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公开(公告)号:CN104816104B
公开(公告)日:2018-07-03
申请号:CN201510059764.2
申请日:2015-02-04
申请人: 千住金属工业株式会社
CPC分类号: B23K35/025 , B22F1/0062 , B22F1/0074 , B22F1/02 , B23K35/00 , B23K35/0244 , B23K35/3006 , B23K35/3033 , B23K35/3046 , C22C5/06 , C22C13/00 , C22C19/03 , C22C19/07 , H01B1/02 , H01L24/13 , H01L2224/13014 , H01L2224/13139 , H01L2224/13655 , H01L2224/13657 , H01L2924/0105 , H01L2924/01082 , H01L2924/01083 , H01L2924/0109 , H01L2924/01092 , H01L2924/15311 , H01L2924/15321 , H01L2924/15331 , H01L2924/2064 , H01L2924/20641 , H01L2924/20642 , H01L2924/20643 , H01L2924/20644 , H01L2924/20645 , H01L2924/20646 , H01L2924/20647 , H01L2924/20648 , H01L2924/20649 , H01L2924/2065
摘要: 本发明涉及Ag球、Ag芯球、助焊剂涂布Ag球、助焊剂涂布Ag芯球、焊料接头、成形焊料、焊膏、Ag糊剂以及Ag芯糊剂。提供即使含有一定量以上的Ag以外的杂质元素也α射线量少且球形度高的Ag球。为了抑制软错误并减少连接不良,将U的含量设为5ppb以下,将Th的含量设为5ppb以下,将纯度设为99.9%以上且99.9995%以下,将α射线量设为0.0200cph/cm2以下,将Pb或Bi任一者的含量、或者Pb和Bi的总含量设为1ppm以上,将球形度设为0.90以上。
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公开(公告)号:CN103943574B
公开(公告)日:2017-11-17
申请号:CN201410022616.9
申请日:2014-01-17
申请人: 肖特公开股份有限公司
IPC分类号: H01L23/045 , H01L23/66 , H01L23/495
CPC分类号: H01L23/08 , H01L23/045 , H01L23/3157 , H01L23/64 , H01L23/66 , H01L24/05 , H01L24/48 , H01L24/49 , H01L2223/6622 , H01L2224/04042 , H01L2224/05554 , H01L2224/32225 , H01L2224/32245 , H01L2224/48011 , H01L2224/48091 , H01L2224/48137 , H01L2224/48245 , H01L2224/49171 , H01L2224/49175 , H01L2224/85203 , H01L2224/85205 , H01L2224/85207 , H01L2924/00014 , H01L2924/12042 , H01L2924/12043 , H01L2924/181 , H01L2924/3011 , H01L2924/30111 , H01L2924/2065 , H01L2924/20649 , H01L2924/20645 , H01L2924/20644 , H01L2924/20643 , H01L2224/45099 , H01L2924/00
摘要: 本发明涉及一种TO壳体及其制造方法,在该壳体中,在上侧,焊线的长度缩短并且联接线路在与联接接头对置的一侧上具有凸出部。
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公开(公告)号:CN104821303A
公开(公告)日:2015-08-05
申请号:CN201410302823.X
申请日:2014-06-30
申请人: 株式会社东芝
发明人: 宫川毅
IPC分类号: H01L23/495 , H01L23/31
CPC分类号: H01L23/49537 , H01B1/02 , H01B5/00 , H01L23/3107 , H01L23/49503 , H01L23/49524 , H01L23/49541 , H01L23/49548 , H01L23/49562 , H01L23/49568 , H01L24/29 , H01L24/32 , H01L24/33 , H01L24/35 , H01L24/37 , H01L24/40 , H01L24/41 , H01L24/73 , H01L24/83 , H01L24/84 , H01L2224/291 , H01L2224/29147 , H01L2224/29294 , H01L2224/29339 , H01L2224/32245 , H01L2224/33181 , H01L2224/352 , H01L2224/35847 , H01L2224/3701 , H01L2224/37012 , H01L2224/37013 , H01L2224/37147 , H01L2224/40245 , H01L2224/40499 , H01L2224/4103 , H01L2224/41051 , H01L2224/73263 , H01L2224/83143 , H01L2224/83447 , H01L2224/83801 , H01L2224/83815 , H01L2224/84143 , H01L2224/84801 , H01L2224/84815 , H01L2924/13055 , H01L2924/13091 , H01L2924/181 , H01L2924/20645 , H01L2924/20646 , H01L2924/20647 , H01L2924/20648 , H01L2924/20649 , H01L2924/2065 , H01L2924/00 , H01L2924/00012 , H01L2924/00014 , H01L2924/014
摘要: 本发明涉及连接器框架以及半导体装置。连接器框架具备框架部、从所述框架部突出并一体地设置于所述框架部的第1连接器、以及从所述框架部突出并一体地设置于所述框架部的第2连接器。所述第1连接器具有第1部分、和设置于所述第1部分与所述框架部之间且比所述第1部分薄的第2部分。所述第2连接器的厚度与所述第1连接器的所述第2部分相同。
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公开(公告)号:CN103943574A
公开(公告)日:2014-07-23
申请号:CN201410022616.9
申请日:2014-01-17
申请人: 肖特公开股份有限公司
IPC分类号: H01L23/045 , H01L23/66 , H01L23/495
CPC分类号: H01L23/08 , H01L23/045 , H01L23/3157 , H01L23/64 , H01L23/66 , H01L24/05 , H01L24/48 , H01L24/49 , H01L2223/6622 , H01L2224/04042 , H01L2224/05554 , H01L2224/32225 , H01L2224/32245 , H01L2224/48011 , H01L2224/48091 , H01L2224/48137 , H01L2224/48245 , H01L2224/49171 , H01L2224/49175 , H01L2224/85203 , H01L2224/85205 , H01L2224/85207 , H01L2924/00014 , H01L2924/12042 , H01L2924/12043 , H01L2924/181 , H01L2924/3011 , H01L2924/30111 , H01L2924/2065 , H01L2924/20649 , H01L2924/20645 , H01L2924/20644 , H01L2924/20643 , H01L2224/45099 , H01L2924/00
摘要: 本发明涉及一种TO壳体及其制造方法,在该壳体中,在上侧,焊线的长度缩短并且联接线路在与联接接头对置的一侧上具有凸出部。
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公开(公告)号:CN103515256B
公开(公告)日:2017-04-26
申请号:CN201310235224.6
申请日:2013-06-14
申请人: 英飞凌科技股份有限公司
发明人: G.迈耶-贝格
IPC分类号: H01L21/58 , H01L21/60 , H01L23/485
CPC分类号: H01L23/49513 , H01L21/4821 , H01L21/561 , H01L23/3128 , H01L23/49541 , H01L23/49575 , H01L23/49582 , H01L24/13 , H01L24/19 , H01L24/20 , H01L24/24 , H01L24/32 , H01L24/82 , H01L25/0655 , H01L2224/0401 , H01L2224/04105 , H01L2224/05548 , H01L2224/12105 , H01L2224/13022 , H01L2224/13024 , H01L2224/24155 , H01L2224/29082 , H01L2224/29139 , H01L2224/29144 , H01L2224/29155 , H01L2224/29164 , H01L2224/2919 , H01L2224/32245 , H01L2224/73267 , H01L2224/82007 , H01L2924/01028 , H01L2924/01046 , H01L2924/01047 , H01L2924/01079 , H01L2924/06 , H01L2924/0665 , H01L2924/07025 , H01L2924/07802 , H01L2924/12042 , H01L2924/1715 , H01L2924/17738 , H01L2924/17747 , H01L2924/1776 , H01L2924/17763 , H01L2924/181 , H01L2924/2064 , H01L2924/20641 , H01L2924/20642 , H01L2924/20643 , H01L2924/20644 , H01L2924/20645 , H01L2924/20646 , H01L2924/20647 , H01L2924/20648 , H01L2924/20649 , H01L2924/2065 , H01L2924/00
摘要: 本发明涉及用于制造芯片封装的方法、芯片封装和晶圆级封装。提供了一种用于制造芯片封装的方法。该方法包括:在载体之上形成层;在该层之上形成进一步载体材料;选择性地移除进一步载体材料的一个或者多个部分,由此从进一步载体材料释放该层的一个或者多个部分;和,经由该层将包括一个或者多个接触垫的芯片附着到载体。
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公开(公告)号:CN101689517A
公开(公告)日:2010-03-31
申请号:CN200880023088.1
申请日:2008-07-24
申请人: 新日铁高新材料株式会社 , 株式会社日铁微金属
CPC分类号: H01L24/85 , H01L24/05 , H01L24/43 , H01L24/45 , H01L24/48 , H01L2224/04042 , H01L2224/05624 , H01L2224/4312 , H01L2224/4321 , H01L2224/43825 , H01L2224/43847 , H01L2224/43848 , H01L2224/43986 , H01L2224/45015 , H01L2224/45144 , H01L2224/45147 , H01L2224/45565 , H01L2224/45572 , H01L2224/456 , H01L2224/45639 , H01L2224/45644 , H01L2224/45655 , H01L2224/45664 , H01L2224/45669 , H01L2224/45671 , H01L2224/45673 , H01L2224/4568 , H01L2224/45684 , H01L2224/48011 , H01L2224/48227 , H01L2224/48247 , H01L2224/4845 , H01L2224/48463 , H01L2224/48472 , H01L2224/48624 , H01L2224/48639 , H01L2224/48644 , H01L2224/48664 , H01L2224/48724 , H01L2224/48824 , H01L2224/48839 , H01L2224/48844 , H01L2224/48864 , H01L2224/78251 , H01L2224/78301 , H01L2224/85045 , H01L2224/85048 , H01L2224/85065 , H01L2224/85075 , H01L2224/85203 , H01L2224/85205 , H01L2224/85207 , H01L2224/85439 , H01L2224/85444 , H01L2224/85464 , H01L2224/859 , H01L2924/00011 , H01L2924/00015 , H01L2924/01004 , H01L2924/01005 , H01L2924/01006 , H01L2924/01007 , H01L2924/01013 , H01L2924/01014 , H01L2924/01015 , H01L2924/01018 , H01L2924/01022 , H01L2924/01023 , H01L2924/01024 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/01033 , H01L2924/0104 , H01L2924/01042 , H01L2924/01045 , H01L2924/01046 , H01L2924/01047 , H01L2924/0105 , H01L2924/01058 , H01L2924/01074 , H01L2924/01077 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/01083 , H01L2924/01105 , H01L2924/01204 , H01L2924/01327 , H01L2924/014 , H01L2924/10253 , H01L2924/12041 , H01L2924/15747 , H01L2924/20105 , H01L2924/20106 , H01L2924/20107 , H01L2924/20752 , H01L2924/20753 , H01L2924/20754 , H01L2924/20755 , H01L2924/20756 , H01L2924/20757 , H01L2924/20758 , H01L2924/20759 , H01L2924/3025 , H01L2924/3861 , H01L2924/01001 , H01L2924/01203 , H01L2924/01034 , H01L2924/01081 , H01L2924/20645 , H01L2924/20652 , H01L2924/20653 , H01L2924/00014 , H01L2924/20108 , H01L2224/45657 , H01L2224/45666 , H01L2924/01008 , H01L2924/20109 , H01L2924/2011 , H01L2924/20111 , H01L2924/2076 , H01L2924/2065 , H01L2924/20651 , H01L2924/20654 , H01L2924/00 , H01L2224/45124 , H01L2924/013 , H01L2924/20751 , H01L2924/2075 , H01L2924/00013 , H01L2924/01049
摘要: 本发明的目的是提供材料费廉价且球接合性、热循环试验或软熔试验的可靠性优异、保管寿命也良好的也适应于窄间距用细线化的铜系接合线。本发明的半导体装置用接合线是具有以铜为主成分的芯材、和设置在所述芯材上的含有成分和组成的某一方或两方与所述芯材不同的金属M和铜的外层的接合线,其特征在于,所述外层的厚度为0.021~0.12μm。
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公开(公告)号:CN104603921A
公开(公告)日:2015-05-06
申请号:CN201280075614.5
申请日:2012-09-04
申请人: 三菱电机株式会社
IPC分类号: H01L21/60
CPC分类号: H01L24/05 , H01L23/498 , H01L24/01 , H01L24/03 , H01L24/08 , H01L24/11 , H01L24/16 , H01L24/48 , H01L24/73 , H01L2224/034 , H01L2224/0401 , H01L2224/04042 , H01L2224/05083 , H01L2224/05124 , H01L2224/05155 , H01L2224/05166 , H01L2224/05624 , H01L2224/05644 , H01L2224/0603 , H01L2224/16113 , H01L2224/16245 , H01L2224/29101 , H01L2224/32245 , H01L2224/48091 , H01L2224/48247 , H01L2224/73251 , H01L2224/73265 , H01L2924/00014 , H01L2924/01022 , H01L2924/01028 , H01L2924/01042 , H01L2924/01047 , H01L2924/01079 , H01L2924/07025 , H01L2924/13055 , H01L2924/13091 , H01L2924/181 , H01L2924/2064 , H01L2924/20641 , H01L2924/20642 , H01L2924/20643 , H01L2924/20644 , H01L2924/20645 , H01L2924/20646 , H01L2924/20647 , H01L2924/20648 , H01L2924/20649 , H01L2924/2065 , H01L2924/351 , H01L2924/00 , H01L2224/45099 , H01L2924/014 , H01L2924/00012 , H01L2224/45015 , H01L2924/207 , H01L2924/01201 , H01L2924/01014
摘要: 本申请的发明所涉及的半导体装置,其特征在于,具有:半导体元件;表面电极,其形成在该半导体元件的表面;金属膜,其形成在该表面电极上,具有接合部、以及以与该接合部接触并且包围该接合部的方式形成的应力缓和部;焊料,其避开该应力缓和部而与该接合部接合;以及外部电极,其经由该焊料而与该接合部接合。
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公开(公告)号:CN103515256A
公开(公告)日:2014-01-15
申请号:CN201310235224.6
申请日:2013-06-14
申请人: 英飞凌科技股份有限公司
发明人: G.迈耶-贝格
IPC分类号: H01L21/58 , H01L21/60 , H01L23/485
CPC分类号: H01L23/49513 , H01L21/4821 , H01L21/561 , H01L23/3128 , H01L23/49541 , H01L23/49575 , H01L23/49582 , H01L24/13 , H01L24/19 , H01L24/20 , H01L24/24 , H01L24/32 , H01L24/82 , H01L25/0655 , H01L2224/0401 , H01L2224/04105 , H01L2224/05548 , H01L2224/12105 , H01L2224/13022 , H01L2224/13024 , H01L2224/24155 , H01L2224/29082 , H01L2224/29139 , H01L2224/29144 , H01L2224/29155 , H01L2224/29164 , H01L2224/2919 , H01L2224/32245 , H01L2224/73267 , H01L2224/82007 , H01L2924/01028 , H01L2924/01046 , H01L2924/01047 , H01L2924/01079 , H01L2924/06 , H01L2924/0665 , H01L2924/07025 , H01L2924/07802 , H01L2924/12042 , H01L2924/1715 , H01L2924/17738 , H01L2924/17747 , H01L2924/1776 , H01L2924/17763 , H01L2924/181 , H01L2924/2064 , H01L2924/20641 , H01L2924/20642 , H01L2924/20643 , H01L2924/20644 , H01L2924/20645 , H01L2924/20646 , H01L2924/20647 , H01L2924/20648 , H01L2924/20649 , H01L2924/2065 , H01L2924/00
摘要: 本发明涉及用于制造芯片封装的方法、芯片封装和晶圆级封装。提供了一种用于制造芯片封装的方法。该方法包括:在载体之上形成层;在该层之上形成进一步载体材料;选择性地移除进一步载体材料的一个或者多个部分,由此从进一步载体材料释放该层的一个或者多个部分;和,经由该层将包括一个或者多个接触垫的芯片附着到载体。
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公开(公告)号:CN101496160B
公开(公告)日:2010-12-22
申请号:CN200680040315.2
申请日:2006-10-26
申请人: 飞思卡尔半导体公司
IPC分类号: H01L23/02
CPC分类号: H01L25/16 , H01L24/48 , H01L24/49 , H01L2223/6611 , H01L2223/6644 , H01L2224/48011 , H01L2224/4809 , H01L2224/48095 , H01L2224/49052 , H01L2224/49111 , H01L2224/49175 , H01L2924/00014 , H01L2924/01013 , H01L2924/01014 , H01L2924/01029 , H01L2924/01033 , H01L2924/01082 , H01L2924/13055 , H01L2924/19041 , H01L2924/19043 , H01L2924/30105 , H01L2924/30107 , H01L2924/3011 , H01L2924/2065 , H01L2924/20651 , H01L2924/00 , H01L2224/45099 , H01L2224/05599
摘要: 根据本发明的一方面,提供了一种电子组件(10)。所述电子组件包括:基板(12)和与其连接的引线(14、16),以及在所述基板上的第一(34)和第二微电子元件(36)。所述第一微电子元件(34)具有第一和第二部分。多个导体(44)将第一微电子元件(34)与引线和第二微电子元件(36)中选择的一个互连。第一导体与第一微电子元件的第一部分接触并具有第一感应系数,第二导体与微电子元件的第二部分接触并具有第二感应系数。第二感应系数大于第一感应系数。
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公开(公告)号:CN101842893A
公开(公告)日:2010-09-22
申请号:CN200680038043.2
申请日:2006-08-15
申请人: 德克萨斯仪器股份有限公司
发明人: B·P·兰格
IPC分类号: H01L23/495
CPC分类号: H01L23/49541 , H01L23/49548 , H01L23/645 , H01L23/66 , H01L24/05 , H01L24/06 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/85 , H01L2223/6611 , H01L2224/04042 , H01L2224/05554 , H01L2224/05624 , H01L2224/05644 , H01L2224/2919 , H01L2224/32245 , H01L2224/45144 , H01L2224/48011 , H01L2224/48091 , H01L2224/48247 , H01L2224/48253 , H01L2224/48624 , H01L2224/48644 , H01L2224/49111 , H01L2224/49113 , H01L2224/49171 , H01L2224/49431 , H01L2224/49433 , H01L2224/73265 , H01L2224/85 , H01L2924/00014 , H01L2924/01005 , H01L2924/01013 , H01L2924/01014 , H01L2924/01023 , H01L2924/01028 , H01L2924/01029 , H01L2924/01031 , H01L2924/01032 , H01L2924/01033 , H01L2924/01046 , H01L2924/01047 , H01L2924/0105 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/14 , H01L2924/181 , H01L2924/30107 , H01L2924/3025 , H01L2924/0665 , H01L2924/07025 , H01L2924/2065 , H01L2224/78 , H01L2924/00 , H01L2924/00012
摘要: 一种器件,该器件包括半导体芯片(110),半导体芯片(110)具有侧边(111)和靠近所述侧边的多个金属焊盘(120,121);这些焊盘被对齐以形成平行于所述侧边的列(130,131)。所述器件进一步包括具有引线的引线框(100),这些引线的一端指向所述芯片边缘并通过一缝隙(150)与其间隔开;所述芯片被附着到所述引线框上。被选择引线的末端通过平行于所述芯片边缘的金属横条(160)连接起来。大致平行的焊丝(170)横跨所述缝隙,以将每个芯片焊盘连接到所述横条上,或者连接到未选择的引线末端。在优选的引线布局中,被选择引线和未选择引线交替出现。
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