Composite motion probing
    28.
    发明申请
    Composite motion probing 失效
    复合运动探测

    公开(公告)号:US20040130312A1

    公开(公告)日:2004-07-08

    申请号:US10328113

    申请日:2002-12-20

    申请人: FormFactor, Inc.

    IPC分类号: G01R007/00

    摘要: An electronic device is moved into a first position with respect to probes for making electrical contact with the device. The electronic device is then moved into a second position in which the electronic device is pressed against the probes, compressing the probes. The movement into the second position includes two components. One component of the movement tends to press the electronic device against the probes, compressing the probes and inducing a stress in the probes. The second movement tends to reduce that stress. Test data are then communicated to and from the electronic device through the probes.

    摘要翻译: 电子设备相对于用于与设备电接触的探针移动到第一位置。 然后将电子设备移动到第二位置,其中电子设备被压靠在探针上,压缩探针。 进入第二位置的运动包括两个部件。 移动的一个组件倾向于将电子装置压靠在探针上,压缩探针并在探针中引起应力。 第二动作往往会减轻压力。 然后通过探头将测试数据传送到电子设备和从电子设备传送。

    Microelectronic contact structures, and methods of making same
    29.
    发明申请
    Microelectronic contact structures, and methods of making same 有权
    微电子接触结构及其制造方法

    公开(公告)号:US20030049951A1

    公开(公告)日:2003-03-13

    申请号:US10202768

    申请日:2002-07-25

    申请人: FormFactor, Inc.

    IPC分类号: H05K001/00 H01R012/00

    摘要: Microelectronic contact structures are fabricated by separately forming, then joining together, various components thereof. Each contact structure has three components: a nullpostnull component, a nullbeamnull component, and a nulltipnull component. The resulting contact structure, mounted to an electronic component, is useful for making an electrical connection with another electronic component. The post component can be fabricated on a sacrificial substrate, joined to the electronic component and its sacrificial substrate removed. Alternatively, the post component can be formed on the electronic component. The beam and tip components can each be fabricated on a sacrificial substrate. The beam component is joined to the post component and its sacrificial substrate is removed, and the tip component is joined to the beam component and its sacrificial substrate is removed.

    摘要翻译: 微电子接触结构通过分别形成,然后连接在一起而制成其各种部件。 每个接触结构具有三个部件:“后”部件,“梁”部件和“尖端”部件。 安装到电子部件上的所得接触结构对于与另一个电子部件进行电连接是有用的。 后部组件可以制造在牺牲基板上,连接到电子部件并且去除其牺牲基板。 或者,可以在电子部件上形成柱部件。 梁和尖端部件可以分别制造在牺牲衬底上。 梁组件连接到柱部件,并且其牺牲基板被移除,并且尖端部件接合到梁部件并且其牺牲基板被移除。

    Interconnection element with contact blade
    30.
    发明申请
    Interconnection element with contact blade 有权
    互连元件与接触片

    公开(公告)号:US20030015347A1

    公开(公告)日:2003-01-23

    申请号:US10174455

    申请日:2002-06-17

    申请人: FormFactor, Inc

    IPC分类号: H05K001/00

    摘要: An apparatus and method providing improved interconnection elements and tip structures for effecting pressure connections between terminals of electronic components is described. The tip structure of the present invention has a sharpened blade oriented on the upper surface of the tip structure such that the length of the blade is substantially parallel to the direction of horizontal movement of the tip structure as the tip structure deflects across the terminal of an electronic component. In this manner, the sharpened substantially parallel oriented blade slices cleanly through any non-conductive layer(s) on the surface of the terminal and provides a reliable electrical connection between the interconnection element and the terminal of the electrical component.

    摘要翻译: 描述了提供改进的互连元件和尖端结构以实现电子部件的端子之间的压力连接的装置和方法。 本发明的尖端结构具有尖端结构的上表面上定向的锋利的叶片,使得叶片的长度基本上平行于尖端结构的水平移动方向,因为尖端结构偏转穿过端部 电子元件 以这种方式,锋利的基本上平行的定向叶片切片通过终端表面上的任何非导电层清洁,并且在互连元件和电气部件的端子之间提供可靠的电连接。