公开(公告)号：US07061122B2

公开(公告)日：2006-06-13

申请号：US10683097

申请日：2003-10-10

申请人： Young-Gon Kim ,  David Gibson ,  Michael Warner ,  Philip Damberg ,  Philip Osborn

发明人： Young-Gon Kim ,  David Gibson ,  Michael Warner ,  Philip Damberg ,  Philip Osborn

IPC分类号： H01L29/40

CPC分类号： H05K1/141 ,  H01L25/105 ,  H01L2224/05568 ,  H01L2224/05573 ,  H01L2224/16225 ,  H01L2225/1005 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2225/107 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01322 ,  H01L2924/01327 ,  H01L2924/15311 ,  H01L2924/1532 ,  H01L2924/15331 ,  H01L2924/3511 ,  H05K3/3436 ,  H05K2201/10719 ,  H05K2203/1572 ,  H01L2924/00 ,  H01L2224/05644 ,  H01L2924/00014 ,  H01L2224/05647

摘要： An ultra thin system-in-a-package (SIP) with independent test and repair capability comprises an interposer having arranged on a top surface and a bottom surface thereof a number of packaged semiconductor chips mounted via solder bumps in accordance with a Land Grid Array (LGA) format and wherein no underfill is used on the SIP.

摘要翻译： 具有独立测试和修复功能的超薄系统级封装（SIP）包括：插入器，其布置在其顶表面和底表面上，多个封装的半导体芯片通过焊料凸块安装，根据Land Grid Array （LGA）格式，并且其中在SIP上不使用底部填充物。

公开(公告)号：US20070166876A1

公开(公告)日：2007-07-19

申请号：US11324453

申请日：2006-01-03

申请人： Young-Gon Kim ,  David Gibson ,  Michael Warner ,  Philip Damberg ,  Philip Osborn

发明人： Young-Gon Kim ,  David Gibson ,  Michael Warner ,  Philip Damberg ,  Philip Osborn

IPC分类号： H01L21/00

CPC分类号： H05K1/141 ,  H01L25/105 ,  H01L2224/05568 ,  H01L2224/05573 ,  H01L2224/16225 ,  H01L2225/1005 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2225/107 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01322 ,  H01L2924/01327 ,  H01L2924/15311 ,  H01L2924/1532 ,  H01L2924/15331 ,  H01L2924/3511 ,  H05K3/3436 ,  H05K2201/10719 ,  H05K2203/1572 ,  H01L2924/00 ,  H01L2224/05644 ,  H01L2924/00014 ,  H01L2224/05647

摘要： An ultra thin system-in-a-package (SIP) with independent test and repair capability comprises an interposer having arranged on a top surface and a bottom surface thereof a number of packaged semiconductor chips mounted via solder bumps in accordance with a Land Grid Array (LGA) format and wherein no underfill is used on the SIP.

摘要翻译： 具有独立测试和修复功能的超薄系统级封装（SIP）包括：插入器，其布置在其顶表面和底表面上，多个封装的半导体芯片通过焊料凸块安装，根据Land Grid Array （LGA）格式，并且其中在SIP上不使用底部填充物。

公开(公告)号：US07149095B2

公开(公告)日：2006-12-12

申请号：US10281550

申请日：2002-10-28

申请人： Michael Warner ,  Philip Damberg ,  John B. Riley ,  David Gibson ,  Young-Gon Kim ,  Belgacem Haba ,  Vernon Solberg

发明人： Michael Warner ,  Philip Damberg ,  John B. Riley ,  David Gibson ,  Young-Gon Kim ,  Belgacem Haba ,  Vernon Solberg

IPC分类号： H05K1/11

CPC分类号： H05K1/189 ,  H01L23/5387 ,  H01L25/0657 ,  H01L2224/05568 ,  H01L2224/05573 ,  H01L2224/16 ,  H01L2225/06517 ,  H01L2225/0652 ,  H01L2225/06541 ,  H01L2225/06555 ,  H01L2225/06579 ,  H01L2225/06582 ,  H01L2225/06586 ,  H01L2924/00014 ,  H01L2924/3011 ,  H01L2224/05599

摘要： A stacked microelectronic assembly includes a plurality of microelectronic subassemblies. Each subassembly includes a substrate having at least one site, a plurality of first contacts and a plurality of second contacts. Each subassembly also has at least one microelectronic element assembled to the at least one attachment site and electrically connected to at least some of the first and second contacts. The substrate is folded so that the first contacts are accessible at a bottom of a subassembly and the second contacts are accessible at a top of a subassembly. The plurality of subassemblies are stacked one on top of another in a generally vertical configuration. The substrate of at least one of the subassemblies has a plurality of attachment sites and a plurality of microelectronic elements assembled to the attachment sites. The substrate is folded so that at least some of the plurality of microelectronic elements are disposed alongside one another.

摘要翻译： 堆叠的微电子组件包括多个微电子子组件。 每个子组件包括具有至少一个位置，多个第一触点和多个第二触点的基板。 每个子组件还具有组装到至少一个附接位置并电连接到第一和第二触点中的至少一些的至少一个微电子元件。 折叠基板使得第一触头在子组件的底部可接近，并且第二触头可在子组件的顶部接近。 多个子组件以大致垂直的配置堆叠在另一个之上。 至少一个子组件的衬底具有多个附接位置和组装到附接位置的多个微电子元件。 折叠基板使得多个微电子元件中的至少一些彼此并排设置。

公开(公告)号：US06885106B1

公开(公告)日：2005-04-26

申请号：US10044121

申请日：2002-01-11

申请人： Philip Damberg ,  Craig S. Mitchell ,  John B. Riley ,  Michael Warner ,  Joseph Fjelstad

发明人： Philip Damberg ,  Craig S. Mitchell ,  John B. Riley ,  Michael Warner ,  Joseph Fjelstad

IPC分类号： H01L23/31 ,  H01L23/49 ,  H01L25/065 ,  H01L23/48 ,  H01R12/00

CPC分类号： H01L25/0657 ,  H01L23/3114 ,  H01L23/3128 ,  H01L24/10 ,  H01L24/13 ,  H01L24/48 ,  H01L24/50 ,  H01L24/73 ,  H01L2224/0401 ,  H01L2224/06135 ,  H01L2224/06136 ,  H01L2224/13 ,  H01L2224/13099 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/45014 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/4824 ,  H01L2224/48247 ,  H01L2224/50 ,  H01L2224/73215 ,  H01L2224/73265 ,  H01L2225/0651 ,  H01L2225/06527 ,  H01L2225/06555 ,  H01L2225/06562 ,  H01L2225/06579 ,  H01L2225/06582 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01033 ,  H01L2924/01322 ,  H01L2924/014 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45015 ,  H01L2924/207

摘要： A stacked microelectronic assembly includes a dielectric element and a first and second microelectronic element stacked one atop the other with the first microelectronic element disposed between the second microelectronic element and the dielectric. The dielectric element has opposed first and second surfaces with conductive features exposed at the first surface and terminals exposed on the second surface. Preferably, the contact-bearing face of the first microelectronic element confronts the first surface of the dielectric with at least some of the conductive features being movable with respect to the contacts or terminals. By providing such movable features, joining units have heights of about 300 microns or less may be joined to the terminals thereby reducing the overall height of the microelectronic assembly to 1.2 mm and less.

摘要翻译： 堆叠的微电子组件包括介电元件和第一和第二微电子元件，第一和第二微电子元件彼此堆叠，第一微电子元件设置在第二微电子元件和电介质之间。 电介质元件具有相对的第一表面和第二表面，其导电特征在第一表面暴露并且端子暴露在第二表面上。 优选地，第一微电子元件的接触面面对电介质的第一表面，其中至少一些导电特征可相对于触点或端子移动。 通过提供这种可移动特征，具有约300微米或更小的高度的接合单元可以连接到端子，从而将微电子组件的整体高度减小到1.2mm以下。

公开(公告)号：US08786083B2

公开(公告)日：2014-07-22

申请号：US12883821

申请日：2010-09-16

申请人： Belgacem Haba ,  Ellis Chau ,  Wael Zohni ,  Philip Damberg ,  Richard Dewitt Crisp

发明人： Belgacem Haba ,  Ellis Chau ,  Wael Zohni ,  Philip Damberg ,  Richard Dewitt Crisp

IPC分类号： H01L23/52

CPC分类号： H01L23/64 ,  H01L23/3128 ,  H01L23/49816 ,  H01L23/552 ,  H01L24/06 ,  H01L24/29 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/73 ,  H01L25/0657 ,  H01L2224/02311 ,  H01L2224/02313 ,  H01L2224/02375 ,  H01L2224/02379 ,  H01L2224/04042 ,  H01L2224/05554 ,  H01L2224/32225 ,  H01L2224/45015 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/48091 ,  H01L2224/48095 ,  H01L2224/48227 ,  H01L2224/49175 ,  H01L2224/73265 ,  H01L2225/0651 ,  H01L2225/06537 ,  H01L2225/06575 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01019 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01079 ,  H01L2924/014 ,  H01L2924/07802 ,  H01L2924/10161 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/19107 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/43

摘要： A microelectronic assembly is disclosed that is capable of achieving a desired impedance for raised conductive elements. The microelectronic assembly may include an interconnection element, a surface conductive element, a microelectronic device, a plurality of raised conductive elements, and a bond element. The microelectronic device may overlie the dielectric element and at least one surface conductive element attached to the front surface. The plurality of raised conductive elements may connect the device contacts with the element contacts. The raised conductive elements may have substantial portions spaced a first height above and extending at least generally parallel to at least one surface conductive element, such that a desired impedance may be achieved for the raised conductive elements. A bond element may electrically connect at least one surface conductive element with at least one reference contact that may be connectable to a source of reference potential.

摘要翻译： 公开了能够实现用于凸起的导电元件的期望阻抗的微电子组件。 微电子组件可以包括互连元件，表面导电元件，微电子器件，多个凸起的导电元件和接合元件。 微电子器件可以覆盖在电介质元件和附接到前表面的至少一个表面导电元件。 多个凸起的导电元件可以将元件触点与元件触点连接。 升高的导电元件可以具有在第一高度之上并且至少大致平行于至少一个表面导电元件延伸的基本部分，使得可以为凸起的导电元件实现期望的阻抗。 键合元件可以将至少一个表面导电元件与可连接到参考电位源的至少一个参考触点电连接。

公开(公告)号：US20130093087A1

公开(公告)日：2013-04-18

申请号：US13404408

申请日：2012-02-24

申请人： Ellis Chau ,  Reynaldo Co ,  Roseann Alatorre ,  Philip Damberg ,  Wei-Shun Wang ,  Se Young Yang

发明人： Ellis Chau ,  Reynaldo Co ,  Roseann Alatorre ,  Philip Damberg ,  Wei-Shun Wang ,  Se Young Yang

IPC分类号： H01L23/498

CPC分类号： H01L24/85 ,  H01L21/4853 ,  H01L21/56 ,  H01L21/565 ,  H01L23/3114 ,  H01L23/3128 ,  H01L23/3677 ,  H01L23/4334 ,  H01L23/49517 ,  H01L23/49811 ,  H01L23/49816 ,  H01L24/06 ,  H01L24/16 ,  H01L24/43 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/73 ,  H01L24/78 ,  H01L25/0655 ,  H01L25/0657 ,  H01L25/105 ,  H01L25/50 ,  H01L2224/0401 ,  H01L2224/05599 ,  H01L2224/131 ,  H01L2224/16145 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/32245 ,  H01L2224/45015 ,  H01L2224/45124 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/4554 ,  H01L2224/45565 ,  H01L2224/48091 ,  H01L2224/48145 ,  H01L2224/48227 ,  H01L2224/4824 ,  H01L2224/48245 ,  H01L2224/48247 ,  H01L2224/48997 ,  H01L2224/49171 ,  H01L2224/73204 ,  H01L2224/73207 ,  H01L2224/73253 ,  H01L2224/73257 ,  H01L2224/73265 ,  H01L2224/78301 ,  H01L2224/851 ,  H01L2224/8518 ,  H01L2224/85399 ,  H01L2224/85951 ,  H01L2224/85986 ,  H01L2225/06506 ,  H01L2225/0651 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06558 ,  H01L2225/06562 ,  H01L2225/06565 ,  H01L2225/06568 ,  H01L2225/1023 ,  H01L2225/1029 ,  H01L2225/1052 ,  H01L2225/1058 ,  H01L2225/1088 ,  H01L2225/1094 ,  H01L2924/00011 ,  H01L2924/00012 ,  H01L2924/00014 ,  H01L2924/01013 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/12042 ,  H01L2924/1431 ,  H01L2924/1434 ,  H01L2924/15311 ,  H01L2924/15331 ,  H01L2924/1715 ,  H01L2924/181 ,  H01L2924/1815 ,  H01L2924/19107 ,  H01L2924/3511 ,  H05K3/3436 ,  H05K2201/10515 ,  H05K2201/1053 ,  Y10T29/49149 ,  Y10T29/49151 ,  H01L2224/45664 ,  H01L2924/00 ,  H01L2924/014 ,  H01L2924/20751 ,  H01L2924/20752 ,  H01L2924/20753 ,  H01L2924/20754 ,  H01L2924/20755 ,  H01L2924/20756 ,  H01L2924/20757 ,  H01L2924/20758 ,  H01L2924/20759 ,  H01L2924/2076

摘要： A microelectronic package can include wire bonds having bases bonded to respective ones of conductive elements exposed at a surface of a substrate. The wire bonds may have exterior edge surfaces disposed at an angle between 25° and 90° relative to the bases, and ends remote, e.g., opposite, from the bases, and remote from the ends which are connected to the bases. A dielectric encapsulation layer extends from the substrate and covers portions of the wire bonds such that covered portions of the wire bonds are separated from one another by the encapsulation layer, wherein unencapsulated portions of the wire bonds are defined by portions of the wire bonds that are uncovered by the encapsulation layer, the unencapsulated portions including the ends of the wire bonds.

摘要翻译： 微电子封装可以包括引线键合，其具有接合到在衬底的表面处暴露的导电元件的相应导电元件的基底。 线接合可以具有相对于基部以25°和90°之间的角度设置的外部边缘表面，并且远离基部远离，例如相反，并且远离连接到基部的端部。 电介质封装层从衬底延伸并覆盖引线接合的部分，使得引线键合的被覆部分通过封装层彼此分开，其中引线键合的未封装部分由引线键的部分限定， 被封装层覆盖的未包封部分包括引线的端部。

公开(公告)号：US20120313228A1

公开(公告)日：2012-12-13

申请号：US13472081

申请日：2012-05-15

申请人： Belgacem Haba ,  Ellis Chau ,  Wael Zohni ,  Philip Damberg ,  Richard Dewitt Crisp

发明人： Belgacem Haba ,  Ellis Chau ,  Wael Zohni ,  Philip Damberg ,  Richard Dewitt Crisp

IPC分类号： H01L23/495 ,  H01L21/60 ,  H01L25/07

CPC分类号： H01L23/3128 ,  H01L23/13 ,  H01L23/49816 ,  H01L23/552 ,  H01L24/06 ,  H01L24/29 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/73 ,  H01L25/0657 ,  H01L2224/02311 ,  H01L2224/02313 ,  H01L2224/02375 ,  H01L2224/02379 ,  H01L2224/05554 ,  H01L2224/0603 ,  H01L2224/06156 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/45015 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/48091 ,  H01L2224/48095 ,  H01L2224/48227 ,  H01L2224/48235 ,  H01L2224/4824 ,  H01L2224/49175 ,  H01L2224/73215 ,  H01L2224/73265 ,  H01L2225/0651 ,  H01L2225/06558 ,  H01L2924/01005 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/01079 ,  H01L2924/014 ,  H01L2924/07802 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/19107 ,  H01L2924/30107 ,  H01L2924/3011 ,  H01L2924/00014 ,  H01L2924/00012 ,  H01L2924/00

摘要： A microelectronic assembly includes an interconnection element, a conductive plane, a microelectronic device, a plurality of traces, and first and second bond elements. The interconnection element includes a dielectric element, a plurality of element contacts, and at least one reference contact thereon. The microelectronic device includes a front surface with device contacts exposed thereat. The conductive plane overlies a portion of the front surface of the microelectronic device. Traces overlying a surface of the conductive plane are insulated therefrom and electrically connected with the element contacts. The traces also have substantial portions spaced a first height above and extending at least generally parallel to the conductive plane, such that a desired impedance is achieved for the traces. First bond element electrically connects the at least one conductive plane with the at least one reference contact. Second bond elements electrically connect device contacts with the traces.

摘要翻译： 微电子组件包括互连元件，导电平面，微电子器件，多个迹线以及第一和第二接合元件。 互连元件包括电介质元件，多个元件触点及其上的至少一个参考触点。 该微电子器件包括一个正面，其中设有触点暴露在该表面上。 导电平面覆盖微电子器件前表面的一部分。 覆盖导电平面表面的迹线与其绝缘，并与元件触点电连接。 迹线还具有在第一高度之上并且至少大致平行于导电平面延伸的基本部分，使得对于迹线实现期望的阻抗。 第一接合元件将至少一个导电平面与至少一个参考触点电连接。 第二接合元件将器件触点与迹线电连接。

公开(公告)号：US20120286416A1

公开(公告)日：2012-11-15

申请号：US13105325

申请日：2011-05-11

申请人： Hiroaki Sato ,  Yukio Hashimoto ,  Yoshikuni Nakadaira ,  Norihito Masuda ,  Belgacem Haba ,  Ilyas Mohammed ,  Philip Damberg

发明人： Hiroaki Sato ,  Yukio Hashimoto ,  Yoshikuni Nakadaira ,  Norihito Masuda ,  Belgacem Haba ,  Ilyas Mohammed ,  Philip Damberg

IPC分类号： H01L23/498 ,  H01L21/60

CPC分类号： H01L24/97 ,  H01L21/4857 ,  H01L21/486 ,  H01L21/561 ,  H01L23/49822 ,  H01L23/49827 ,  H01L24/13 ,  H01L24/16 ,  H01L24/32 ,  H01L24/73 ,  H01L24/81 ,  H01L2224/13109 ,  H01L2224/13111 ,  H01L2224/16225 ,  H01L2224/32225 ,  H01L2224/73204 ,  H01L2224/81191 ,  H01L2224/81444 ,  H01L2224/81455 ,  H01L2224/97 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01049 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/12042 ,  H01L2924/15311 ,  H01L2224/81 ,  H01L2924/00012 ,  H01L2924/00

摘要： A microelectronic assembly may include a microelectronic element having a plurality of element contacts at a face thereof, and a compliant dielectric element having a Young's modulus of less than about two gigapascal (GPa) and substrate contacts at a first surface joined to the element contacts. The substrate contacts may be electrically connected with terminals at a second surface of the compliant dielectric element that opposes the first surface, through conductive vias in the compliant dielectric element. A rigid underfill may be between the face of the microelectronic element and the first surface of the compliant dielectric element. The terminals may be usable for bonding the microelectronic assembly to corresponding contacts of a component external to the microelectronic assembly.

摘要翻译： 微电子组件可以包括在其表面具有多个元件触点的微电子元件，以及在与元件触点连接的第一表面处具有小于约二千兆帕（GPa）的杨氏模量和柔性介电元件以及在第一表面处的衬底触点。 衬底触点可以通过柔性介电元件中的导电通孔与柔性介电元件的与第一表面相对的第二表面的端子电连接。 刚性底部填充物可以位于微电子元件的表面和顺应介电元件的第一表面之间。 端子可用于将微电子组件接合到微电子组件外部的部件的相应触点。

公开(公告)号：US20110285020A1

公开(公告)日：2011-11-24

申请号：US13196192

申请日：2011-08-02

申请人： Belgacem Haba ,  Philip Damberg ,  Philip R. Osborn

发明人： Belgacem Haba ,  Philip Damberg ,  Philip R. Osborn

IPC分类号： H01L23/49

CPC分类号： H01L23/49816 ,  H01L21/50 ,  H01L23/13 ,  H01L23/49861 ,  H01L24/01 ,  H01L24/36 ,  H01L24/40 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/85 ,  H01L24/91 ,  H01L2224/05554 ,  H01L2224/40091 ,  H01L2224/40225 ,  H01L2224/45014 ,  H01L2224/45015 ,  H01L2224/45144 ,  H01L2224/4809 ,  H01L2224/48091 ,  H01L2224/48096 ,  H01L2224/4813 ,  H01L2224/4824 ,  H01L2224/4846 ,  H01L2224/48465 ,  H01L2224/48477 ,  H01L2224/48599 ,  H01L2224/4911 ,  H01L2224/49112 ,  H01L2224/4942 ,  H01L2224/49427 ,  H01L2224/49429 ,  H01L2224/4945 ,  H01L2224/85051 ,  H01L2224/85191 ,  H01L2224/85205 ,  H01L2924/00014 ,  H01L2924/01033 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/19107 ,  H01L2924/20751 ,  H01L2924/20752 ,  H01L2924/30107 ,  H01L2924/00 ,  H01L2224/48095 ,  H01L2224/37099 ,  H01L2224/85399 ,  H01L2224/05599

摘要： A microelectronic assembly includes a semiconductor chip having chip contacts exposed at a first face and a substrate juxtaposed with a face of the chip. A conductive bond element can electrically connect a first chip contact with a first substrate contact of the substrate, and a second conductive bond element can electrically connect the first chip contact with a second substrate contact. The first bond element can have a first end metallurgically joined to the first chip contact and a second end metallurgically joined to the first substrate contact. A first end of the second bond element can be metallurgically joined to the first bond element. The second bond element may or may not touch the first chip contact or the substrate contact. A third bond element can be joined to ends of first and second bond elements which are joined to substrate contacts or to chip contacts. In one embodiment, a bond element can have a looped connection, having first and second ends joined at a first contact and a middle portion joined to a second contact.

摘要翻译： 微电子组件包括半导体芯片，其具有在第一面处露出的芯片触点和与芯片的表面并置的衬底。 导电接合元件可以将第一芯片触点与衬底的第一衬底触点电连接，并且第二导电结合元件可以将第一芯片触点与第二衬底触点电连接。 第一结合元件可以具有冶金地连接到第一芯片触点的第一端和冶金地连接到第一衬底触点的第二端。 第二结合元件的第一端可以冶金地连接到第一结合元件。 第二接合元件可以或可以不接触第一芯片接触或基板接触。 第三接合元件可以连接到第一和第二接合元件的端部，所述第一和第二接合元件连接到衬底触点或芯片触点。 在一个实施例中，接合元件可以具有环形连接，其具有在第一接触处连接的第一端和第二端以及与第二接触连接的中间部。

公开(公告)号：US07521785B2

公开(公告)日：2009-04-21

申请号：US11018969

申请日：2004-12-21

申请人： Philip Damberg ,  Nicholas J. Colella

发明人： Philip Damberg ,  Nicholas J. Colella

IPC分类号： H01L23/02

CPC分类号： H01L25/0657 ,  H01L23/49816 ,  H01L24/48 ,  H01L25/105 ,  H01L2224/05001 ,  H01L2224/05008 ,  H01L2224/05023 ,  H01L2224/05024 ,  H01L2224/05026 ,  H01L2224/05568 ,  H01L2224/05571 ,  H01L2224/16145 ,  H01L2224/32145 ,  H01L2224/48145 ,  H01L2224/73253 ,  H01L2225/06506 ,  H01L2225/0651 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06565 ,  H01L2225/06568 ,  H01L2225/06572 ,  H01L2225/06589 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2225/1094 ,  H01L2924/00014 ,  H01L2924/01322 ,  H01L2924/15311 ,  H01L2924/16152 ,  H01L2224/05599 ,  H01L2224/05099 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2924/00012

摘要： A semiconductor assembly includes plural chips stacked one above the other. One or more of the chips is a magnetic random access memory (MRAM). Use of MRAM alleviates problems caused by heat dissipation in the stack.

摘要翻译： 半导体组件包括多个堆叠在一起的芯片。 一个或多个芯片是磁性随机存取存储器（MRAM）。 使用MRAM可减轻堆叠中散热引起的问题。