Radio frequency device for tracking goods
    51.
    发明申请
    Radio frequency device for tracking goods 失效
    射频设备跟踪商品

    公开(公告)号:US20050270160A1

    公开(公告)日:2005-12-08

    申请号:US10860071

    申请日:2004-06-04

    摘要: A radio frequency (RF) device (or “tag”) for containing specific information relating to a particular good being shipped from one location (e.g., warehouse) to another (e.g., customer). The device includes a circuitized substrate (e.g., a printed circuit board), a semiconductor chip, an antenna and a power regulator, and is designed in one embodiment to be partly inserted within a good (e.g., a cardboard box) containing one or more of the goods being shipped and tracked. Alternatively, the device may be attached by other means (e.g., adhesive). A shipper can simply track the goods containing such devices using wireless communication devices (e.g., satellites) to quickly and readily ascertain the specific location of the goods at any time as well as the appropriate desired information relating to such goods (e.g., quantity, weight, type, etc.).

    摘要翻译: 用于包含与从一个位置(例如,仓库)运送到另一个位置(例如客户)的特定商品相关的特定信息的射频(RF)设备(或“标签”)。 该装置包括电路化基板(例如,印刷电路板),半导体芯片,天线和功率调节器,并且在一个实施例中设计成部分地插入到包含一个或多个 的货物被运输和跟踪。 或者,该装置可以通过其他方式(例如,粘合剂)附接。 托运人可以使用无线通信设备(例如,卫星)轻松跟踪含有此类设备的货物,以便随时快速确定货物的具体位置以及与此类货物相关的适当的所需信息(例如数量,重量 ,类型等)。

    Method of testing printed circuit board opening spacings
    55.
    发明申请
    Method of testing printed circuit board opening spacings 失效
    测试印刷电路板开口间距的方法

    公开(公告)号:US20050005438A1

    公开(公告)日:2005-01-13

    申请号:US10616932

    申请日:2003-07-11

    申请人: John Durkot

    发明人: John Durkot

    摘要: A method for testing opening patterns in an active area of a PCB wherein two arrays of test patterns of apertured pads are analyzed following drilling therethrough in accordance with a specified manner. Specifically, the outer patterns are first tested and if failure results in one or more of said patterns, an inner array of patterns closer to the active area are then tested and, significantly, only the respective test pattern nearest the associated array of openings is used to determine whether said array of openings meets the designated spacing criteria.

    摘要翻译: 一种用于测试PCB有源区域中的开口图案的方法,其中根据指定的方式在钻孔之后分析孔径焊盘的测试图案的两个阵列。 具体地,首先测试外部图案,并且如果失败导致所述图案中的一个或多个,则然后测试更接近有源区域的图案的内部阵列,并且显着地仅使用最接近相关联的开口阵列的各个测试图案 以确定所述开口阵列是否满足指定的间隔标准。