摘要:
Thermal stress caused by a difference in the coefficient of thermal expansion between the mounting substrate and the ceramic substrate acts little on the junction portions of the external connection terminals when a semiconductor device is mounted avoiding such problems that the junction portions are broken or peeled off the mounting substrate. An insulating buffer layer 40 is adhered onto the mounting surface of ceramic substrate 32 having required wiring patterns 34 onto where the external connection terminals 12 will be connected, the insulating buffer layer 40 having a Young's modulus smaller than that of a ceramic material of the ceramic substrate 32 and having electrically insulating property, terminal pads 14 are provided on the outer surface of the insulating buffer layer 40, and the terminal pads 14 and the wiring patterns 34 are electrically connected together through buffer conducting portions 42 provided penetrating through the insulating buffer layer 40 and having a Young's modulus nearly equal to that of the insulating buffer layer 40.
摘要:
A substrate for inspecting an electronic device used for an electrical test of the electronic device having bump-shaped connection terminals, comprises: opening sections, the diameter of each opening being determined so that a connection terminal can be inserted into and drawn out from the opening, are formed penetrating the insulating substrate in a region on one side of an insulating substrate on which the electronic device is mounted, corresponding to an arrangement of the connection terminals; and wiring patterns, each of which is composed of a pad section being exposed onto a bottom face of the opening so that the pad can come into contact with the connection terminal so as to accomplish electrical continuity, a connecting pad section formed in a region outside of the region in which the pad section is formed, which comes into contact with a contact terminal of an inspection device so as to accomplish electrical continuity, and a wiring section for electrically connecting the pad section with the connecting pad section, are formed on the other side of the insulating substrate.
摘要:
Interconnection wiring lines connecting electrode terminals with external connection terminals are easily provided for semiconductor chips having increased number or density of external connection terminals as in/out terminals. A semiconductor device including a semiconductor chip having electrode terminals electrically connected to external connection terminals, the device comprising: a semiconductor chip having an electrode terminal carrying surface including electrode terminals and interconnection wiring lines, each of the interconnection wiring lines having one end bonded to one of the electrode terminals and the other end forming a pad; an insulating layer formed on the electrode terminal carrying surface to cover the electrode terminals, the interconnection wiring lines and the remaining area of the electrode terminal carrying surface; conductor lands formed on the insulating layer, each of the conductor lands having a part forming a via extending through the insulating layer to the pad of one of the interconnection wiring lines; and external connection terminals formed on the lands.
摘要:
A wiring board and electrode of a semiconductor element are connected with each other by the method of wire bonding, and problems arising from the thermal stress generated in the process of mounting are overcome. There is provided a wiring board comprising: a first face joined to an electrode forming face of a semiconductor element 10; and a second face on the opposite side of the first face, a wiring pattern 16 being formed on the second face, a land 24 joined to an external connecting terminal 22 being formed at one end of the wiring pattern, a wire bonding section 16a connected with a bonding wire 40 being formed at the other end of the wiring pattern, wherein the land 24 is supported by a buffer layer 34 for reducing the thermal stress generated when the semiconductor element, to which the wiring board is attached, is mounted via the external connecting terminals, and the wire bonding section 16a is supported by a bonding support layer 36 having an elastic modulus capable of allowing wire bonding.
摘要:
A multilayer wiring board for mounting a semiconductor chip or a semiconductor device, in which the number of wiring layers in minimized, having a plurality of wiring layers, in which each of said wiring layers includes lands arranged in the form of a square lattice and wiring patterns each having one end connected to one of said lands and the other end extending outward beyond an outermost row of said lattice, said lands having a land pitch p and a land diameter d and said wiring patterns having a pattern width w and an interpattern space s, said p, d, w, and s satisfying the following relationship: p−d
摘要:
A chip-sized semiconductor device includes a semiconductor element having a plurality of electrodes and a plurality of connecting pads electrically connected to the respective electrodes. A connecting board includes a base substrate having a first surface and a second surface, a plurality of connecting holes extending from the first surface to the second surface, a plurality of lands formed on the first surface to close the respective connecting holes, the lands being arranged in conformity with positions of the connecting pads of the semiconductor element, each of the connecting pads having a surface area smaller than that of the land. The semiconductor element is mounted on the connecting board in such a manner that the connecting pads of the semiconductor element are electrically connected to the respective lands of the connecting board by means of a plurality of bumps, respectively. A plurality of external connecting terminals on the second surface of the base substrate to be in contact with the respective lands through the respective connectings holes.
摘要:
An anisotropic stress buffer includes a plate or sheet-like body having relatively low elastic modulus. A plurality of elements, each having relatively high elastic modulus, are contained in the plate or sheet-like body, in such a manner that the buffer has a characteristic as a high elastic modulus member having a Young's modulus higher than a predetermined value with respect to a compression stress in the thickness direction and also has a characteristic as a low elastic modulus member having a Young's modulus lower than the predetermined value with respect to a tension stress in the planar direction. A semiconductor device includes such a anisotropic stress buffer to which a semiconductor chip is adhered. Electrode terminals of the chip are electrically connected to a wiring pattern formed on the anisotropic stress buffer.
摘要:
A wiring substrate includes a wiring pattern in an uppermost layer that includes pads. A solder resist layer covers the wiring pattern. A recess exposes part of the wiring pattern from the solder resist layer to form pads. The solder resist layer includes a portion formed in a region corresponding to the recess, a portion formed outward from the recess, and a portion formed inward from the recess. The upper surface of the solder resist layer at the portion corresponding to the recess is higher than the upper surface of the pads but lower than the upper surfaces of the other portions of the solder resist layer.
摘要:
A wiring board includes: an uppermost wiring layer formed on a prescribed number of underlying wiring layers, a portion of the uppermost wiring layer being exposed and used as a pad for connection with a component to be mounted; and an insulation resin layer covering the uppermost wiring layer, wherein the thickness of the portion of the uppermost wiring layer is larger than that of other portions thereof.
摘要:
A unit interconnection substrate for mounting leadless type electronic parts on a mount substrate by superposing them on each other in two or more stages, comprising an insulating surface on the top surface of which an interconnection circuit with conductor pads and connection terminals is formed, depressions for holding electronic parts formed in a bottom surface of the insulating substrate, connection terminals provided on the bottom surface of the insulating substrate on the periphery of the depression, and connection terminals electrically connected to the connection terminals of the top surface of the insulating substrate via conductor via holes provided in the insulating substrate. Electronic parts are electrically connected to the conductor pads on the top surface of the insulating substrate, thereby to make it possible to mount the electronic parts on the insulating substrate. Together with this, holding of the electronic parts mounted on the mount substrate in the depressions of the bottom surface of the insulating substrate is made possible.