Abstract:
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing the occurrence of a crack. SOLUTION: This semiconductor device 1 includes a multilayer wiring board 4 and a semiconductor chip 2 mounted on the multilayer wiring board 4. Electrode pads 3 of the semiconductor chip 2 comprise first electrode pads 3a arranged adjacently to respective corners of a rear surface 2a of the semiconductor chip 2, and second electrode pads 3b other than them. Connecting pads 5 on the multilayer wiring board 4 comprise first connecting pads 5a connected to the first electrode pads 3a through bumps 7, and second connecting pads 5b connected to the second electrode pads 3b through the bumps 7. The first connecting pads 5a are supported by a first insulating region 41 formed of a thermoplastic resin, and the second connection pads 5b are supported by a second insulating region 42 formed of a thermosetting resin. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a resin composition suitable for forming an insulating layer of a multilayered printed wiring board or the like, excellent in heat resistance, mechanical strength and laminating performance, and having low thermal expansion coefficient. SOLUTION: This resin composition contains (A) a polymer of a bismaleimide compound and a diamine compound, (B) an epoxy resin having two or more of epoxy groups in one molecule, (C) a curing agent and (D) a polyethersulfone resin. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a high frequency-corresponding wiring board material with the dielectric dissipation factor, weight and cost reduced without deterioration of the processability, and an electronic component using the same. SOLUTION: The prepreg comprises a substrate of a polyolefin fiber and a high-strength fiber complexed, impregnated with a thermosetting low dielectric loss tangent resin composition. The electronic component comprises a cured material of the prepreg as an insulation layer. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To increase the bonding reliability of a power module. SOLUTION: A substrate 14 for a power module comprises a ceramics plate 11; a circuit layer 12 which is brazed to the front surface of the ceramic plate; a metal layer 13 which is brazed to the back surface of the ceramic plate; and a semiconductor chip 16 which is solder-bonded to the circuit layer 12. The metal layer 13 is formed of an Al alloy, having overall average purity of 98.0 to 99.9 wt.%. The concentration of Fe contained in a brazing surface 13a side for the ceramic plate 11 is less than 0.1 wt.%, and the concentration of Fe, contained in a surface 13b side opposite to the brazing surface 13a, is 0.1 wt.% or higher. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a printed circuit board which can surely prevent a poor connection between a terminal pad and a terminal of an electronic component. SOLUTION: In the printed circuit board 17, specific regions 42a-42d are located on the rear side of an electronic component mounting region for bearing the electronic component. In the specific regions 42a-42d, a conductive film 39 is formed according to the ratio of the surface area of the board and the area of the conductive material which is defined by the electronic component mounting region. The ratio of the surface area of the board 28 and the area of the conductive material 39 is adapted to each electronic component by the electronic component mounting region and the specific regions 42a-42d. Thus, the warping of the printed circuit board 17 can be suppressed during heating in the reflow process. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method to enable the tip of a probe element to be oriented without changing the position of a probe card. SOLUTION: A probe card assembly 500 comprises a probe card 502 and a space converter 506. The space converter 506 is equipped with the probe element 524. An interposer 504 is interposed in between the space converter 506 and the probe card 502. The space converter 506 and the interposer 504 are stacked up. The orientation of the space converter 506 is adjusted by an actuator. Thus, the probe elements 524 can be arranged so as to optimize probing of the wafer 508 as a whole. COPYRIGHT: (C)2008,JPO&INPIT