Plasma processing apparatus with reduced parasitic capacity and loss in RF power
    1.
    发明授权
    Plasma processing apparatus with reduced parasitic capacity and loss in RF power 有权
    具有降低的寄生容量和RF功率损耗的等离子体处理设备

    公开(公告)号:US06780278B2

    公开(公告)日:2004-08-24

    申请号:US09892481

    申请日:2001-06-28

    IPC分类号: H01L2100

    CPC分类号: H01J37/32082 H01J37/32532

    摘要: A plasma processing apparatus comprises a grounded housing, a thin RF plate electrode, an opposite electrode facing the RF plate electrode, and a RF power source for applying a radio frequency to either the RF plate electrode or the opposite electrode to produce plasma between the two electrodes. If the radio frequency applied to the electrode is f (MHz), the parasitic capacity C (pF) between the grounded portion of the housing and a conductive portion through which the radio frequency propagates is less than 1210*f−0.9. The thickness of the RF plate electrode is 1 mm to 6 mm, and it is supported by a heat sink. The heat sink has a coolant passage in the proximity to the RF plate electrode. The heat sink also has a groove or a cavity in addition to the coolant passage, thereby reducing the value of the dielectric constant of the heat sink as a whole.

    摘要翻译: 等离子体处理装置包括接地壳体,薄RF板电极,面对RF板电极的相对电极和用于将射频施加到RF板电极或相对电极的RF电源,以在两者之间产生等离子体 电极。 如果施加到电极的射频为f(MHz),则壳体的接地部分与射频传播的导电部分之间的寄生电容C(pF)小于1210×f <-0.9>。 RF板电极的厚度为1mm〜6mm,由散热片支撑。 散热器在RF板电极附近具有冷却剂通道。 除了冷却剂通道之外,散热器还具有凹槽或空腔,从而整体上降低了散热器的介电常数值。

    Plasma processing method and plasma processing apparatus
    3.
    发明授权
    Plasma processing method and plasma processing apparatus 有权
    等离子体处理方法和等离子体处理装置

    公开(公告)号:US06433297B1

    公开(公告)日:2002-08-13

    申请号:US09531591

    申请日:2000-03-20

    IPC分类号: B23K1000

    CPC分类号: H01J37/32082 H01J37/32165

    摘要: A plasma processing apparatus includes upper and lower electrodes opposed to each other in an evacuated vessel, a first high-frequency power supply for applying power having a frequency of 27.12 MHz to the lower electrode, a second high-frequency power supply for applying power having a frequency of 3.1 MHz thereto, and a dipole ring for forming a magnetic field between the upper and lower electrodes.

    摘要翻译: 等离子体处理装置包括在真空容器中彼此相对的上下电极,向下电极施加频率为27.12MHz的第一高频电源,用于施加功率的第二高频电源, 其频率为3.1MHz,以及用于在上电极和下电极之间形成磁场的偶极环。

    Plasma processing apparatus of substrate and plasma processing method thereof
    4.
    发明授权
    Plasma processing apparatus of substrate and plasma processing method thereof 有权
    基板等离子体处理装置及其等离子体处理方法

    公开(公告)号:US08252193B2

    公开(公告)日:2012-08-28

    申请号:US12052522

    申请日:2008-03-20

    摘要: A substrate plasma processing apparatus includes a chamber of which an interior is evacuated under a predetermined vacuum condition; an RF electrode which is disposed in the chamber and configured so as to hold a substrate to be processed on a main surface thereof; an opposing electrode which is disposed opposite to the RF electrode in the chamber; an RF voltage applying device for applying an RF voltage with a predetermined frequency to the RF electrode; and a pulsed voltage applying device for applying a pulsed voltage to the RF electrode so as to be superimposed with the RF voltage and which includes a controller for controlling a timing in application of the pulsed voltage and defining a pause period of the pulsed voltage.

    摘要翻译: 基板等离子体处理装置包括在预定的真空条件下将内部抽真空的室; RF电极,其设置在所述室中并且构造成在其主表面上保持要处理的基板; 在所述室中与所述RF电极相对设置的对置电极; RF电压施加装置,用于向RF电极施加预定频率的RF电压; 以及脉冲电压施加装置,用于向RF电极施加脉冲电压以与RF电压叠加,并且包括用于控制施加脉冲电压的定时并且限定脉冲电压的暂停时段的控制器。

    PLASMA PROCESSING APPARATUS OF SUBSTRATE AND PLASMA PROCESSING METHOD THEREOF
    5.
    发明申请
    PLASMA PROCESSING APPARATUS OF SUBSTRATE AND PLASMA PROCESSING METHOD THEREOF 有权
    基板等离子体处理装置及其等离子体处理方法

    公开(公告)号:US20080237185A1

    公开(公告)日:2008-10-02

    申请号:US12052522

    申请日:2008-03-20

    IPC分类号: H01L21/3065

    摘要: A substrate plasma processing apparatus includes a chamber of which an interior is evacuated under a predetermined vacuum condition; an RF electrode which is disposed in the chamber and configured so as to hold a substrate to be processed on a main surface thereof; an opposing electrode which is disposed opposite to the RF electrode in the chamber; an RF voltage applying device for applying an RF voltage with a predetermined frequency to the RF electrode; and a pulsed voltage applying device for applying a pulsed voltage to the RF electrode so as to be superimposed with the RF voltage and which includes a controller for controlling a timing in application of the pulsed voltage and defining a pause period of the pulsed voltage.

    摘要翻译: 基板等离子体处理装置包括在预定的真空条件下将内部抽真空的室; RF电极,其设置在所述室中并且构造成在其主表面上保持要处理的基板; 在所述室中与所述RF电极相对设置的对置电极; RF电压施加装置,用于向RF电极施加预定频率的RF电压; 以及脉冲电压施加装置,用于向RF电极施加脉冲电压以与RF电压叠加,并且包括用于控制施加脉冲电压的定时并且限定脉冲电压的暂停时段的控制器。

    Plasma processing apparatus and plasma processing method
    6.
    发明授权
    Plasma processing apparatus and plasma processing method 有权
    等离子体处理装置和等离子体处理方法

    公开(公告)号:US08545670B2

    公开(公告)日:2013-10-01

    申请号:US12209617

    申请日:2008-09-12

    IPC分类号: C23F1/00 H01L21/306 C23C16/00

    摘要: A plasma processing apparatus for processing a substrate using plasma includes a first electrode configured to mount the substrate, a second electrode disposed to face the first electrode with a predetermined space, a chamber containing the first electrode and the second electrode, the chamber being capable of adjusting an inside atmosphere, a first electric power source device configured to apply a first RF voltage for controlling a self-bias voltage generated on the substrate to the first electrode, the first electric power source device applying a substantially constant width and a substantially constant value in a peak-to-peak voltage of an RF voltage of a first frequency at intervals, and a second electric power source device configured to apply a second RF voltage of a second frequency for generating plasma between the first and second electrodes to one of the first electrode and the second electrode.

    摘要翻译: 使用等离子体处理衬底的等离子体处理装置包括:被配置为安装衬底的第一电极,以预定空间设置为面对第一电极的第二电极,容纳第一电极和第二电极的腔室, 调整内部气氛的第一电源装置,被配置为向第一电极施加用于控制在基板上产生的自偏压的第一RF电压的第一电源装置,施加基本上恒定的宽度和基本恒定的值的第一电力源装置 在间隔的第一频率的RF电压的峰峰值电压中,以及第二电源装置,被配置为将第二频率的第二RF电压施加到第一和第二电极之间的等离子体之一 第一电极和第二电极。

    PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD
    7.
    发明申请
    PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHOD 有权
    等离子体加工设备和等离子体处理方法

    公开(公告)号:US20090078678A1

    公开(公告)日:2009-03-26

    申请号:US12209617

    申请日:2008-09-12

    IPC分类号: B44C1/22 C23F1/08

    摘要: A plasma processing apparatus for processing a substrate using plasma includes a first electrode configured to mount the substrate, a second electrode disposed to face the first electrode with a predetermined space, a chamber containing the first electrode and the second electrode, the chamber being capable of adjusting an inside atmosphere, a first electric power source device configured to apply a first RF voltage for controlling a self-bias voltage generated on the substrate to the first electrode, the first electric power source device applying a substantially constant width and a substantially constant value in a peak-to-peak voltage of an RF voltage of a first frequency at intervals, and a second electric power source device configured to apply a second RF voltage of a second frequency for generating plasma between the first and second electrodes to one of the first electrode and the second electrode.

    摘要翻译: 使用等离子体处理衬底的等离子体处理装置包括:被配置为安装衬底的第一电极,以预定空间设置为面对第一电极的第二电极,容纳第一电极和第二电极的腔室, 调整内部气氛的第一电源装置,被配置为向第一电极施加用于控制在基板上产生的自偏压的第一RF电压的第一电源装置,施加基本上恒定的宽度和基本恒定的值的第一电力源装置 在间隔的第一频率的RF电压的峰峰值电压中,以及第二电源装置,被配置为将第二频率的第二RF电压施加到第一和第二电极之间的等离子体之一 第一电极和第二电极。