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公开(公告)号:CN103887190B
公开(公告)日:2018-07-31
申请号:CN201310464601.3
申请日:2013-10-08
申请人: 英特赛尔美国有限公司
IPC分类号: H01L21/60 , H01L23/495
CPC分类号: H01L24/32 , H01L21/4828 , H01L23/49503 , H01L23/49513 , H01L23/49541 , H01L23/49575 , H01L23/49586 , H01L24/29 , H01L24/37 , H01L24/40 , H01L24/48 , H01L24/73 , H01L24/83 , H01L24/84 , H01L24/85 , H01L24/92 , H01L2224/26175 , H01L2224/2731 , H01L2224/2732 , H01L2224/29007 , H01L2224/291 , H01L2224/2919 , H01L2224/2929 , H01L2224/293 , H01L2224/32058 , H01L2224/32245 , H01L2224/37124 , H01L2224/37147 , H01L2224/40245 , H01L2224/48245 , H01L2224/48247 , H01L2224/73263 , H01L2224/73265 , H01L2224/83121 , H01L2224/83192 , H01L2224/83801 , H01L2224/83815 , H01L2224/8385 , H01L2224/84801 , H01L2224/8485 , H01L2224/92246 , H01L2224/92247 , H01L2924/00014 , H01L2924/12032 , H01L2924/1425 , H01L2924/15747 , H01L2924/181 , H01L2924/014 , H01L2924/0665 , H01L2224/45099 , H01L2924/00012 , H01L2924/00
摘要: 本文描述的实施方案涉及制造装置。所述方法包括在引线框架的内表面中蚀刻至少个凹部图案,所述至少个凹部图案包括限定安装区域的周边的周边凹部。所述方法还包括将组件附接至引线框架的内表面,使得所述组件的单个端子附接在安装区域中且单个端子覆盖周边凹部,其中周边凹部具有使得凹部接近单个端子的周边的尺寸和形状。
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公开(公告)号:CN106716636A
公开(公告)日:2017-05-24
申请号:CN201480081235.6
申请日:2014-09-17
申请人: 英特尔公司
CPC分类号: H04R1/04 , B81B7/02 , B81B2201/0257 , B81B2207/096 , B81C1/00158 , B81C2201/0132 , B81C2203/0109 , H01L21/6835 , H01L21/6836 , H01L21/76898 , H01L23/481 , H01L24/13 , H01L24/16 , H01L24/27 , H01L24/29 , H01L24/32 , H01L24/83 , H01L2221/68327 , H01L2221/6834 , H01L2221/68381 , H01L2224/131 , H01L2224/16227 , H01L2224/27002 , H01L2224/27618 , H01L2224/27848 , H01L2224/29011 , H01L2224/2919 , H01L2224/3201 , H01L2224/32058 , H01L2224/32225 , H01L2224/32245 , H01L2224/73204 , H01L2224/83005 , H01L2224/83193 , H01L2224/83438 , H01L2224/8346 , H01L2224/83488 , H01L2224/8359 , H01L2224/83688 , H01L2224/83862 , H01L2224/92 , H01L2224/9222 , H01L2224/92225 , H01L2924/1461 , H01L2924/15311 , H01L2924/161 , H01L2924/16151 , H01L2924/16152 , H01L2924/163 , H01L2924/166 , H04R1/406 , H04R19/005 , H04R19/04 , H01L2924/014 , H01L2924/0665 , H01L2924/01014 , H01L2924/00014 , H01L2924/00012 , H01L2224/11 , H01L2224/27 , H01L2224/83 , H01L2224/81 , H01L2221/68304
摘要: 本公开内容的实施例描述了具有使用穿硅过孔(TSV)和相关联的技术和构造的集成麦克风设备的管芯。在一个实施例中,一种装置包括具有第一侧和被设置为与第一侧相对的第二侧的半导体衬底,形成在半导体衬底的第一侧上的互连层,形成为穿过半导体衬底并且被配置为在半导体衬底的第一侧与半导体衬底的第二侧之间传送电信号的穿硅过孔(TSV),以及形成在半导体衬底的第二侧上并与TSV电气耦合的麦克风器件。可以描述和/或要求保护其它实施例。
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公开(公告)号:CN105592636A
公开(公告)日:2016-05-18
申请号:CN201510741043.X
申请日:2015-11-04
申请人: 富士通株式会社
CPC分类号: H01L24/81 , B23K35/26 , H01L23/49816 , H01L23/49827 , H01L24/05 , H01L24/13 , H01L24/16 , H01L24/29 , H01L24/32 , H01L24/73 , H01L24/75 , H01L24/83 , H01L24/92 , H01L2224/0401 , H01L2224/05082 , H01L2224/05147 , H01L2224/05155 , H01L2224/05644 , H01L2224/13023 , H01L2224/13109 , H01L2224/16227 , H01L2224/16238 , H01L2224/16507 , H01L2224/2919 , H01L2224/32058 , H01L2224/32225 , H01L2224/73204 , H01L2224/75702 , H01L2224/81011 , H01L2224/81024 , H01L2224/81098 , H01L2224/81192 , H01L2224/81211 , H01L2224/81444 , H01L2224/81815 , H01L2224/81907 , H01L2224/8191 , H01L2224/81948 , H01L2224/83104 , H01L2224/92125 , H01L2924/0133 , H01L2924/20104 , H01L2924/3511 , H05K3/3436 , H05K3/3463 , H05K2201/10674 , H05K2203/047 , H01L2924/00014 , H01L2224/05166 , H01L2924/0105 , H01L2924/01047 , H01L2924/00012 , H05K3/3457 , C22C13/00 , C22C28/00 , C22C30/00 , C22C30/04
摘要: 本发明公开了一种电装置及其制造方法。电装置包括:第一电部件、第二电部件、以及连接第一电部件与第二电部件的In-Sn-Ag合金,所述In-Sn-Ag合金包含AgIn2和Ag2In,Ag2In含量低于AgIn2含量。
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公开(公告)号:CN104465579A
公开(公告)日:2015-03-25
申请号:CN201410061293.4
申请日:2014-02-24
申请人: 株式会社东芝
IPC分类号: H01L23/488 , H01L21/60 , B23K35/24
CPC分类号: H01L23/481 , H01L24/04 , H01L24/29 , H01L24/32 , H01L24/82 , H01L24/83 , H01L2224/04026 , H01L2224/05655 , H01L2224/26152 , H01L2224/29109 , H01L2224/29111 , H01L2224/29118 , H01L2224/29139 , H01L2224/29144 , H01L2224/29147 , H01L2224/3201 , H01L2224/32058 , H01L2224/32227 , H01L2224/32505 , H01L2224/82101 , H01L2224/83192 , H01L2224/83206 , H01L2224/83207 , H01L2224/83447 , H01L2224/83815 , H01L2924/01322 , H01L2924/351 , H01L2924/00 , H01L2924/00014 , H01L2924/014 , H01L2924/01049 , H01L2924/0105 , H01L2924/00012
摘要: 一种半导体装置,包含半导体元件、布线层以及接合层。所述布线层包含Cu。所述接合层包含第一合金,该第一合金以实质上均匀的组分在所述半导体元件与所述布线层之间设置,是Cu与Cu以外的第一金属的合金。所述第一合金的熔点比所述第一金属的熔点高。
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公开(公告)号:CN103175881B
公开(公告)日:2015-02-18
申请号:CN201210470822.7
申请日:2012-11-20
申请人: 迈克纳斯公司
IPC分类号: G01N27/403
CPC分类号: H01L29/66 , G01N27/4143 , G01N27/4148 , H01L23/3171 , H01L24/05 , H01L24/13 , H01L24/16 , H01L24/17 , H01L24/29 , H01L24/32 , H01L24/33 , H01L24/48 , H01L2224/0401 , H01L2224/04026 , H01L2224/05017 , H01L2224/05138 , H01L2224/05557 , H01L2224/05558 , H01L2224/05564 , H01L2224/05571 , H01L2224/05572 , H01L2224/05578 , H01L2224/05582 , H01L2224/05638 , H01L2224/05684 , H01L2224/05686 , H01L2224/05687 , H01L2224/1319 , H01L2224/1329 , H01L2224/133 , H01L2224/16058 , H01L2224/16112 , H01L2224/1613 , H01L2224/16145 , H01L2224/17505 , H01L2224/17517 , H01L2224/26145 , H01L2224/2919 , H01L2224/2929 , H01L2224/293 , H01L2224/32058 , H01L2224/32112 , H01L2224/3213 , H01L2224/32145 , H01L2224/32245 , H01L2224/33181 , H01L2224/33505 , H01L2224/33517 , H01L2224/48247 , H01L2224/73207 , H01L2224/73215 , H01L2224/73265 , H01L2224/8185 , H01L2224/8385 , H01L2224/83851 , H01L2924/00014 , H01L2924/10155 , H01L2924/01014 , H01L2924/0476 , H01L2924/01074 , H01L2924/00 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
摘要: 基于集成的场效应晶体管的半导体气体传感器具有半导体主体和通过间隙与通道区域分离的气体敏感的控制电极且构造为悬浮栅场效应晶体管,或者控制电极设置为具有间隙的电容器的第一板且电容器的第二板与电容性控制构造的场效应晶体管的栅极连接,控制电极具有半导体载体层和气体敏感层,半导体载体层具有增附剂层且气体敏感层位于增附剂层上,控制电极与参考电势连接,气体敏感层的表面朝着通道区域或第二板,在半导体主体表面上设有连接区,支撑区设置在连接区内,连接区具有第一连接区域和第二连接区域,第一连接区域借助第一连接剂与控制电极电连接和力锁合连接,第二连接区域借助第二连接剂与控制电极至少力锁合连接。
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公开(公告)号:CN104051401A
公开(公告)日:2014-09-17
申请号:CN201410095780.2
申请日:2014-03-14
申请人: 瑞萨电子株式会社
IPC分类号: H01L23/495 , H01L23/488 , H01L23/31 , H01L21/56 , H01L21/60
CPC分类号: H01L23/49 , H01L21/50 , H01L23/293 , H01L23/295 , H01L23/3107 , H01L23/3192 , H01L23/49513 , H01L23/4952 , H01L23/49562 , H01L23/49582 , H01L23/562 , H01L23/564 , H01L24/03 , H01L24/05 , H01L24/06 , H01L24/29 , H01L24/30 , H01L24/32 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L24/83 , H01L24/85 , H01L24/92 , H01L29/1608 , H01L29/2003 , H01L2224/0381 , H01L2224/04042 , H01L2224/05073 , H01L2224/05082 , H01L2224/05155 , H01L2224/05166 , H01L2224/05552 , H01L2224/05553 , H01L2224/05624 , H01L2224/05639 , H01L2224/05644 , H01L2224/0603 , H01L2224/291 , H01L2224/29111 , H01L2224/29118 , H01L2224/29139 , H01L2224/29144 , H01L2224/29294 , H01L2224/29439 , H01L2224/2949 , H01L2224/3011 , H01L2224/3201 , H01L2224/32013 , H01L2224/32058 , H01L2224/32059 , H01L2224/32245 , H01L2224/45124 , H01L2224/45139 , H01L2224/45147 , H01L2224/45155 , H01L2224/45565 , H01L2224/45616 , H01L2224/45639 , H01L2224/45644 , H01L2224/45664 , H01L2224/48247 , H01L2224/48472 , H01L2224/48724 , H01L2224/48739 , H01L2224/48744 , H01L2224/48755 , H01L2224/48824 , H01L2224/48839 , H01L2224/48844 , H01L2224/48855 , H01L2224/48997 , H01L2224/4903 , H01L2224/49111 , H01L2224/73265 , H01L2224/83055 , H01L2224/83192 , H01L2224/83194 , H01L2224/83439 , H01L2224/83801 , H01L2224/8384 , H01L2224/8392 , H01L2224/83951 , H01L2224/85205 , H01L2224/85439 , H01L2224/85444 , H01L2224/85455 , H01L2224/8592 , H01L2224/85951 , H01L2224/92 , H01L2224/92247 , H01L2924/00011 , H01L2924/10272 , H01L2924/15747 , H01L2924/181 , H01L2924/3512 , H01L2924/00014 , H01L2924/06 , H01L2924/00012 , H01L2224/85 , H01L2224/83 , H01L2924/01013 , H01L2924/01051 , H01L2924/01047 , H01L2924/01029 , H01L2924/0105 , H01L2924/014 , H01L2924/00 , H01L2224/83205
摘要: 本发明涉及半导体装置及其制造方法。本发明的解决的一个问题是提高半导体装置的可靠性。具有:管芯焊盘(6)、搭载于管芯焊盘(6)的SiC芯片(1)、对管芯焊盘(6)和SiC芯片(1)进行接合的多孔质的第1烧结Ag层(16)、以及覆盖第1烧结Ag层(16)的表面并且被形成为圆角状的加强树脂部(17)。进而,具有与SiC芯片(1)的源电极(2)电连接的源极引线(9)、与栅电极(3)电连接的栅极引线、与漏电极(4)电连接的漏极引线、以及覆盖SiC芯片(1)、第1烧结Ag层(16)及管芯焊盘(6)的一部分的密封体(14),加强树脂部(17)覆盖SiC芯片(1)的侧面(1c)的一部分。
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公开(公告)号:CN103839910A
公开(公告)日:2014-06-04
申请号:CN201310588326.6
申请日:2013-11-21
申请人: 英飞凌科技奥地利有限公司
IPC分类号: H01L23/488 , H01L23/544 , H01L21/78
CPC分类号: H01L23/538 , H01L21/78 , H01L23/3735 , H01L23/49513 , H01L24/03 , H01L24/05 , H01L24/29 , H01L24/32 , H01L24/83 , H01L24/94 , H01L29/0657 , H01L2224/03001 , H01L2224/03462 , H01L2224/0347 , H01L2224/04026 , H01L2224/05018 , H01L2224/05124 , H01L2224/05139 , H01L2224/05144 , H01L2224/05155 , H01L2224/05164 , H01L2224/05166 , H01L2224/05169 , H01L2224/05172 , H01L2224/05184 , H01L2224/05187 , H01L2224/05558 , H01L2224/05564 , H01L2224/05582 , H01L2224/05639 , H01L2224/05644 , H01L2224/26145 , H01L2224/291 , H01L2224/29116 , H01L2224/2912 , H01L2224/32058 , H01L2224/32225 , H01L2224/32245 , H01L2224/83365 , H01L2224/83455 , H01L2224/83815 , H01L2224/83825 , H01L2224/94 , H01L2924/00014 , H01L2924/10157 , H01L2924/10158 , H01L2924/12042 , H01L2924/1301 , H01L2924/1305 , H01L2924/13055 , H01L2924/1306 , H01L2924/13091 , H01L2924/15747 , H01L2924/014 , H01L2924/01023 , H01L2924/0105 , H01L2924/01047 , H01L2924/047 , H01L2224/03 , H01L2924/00012 , H01L2924/00 , H01L2224/05552
摘要: 本发明涉及包括芯片载体的半导体器件组件、半导体晶片和制造半导体器件的方法。一种半导体器件包括芯片载体以及具有半导体部分和传导结构半导体管芯。焊接层在半导体管芯的焊接侧机械连接和电连接芯片载体和传导结构。在焊接侧,沿半导体管芯的边缘的最外侧表面部分到芯片载体的距离大于中央表面部分到芯片载体的距离。传导结构覆盖中央表面部分以及中间表面部分的至少区段,所述中间表面部分相对于中央表面部分倾斜。焊接材料被有效地防止以免于涂覆易受损坏的这样的半导体表面,并且焊接引起的污染被显著地减少。
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公开(公告)号:CN103247545A
公开(公告)日:2013-08-14
申请号:CN201310049181.2
申请日:2013-02-07
申请人: 英飞凌科技股份有限公司
IPC分类号: H01L21/60 , H01L23/488 , H01L23/495
CPC分类号: H01L23/49562 , H01L23/49524 , H01L24/05 , H01L24/27 , H01L24/29 , H01L24/32 , H01L24/33 , H01L24/35 , H01L24/37 , H01L24/40 , H01L24/83 , H01L24/84 , H01L24/95 , H01L2224/04026 , H01L2224/05553 , H01L2224/05639 , H01L2224/05644 , H01L2224/05647 , H01L2224/05655 , H01L2224/05664 , H01L2224/05669 , H01L2224/0603 , H01L2224/2732 , H01L2224/2745 , H01L2224/27462 , H01L2224/29109 , H01L2224/29111 , H01L2224/32058 , H01L2224/32225 , H01L2224/32245 , H01L2224/32503 , H01L2224/32507 , H01L2224/33181 , H01L2224/3512 , H01L2224/352 , H01L2224/37099 , H01L2224/37111 , H01L2224/37139 , H01L2224/37144 , H01L2224/37147 , H01L2224/37155 , H01L2224/37164 , H01L2224/37169 , H01L2224/37572 , H01L2224/376 , H01L2224/37639 , H01L2224/37644 , H01L2224/37647 , H01L2224/37655 , H01L2224/37664 , H01L2224/37669 , H01L2224/40095 , H01L2224/40101 , H01L2224/40175 , H01L2224/40245 , H01L2224/40247 , H01L2224/40491 , H01L2224/73253 , H01L2224/73263 , H01L2224/77272 , H01L2224/83191 , H01L2224/83192 , H01L2224/8321 , H01L2224/83439 , H01L2224/83444 , H01L2224/83447 , H01L2224/83455 , H01L2224/83464 , H01L2224/83469 , H01L2224/83801 , H01L2224/83825 , H01L2224/84439 , H01L2224/84444 , H01L2224/84447 , H01L2224/84455 , H01L2224/84464 , H01L2224/84469 , H01L2224/84801 , H01L2224/84825 , H01L2224/9221 , H01L2224/92246 , H01L2224/95 , H01L2924/00014 , H01L2924/014 , H01L2924/1305 , H01L2924/13055 , H01L2924/1306 , H01L2924/13062 , H01L2924/13091 , H01L2924/15787 , H01L2924/181 , H01L2924/00 , H01L2924/0105 , H01L2924/01047 , H01L2924/01079 , H01L2224/83 , H01L2224/84 , H01L2924/00012 , H01L2224/37599
摘要: 本发明涉及半导体装置及其方法。该方法包括提供具有第一主表面和第二主表面的半导体芯片。以半导体芯片的第一主表面面向承载件的形式,将半导体芯片放置在承载件上。在第一主表面和承载件之间设置焊料材料的第一层。以第一接触区域面向半导体芯片的第二主表面的方式,将包括第一接触区域的接触夹放置在半导体芯片上。在第一接触区域和第二主表面之间设置焊料材料的第二层。其后,将热量施加于焊料材料的第一层和第二层,从而在承载件、半导体芯片和接触片之间形成扩散焊料结合。
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公开(公告)号:CN104134651B
公开(公告)日:2018-06-26
申请号:CN201410182740.1
申请日:2014-04-30
申请人: 瑞萨电子株式会社
发明人: 宮本浩靖
IPC分类号: H01L25/065 , H01L23/04 , H01L23/488
CPC分类号: H01L21/563 , H01L23/04 , H01L23/10 , H01L23/367 , H01L23/49816 , H01L23/49894 , H01L23/50 , H01L23/544 , H01L24/16 , H01L24/17 , H01L24/29 , H01L24/32 , H01L24/33 , H01L24/37 , H01L24/40 , H01L24/73 , H01L24/81 , H01L24/83 , H01L24/84 , H01L25/0657 , H01L25/18 , H01L2223/5442 , H01L2223/54486 , H01L2224/16145 , H01L2224/16146 , H01L2224/16225 , H01L2224/17181 , H01L2224/26175 , H01L2224/291 , H01L2224/2919 , H01L2224/2929 , H01L2224/293 , H01L2224/29324 , H01L2224/29339 , H01L2224/32013 , H01L2224/32058 , H01L2224/32059 , H01L2224/32145 , H01L2224/32225 , H01L2224/32245 , H01L2224/33181 , H01L2224/3701 , H01L2224/37012 , H01L2224/37147 , H01L2224/376 , H01L2224/40225 , H01L2224/40499 , H01L2224/73204 , H01L2224/73253 , H01L2224/73255 , H01L2224/73263 , H01L2224/83132 , H01L2224/83801 , H01L2224/83851 , H01L2224/84132 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2225/06565 , H01L2225/06589 , H01L2924/15311 , H01L2924/16196 , H01L2924/16251 , H01L2924/19105 , H01L2924/19106 , H01L2924/351 , H01L2924/3511 , H05K1/0203 , H05K2201/066 , H05K2201/10515 , H05K2201/1053 , H05K2201/1056 , H05K2201/10674 , H01L2924/00012 , H01L2924/00 , H01L2924/00014 , H01L2924/014 , H01L2924/07811
摘要: 本发明涉及半导体装置。矩形的控制芯片的长边和矩形的存储器芯片的长边被布置为平行于BGA中的布线衬底的上表面的第一边。盖子包括一对第一边檐和一对第二边檐,第二边檐的宽度被形成为比第一边檐更宽,并且在安装在布线衬底的上表面上的控制芯片的短边的外侧以及安装在布线衬底的上表面上的存储器芯片的短边的外侧确保用于安装片状部件的安装区域和用于接合盖子的接合基底区,这使得能够在接合基底区上布置盖子的较宽的宽度的第二边檐。因此,能够减小BGA的安装面积。
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公开(公告)号:CN104139249B
公开(公告)日:2017-01-18
申请号:CN201410194323.9
申请日:2014-05-09
申请人: LG伊诺特有限公司
发明人: 黄德起
IPC分类号: B23K35/24 , B23K35/363
CPC分类号: B23K35/025 , B22F1/0003 , B22F1/025 , B22F2998/10 , B23K1/0016 , B23K35/0244 , B23K35/24 , B23K35/262 , B23K35/302 , B23K35/36 , B23K35/3612 , C22C1/0425 , C22C1/0483 , H01L24/14 , H01L24/27 , H01L24/29 , H01L24/32 , H01L2224/06102 , H01L2224/27442 , H01L2224/27849 , H01L2224/29294 , H01L2224/29311 , H01L2224/29347 , H01L2224/29439 , H01L2224/32058 , H01L2224/32245 , H01L2224/83801 , H01L2924/01322 , H05K3/3463 , H05K3/3484 , H05K2201/0272 , H01L2924/00 , B22F9/04 , H01L2924/00014 , H01L2924/01047 , H01L2924/01029
摘要: 本发明的实施方案涉及焊膏,其包含熔剂和与熔剂混合的粉末,所述粉末包含彼此混合的第一粉末和第二粉末。第一粉末包含锡(Sn)和溶于锡(Sn)中的至少一种金属,并且第二粉末包含其表面涂覆有银(Ag)的铜(Cu)粉。
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