth metal layer, the mask defined connections are substantially similar to antifuse programmed connections of a programmed antifuse programmable device, where the antifuse programmable device is a 3D antifuse programmable device including antifuses and antifuse programming transistors, where the antifuse programming transistors overlay the antifuses, and where the antifuse programming transistors include a monocrystalline channel.
Abstract translation: 一种制造半导体器件的方法,包括:提供CMOS结构和金属层,所述金属层包括第一金属层,第二金属层,第三金属层和第四金属层,所述金属层为CMOS提供互连 织物,并且在第三金属层和第四金属层之间构造掩模限定的连接,掩模限定的连接基本上类似于编程反熔丝可编程器件的反熔丝编程连接,其中反熔丝可编程器件是包括反熔丝的3D反熔丝可编程器件, 反熔丝编程晶体管,其中反熔丝编程晶体管覆盖反熔丝,并且其中反熔丝编程晶体管包括单晶通道。
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公开(公告)号:US20150123072A1
公开(公告)日:2015-05-07
申请号:US14555494
申请日:2014-11-26
Applicant: Monolithic 3D Inc.
Inventor: Deepak C. Sekar , Zvi Or-Bach
IPC: H01L27/24 , H01L27/108
CPC classification number: H01L27/2481 , H01L21/268 , H01L21/6835 , H01L21/76254 , H01L21/8221 , H01L21/84 , H01L21/845 , H01L27/0688 , H01L27/105 , H01L27/10802 , H01L27/10826 , H01L27/10879 , H01L27/10897 , H01L27/11 , H01L27/11526 , H01L27/11529 , H01L27/11551 , H01L27/11573 , H01L27/11578 , H01L27/1203 , H01L27/1211 , H01L27/228 , H01L27/2436 , H01L27/249 , H01L29/42392 , H01L29/7841 , H01L29/785 , H01L45/04 , H01L45/1226 , H01L45/146 , H01L2029/7857 , H01L2221/6835
Abstract: A device, including: a first layer including first transistors and a second layer including second transistors, where at least one of the first transistors is self-aligned to one of the second transistors, where the second transistors are horizontally oriented transistors, and where the second layer includes a plurality of resistive-random-access memory (RRAM) cells, the memory cells including the second transistors.
Abstract translation: 一种器件,包括:包括第一晶体管的第一层和包括第二晶体管的第二层,其中所述第一晶体管中的至少一个与所述第二晶体管之一自对准,其中所述第二晶体管是水平取向的晶体管,并且其中 第二层包括多个电阻随机存取存储器(RRAM)单元,该存储单元包括第二晶体管。
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