公开(公告)号：US08778735B1

公开(公告)日：2014-07-15

申请号：US13931854

申请日：2013-06-29

申请人： Yan Xun Xue ,  Hamza Yilmaz ,  Yueh-Se Ho ,  Jun Lu ,  Ping Huang ,  Lei Shi ,  Lei Duan ,  Yuping Gong

发明人： Yan Xun Xue ,  Hamza Yilmaz ,  Yueh-Se Ho ,  Jun Lu ,  Ping Huang ,  Lei Shi ,  Lei Duan ,  Yuping Gong

IPC分类号： H01L21/00 ,  H01L21/304 ,  H01L21/78

CPC分类号： H01L21/304 ,  H01L21/561 ,  H01L21/78 ,  H01L23/3114 ,  H01L24/27 ,  H01L2224/73104 ,  H01L2224/83191 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/00

摘要： A WLCSP method comprises: depositing a metal bump on bonding pads of chips; forming a first packaging layer at front surface of wafer to cover metal bumps while forming an un-covered ring at the edge of wafer to expose the ends of each scribe line located between two adjacent chips; thinning first packaging layer to expose metal bumps; forming a groove on front surface of first packaging layer along each scribe line by cutting along a straight line extended by two ends of scribe line exposed on front surface of un-covered ring; grinding back surface of wafer to form a recessed space and a support ring at the edge of the wafer; depositing a metal layer at bottom surface of wafer in recessed space; cutting off the edge portion of wafer; and separating individual chips from wafer by cutting through first packaging layer, the wafer and metal layer along groove.

摘要翻译： WLCSP方法包括：在芯片的焊盘上沉积金属凸块; 在晶片的前表面形成第一包装层以覆盖金属凸块，同时在晶片边缘形成未覆盖的环，以露出位于两个相邻芯片之间的每个划线的端部; 稀释第一包装层以暴露金属凸块; 通过沿着未被覆盖的环的前表面上暴露的划线的两端延伸的直线切割沿着每个划线在第一包装层的前表面上形成凹槽; 研磨晶片的后表面以在晶片的边缘处形成凹陷空间和支撑环; 在凹陷空间中在晶片的底面沉积金属层; 切断晶片的边缘部分; 以及通过沿着沟槽切割第一包装层，晶片和金属层，从晶片分离单个芯片。

公开(公告)号：US20140175628A1

公开(公告)日：2014-06-26

申请号：US13724006

申请日：2012-12-21

申请人： Hua Pan ,  Yueh-Se Ho ,  Jun Lu ,  Ming-Chen Lu ,  Zhiqiang Niu

发明人： Hua Pan ,  Yueh-Se Ho ,  Jun Lu ,  Ming-Chen Lu ,  Zhiqiang Niu

IPC分类号： H01L23/495 ,  H01L23/00

CPC分类号： H01L24/97 ,  H01L23/3107 ,  H01L23/3171 ,  H01L23/49524 ,  H01L23/49548 ,  H01L23/49562 ,  H01L24/03 ,  H01L24/05 ,  H01L24/29 ,  H01L24/32 ,  H01L24/37 ,  H01L24/40 ,  H01L24/45 ,  H01L24/48 ,  H01L24/73 ,  H01L24/83 ,  H01L24/84 ,  H01L24/85 ,  H01L24/92 ,  H01L24/94 ,  H01L2224/02166 ,  H01L2224/03464 ,  H01L2224/04042 ,  H01L2224/05082 ,  H01L2224/05124 ,  H01L2224/05155 ,  H01L2224/05647 ,  H01L2224/0603 ,  H01L2224/291 ,  H01L2224/32245 ,  H01L2224/37147 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/40479 ,  H01L2224/4048 ,  H01L2224/40499 ,  H01L2224/45015 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/48245 ,  H01L2224/48247 ,  H01L2224/48465 ,  H01L2224/48482 ,  H01L2224/48499 ,  H01L2224/48647 ,  H01L2224/48847 ,  H01L2224/73215 ,  H01L2224/73221 ,  H01L2224/73263 ,  H01L2224/73265 ,  H01L2224/83191 ,  H01L2224/83801 ,  H01L2224/83815 ,  H01L2224/8391 ,  H01L2224/84801 ,  H01L2224/84815 ,  H01L2224/8491 ,  H01L2224/92 ,  H01L2224/92142 ,  H01L2224/92147 ,  H01L2224/92157 ,  H01L2224/9221 ,  H01L2224/92242 ,  H01L2224/92246 ,  H01L2224/94 ,  H01L2224/97 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/386 ,  H01L2924/00 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2224/05644 ,  H01L2924/01079 ,  H01L2224/03 ,  H01L21/78 ,  H01L2224/83 ,  H01L2224/84 ,  H01L2224/85 ,  H01L2924/20752 ,  H01L2924/20753 ,  H01L2924/20755 ,  H01L2924/2075 ,  H01L2924/20754 ,  H01L2924/00015 ,  H01L2924/00012

摘要： A semiconductor device comprises a first top electrode and a second top electrode at a front surface of the die, at least a Ni plating layer and an Au plating layer overlaying the Ni plating layer are formed on each of the first top electrode and the second top electrode. A copper clip attaches on the Au plating layer of the second top electrode. A gold (Au) stud bump is formed on the Au plating layer of the first top electrode with a copper wire connected on the stud bump. The Au stud bump is thicker than a thickness of the Au plating layer and thinner than a thickness of the copper clip to avoid copper wire NSOP (non-stick on pad) problem due to Ni plating layer diffusion during the solder reflow process in the copper clip attachment.

摘要翻译： 半导体器件包括在管芯的前表面处的第一顶电极和第二顶电极，在第一顶电极和第二顶部的每一个上形成至少Ni镀层和覆盖Ni镀层的Au镀层 电极。 铜夹附着在第二顶电极的Au镀层上。 在第一顶电极的Au镀层上形成金（Au）柱凸块，铜柱连接在凸块上。 Au凸块比Au镀层的厚度厚，比铜夹的厚度薄，以避免在铜回焊过程中镀镍层扩散的铜线NSOP（不粘垫）问题 夹子附件。

公开(公告)号：US20140117523A1

公开(公告)日：2014-05-01

申请号：US13663694

申请日：2012-10-30

申请人： Yueh-Se Ho ,  Yan Xun Xue ,  Hamza Yilmaz ,  Jun Lu

发明人： Yueh-Se Ho ,  Yan Xun Xue ,  Hamza Yilmaz ,  Jun Lu

IPC分类号： H01L23/495 ,  H01L21/60

CPC分类号： H01L23/4952 ,  H01L21/6835 ,  H01L23/3107 ,  H01L23/3142 ,  H01L23/49562 ,  H01L24/11 ,  H01L24/13 ,  H01L24/14 ,  H01L24/16 ,  H01L24/29 ,  H01L24/32 ,  H01L24/37 ,  H01L24/40 ,  H01L24/41 ,  H01L24/81 ,  H01L24/83 ,  H01L24/84 ,  H01L2221/68327 ,  H01L2224/1134 ,  H01L2224/1308 ,  H01L2224/13082 ,  H01L2224/131 ,  H01L2224/13111 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/136 ,  H01L2224/13794 ,  H01L2224/13839 ,  H01L2224/1403 ,  H01L2224/16245 ,  H01L2224/2929 ,  H01L2224/293 ,  H01L2224/32245 ,  H01L2224/37011 ,  H01L2224/37013 ,  H01L2224/371 ,  H01L2224/4007 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/40248 ,  H01L2224/40499 ,  H01L2224/405 ,  H01L2224/73253 ,  H01L2224/73255 ,  H01L2224/81191 ,  H01L2224/81801 ,  H01L2224/8185 ,  H01L2224/83801 ,  H01L2224/83851 ,  H01L2224/84385 ,  H01L2224/84801 ,  H01L2224/8485 ,  H01L2224/92225 ,  H01L2224/92226 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2924/00014 ,  H01L2924/014 ,  H01L2924/01082 ,  H01L2924/07811 ,  H01L2924/00012

摘要： The invention relates to a power semiconductor device and a preparation method, particularly relates to preparation of stacked dual-chip packaging structure of MOSFET (Metal-Oxide-Semiconductor Field Effect Transistor) using flip chip technology with two interconnecting plates. The first chip is flipped and attached on the base such that the first chip is overlapped with the third pin; the back metal layer of the first chip is connected to the bonding strip of the first pin through a first interconnecting plate; the second chip is flipped and attached on a main plate portion of the first interconnecting plate such that the second chip is overlapped with the fourth pin; and the back metal layer of the second chip is connected to the bonding strip of the second pin through the second interconnecting plate.

摘要翻译： 本发明涉及一种功率半导体器件及其制备方法，特别涉及使用具有两个互连板的倒装芯片技术来制备MOSFET（金属氧化物半导体场效应晶体管）的层叠双芯片封装结构。 第一芯片被翻转并附接在基座上，使得第一芯片与第三引脚重叠; 第一芯片的背金属层通过第一互连板连接到第一引脚的接合条; 第二芯片被翻转并附接在第一互连板的主板部分上，使得第二芯片与第四引脚重叠; 并且第二芯片的背金属层通过第二互连板连接到第二引脚的接合条。

公开(公告)号：US08563361B2

公开(公告)日：2013-10-22

申请号：US13547358

申请日：2012-07-12

申请人： Yan Xun Xue ,  Hamza Yilmaz ,  Yueh-Se Ho ,  Jun Lu ,  Ping Huang ,  Lei Shi ,  Lei Duan ,  Yuping Gong

发明人： Yan Xun Xue ,  Hamza Yilmaz ,  Yueh-Se Ho ,  Jun Lu ,  Ping Huang ,  Lei Shi ,  Lei Duan ,  Yuping Gong

IPC分类号： H01L21/00

CPC分类号： H01L21/563 ,  H01L23/3157 ,  H01L2224/73104 ,  H01L2224/83191 ,  H01L2924/13091 ,  H01L2924/00

摘要： A WLCSP method comprises: depositing a metal bump on bonding pads of chips; forming a first packaging layer at front surface of wafer to cover metal bumps while forming an un-covered ring at the edge of wafer to expose the ends of each scribe line located between two adjacent chips; thinning first packaging layer to expose metal bumps; forming a groove on front surface of first packaging layer along each scribe line by cutting along a straight line extended by two ends of scribe line exposed on front surface of un-covered ring; grinding back surface of wafer to form a recessed space and a support ring at the edge of the wafer; depositing a metal layer at bottom surface of wafer in recessed space; cutting off the edge portion of wafer; and separating individual chips from wafer by cutting through first packaging layer, the wafer and metal layer along groove.

摘要翻译： WLCSP方法包括：在芯片的焊盘上沉积金属凸块; 在晶片的前表面形成第一包装层以覆盖金属凸块，同时在晶片边缘形成未覆盖的环，以露出位于两个相邻芯片之间的每个划线的端部; 稀释第一包装层以暴露金属凸块; 通过沿着未被覆盖的环的前表面上暴露的划线的两端延伸的直线切割沿着每个划线在第一包装层的前表面上形成凹槽; 研磨晶片的后表面以在晶片的边缘处形成凹陷空间和支撑环; 在凹陷空间中在晶片的底面沉积金属层; 切断晶片的边缘部分; 以及通过沿着沟槽切割第一包装层，晶片和金属层，从晶片分离单个芯片。

公开(公告)号：US20130037935A1

公开(公告)日：2013-02-14

申请号：US13205864

申请日：2011-08-09

申请人： Yan Xun Xue ,  Ping Huang ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu ,  Ming-Chen Lu

发明人： Yan Xun Xue ,  Ping Huang ,  Yueh-Se Ho ,  Hamza Yilmaz ,  Jun Lu ,  Ming-Chen Lu

IPC分类号： H01L23/498 ,  H01L21/78

CPC分类号： H01L21/76898 ,  H01L21/561 ,  H01L21/6836 ,  H01L23/3114 ,  H01L23/3135 ,  H01L23/481 ,  H01L24/03 ,  H01L24/05 ,  H01L24/11 ,  H01L24/13 ,  H01L2221/6834 ,  H01L2221/68359 ,  H01L2221/68377 ,  H01L2224/02166 ,  H01L2224/0401 ,  H01L2224/05548 ,  H01L2224/05554 ,  H01L2224/05571 ,  H01L2224/1184 ,  H01L2224/13009 ,  H01L2224/13022 ,  H01L2224/13024 ,  H01L2224/131 ,  H01L2224/94 ,  H01L2924/00014 ,  H01L2924/12042 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2224/03 ,  H01L2224/11 ,  H01L2924/00012 ,  H01L2924/014 ,  H01L2924/00 ,  H01L2224/05552

摘要： The present invention relates to a package for semiconductor device and the fabrication method for integrally encapsulating a whole semiconductor chip within a molding compound. In the semicondcutor device package, bonding pads distributed on the top of the chip are redistributed into an array of redistributed bonding pads located in an dielectric layer by utilizing the redistribution technique. The electrodes or signal terminals on the top of the semiconductor chip are connected to an electrode metal segment on the bottom of the chip by conductive materials filled in through holes formed in a silicon substrate of a semiconductor wafer. Furthermore, the top molding portion and the bottom molding portion seal the semiconductor chip completely, thus providing optimum mechanical and electrical protections.

摘要翻译： 本发明涉及一种用于半导体器件的封装以及用于将整个半导体芯片整体封装在模塑料中的制造方法。 在半封装器件封装中，通过利用再分配技术，分布在芯片顶部的焊盘重新分布到位于介质层中的再分布焊盘的阵列中。 半导体芯片的顶部上的电极或信号端子通过填充在半导体晶片的硅衬底中形成的通孔中的导电材料连接到芯片底部的电极金属段。 此外，顶部模制部分和底部模制部分完全密封半导体芯片，从而提供最佳的机械和电气保护。

公开(公告)号：US20120299119A1

公开(公告)日：2012-11-29

申请号：US13118445

申请日：2011-05-29

申请人： Yan Xun Xue ,  Yueh-Se Ho ,  Lei Shi ,  Jun Lu ,  Liang Zhao

发明人： Yan Xun Xue ,  Yueh-Se Ho ,  Lei Shi ,  Jun Lu ,  Liang Zhao

IPC分类号： H01L27/088 ,  H01L23/495 ,  H01L21/56

CPC分类号： H01L23/49562 ,  H01L23/49524 ,  H01L23/49575 ,  H01L24/48 ,  H01L2224/48247 ,  H01L2924/00014 ,  H01L2924/01322 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A stacked power semiconductor device includes vertical metal oxide semiconductor field-effect transistors and dual lead frames packaged with flip-chip technology. In the method of manufacturing the stacked power semiconductor device, a first semiconductor chip is flip chip mounted on the first lead frame. A mounting clips is connected to the electrode at back side of the first semiconductor chip. A second semiconductor chip is mounted on the second lead frame, which is then flipped and stacked on the mounting clip.

摘要翻译： 叠层功率半导体器件包括垂直金属氧化物半导体场效应晶体管和采用倒装芯片技术封装的双引线框架。 在制造堆叠式功率半导体器件的方法中，第一半导体芯片是安装在第一引线框上的倒装芯片。 安装夹在第一半导体芯片的背面连接到电极。 第二半导体芯片安装在第二引线框架上，然后翻转并堆叠在安装夹上。

公开(公告)号：US20120235306A1

公开(公告)日：2012-09-20

申请号：US13488424

申请日：2012-06-04

申请人： Tao Feng ,  Yueh-Se Ho

发明人： Tao Feng ,  Yueh-Se Ho

IPC分类号： H01L23/48

CPC分类号： H01L21/561 ,  H01L23/142 ,  H01L23/3114 ,  H01L23/49827 ,  H01L24/29 ,  H01L24/92 ,  H01L2224/29101 ,  H01L2224/2919 ,  H01L2224/8385 ,  H01L2224/9202 ,  H01L2224/94 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01057 ,  H01L2924/01078 ,  H01L2924/01082 ,  H01L2924/01322 ,  H01L2924/014 ,  H01L2924/12042 ,  H01L2924/12044 ,  H01L2924/1305 ,  H01L2924/13055 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/00

摘要： A virtually substrate-less composite power semiconductor device (VSLCPSD) and method are disclosed. The VSLCPSD has a power semiconductor device (PSD), a front-face device carrier (FDC) made out of a carrier material and an intervening bonding layer (IBL). Both carrier and IBL material can be conductive or non-conductive. The PSD has back substrate portion, front semiconductor device portion with patterned front-face device metallization pads and a virtually diminishing thickness TPSD. The FDC has patterned back-face carrier metallizations contacting the front-face device metallization pads, patterned front-face carrier metallization pads and numerous parallelly connected through-carrier conductive vias respectively connecting the back-face carrier metallizations to the front-face carrier metallization pads. The FDC thickness TFDC is large enough to provide structural rigidity to the VSLCPSD. The diminishing thickness TPSD effects a low back substrate resistance and the through-carrier conductive vias effect a low front-face contact resistance to the front-face device metallization pads.

摘要翻译： 公开了一种实际上无衬底的复合功率半导体器件（VSLCPSD）和方法。 VSLCPSD具有功率半导体器件（PSD），由载体材料制成的正面器件载体（FDC）和中间键合层（IBL）。 载体和IBL材料都可以是导电的或不导电的。 PSD具有后衬底部分，具有图案化前面装置金属化焊盘的前半导体器件部分和实际上减小的厚度TPSD。 FDC具有接触前表面器件金属化焊盘，图案化前面载体金属化焊盘和多个并联连接的贯穿载体导电通孔的图案化背面载体金属化，其分别将背面载体金属化物连接到前面载体金属化焊盘 。 FDC厚度TFDC足够大以向VSLCPSD提供结构刚度。 厚度减小的TPSD会影响背面的底层电阻，并且贯穿载体的导电通孔会对前面装置的金属化焊盘产生低的前端接触电阻。

公开(公告)号：US20090160045A1

公开(公告)日：2009-06-25

申请号：US11963690

申请日：2007-12-21

申请人： Ming Sun ,  Tao Feng ,  Francois Hebert ,  Yueh-Se Ho

发明人： Ming Sun ,  Tao Feng ,  Francois Hebert ,  Yueh-Se Ho

IPC分类号： H01L23/06 ,  H01L21/304

CPC分类号： H01L21/6835 ,  H01L21/568 ,  H01L24/02 ,  H01L24/11 ,  H01L24/17 ,  H01L2221/68354 ,  H01L2224/0231 ,  H01L2224/0233 ,  H01L2224/0239 ,  H01L2224/0401 ,  H01L2224/04042 ,  H01L2224/13099 ,  H01L2224/16 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01014 ,  H01L2924/01015 ,  H01L2924/01022 ,  H01L2924/01024 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01072 ,  H01L2924/01074 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/05042 ,  H01L2924/1305 ,  H01L2924/13055 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/14 ,  H01L2924/30105 ,  H01L2924/30107 ,  H01L2924/351 ,  H01L2924/00

摘要： A method for making back-to-front electrical connections in a wafer level chip scale packaging process is disclosed. A wafer containing a plurality of semiconductor chips is mounted on a package substrate. Each semiconductor chip in the plurality includes one or more electrodes on an exposed back side. Scribe lines between two or more adjacent chips on the wafer are removed to form relatively wide gaps. A conductive material is applied to the back side of the semiconductor chips and in the gaps. The conductive material in the gaps between two or more of the chips is then cut through leaving conductive material on the back side and on side walls of the two or more chips. As a result, the conductive material provides an electrical connection from the electrode on the back side of the chip to the front side of the chip.

摘要翻译： 公开了一种用于在晶片级芯片级封装工艺中进行背对背电连接的方法。 将包含多个半导体芯片的晶片安装在封装基板上。 多个半导体芯片包括暴露背面的一个或多个电极。 去除晶片上的两个或更多个相邻芯片之间的划痕线以形成较宽的间隙。 将导电材料施加到半导体芯片的背面和间隙中。 然后通过在两个或更多个芯片的背侧和侧壁上留下导电材料来切割两个或更多个芯片之间的间隙中的导电材料。 结果，导电材料提供从芯片的背面上的电极到芯片的前侧的电连接。

公开(公告)号：US07183616B2

公开(公告)日：2007-02-27

申请号：US10208275

申请日：2002-07-30

申请人： Anup Bhalla ,  Sik K Lui ,  Leeshawn Luo ,  Yueh-Se Ho

发明人： Anup Bhalla ,  Sik K Lui ,  Leeshawn Luo ,  Yueh-Se Ho

IPC分类号： H01L23/62 ,  H01L29/94 ,  H01L29/76 ,  H01L31/119 ,  H01L31/113 ,  H01L23/34 ,  H01L23/50

CPC分类号： H01L24/06 ,  H01L23/49575 ,  H01L24/48 ,  H01L24/49 ,  H01L25/072 ,  H01L2224/05553 ,  H01L2224/05599 ,  H01L2224/0603 ,  H01L2224/45015 ,  H01L2224/45144 ,  H01L2224/48091 ,  H01L2224/48111 ,  H01L2224/48137 ,  H01L2224/48247 ,  H01L2224/49111 ,  H01L2224/49113 ,  H01L2224/49171 ,  H01L2224/49175 ,  H01L2224/85399 ,  H01L2924/00014 ,  H01L2924/01013 ,  H01L2924/01014 ,  H01L2924/01074 ,  H01L2924/01079 ,  H01L2924/1306 ,  H01L2924/13091 ,  H01L2924/14 ,  H01L2924/20755 ,  H01L2924/30107 ,  H01L2224/45099 ,  H01L2924/00 ,  H01L2924/00012

摘要： This invention discloses a method for configuring a power MOSFET package by packaging several paralleled and separated MOSFET chips in the assembly. The method further includes a step of connecting the gate pad on each of these MOSFET chips with a low-resistance gate bus. The package resistance and inductance are significantly reduced and switching speed and heat dissipation are substantially improved.

摘要翻译： 本发明公开了一种通过在组件中封装几个并联和分离的MOSFET芯片来配置功率MOSFET封装的方法。 该方法还包括将这些MOSFET芯片中的每一个上的栅极焊盘与低电阻栅极总线连接的步骤。 封装电阻和电感显着降低，开关速度和散热明显提高。

公开(公告)号：US09214417B2

公开(公告)日：2015-12-15

申请号：US14186275

申请日：2014-02-21

申请人： Yueh-Se Ho ,  Hamza Yilmaz ,  Yan Xun Xue ,  Jun Lu

发明人： Yueh-Se Ho ,  Hamza Yilmaz ,  Yan Xun Xue ,  Jun Lu

IPC分类号： H01L23/495 ,  H01L27/088

CPC分类号： H01L23/49575 ,  H01L23/49503 ,  H01L23/49513 ,  H01L23/49524 ,  H01L23/49555 ,  H01L23/49558 ,  H01L23/49562 ,  H01L23/49568 ,  H01L24/36 ,  H01L24/37 ,  H01L24/40 ,  H01L24/41 ,  H01L24/48 ,  H01L24/49 ,  H01L27/088 ,  H01L2224/05554 ,  H01L2224/0603 ,  H01L2224/371 ,  H01L2224/40095 ,  H01L2224/40245 ,  H01L2224/48137 ,  H01L2224/48245 ,  H01L2224/48247 ,  H01L2224/48257 ,  H01L2224/49111 ,  H01L2224/49171 ,  H01L2224/73221 ,  H01L2224/8385 ,  H01L2224/8485 ,  H01L2924/00014 ,  H01L2924/13091 ,  H01L2924/181 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2224/45099 ,  H01L2224/85399 ,  H01L2224/05599

摘要： A combined packaged power semiconductor device includes flipped top source low-side MOSFET electrically connected to top surface of a die paddle, first metal interconnection plate connecting between bottom drain of a high-side MOSFET or top source of a flipped high-side MOSFET to bottom drain of the low-side MOSFET, and second metal interconnection plate stacked on top of the high-side MOSFET chip. The high-side, low-side MOSFET and the IC controller can be packaged three-dimensionally reducing the overall size of semiconductor devices and can maximize the chip's size within a package of the same size and improves the performance of the semiconductor devices. The top source of flipped low-side MOSFET is connected to the top surface of the die paddle and thus is grounded through the exposed bottom surface of die paddle, which simplifies the shape of exposed bottom surface of the die paddle and maximizes the area to facilitate heat dissipation.

摘要翻译： 组合封装的功率半导体器件包括电连接到管芯焊盘的顶表面的翻转顶部源极低侧MOSFET，第一金属互连板，将高边MOSFET的底部漏极或翻转的高侧MOSFET的顶部源极连接到底部 低端MOSFET的漏极和堆叠在高边MOSFET芯片顶部的第二金属互连板。 高侧，低端MOSFET和IC控制器可以三维封装，减小半导体器件的总体尺寸，并可在相同尺寸的封装内最大化芯片的尺寸，并提高半导体器件的性能。 翻转的低侧MOSFET的顶部源极连接到管芯焊盘的顶表面，并且因此通过裸片的裸露的底表面接地，这简化了裸片焊盘的暴露的底面的形状，并使面积最大化 散热。