Surface acoustic wave device and method of fabricating the same
    5.
    发明授权
    Surface acoustic wave device and method of fabricating the same 有权
    表面声波装置及其制造方法

    公开(公告)号:US07911116B2

    公开(公告)日:2011-03-22

    申请号:US12410131

    申请日:2009-03-24

    Abstract: A surface acoustic wave device includes a piezoelectric substrate, an interdigital transducer (IDT) formed on the piezoelectric substrate, an interconnection electrode that is provided on the piezoelectric substrate and is connected to the IDT, the IDT being made of a metal identical to that of the IDT, an inorganic insulation layer that is provided on the piezoelectric substrate so that at least the interconnection electrode is exposed, an insulative resin layer that is located on an interface between the inorganic insulation layer and a portion of the interconnection electrode exposed from the inorganic insulation layer and is formed so as to cover a side surface of the interconnection electrode, and a metal layer that is provided on the interconnection electrode and the insulative resin layer.

    Abstract translation: 表面声波装置包括压电基板,形成在压电基板上的叉指式换能器(IDT),配置在压电基板上并与IDT连接的互连电极,IDT由与IDT相同的金属制成 IDT是设置在压电基板上至少使互连电极露出的无机绝缘层,位于无机绝缘层与互连电极的从无机物露出的部分的界面上的绝缘性树脂层 形成为覆盖互连电极的侧面的金属层和设置在配线电极和绝缘性树脂层上的金属层。

    Soldering method and soldered joint

    公开(公告)号:US06428911B2

    公开(公告)日:2002-08-06

    申请号:US09930245

    申请日:2001-08-16

    Abstract: The present invention provides a soldering method and a soldered joint securing a strength of joint equivalent to soldering using a conventional Pb—Sn solder alloy without having a detrimental effect on the environment and without causing a rise in cost. A soldering method comprising a step of covering Cu electrodes of electronic equipment by a rust-proofing coating consisting of an organic compound including N and a step of forming soldered joints on the covered Cu electrodes, by using a solder material consisting of at least 2.0 wt % and less than 3 wt % of Ag, 0.5 to 0.8 wt % of Cu, and a balance of Sn and unavoidable impurities. The solder material used in the present invention further contains not more than 3 wt % in total of at least one element selected from the group consisting of Sb, In, Au, Zn, Bi, and Al.

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