Varistor and varistor apparatus
    71.
    发明授权
    Varistor and varistor apparatus 失效
    压敏电阻和变阻器装置

    公开(公告)号:US08174353B2

    公开(公告)日:2012-05-08

    申请号:US12235437

    申请日:2008-09-22

    IPC分类号: H01C7/10

    CPC分类号: H01C1/022 H01C1/144 H01C7/126

    摘要: A varistor comprises a main body having first and second external terminals formed on the outer surface thereof, a first withdrawn terminal plate joined to the first external terminal, and a second withdrawn terminal plate joined to the second external terminal, wherein the melting point of a second bonding material for allowing the second withdrawn terminal plate and the second external terminal to be joined to each other is lower than that of a first bonding material for allowing the first withdrawn terminal plate and the first external terminal to be joined to each other.

    摘要翻译: 变阻器包括:主体,其外表面上形成有第一和第二外部端子,与第一外部端子接合的第一引出端子板和与第二外部端子连接的第二抽出端子板,其中熔点 用于使第二取出端子板和第二外部端子彼此接合的第二接合材料低于用于使第一取出端子板和第一外部端子彼此接合的第一接合材料的接合材料。

    ARRAY SUBSTRATE, METHOD OF MANUFACTURING THE SAME, AND METHOD OF REPAIRING LINE IN THE SAME
    75.
    发明申请
    ARRAY SUBSTRATE, METHOD OF MANUFACTURING THE SAME, AND METHOD OF REPAIRING LINE IN THE SAME 有权
    阵列基板,其制造方法及其修复方法

    公开(公告)号:US20110097836A1

    公开(公告)日:2011-04-28

    申请号:US12982252

    申请日:2010-12-30

    IPC分类号: H01L21/336

    摘要: An array substrate includes a substrate, a gate line on the substrate, a data line crossing the gate line to define a pixel region, a thin film transistor connected to the gate and data lines, a pixel electrode in the pixel region, and a common electrode including first, second, third, fourth and fifth portions, wherein the first and second portions are disposed at both sides of the data line, each of the third and fourth portions is connected to the first and second portions, and the fifth portion is connected to the second portion and is extended into a next pixel region adjacent to the pixel region.

    摘要翻译: 阵列基板包括基板,基板上的栅极线,与栅极线交叉以限定像素区域的数据线,连接到栅极和数据线的薄膜晶体管,像素区域中的像素电极,以及共同的 电极,包括第一,第二,第三,第四和第五部分,其中第一和第二部分设置在数据线的两侧,第三和第四部分中的每一个连接到第一和第二部分,第五部分是 连接到第二部分并且延伸到与像素区域相邻的下一个像素区域。

    Method of manufacturing barrier rib for plasma display panel
    77.
    发明授权
    Method of manufacturing barrier rib for plasma display panel 有权
    等离子显示面板隔壁的制造方法

    公开(公告)号:US07766713B2

    公开(公告)日:2010-08-03

    申请号:US11918221

    申请日:2006-02-03

    IPC分类号: H01J17/49

    CPC分类号: H01J9/242 H01J2211/36

    摘要: Disclosed herein is a method of manufacturing a barrier rib for a plasma display panel, including a silicon compound resin. The method according to a first embodiment of this invention includes providing a silicon compound resin layer on a substrate; pressing the silicon compound resin layer using a master having a pattern corresponding to the shape of a barrier rib to be transferred; and curing the silicon compound resin and then releasing the master. In addition, the method according to a second embodiment includes loading a silicon compound resin into grooves of a master having a pattern corresponding to the shape of a barrier rib; pressing the master on a substrate to transfer the silicon compound to the substrate; and curing the transferred silicon compound resin and then releasing the master.

    摘要翻译: 本文公开了一种制造包括硅化合物树脂的等离子体显示面板的隔壁的方法。 根据本发明的第一实施方案的方法包括在基材上提供硅化合物树脂层; 使用具有对应于要传送的障壁的形状的图案的主体来压制硅化合物树脂层; 并固化硅化合物树脂,然后释放母料。 此外,根据第二实施例的方法包括将硅化合物树脂加载到具有对应于障壁形状的图案的母版的凹槽中; 将基板压在基板上以将硅化合物转印到基板上; 并固化转移的硅化合物树脂,然后释放母料。

    Methods of manufacturing a semiconductor device
    80.
    发明申请
    Methods of manufacturing a semiconductor device 失效
    制造半导体器件的方法

    公开(公告)号:US20070010068A1

    公开(公告)日:2007-01-11

    申请号:US11481928

    申请日:2006-07-07

    IPC分类号: H01L21/30 H01L21/46

    摘要: Example embodiments of the present invention relate to methods of manufacturing a semiconductor device. Other example embodiments of the present invention relate to methods of manufacturing a semiconductor device having a gate electrode. In the method of manufacturing the semiconductor device, a gate electrode may be formed on a semiconductor substrate. Damage in the semiconductor substrate and a sidewall of the gate electrode may be cured, or repaired, by a radical re-oxidation process to form an oxide layer on the semiconductor substrate and the gate electrode. The radical re-oxidation process may be performed by providing a nitrogen gas onto the semiconductor substrate while increasing a temperature of the semiconductor substrate to a first temperature to passivate a surface of the gate electrode under a nitrogen gas atmosphere, providing an oxygen gas onto the semiconductor substrate while increasing the temperature from a first temperature to a second temperature to perform a first oxidation process and/or performing a second oxidation process at the second temperature.

    摘要翻译: 本发明的示例性实施例涉及制造半导体器件的方法。 本发明的其它示例实施例涉及制造具有栅电极的半导体器件的方法。 在制造半导体器件的方法中,可以在半导体衬底上形成栅电极。 可以通过自由基再氧化工艺固化或修复半导体衬底和栅电极的侧壁的损伤,以在半导体衬底和栅电极上形成氧化物层。 可以通过在半导体衬底上提供氮气同时将半导体衬底的温度提高到第一温度以在氮气气氛下钝化栅电极的表面来进行自由基再氧化工艺,从而将氧气提供到 半导体衬底,同时将温度从第一温度升至第二温度,以进行第一氧化工艺和/或在第二温度下进行第二氧化工艺。