SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD THEREOF
    7.
    发明申请
    SEMICONDUCTOR TESTING FIXTURE AND FABRICATION METHOD THEREOF 有权
    半导体测试仪器及其制造方法

    公开(公告)号:US20160124020A1

    公开(公告)日:2016-05-05

    申请号:US14927749

    申请日:2015-10-30

    发明人: LEI SHI

    摘要: A semiconductor testing fixture is provided. The semiconductor testing fixture comprises a substrate having a surface; a plurality of testing probes formed on the surface of the substrate; and a dielectric layer filling space between adjacent testing probes and covering side surfaces of the plurality of testing probes formed on the surface of the substrate.

    摘要翻译: 提供半导体测试夹具。 半导体测试夹具包括具有表面的基板; 形成在所述基板的表面上的多个测试探针; 以及在相邻的测试探针之间的介电层填充空间和形成在基板的表面上的多个测试探针的覆盖侧表面。

    TESTING PROBE AND SEMICONDUCTOR TESTING FIXTURE, AND FABRICATION METHODS THEREOF
    8.
    发明申请
    TESTING PROBE AND SEMICONDUCTOR TESTING FIXTURE, AND FABRICATION METHODS THEREOF 审中-公开
    测试探针和半导体测试仪器及其制造方法

    公开(公告)号:US20160124017A1

    公开(公告)日:2016-05-05

    申请号:US14926961

    申请日:2015-10-29

    发明人: LEI SHI

    IPC分类号: G01R1/067 G01R3/00 G01R31/26

    CPC分类号: G01R1/06733 G01R3/00

    摘要: Testing probe and semiconductor testing fixture, and their fabrication methods are provided. A plurality of first testing pins is formed on the substrate, each first testing pin including a first testing terminal on a top and a first connection terminal on a bottom. An insulating layer is formed on a sidewall surface of each first testing pin. A number of second testing pins are formed on the insulating layers, each second testing pin including a second testing terminal on a top thereof and a second connection terminal on a bottom thereof. A first concave surface is formed on a top of the second testing terminal, and surrounds a corresponding first testing pin.

    摘要翻译: 提供测试探头和半导体测试夹具及其制造方法。 多个第一测试引脚形成在基板上,每个第一测试引脚包括顶部的第一测试端子和底部的第一连接端子。 在每个第一测试销的侧壁表面上形成绝缘层。 在绝缘层上形成多个第二测试引脚,每个第二测试引脚在其顶部包括第二测试端子和在其底部的第二连接端子。 第一凹面形成在第二测试端子的顶部,并且包围相应的第一测试针。