-
61.ENHANCED WIRE BOND STABILITY ON REACTIVE METAL SURFACES OF A SEMICONDUCTOR DEVICE BY ENCAPSULATION OF THE BOND STRUCTURE 审中-公开
标题翻译: 通过封装结构结构,半导体器件的反应性金属表面的增强线束稳定性公开(公告)号:WO2010024932A2
公开(公告)日:2010-03-04
申请号:PCT/US2009/004916
申请日:2009-08-29
CPC分类号: H01L24/85 , H01L21/56 , H01L23/24 , H01L23/3121 , H01L23/3171 , H01L24/02 , H01L24/45 , H01L24/48 , H01L2224/04042 , H01L2224/05009 , H01L2224/05166 , H01L2224/05181 , H01L2224/05624 , H01L2224/05639 , H01L2224/05647 , H01L2224/45124 , H01L2224/45139 , H01L2224/45144 , H01L2224/45147 , H01L2224/48091 , H01L2224/48095 , H01L2224/48247 , H01L2224/48453 , H01L2224/48463 , H01L2224/48507 , H01L2224/48624 , H01L2224/48639 , H01L2224/48647 , H01L2224/48724 , H01L2224/48739 , H01L2224/48747 , H01L2224/48824 , H01L2224/48839 , H01L2224/48847 , H01L2224/85201 , H01L2224/85205 , H01L2224/85375 , H01L2224/8592 , H01L2924/00014 , H01L2924/01006 , H01L2924/01007 , H01L2924/01013 , H01L2924/01014 , H01L2924/01019 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/01057 , H01L2924/01073 , H01L2924/01079 , H01L2924/01082 , H01L2924/01327 , H01L2924/04941 , H01L2924/04953 , H01L2924/1306 , H01L2924/14 , H01L2924/16152 , H01L2924/16195 , H01L2924/181 , H01L2924/19041 , H01L2924/19043 , H01L2924/30105 , H01L2924/351 , H01L2224/78 , H01L2924/00 , H01L2924/00015 , H01L2924/00012
摘要: The wire bond structure of sophisticated metallization systems, for instance based on copper, may be provided without a terminal aluminum layer and without any passivation layers for exposed copper surfaces (212S) by providing a fill material (250) after the wire bonding process in order to encapsulate at least the sensitive metal surfaces (212S) and a portion of the bond wire (230). Hence, significant cost reduction, reduced cycle times and a reduction of the required process steps may be accomplished independently from the wire bond materials used. Thus, integrated circuits requiring a sophisticated metallization system may be connected by wire bonding to the corresponding package (260) or carrier substrate with a required degree of reliability based on a corresponding fill material (250) for encapsulating at least the sensitive metal surfaces (212S).
摘要翻译: 复合金属化系统(例如基于铜)的引线接合结构可以通过在引线接合工艺之后依次提供填充材料(250)而没有端子铝层而没有任何用于暴露的铜表面(212S)的钝化层 至少封装敏感金属表面(212S)和接合线(230)的一部分。 因此,可以独立于使用的引线接合材料来实现显着的成本降低,循环时间缩短和所需工艺步骤的减少。 因此,需要复杂金属化系统的集成电路可以通过引线键合连接到基于相应的填充材料(250)的所需可靠度的相应封装(260)或载体衬底,用于至少将敏感金属表面(212S )。
-
公开(公告)号:WO2010024442A1
公开(公告)日:2010-03-04
申请号:PCT/JP2009/065225
申请日:2009-08-31
发明人: 青野 重雄
IPC分类号: H01L33/00
CPC分类号: B41J2/3351 , B41J2/3352 , B41J2/33575 , B41J2/3359 , B41J2/475 , H01L24/45 , H01L24/48 , H01L24/78 , H01L24/85 , H01L25/167 , H01L27/153 , H01L2224/45015 , H01L2224/45144 , H01L2224/48091 , H01L2224/48137 , H01L2224/48465 , H01L2224/48599 , H01L2224/78301 , H01L2224/85 , H01L2224/85205 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01014 , H01L2924/01019 , H01L2924/01023 , H01L2924/01029 , H01L2924/0103 , H01L2924/01031 , H01L2924/01032 , H01L2924/01033 , H01L2924/01049 , H01L2924/01079 , H01L2924/01083 , H01L2924/10329 , H01L2924/10336 , H01L2924/12041 , H01L2924/1301 , H01L2924/14 , H01L2924/00 , H01L2224/85399 , H01L2224/05599
摘要: 本発明は、回路基板、およびそれを用いた、画像形成装置、サーマルヘッド並びにイメージセンサに関する。基板101と、基板101上に位置し、表面に溝部108を有する導体105と、導体105に接続されたワイヤ107とを具備し、溝部108が、ワイヤ107と導体105との接続部を、一部の開口Xを除いて取り囲む。
摘要翻译: 提供了一种电路板,以及使用这种电路板的图像形成装置,热敏头和图像传感器。 电路板设置有基板(101),位于基板(101)上的导体(105),导体表面上具有凹槽部分(108),以及连接到导体(105)的导线(107) )。 凹槽部分(108)围绕线(107)和导体(105)之间的连接部分,不包括开口(X)的一部分。
-
公开(公告)号:WO2010015678A2
公开(公告)日:2010-02-11
申请号:PCT/EP2009/060213
申请日:2009-08-06
申请人: INTERNATIONAL BUSINESS MACHINES CORPORATION , IBM UNITED KINGDOM LIMITED , STAMPER, Anthony , ANDERSON, Felix, Patrick , MCDEVITT, Thomas, Leddy , EDELSTEIN, Daniel , COTE, William
发明人: STAMPER, Anthony , ANDERSON, Felix, Patrick , MCDEVITT, Thomas, Leddy , EDELSTEIN, Daniel , COTE, William
IPC分类号: H01L23/532 , H01L23/485 , H01L21/3105 , H01L21/768 , H01L21/60
CPC分类号: H01L24/13 , H01L21/3105 , H01L21/76807 , H01L21/76814 , H01L21/76826 , H01L21/76831 , H01L23/53238 , H01L23/53295 , H01L24/11 , H01L24/45 , H01L24/48 , H01L24/85 , H01L2221/1036 , H01L2224/0401 , H01L2224/05124 , H01L2224/05147 , H01L2224/05166 , H01L2224/05181 , H01L2224/05647 , H01L2224/05666 , H01L2224/13022 , H01L2224/13027 , H01L2224/13099 , H01L2224/13111 , H01L2224/13139 , H01L2224/13144 , H01L2224/13147 , H01L2224/45147 , H01L2224/48847 , H01L2924/00011 , H01L2924/01005 , H01L2924/01014 , H01L2924/01018 , H01L2924/01029 , H01L2924/01033 , H01L2924/01044 , H01L2924/01047 , H01L2924/0105 , H01L2924/01073 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/04953 , H01L2924/14 , H01L2924/19042 , H01L2924/00014 , H01L2924/00 , H01L2924/01006
摘要: Structures with improved solder bump connections and methods of fabricating such structures are provided herein. The structure includes a trench formed in a dielectric layer which has at least a portion thereof devoid of a fluorine boundary layer. The structure further includes a copper wire in the trench having at least a bottom portion thereof in contact with the non- fluoride boundary layer of the trench. A lead free solder bump is in electrical contact with the copper wire.
摘要翻译: 具有改善的焊料凸点连接的结构和制造这种结构的方法在本文中提供。 该结构包括在至少一部分没有氟边界层的电介质层中形成的沟槽。 该结构还包括在沟槽中的铜线,其至少其底部与沟槽的非氟化物边界层接触。 无铅焊料凸块与铜线电接触。
-
64.A SUBSTRATE ARRANGEMENT AND A METHOD OF MANUFACTURING A SUBSTRATE ARRANGEMENT 审中-公开
标题翻译: 基板装配和制造基板装配的方法公开(公告)号:WO2010011177A1
公开(公告)日:2010-01-28
申请号:PCT/SG2008/000268
申请日:2008-07-24
申请人: AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH , KRIPESH, Vaidyanathan , ORATTI KALANDAR, Navas Khan , VEMPATI, Srinivasa Rao , LIM, Yak Long Samuel , KHOO, Yee Mong , KHONG, Chee Houe , ZHANG, Xiao Wu , CHAI, Tai Chong , LAU, Hong-Shing John
发明人: KRIPESH, Vaidyanathan , ORATTI KALANDAR, Navas Khan , VEMPATI, Srinivasa Rao , LIM, Yak Long Samuel , KHOO, Yee Mong , KHONG, Chee Houe , ZHANG, Xiao Wu , CHAI, Tai Chong , LAU, Hong-Shing John
IPC分类号: H01L21/68 , H01L23/522
CPC分类号: H01L29/0657 , H01L24/11 , H01L24/13 , H01L24/14 , H01L24/16 , H01L24/81 , H01L25/0657 , H01L2224/0554 , H01L2224/05548 , H01L2224/05573 , H01L2224/05647 , H01L2224/1132 , H01L2224/1146 , H01L2224/1147 , H01L2224/11472 , H01L2224/11849 , H01L2224/11902 , H01L2224/13009 , H01L2224/13025 , H01L2224/131 , H01L2224/13147 , H01L2224/1403 , H01L2224/14051 , H01L2224/14181 , H01L2224/14505 , H01L2224/161 , H01L2224/16145 , H01L2224/16146 , H01L2224/16225 , H01L2224/1624 , H01L2224/8114 , H01L2224/81141 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2225/06555 , H01L2924/00014 , H01L2924/01006 , H01L2924/01011 , H01L2924/01022 , H01L2924/01029 , H01L2924/01032 , H01L2924/01033 , H01L2924/01059 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/10329 , H01L2924/14 , H01L2924/15787 , H01L2924/3025 , H01L2924/35 , H01L2924/01014 , H01L2924/00 , H01L2224/05599 , H01L2224/0555 , H01L2224/0556
摘要: According to one embodiment of the present invention, a substrate arrangement is provided. The substrate arrangement includes a first substrate; a second substrate positioned above the first substrate, the second substrate comprising a first through hole; a third substrate positioned above the second substrate, the third substrate comprising a second through hole; a first electrically conductive interconnect pillar positioned on the first substrate and extending from the first substrate through the first through hole to electrically contact the third substrate; and a second electrically conductive interconnect pillar positioned on the second substrate and extending from the second substrate through the second through hole. A method of manufacturing a substrate arrangement is also provided.
摘要翻译: 根据本发明的一个实施例,提供了一种衬底布置。 衬底布置包括第一衬底; 位于所述第一基板上方的第二基板,所述第二基板包括第一通孔; 位于所述第二基板上方的第三基板,所述第三基板包括第二通孔; 位于所述第一基板上并且从所述第一基板延伸穿过所述第一通孔的第一导电互连柱,以与所述第三基板电接触; 以及第二导电互连柱,其定位在所述第二基板上并且从所述第二基板延伸穿过所述第二通孔。 还提供了一种制造衬底布置的方法。
-
65.SUBSTRATE-MOUNTED CIRCUIT MODULE COMPRISING COMPONENTS IN A PLURALITY OF CONTACT PLANES 审中-公开
标题翻译: 在几个触点接通组件基板,电路模块公开(公告)号:WO2009132922A3
公开(公告)日:2009-12-30
申请号:PCT/EP2009053914
申请日:2009-04-02
发明人: KIMMICH PETER , NGUYEN QUOC-DAT
IPC分类号: H01L23/367 , H01L25/065
CPC分类号: H01L23/3677 , H01L23/142 , H01L24/45 , H01L24/48 , H01L24/49 , H01L25/072 , H01L2224/32225 , H01L2224/45015 , H01L2224/45124 , H01L2224/45144 , H01L2224/48091 , H01L2224/48137 , H01L2224/48227 , H01L2224/48472 , H01L2224/49 , H01L2224/73265 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01014 , H01L2924/01029 , H01L2924/01033 , H01L2924/01042 , H01L2924/0105 , H01L2924/01052 , H01L2924/01079 , H01L2924/01082 , H01L2924/014 , H01L2924/12041 , H01L2924/1301 , H01L2924/13033 , H01L2924/13034 , H01L2924/13055 , H01L2924/13091 , H01L2924/14 , H01L2924/181 , H01L2924/19041 , H01L2924/30107 , Y10T29/49162 , H01L2924/00014 , H01L2924/00
摘要: The invention relates to circuit module comprising components that are mounted on a substrate (10). Said substrate (10) comprises a metal carrier layer (20) having a first surface, a first insulating layer (30) directly adjoining the carrier layer (20) being arranged on said first surface. The substrate furthermore comprises a first wiring layer (40) which directly adjoins the first insulating layer (30), which is electroconductive and which is arranged on the first insulating layer (30). The substrate (10) comprises a first contact plane extending along the first surface, at least one of the components being directly electrically connected to the carrier layer (20) in the first contact plane. The invention further relates to a method for producing a circuit module according to the invention, wherein a surface section of the wiring layer (40) and a surface section of the underlying insulating layer (30) are removed and a component is fitted into the recess so produced.
摘要翻译: 本发明涉及一种具有衬底(10)被附接在元件的电路模块。 在基板(10)包括金属的具有第一表面的支撑层(20),在其第一表面直接到背衬层(20)相邻的第一绝缘层(30)布置。 该基板还包括设置其导电的第一绝缘层(30)相邻的第一布线层(40)上,并在第一绝缘层(30)上的直接。 在基板(10)包括沿着所述第一表面,其中在第一接触平面上的部件中的至少一者电连接到所述载体层(20)直接连接延伸的第一接触平面。 本发明还包括用于在其中布线层(40)和下面的绝缘层的表面部分的一个表面部分(30)被移除的本发明的电路模块的制造方法,并且在所提供的凹部,以便放置一个组件。
-
公开(公告)号:WO2009093825A3
公开(公告)日:2009-11-05
申请号:PCT/KR2009000223
申请日:2009-01-15
申请人: LG INNOTEK CO LTD , KIM DAE HUN , YANG YONG SUK
发明人: KIM DAE HUN , YANG YONG SUK
IPC分类号: H01L23/00
CPC分类号: H01L23/49537 , H01L23/49575 , H01L23/49589 , H01L24/45 , H01L24/48 , H01L24/49 , H01L2224/32145 , H01L2224/45144 , H01L2224/48091 , H01L2224/48247 , H01L2224/48463 , H01L2224/49171 , H01L2924/01005 , H01L2924/01006 , H01L2924/01014 , H01L2924/01033 , H01L2924/01047 , H01L2924/01079 , H01L2924/01082 , H01L2924/181 , H01L2924/19041 , H01L2924/19042 , H01L2924/19043 , H01L2924/19105 , H01L2924/00014 , H01L2924/00 , H01L2924/00012
摘要: A semiconductor package disclosed in an embodiment of this invention includes; a semiconductor chip; a first lead frame to which said semiconductor chip is bonded; plural second lead frames in at least one side of said first lead frame; a passive device mounted at some of said second lead frames; and a wire which connects said semiconductor chip to said second lead frames electrically.
摘要翻译: 在本发明的实施例中公开的半导体封装包括: 半导体芯片; 所述半导体芯片接合的第一引线框架; 在所述第一引线框架的至少一侧的多个第二引线框架; 安装在所述第二引线框架中的一些上的无源器件; 以及将所述半导体芯片电连接到所述第二引线框架的导线。
-
公开(公告)号:WO2009128035A1
公开(公告)日:2009-10-22
申请号:PCT/IB2009/051568
申请日:2009-04-15
IPC分类号: H01L23/482 , H01L29/78
CPC分类号: H01L23/4824 , H01L23/66 , H01L24/48 , H01L24/49 , H01L29/402 , H01L29/4175 , H01L29/41758 , H01L29/41775 , H01L29/42356 , H01L29/4238 , H01L29/7835 , H01L2223/6644 , H01L2224/48091 , H01L2224/49111 , H01L2224/49175 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01013 , H01L2924/01014 , H01L2924/01015 , H01L2924/01023 , H01L2924/01027 , H01L2924/01031 , H01L2924/01032 , H01L2924/01033 , H01L2924/01049 , H01L2924/0105 , H01L2924/01051 , H01L2924/01057 , H01L2924/01074 , H01L2924/01082 , H01L2924/10253 , H01L2924/10329 , H01L2924/1306 , H01L2924/13062 , H01L2924/13091 , H01L2924/19041 , H01L2924/19042 , H01L2924/19051 , H01L2924/30105 , H01L2924/30107 , H01L2924/3011 , H01L2924/30111 , H01L2924/3025 , H01L2924/00 , H01L2224/45099 , H01L2224/05599
摘要: The invention relates to a field-effect transistor having a higher efficiency than the known field-effect transistors, in particular at higher operating frequencies. This is achieved by electrically connecting sources of a plurality of main current paths by means of a strap line (SL) being inductively coupled to a gate line (Gtl) and/or a drain line (Drnl) for forming an additional RF-return current path parallel to the RF-return current path in a semiconductor body(SB). The invention further relates to a field-effect transistor package, a power amplifier, a multi-stage power amplifier and a base station comprising such a field-effect transistor.
摘要翻译: 本发明涉及具有比已知的场效应晶体管更高效率的场效应晶体管,特别是在较高的工作频率下。 这通过电感耦合到栅极线(Gt1)和/或漏极线(Drn1)的绑带线(SL)电连接多个主电流路径的源来实现,用于形成额外的RF返回电流 路径平行于半导体本体(SB)中的RF返回电流路径。 本发明还涉及场效应晶体管封装,功率放大器,多级功率放大器和包括这种场效应晶体管的基站。
-
公开(公告)号:WO2009125779A1
公开(公告)日:2009-10-15
申请号:PCT/JP2009/057162
申请日:2009-04-08
CPC分类号: H01L24/80 , H01L21/4882 , H01L23/3107 , H01L23/3735 , H01L23/4334 , H01L23/473 , H01L23/49537 , H01L23/49562 , H01L23/49575 , H01L24/29 , H01L24/32 , H01L24/33 , H01L24/37 , H01L24/40 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/83 , H01L25/072 , H01L25/117 , H01L2224/05554 , H01L2224/29 , H01L2224/29111 , H01L2224/2919 , H01L2224/32225 , H01L2224/371 , H01L2224/40137 , H01L2224/45124 , H01L2224/45144 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/49171 , H01L2224/73215 , H01L2224/73221 , H01L2224/73265 , H01L2224/83801 , H01L2224/84801 , H01L2924/00011 , H01L2924/00013 , H01L2924/01013 , H01L2924/01014 , H01L2924/01019 , H01L2924/01029 , H01L2924/01033 , H01L2924/01047 , H01L2924/0105 , H01L2924/01051 , H01L2924/01074 , H01L2924/01079 , H01L2924/01082 , H01L2924/0132 , H01L2924/014 , H01L2924/0665 , H01L2924/12041 , H01L2924/12042 , H01L2924/1305 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/1579 , H01L2924/181 , H01L2924/00014 , H01L2924/00 , H01L2924/00012 , H01L2224/29099 , H01L2224/29199 , H01L2224/29299 , H01L2224/2929 , H01L2224/29298 , H01L2224/83205
摘要: 半導体素子が搭載された半導体装置の上下の主面から効率よく放熱を行う。 半導体装置(1)は、絶縁基板(10A)と、絶縁基板(10A)に対向するように配設された絶縁基板(10B)と、絶縁基板(10A)と絶縁基板(10B)の間隙に配置され、コレクタ電極とコレクタ電極とは反対側に配設されたエミッタ電極を有した半導体素子(20)と、を備え、コレクタ電極が絶縁基板(10A)に配設された金属箔(10ac)に電気的に接続されると共に、エミッタ電極が絶縁基板(10B)に配設された金属箔(10bc)に電気的に接続されている。これにより、半導体素子(20)から発生した熱が、半導体装置(1)の上下の主面から効率よく放熱されるようになる。
摘要翻译: 热量从其上安装有半导体元件的半导体器件的上下表面有效地消散。 一种半导体器件(1),包括绝缘基板(10A),绝缘基板(10B),被布置成面对绝缘基板(10A);以及半导体元件(20),布置在绝缘基板(10A)和绝缘基板 基板(10B),并且具有与集电极相对布置的集电极和发射极。 集电极与形成在绝缘基板(10A)上的金属箔(10ac)电连接,发射电极与绝缘基板(10B)上形成的金属箔(10bc)电连接。 因此,可以从半导体器件(1)的上下表面有效地散发由半导体元件(20)产生的热量。
-
69.FLIP CHIP PACKAGING METHOD USING DOUBLE LAYER TYPE WAFER LEVEL UNDERFILL, FLIP CHIP PACKAGE MANUFACTURED USING THE SAME, AND SEMICONDUCTOR DEVICE FOR THE SAME 审中-公开
标题翻译: 使用双层类型水平底层的翻转芯片包装方法,使用其制造的片状芯片包装及其相同的半导体器件公开(公告)号:WO2009107880A1
公开(公告)日:2009-09-03
申请号:PCT/KR2008/001087
申请日:2008-02-25
申请人: LS MTRON, LTD. , ROH, June , KANG, Byung-Un , SUNG, Choong-Hyun , SEO, Joon-Mo , KIM, Jae-Hun , HYUN, Soon-Young , KIM, Ji-Eun , LEE, Jun-Woo
发明人: ROH, June , KANG, Byung-Un , SUNG, Choong-Hyun , SEO, Joon-Mo , KIM, Jae-Hun , HYUN, Soon-Young , KIM, Ji-Eun , LEE, Jun-Woo
CPC分类号: H01L21/563 , C08L63/00 , C09J163/00 , H01L24/11 , H01L24/27 , H01L24/29 , H01L24/73 , H01L24/81 , H01L24/83 , H01L24/92 , H01L24/94 , H01L2224/131 , H01L2224/2732 , H01L2224/274 , H01L2224/27416 , H01L2224/29082 , H01L2224/2919 , H01L2224/2929 , H01L2224/29299 , H01L2224/29386 , H01L2224/73104 , H01L2224/73204 , H01L2224/81815 , H01L2224/83191 , H01L2224/83862 , H01L2224/9211 , H01L2924/00013 , H01L2924/01005 , H01L2924/01006 , H01L2924/0102 , H01L2924/01027 , H01L2924/01029 , H01L2924/01033 , H01L2924/01057 , H01L2924/01058 , H01L2924/01079 , H01L2924/01087 , H01L2924/01322 , H01L2924/00014 , H01L2924/01014 , H01L2924/3512 , H01L2924/00 , H01L2924/0665 , H01L2924/05442 , H01L2224/29099 , H01L2224/29199
摘要: The present invention relates to a flip chip packaging method comprising the steps of forming a double layer type underfill layer having different curing temperatures on one surface of a semi¬ conductor wafer having a solder bump pattern; performing a B-stage process on the underfill layer to cure a layer having a relatively lower curing temperature among the double layer type underfill layer; dicing the semiconductor wafer into individual chips; aligning the individual chips on a substrate such that a surface of the underfill layer faces a surface of the substrate; and performing a reflow process with temperature capable of curing all of the double layer type underfill layer.
摘要翻译: 本发明涉及一种倒装芯片封装方法,包括以下步骤:在具有焊料凸块图形的半导体晶片的一个表面上形成具有不同固化温度的双层型底部填充层; 在底层填充层上进行B阶段处理以固化双层型底部填充层中具有相对较低固化温度的层; 将半导体晶片切割成单个芯片; 将衬底上的各个芯片对准,使得底部填充层的表面面向衬底的表面; 以及能够固化所有双层型底部填充层的温度的回流处理。
-
公开(公告)号:WO2009093554A1
公开(公告)日:2009-07-30
申请号:PCT/JP2009/050712
申请日:2009-01-20
申请人: 新日鉄マテリアルズ株式会社 , 株式会社日鉄マイクロメタル , 宇野 智裕 , 木村 圭一 , 山田 隆
CPC分类号: C22C5/02 , B21C37/047 , B23K35/0261 , B23K35/0272 , B23K35/24 , B23K35/30 , B23K35/3006 , B23K35/3013 , B23K35/302 , C22C9/00 , C22F1/08 , C22F1/14 , H01L24/43 , H01L24/45 , H01L24/48 , H01L24/85 , H01L2224/05624 , H01L2224/4312 , H01L2224/4321 , H01L2224/43825 , H01L2224/43848 , H01L2224/43986 , H01L2224/45014 , H01L2224/45015 , H01L2224/45139 , H01L2224/45144 , H01L2224/45147 , H01L2224/45164 , H01L2224/45169 , H01L2224/45173 , H01L2224/45176 , H01L2224/45565 , H01L2224/45572 , H01L2224/456 , H01L2224/45639 , H01L2224/45644 , H01L2224/45664 , H01L2224/45669 , H01L2224/45673 , H01L2224/45676 , H01L2224/48011 , H01L2224/48227 , H01L2224/48247 , H01L2224/48471 , H01L2224/48479 , H01L2224/4848 , H01L2224/4849 , H01L2224/4851 , H01L2224/48511 , H01L2224/48624 , H01L2224/48639 , H01L2224/48644 , H01L2224/48839 , H01L2224/48844 , H01L2224/85045 , H01L2224/85065 , H01L2224/85075 , H01L2224/85186 , H01L2224/85203 , H01L2224/85207 , H01L2224/85439 , H01L2224/85444 , H01L2225/06562 , H01L2924/00015 , H01L2924/01005 , H01L2924/01006 , H01L2924/01007 , H01L2924/01014 , H01L2924/01015 , H01L2924/01018 , H01L2924/0102 , H01L2924/01022 , H01L2924/01027 , H01L2924/01028 , H01L2924/01029 , H01L2924/01033 , H01L2924/0104 , H01L2924/01044 , H01L2924/01045 , H01L2924/01046 , H01L2924/01047 , H01L2924/01049 , H01L2924/01078 , H01L2924/01079 , H01L2924/01082 , H01L2924/01083 , H01L2924/01327 , H01L2924/10253 , H01L2924/12041 , H01L2924/14 , H01L2924/15311 , H01L2924/15747 , H01L2924/20752 , H01L2924/3025 , H01L2924/01004 , H01L2924/01203 , H01L2224/45655 , H01L2224/45657 , H01L2224/45671 , H01L2224/45666 , H01L2924/01204 , H01L2924/01202 , H01L2224/48465 , H01L2924/20751 , H01L2924/01001 , H01L2924/20655 , H01L2924/20652 , H01L2924/20653 , H01L2924/20654 , H01L2924/20656 , H01L2924/00 , H01L2224/48824 , H01L2924/00014 , H01L2924/013 , H01L2924/20753 , H01L2924/20755 , H01L2924/20756 , H01L2924/20757 , H01L2924/20758 , H01L2924/20759 , H01L2924/2076 , H01L2924/20105 , H01L2924/20106 , H01L2924/20107 , H01L2924/2075 , H01L2924/20754
摘要: 本発明は、ボール直上部のワイヤ倒れ(リーニング)及び、スプリング不良を抑制することもでき、ループの直線性、ループ高さの安定性等にも優れていることで、積層チップ接続、細線化、狭ピッチ実装等の半導体実装技術にも適応する、高機能のボンディングワイヤを提供することを目的とする。 導電性金属からなる芯材と、該芯材の上に芯材とは異なる金属を主成分とする表皮層を有するボンディングワイヤであって、該表皮層の表面における結晶粒の円周方向の平均サイズaと、ワイヤ軸の垂直断面における該芯材の結晶粒の平均サイズbとの関係について、a/b≦0.7である半導体装置用ボンディングワイヤである。
摘要翻译: 提供一种高功能的接合线,其能够抑制直接发生在球上方的线倾斜和弹簧故障,并且具有优异的环路线性,环路高度稳定性等,因此可应用于多层芯片连接的半导体安装技术 ,线材变薄,窄间距安装等。 接合线具有由导电金属构成的芯材,以及在芯材上具有不同于芯材作为主要成分的金属的表面层。 用于半导体器件的接合线满足a / b = 0.7的不等式,其中(a)是表面层的表面上的圆周方向的晶粒的平均尺寸,(b)是表面层的平均尺寸 芯材的晶粒在线轴的垂直横截面上。
-
-
-
-
-
-
-
-
-