III-nitride light emitting devices grown on templates to reduce strain
    83.
    发明授权
    III-nitride light emitting devices grown on templates to reduce strain 有权
    在模板上生长的III族氮化物发光器件以减少应变

    公开(公告)号:US07547908B2

    公开(公告)日:2009-06-16

    申请号:US11615834

    申请日:2006-12-22

    IPC分类号: H01L29/06

    CPC分类号: H01L33/007 H01L31/184

    摘要: In a III-nitride light emitting device, the device layers including the light emitting layer are grown over a template designed to reduce strain in the device, in particular in the light emitting layer. Reducing the strain in the light emitting device may improve the performance of the device. The template may expand the lattice constant in the light emitting layer over the range of lattice constants available from conventional growth templates. Strain is defined as follows: a given layer has a bulk lattice constant abulk corresponding to a lattice constant of a free standing material of a same composition as that layer and an in-plane lattice constant ain-plane corresponding to a lattice constant of that layer as grown in the structure. The amount of strain in a layer is |(ain-plane−abulk)|/abulk. In some embodiments, the strain in the light emitting layer is less than 1%.

    摘要翻译: 在III族氮化物发光器件中,包括发光层的器件层在设计成减小器件中特别是在发光层中的应变的模板上生长。 降低发光器件中的应变可以提高器件的性能。 模板可以在常规生长模板可获得的晶格常数的范围内扩展发光层中的晶格常数。 应变定义如下:给定层具有对应于与该层相同组成的自由材料的晶格常数的块状晶格常数吸收和对应于该层的晶格常数的面内晶格常数ain-平面 如在结构中生长。 一层中的应变量为|(ain-plane-abulk)| / abulk。 在一些实施方案中,发光层中的应变小于1%。