ELECTRICAL INTERCONNECT FOR AN INTEGRATED CIRCUIT PACKAGE AND METHOD OF MAKING SAME
    28.
    发明申请
    ELECTRICAL INTERCONNECT FOR AN INTEGRATED CIRCUIT PACKAGE AND METHOD OF MAKING SAME 有权
    用于集成电路封装的电气互连及其制造方法

    公开(公告)号:US20160211208A1

    公开(公告)日:2016-07-21

    申请号:US15082501

    申请日:2016-03-28

    Abstract: An interconnect assembly for an embedded chip package includes a dielectric layer, first metal layer comprising upper contact pads, second metal layer comprising lower contact pads, and metalized connections formed through the dielectric layer and in contact with the upper and lower contact pads to form electrical connections therebetween. A first surface of the upper contact pads is affixed to a top surface of the dielectric layer and a first surface of the lower contact pads is affixed to a bottom surface of the dielectric layer. An input/output (I/O) of a first side of the interconnect assembly is formed on a surface of the lower contact pads that is opposite the first surface of the lower contact pads, and an I/O of a second side of the interconnect assembly is formed on a surface of the upper contact pads that is opposite the first surface of the upper contact pads.

    Abstract translation: 用于嵌入式芯片封装的互连组件包括介电层,包括上接触焊盘的第一金属层,包括下接触焊盘的第二金属层和通过介电层形成并与上接触焊盘和下接触焊盘接触的金属化连接,以形成电 它们之间的连接。 上接触焊盘的第一表面固定到电介质层的顶表面,并且下接触焊盘的第一表面固定到电介质层的底表面。 互连组件的第一侧的输入/输出(I / O)形成在下接触焊盘的与下接触焊盘的第一表面相对的表面上,并且第二侧的I / O 互连组件形成在与上接触焊盘的第一表面相对的上接触焊盘的表面上。

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